CN102647850A - Positioning mark structure for measuring harmomegathus of six-layer HDI (high density interconnect) circuit board - Google Patents
Positioning mark structure for measuring harmomegathus of six-layer HDI (high density interconnect) circuit board Download PDFInfo
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- CN102647850A CN102647850A CN 201110039803 CN201110039803A CN102647850A CN 102647850 A CN102647850 A CN 102647850A CN 201110039803 CN201110039803 CN 201110039803 CN 201110039803 A CN201110039803 A CN 201110039803A CN 102647850 A CN102647850 A CN 102647850A
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- positioning mark
- telltale mark
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Abstract
The invention discloses a positioning mark structure for measuring harmomegathus of a six-layer HDI (High Density Interconnect) circuit board. The six-layer HDI circuit board comprises a double surface core board two sides of which are line layers, wherein two insulating layers and two line layers are alternately covered on the two sides of the double surface core board alternately, and the insulating layers are used for dividing the line layers; the periphery of each line layer close to a board edge forms an insulating board edge region, the board edge region of one side of the double surface core board is at least provided with a first pair positioning mark and a second pair positioning mark, and the first pair positioning mark and the second pair positioning mark are formed on the board edge region by the residual line layers; and the first pair positioning mark and the second pair positioning mark are together arranged into a square matrix type, wherein two positioning mark shapes in the second pair positioning mark are the same, and two positioning mark shapes in the first pair positioning mark are different. The first pair positioning mark and the second pair positioning mark on the core board are not completely same and can be directly distinguished, the press fitting shooting efficiency is improved, the practice shooting error is prevented, the measuring conversion error is avoided, and the scrappage is effectively reduced.
Description
Technical field
The present invention relates to the expansion-proof project organization of multilayer circuit board, especially a kind of survey harmomegathus of six layers of HDI wiring board is used the telltale mark structure.
Background technology
Insulating barrier and line layer superpose at interval and six layers of wiring board forming are 1+4+1 type six laminates by two-sided central layer two sides; Need superpose twice of lamination of this six layers of wiring board; The harmomegathus phenomenon can take place during the wiring board lamination; For high density interconnect (HDI) circuit board, its harmomegathus ratio needs strict control, and therefore each lamination all need be measured the harmomegathus ratio that converses; Six layers of HDI wiring board of traditional 1+4+1 type are to produce two pairs of telltale marks that shape is all identical in two-sided central layer one panel edges district, and first pair of telltale mark of contraposition carries out the X-RAY target practice behind the lamination, measures the location distance between borehole after practicing shooting, conversion harmomegathus value; Then during the inferior outer-layer circuit after making lamination for the first time, second pair of contraposition specifically labelled one of them produce a shape and different before alignment mark to distinguish second pair of telltale mark; Second pair of telltale mark of contraposition carries out the X-RAY target practice behind the secondary lamination, measures the location distance between borehole after practicing shooting, conversion harmomegathus value; Because two pairs of location holes are prone to obscure when once practicing shooting, and secondary also need make the telltale mark of differentiation before practicing shooting, and causes the increase of wrong amount data and bad scrappage.
Summary of the invention
In order to overcome above-mentioned defective, the survey harmomegathus that the invention provides a kind of six layers of HDI wiring board is used the telltale mark structure, and the mistake that effectively prevents to practice shooting causes harmomegathus DATA REASONING mistake, reduces bad scrapping.
The present invention for the technical scheme that solves its technical problem and adopt is:
A kind of survey harmomegathus of six layers of HDI wiring board is used the telltale mark structure; These six layers of HDI wiring boards comprise that a two sides is the two-sided central layer of line layer; This two-sided central layer two sides all alternately is coated with two insulating barriers and two line layers; Separated by insulating barrier between each line layer, each line layer forms the edges of boards district of insulating near etching around the edges of boards, is provided with first and second at least to telltale mark in the edges of boards district of said two-sided central layer one side; Said first and second to be that line layer is residual to telltale mark be formed in the edges of boards district; Said first and second is arranged in the square formation type jointly to telltale mark, and wherein two telltale mark shapes in the second pair of telltale mark are identical, and two telltale mark shapes in the first pair of telltale mark are different.
As further improvement of the present invention, specifically labelled shape in said first pair of telltale mark is identical with each the telltale mark shape in second pair of telltale mark.
The invention has the beneficial effects as follows: six layers of HDI wiring board advanced twice lamination by central layer and formed; First and second is incomplete same to telltale mark on the central layer; Can directly distinguish, first and second time lamination only need be distinguished contraposition and practice shooting first and second to telltale mark, can measure the harmomegathus ratio behind the lamination that converses twice; Behind the lamination, also need not to do again time outer field differentiation telltale mark for the first time; Improve the pressing target practice efficiency like this, prevent the mistake of practicing shooting, stopped measurement conversion mistake, effectively reduce bad scrappage.
Description of drawings
Fig. 1 is a structural representation of the present invention;
Fig. 2 is the prior art constructions sketch map that the present invention contrasted.
Embodiment
Embodiment: a kind of survey harmomegathus of six layers of HDI wiring board is used the telltale mark structure; These six layers of HDI wiring boards comprise that a two sides is the two-sided central layer of line layer; This two-sided central layer two sides all alternately is coated with two insulating barriers and two line layers; Separated by insulating barrier between each line layer, each line layer forms the edges of boards district 1 of insulating near etching around the edges of boards, is provided with first and second at least to telltale mark 21,22 in the edges of boards district 1 of said two-sided central layer one side; Said first and second is formed in the edges of boards district 1 for line layer is residual telltale mark 21,22; Said first and second is arranged in the square formation type jointly to telltale mark 21,22, and wherein two telltale mark shapes in the second pair of telltale mark 22 are identical, and two telltale mark shapes in the first pair of telltale mark 21 are different.
Specifically labelled shape in said first pair of telltale mark 21 is identical with each the telltale mark shape in second pair of telltale mark 22.
Six layers of HDI wiring board advanced twice lamination by central layer and formed; First and second is incomplete same to telltale mark on the central layer; Can directly distinguish, first and second time lamination only need be distinguished contraposition and practice shooting first and second to telltale mark, can measure the harmomegathus ratio behind the lamination that converses twice; Behind the lamination, also need not to do again time outer field differentiation telltale mark for the first time; Improve the pressing target practice efficiency like this, prevent the mistake of practicing shooting, stopped measurement conversion mistake, effectively reduce bad scrappage.
Claims (2)
1. the survey harmomegathus of six layers of HDI wiring board is used the telltale mark structure; These six layers of HDI wiring boards comprise that a two sides is the two-sided central layer of line layer; This two-sided central layer two sides all alternately is coated with two insulating barriers and two line layers; Separated by insulating barrier between each line layer, each line layer forms the edges of boards district (1) of insulating near etching around the edges of boards, is provided with first and second at least to telltale mark (21,22) in the edges of boards district (1) of said two-sided central layer one side; Said first and second is formed in the edges of boards district (1) for line layer is residual telltale mark (21,22); It is characterized in that: said first and second is arranged in the square formation type jointly to telltale mark (21,22), and wherein two telltale mark shapes in second pair of telltale mark (22) are identical, and two telltale mark shapes in first pair of telltale mark (21) are different.
2. the survey harmomegathus of six layers of HDI wiring board according to claim 1 is used the telltale mark structure, it is characterized in that: specifically labelled shape in said first pair of telltale mark (21) is identical with each the telltale mark shape in second pair of telltale mark (22).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110039803 CN102647850A (en) | 2011-02-17 | 2011-02-17 | Positioning mark structure for measuring harmomegathus of six-layer HDI (high density interconnect) circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110039803 CN102647850A (en) | 2011-02-17 | 2011-02-17 | Positioning mark structure for measuring harmomegathus of six-layer HDI (high density interconnect) circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102647850A true CN102647850A (en) | 2012-08-22 |
Family
ID=46660368
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201110039803 Pending CN102647850A (en) | 2011-02-17 | 2011-02-17 | Positioning mark structure for measuring harmomegathus of six-layer HDI (high density interconnect) circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102647850A (en) |
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2011
- 2011-02-17 CN CN 201110039803 patent/CN102647850A/en active Pending
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20120822 |