CN102662258B - 背光模组的检测方法及装置 - Google Patents
背光模组的检测方法及装置 Download PDFInfo
- Publication number
- CN102662258B CN102662258B CN201210129108.1A CN201210129108A CN102662258B CN 102662258 B CN102662258 B CN 102662258B CN 201210129108 A CN201210129108 A CN 201210129108A CN 102662258 B CN102662258 B CN 102662258B
- Authority
- CN
- China
- Prior art keywords
- backlight module
- brightness value
- detected
- space brightness
- pick
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 28
- 238000005286 illumination Methods 0.000 claims abstract description 26
- 230000002159 abnormal effect Effects 0.000 claims abstract description 20
- 238000005375 photometry Methods 0.000 claims description 17
- 238000000034 method Methods 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
- G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
- G01J1/32—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors adapted for automatic variation of the measured or reference value
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Circuit Arrangement For Electric Light Sources In General (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Liquid Crystal Display Device Control (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Description
Claims (10)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210129108.1A CN102662258B (zh) | 2012-04-27 | 2012-04-27 | 背光模组的检测方法及装置 |
PCT/CN2012/075064 WO2013159377A1 (zh) | 2012-04-27 | 2012-05-04 | 背光模组的检测方法及装置 |
US13/518,756 US20130285819A1 (en) | 2012-04-27 | 2012-05-04 | Inspection method of backlight module and inspection apparatus thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210129108.1A CN102662258B (zh) | 2012-04-27 | 2012-04-27 | 背光模组的检测方法及装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102662258A CN102662258A (zh) | 2012-09-12 |
CN102662258B true CN102662258B (zh) | 2015-04-15 |
Family
ID=46771776
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201210129108.1A Expired - Fee Related CN102662258B (zh) | 2012-04-27 | 2012-04-27 | 背光模组的检测方法及装置 |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN102662258B (zh) |
WO (1) | WO2013159377A1 (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106895961B (zh) * | 2016-07-29 | 2019-07-23 | 深圳市德仓科技有限公司 | 一种背光模组的检测设备及其检测方法 |
CN108418997B (zh) * | 2018-01-31 | 2020-12-22 | 深圳市商巨视觉技术有限公司 | 去除图像摩尔纹的方法 |
CN110057549B (zh) * | 2019-04-08 | 2021-06-01 | Tcl华星光电技术有限公司 | 一种光源照度检测方法及系统 |
CN109946859B (zh) * | 2019-04-09 | 2022-02-01 | 深圳市华星光电半导体显示技术有限公司 | 背光模组的检测方法和装置 |
CN111721505A (zh) * | 2020-06-30 | 2020-09-29 | 东莞市聚明电子科技有限公司 | 基于极坐标的键盘背光模组的自动校准检测方法及装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06331962A (ja) * | 1993-05-21 | 1994-12-02 | Keibunshiya:Kk | 液晶表示装置 |
CN1466408A (zh) * | 2002-06-26 | 2004-01-07 | 明基电通股份有限公司 | 液晶显示器亮度的探测与调整方法 |
CN1862334A (zh) * | 2005-05-11 | 2006-11-15 | 英华达(上海)电子有限公司 | 手持设备自动调整背光亮度和效果的装置及其方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1115552C (zh) * | 2000-06-07 | 2003-07-23 | 明碁电脑股份有限公司 | 用来检测平面光源所发出的光线的检测装置 |
JP2002101194A (ja) * | 2000-09-26 | 2002-04-05 | Toshiba Corp | 移動通信端末装置 |
JP2003254861A (ja) * | 2002-03-01 | 2003-09-10 | Seiko Epson Corp | 液晶パネル検査方法及び装置 |
JP3813144B2 (ja) * | 2003-09-12 | 2006-08-23 | ローム株式会社 | 発光制御回路 |
CN2828858Y (zh) * | 2005-09-15 | 2006-10-18 | 比亚迪股份有限公司 | 一种背光亮度稳定的液晶模组测试装置 |
JP2007250986A (ja) * | 2006-03-17 | 2007-09-27 | Harison Toshiba Lighting Corp | Ledバックライト装置 |
CN101075025A (zh) * | 2007-07-02 | 2007-11-21 | 浙江大学 | 背光模组在线色度(或辉度)测量方法及仪器和系统 |
KR101604482B1 (ko) * | 2008-08-14 | 2016-03-25 | 엘지디스플레이 주식회사 | 액정표시장치와 그 구동방법 |
JP2010171617A (ja) * | 2009-01-21 | 2010-08-05 | Nec Saitama Ltd | 折り畳み式電子機器の照度検出方法、折り畳み式電子機器及びプログラム |
-
2012
- 2012-04-27 CN CN201210129108.1A patent/CN102662258B/zh not_active Expired - Fee Related
- 2012-05-04 WO PCT/CN2012/075064 patent/WO2013159377A1/zh active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06331962A (ja) * | 1993-05-21 | 1994-12-02 | Keibunshiya:Kk | 液晶表示装置 |
CN1466408A (zh) * | 2002-06-26 | 2004-01-07 | 明基电通股份有限公司 | 液晶显示器亮度的探测与调整方法 |
CN1862334A (zh) * | 2005-05-11 | 2006-11-15 | 英华达(上海)电子有限公司 | 手持设备自动调整背光亮度和效果的装置及其方法 |
Also Published As
Publication number | Publication date |
---|---|
CN102662258A (zh) | 2012-09-12 |
WO2013159377A1 (zh) | 2013-10-31 |
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SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Detection method and device of backlight module Effective date of registration: 20190426 Granted publication date: 20150415 Pledgee: Bank of Beijing Limited by Share Ltd. Shenzhen branch Pledgor: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY Co.,Ltd. Registration number: 2019440020032 |
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PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20201016 Granted publication date: 20150415 Pledgee: Bank of Beijing Limited by Share Ltd. Shenzhen branch Pledgor: Shenzhen China Star Optoelectronics Technology Co.,Ltd. Registration number: 2019440020032 |
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CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150415 |