CN102636741A - Method and system for testing circuit board - Google Patents
Method and system for testing circuit board Download PDFInfo
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- CN102636741A CN102636741A CN2012101298343A CN201210129834A CN102636741A CN 102636741 A CN102636741 A CN 102636741A CN 2012101298343 A CN2012101298343 A CN 2012101298343A CN 201210129834 A CN201210129834 A CN 201210129834A CN 102636741 A CN102636741 A CN 102636741A
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Abstract
The invention discloses a method and a system for testing a circuit board. The method comprises the step of testing the circuit board corresponding to testing equipment when each piece of testing equipment is controlled by a thread allocated to the testing equipment under the condition that a thread is allocated for each piece of testing equipment in a plurality of pieces of testing equipment by the system, wherein a plurality of pieces of testing equipment are tested in a parallel mode. According to the method and the system, a plurality of threads are established for controlling and testing a plurality of pieces of testing equipment respectively, so that resources of a processor can be used more effectively, the time for testing can be effectively reduced, the testing speed is increased, and the labor and the cost are saved.
Description
Technical field
The present invention relates to the circuit devcie field tests, and especially, relate to a kind of circuit board detection method and system.
Background technology
The test of circuit board mainly is divided into on-line testing and functional test; Wherein, On-line testing realizes that by on-line testing appearance (In Circuit Tester abbreviates ICT as) functional test is by functional tester (Functional Circuit Tester; Abbreviate FCT as) to accomplish, this test process is called dynamic test (energising) again.
Particularly; The on-line testing appearance is called the board failure analyser again; The performed test of this equipment belongs to static test, is the testing apparatus that the indispensable P.e.c. loaded board (Printed Circuit Board Assembly abbreviates PCBA as) of a lot of electrical type enterprises is produced.On-line testing appearance such as same powerful multimeter carry out the instrument of scanning inspection successively to all components and parts on the circuit board.As shown in Figure 1; Conventional ICT uses special needle-bar 2; Make probe 1 contact with components and parts on the wiring board that has welded 3; And carry out discrete isolation test with interior electric current through switching motherboard 5 with hundreds of millivolts of voltages 4 and 10 milliamperes; The resistance of adorning, inductance, electric capacity, diode, triode, controllable silicon, FET, neglected loading, misloading, parameter value deviation, solder joint general and specific components such as integrated connect weldering, wiring board is opened faults such as short circuit thereby accurately measure, and with fault element or occur open circuit/short circuit the position accurately inform the user.The ICT usable range is wide, and test coverage is high, and it is high to measure accuracy, and localization of fault is accurate, can directly navigate to component-level, therefore uses than being easier at handling failure PCBA.
Traditional IC T is made up of 1 computing machine, a cover ICT testing hardware kernel.The test of ICT is in sequence, just, has surveyed first element, surveys second element again, accomplish up to all element tests of a circuit board, like this, total test duration, be exactly the test duration sum of all elements; If many jigsaw tests then are to test a plate earlier, test second block of plate again; At this moment, Zong the test duration is exactly the test duration summation of polylith plate, for example; If 4 jigsaw are arranged, the test duration of every block of plate is 10 seconds, total then the test duration of 4 blocks of plates is exactly 10 * 4=40 second.
On the other hand, functional tester can verify whether an element circuit, a real device, circuit board have some function under the real work situation.FCT need carry out the test operation of following five steps according to the actual needs of circuit board usually: load suitable working power one, for the circuit board under test power end; Two, apply suitable pumping signal for the relevant input end of circuit board; Three, the relevant output terminal to circuit carries out relevant parameter measurement; Four, according to the related parameter that has of circuit board actual conditions counting circuit; Five, according to parameter value decision circuitry plate whether fault is arranged.Through above testing procedure, can reach testing goal to the circuit board function.
ICT can be under the situation that loaded board does not power up each components and parts are carried out parameter testing, generally can not cause damage to components and parts; FCT belongs to dynamic side examination, is that the test of carrying out might bring damage to components and parts under the situation under powering up, work at loaded board.The loaded board that the ICT test is passed through carries out the FCT test and may not pass through; The loaded board of ICT test failure carries out the FCT test and must fail; The loaded board that has only the ICT test to pass through can carry out the FCT test, otherwise can bring potential safety hazard.ICT and FCT test all need test point is drawn, and ICT must be provided with probe on routing networks all on the loaded board, and the FCT test only needs probe is set on the part key network, and therefore, the FCT test point must be comprised in the ICT test point.But FCT test also comprises some non-probe contacts tests, the test of whether lighting like luminotron, the test whether hummer takes place or the like, and this class testing need adopt non-probe-type module to test.The difference of two kinds of testers is bigger, and for FCT, should fully take into account the actual conditions of each test point, as adds the size of electrical testing points considered voltage, the size of electric current, thereby confirms the spacing of pin, the thickness of pin; Some test points also will be considered the interference of other networks to it.The definition of ICT test point is general, of equal value, promptly need not stipulate the components and parts type that connects on the test point, and all types all can; And the FCT test point need be sorted out by certain condition, loads test point etc. like electric-adding point, voltage acquisition point, frequency collection point, logic, and different classes should be connected on the different functions integrated circuit board, and each point all has the uniqueness definition of oneself.
When testing, the factor that influences test speed mainly comprises: the travelling speed of Test Host (being generally the standard PC), the response speed of ICT test system hardware, the influence of testing software algorithm and the influence of board under test self character.
The travelling speed of Test Host depends primarily on the cpu performance of computing machine; Development along with various technology; Computer CPU performance and speed almost are according to Moore's Law, continuous double lifting, up to the present; The travelling speed of computing machine is considerably beyond the ICT test speed, so the travelling speed of Test Host can not become the bottleneck of restriction ICT test speed.
In addition; The response speed of ICT test system hardware mainly comprises the switching speed of electron channel switch, the foundation of circuit and the sample rate of stabilization time, AD and DA etc.; Continuous development along with electronic technology; Electronic component speed was high more originally, and therefore, the response speed of ICT test system hardware can obviously not influence the speed of actual test yet.
And aspect the testing software algorithm, outstanding software algorithm can improve open-short circuit speed greatly.For the ICT of same brand, the algorithm that is adopted is almost fixed, and therefore, algorithm can obviously not influence the speed of actual test equally.
For, the board under test self character, for example, under the situation that energy-storage travelling wave tubes such as more big electric capacity, big inductance are arranged on the circuit board, in test process, the stabilization time of circuit can be long, so test speed must reduce.But the reduction of this speed is irrelevant in tester itself by Board Under Test decision itself.
In sum, ICT has almost risen to the limit to the test speed of Board Under Test, and the space of further improving speed is very little.
In addition, for the test of other types, the same problem that is difficult to further improve test speed that exists to this problem, does not propose effective solution at present as yet.
Summary of the invention
To the problem that is difficult to further improve circuit board testing speed in the correlation technique, the present invention proposes a kind of circuit board detection method and system, can improve the efficient of test, reduces time and human cost that test is consumed.
Technical scheme of the present invention is achieved in that
According to embodiments of the invention, a kind of circuit board detection method is provided.
This method comprises: in system each testing apparatus in a plurality of testing apparatuss has been distributed under the situation of thread; Each testing apparatus is being distributed under the control of thread separately; This testing apparatus corresponding electrical circuits plate is tested, and wherein, a plurality of testing apparatuss are tested with parallel mode.
Wherein, each testing apparatus comprises a plurality of proving installations, and a plurality of proving installations are used for circuit board is carried out different tests.
Alternatively, a plurality of proving installations comprise online tester ICT and functional tester FCT.
And when each testing apparatus was tested a circuit board, the ICT by this testing apparatus tested earlier; FCT by this testing apparatus tests afterwards, wherein, and after the ICT of this testing apparatus test is accomplished; By the shutoff that is connected of the change-over switch plate of this testing apparatus with ICT with the master system of this testing apparatus; And with the conducting that is connected of FCT with the master system of this testing apparatus, and after the FCT test was accomplished, the discharge circuit of this FCT discharged to this circuit board.
In addition, when each testing apparatus is tested a circuit board, call a plurality of proving installations of this testing apparatus according to predefined procedure this circuit board is tested.
According to a further aspect in the invention, a kind of circuit board testing system is provided.
This system comprises: a plurality of testing apparatuss are used for circuit board is tested; Processor is used to create thread, and controls a plurality of testing apparatuss through the thread that operation is created circuit board is tested, and wherein, processor is controlled a plurality of testing apparatuss and tested with parallel mode.
Wherein, each testing apparatus comprises a plurality of proving installations, and a plurality of proving installations are used for circuit board is carried out different tests, and each testing apparatus comprises line tester ICT and functional tester FCT.
And each ICT comprises:
Multiple power supplies is used for the predetermined test position of circuit board is applied desired level;
The AD Acquisition Circuit is used for the voltage and/or the electric current of the detected element output of collecting circuit board;
Signal condition and amplifying circuit are used for sending to the master system that is connected with a plurality of proving installations afterwards to carry out the signal format adjustment from the collection result of AD Acquisition Circuit.
In addition, each FCT comprises:
Power module is used for working power to the detected element of circuit board being provided;
Digital I/O module is used for to the detected element of circuit board the signal input being provided;
Signal source module is used to provide reference signal;
Signal acquisition module is used for detected element based on signal input and the result of output compares with reference signal from signal source module, and comparing result is exported to the master system that is connected with a plurality of proving installations;
Discharge module is used for after this FCT accomplishes a circuit board testing, this circuit board being carried out discharge operation;
Communication module is used to realize communicating by letter between this FCT and the circuit-under-test plate.
In addition, each testing apparatus further comprises:
The change-over switch plate is connected with ICT with FCT, and is connected to master system; Be used for when each testing apparatus is tested a circuit board, control is tested by the ICT of this testing apparatus earlier, and the FCT by this testing apparatus tests afterwards; Wherein, After the ICT of this testing apparatus test is accomplished, by the shutoff that is connected of the change-over switch plate of this testing apparatus with ICT with the master system of this testing apparatus, and with the conducting that is connected of FCT with the master system of this testing apparatus.
The present invention controls a plurality of testing apparatuss respectively and carries out concurrent testing through setting up a plurality of threads, can effectively utilize the resource of processor more, effectively reduces the required time of test, improves test speed, has saved manpower and cost.
Description of drawings
Fig. 1 carries out the testing principle synoptic diagram through ICT in the correlation technique;
Fig. 2 is the process flow diagram according to the circuit board detection method of the embodiment of the invention;
Fig. 3 is the principle schematic of circuit board being carried out concurrent testing according to the circuit board detection method of the embodiment of the invention;
Fig. 4 is the synoptic diagram that interconnects between the equipment when testing according to the circuit board detection method of the embodiment of the invention;
Fig. 5 is the synoptic diagram that interconnects between a plurality of equipment when testing according to the circuit board detection method of the embodiment of the invention;
Fig. 6 is the block diagram according to the circuit board testing system of the embodiment of the invention;
Fig. 7 is the structured flowchart according to testing apparatus in the circuit board testing system of the embodiment of the invention;
Fig. 8 is the block diagram of forming according to the function of the circuit board testing system of the embodiment of the invention.
Embodiment
Usually, the manufacturer of CPU is in order to improve the performance of CPU, and way is to improve the clock frequency and increase buffer memory capacity of CPU usually.But the frequency of CPU is more and more faster at present, if improve performance through promoting cpu frequency with the method that increases buffer memory again, tends to receive restriction and the too high restriction of cost on the manufacturing process.Although can improve performance really after improving the clock frequency of CPU and increasing buffer memory capacity, there is big difficulty in realization through this mode by cpu performance raising performance.And even the processing speed of CPU and buffer memory can increase substantially, but actual when carrying out circuit board testing, the performance element of CPU (processing resource) still can not be fully used.
Consider the problems referred to above,, a kind of circuit board detection method is provided according to embodiments of the invention.
As shown in Figure 2, comprise according to the circuit board detection method of the embodiment of the invention:
Step S201, system distributes thread to each testing apparatus in a plurality of testing apparatuss;
Step S203, each testing apparatus is being distributed under the control of thread separately, and this testing apparatus corresponding electrical circuits plate is tested, and wherein, a plurality of testing apparatuss are tested with parallel mode.
As shown in Figure 3, through above-mentioned processing, can test simultaneously a plurality of circuit board 1-n.
Wherein, each testing apparatus can comprise a plurality of proving installations, and a plurality of proving installations are used for circuit board is carried out different tests.
A plurality of proving installations comprise online tester (ICT) and functional tester (FCT).As shown in Figure 4, master system (for example, PC (computing machine)) can be through the address card of setting on it and the hardware-core communication of ICT or FCT, and the hardware-core of ICT or FCT is connected to the needle-bar pressing element, and board under test is tested.
As shown in Figure 5; There are many testing apparatuss; Every testing apparatus all comprises the hardware-core of ICT or FCT, at this moment, on the PC a plurality of address cards can be set; Carry out communication with the hardware-core of ICT or FCT is corresponding one by one, the hardware-core of ICT or FCT is parallel tests the circuit board on the needle-bar pressing element.
Except the above-mentioned ICT and FCT that enumerates; Each testing apparatus can comprise various proving installations, and each testing apparatus can both utilize these proving installations that circuit board is tested; Each testing apparatus is tested after the completion to a circuit board; Can continue next circuit board is tested, that is to say, each testing apparatus can be interpreted as corresponding to a test queue; A plurality of circuit boards that need test are arranged in this formation, and testing apparatus can be tested the circuit board in its formation successively.
Particularly, when each testing apparatus was tested a circuit board, the ICT by this testing apparatus tested earlier; FCT by this testing apparatus tests afterwards, wherein, and after the ICT of this testing apparatus test is accomplished; By the shutoff that is connected of the change-over switch plate of this testing apparatus with ICT with the master system of this testing apparatus, and with the conducting that is connected of FCT with the master system of this testing apparatus, and after the FCT test is accomplished; The discharge circuit of this FCT discharges to this circuit board; Through accomplish laggard row discharge in FCT test, can guarantee that circuit board is follow-up carries out other tests or the security when using, and avoids circuit board to be damaged.
By means of above-mentioned processing, not only can improve testing efficiency through the mode of concurrent testing, can also different testing devices is integrated; Make a testing apparatus possess multiple test function, can carry out dissimilar tests, just can accomplish polytype test through each testing apparatus; Avoided test process between distinct device, to shift at circuit board; Further improve testing efficiency, and can make test process stable and controllable more, be convenient to management.
According to embodiments of the invention, a kind of circuit board testing system is provided.
Circuit board testing system according to the embodiment of the invention comprises:
A plurality of testing apparatus 62-64 are used for circuit board is tested;
Processor 61 is used to create thread, and controls a plurality of testing apparatuss through the thread that operation is created circuit board is tested, and wherein, processor is controlled a plurality of testing apparatuss and tested with parallel mode.
Wherein, only show testing apparatus 62-64 among Fig. 6, in fact, can comprise more testing apparatus (for example, the quantity of testing apparatus can be tens of, hundreds of or more) in the system, shown in Fig. 6 only is concrete instance.
Wherein, each testing apparatus comprises a plurality of proving installations, and a plurality of proving installations are used for circuit board is carried out different tests, and alternatively, the proving installation of each testing apparatus can comprise line tester and functional tester.
Fig. 7 shows the concrete structure instance of a testing apparatus, and wherein, in this example, a testing apparatus comprises ICT 71 and FCT 72.All element circuits are all controlled through number bus by host computer (PC).
As shown in Figure 7, the ICT 71 of a testing apparatus can comprise:
Multiple power supplies (A source circuit as shown in Figure 7, B source circuit, B source circuit, D source circuit and 4 road DA circuit); Be used for the predetermined test position of circuit board is applied desired level; Wherein, The DA magnitude of voltage of 4 road DA circuit output is exported to A source and C source, is used to control the output voltage values of AC signal frequency value, DC signal voltage value and the C source circuit of A source circuit;
The AD Acquisition Circuit is used for the voltage and/or the electric current of the detected element output of collecting circuit board;
Signal condition and amplifying circuit are used for sending to the master system that is connected with a plurality of proving installations afterwards to carry out the signal format adjustment from the collection result of AD Acquisition Circuit.
Host computer can be according to the characteristic of element under test; Direct current signal or AC signal through the output of ICT switching motherboard is suitable are given element under test; Through signal condition and amplifying circuit the electric current and voltage of output is gathered, finally calculated the parameter of element under test, and judge whether correct.
Continuation is with reference to Fig. 7, and each FCT 72 of a testing apparatus comprises:
Power module is used for working power to circuit board under test (element under test on the plate) being provided;
Digital I/O module is used for to the detected element of circuit board the signal input being provided;
Signal source module is used to provide reference signal;
Signal acquisition module is used for detected element based on signal input and the result of output compares with reference signal from signal source module, and comparing result is exported to the master system that is connected with a plurality of proving installations;
Discharge module is used for after this FCT accomplishes a circuit board testing, this circuit board being carried out discharge operation;
Communication module is used to realize communicating by letter between this FCT and the circuit-under-test plate.
Particularly; Digital I/O module is used for the Digital I of circuit under test is partly tested; Signal source module is used for applying pumping signal to the input end of circuit under test; Signal acquisition module is used for carrying out signals collecting to the output terminal of circuit board under test, and discharge module discharges to the electric capacity on the circuit board after giving the board under test EOT; Communication module is used for the communication (such as RS232 serial communication etc.) with board under test.Since weak signal test during the ICT test, and the FCT test need power up, so have forceful electric power usually.
As shown in Figure 7, each testing apparatus further comprises:
Change-over switch plate (ICT and FCT change-over switch plate); Be connected with ICT with FCT, and be connected to master system, be used for when each testing apparatus is tested a circuit board; Control is tested by the ICT of this testing apparatus earlier; FCT by this testing apparatus tests afterwards, wherein, and after the ICT of this testing apparatus tests completion; The change-over switch plate of this testing apparatus is the shutoff that is connected of ICT with the master system of this testing apparatus, and with the conducting that is connected of FCT with the master system of this testing apparatus.Wherein, ICT and FCT change-over switch plate can be protected the safety of ICT circuit, are used for board under test is connected to ICT or FCT, guarantee that FCT forceful electric power signal can not influence the ICT hardware circuit.
By the way ICT is combined with FCT, the testing apparatus that obtains can become online-functional tester (abbreviating IFT as).In addition; Only show among Fig. 7 an instantiation in ICT and the situation that FCT combines; In practical application, can other proving installations be integrated, and by similar assembly (for example; Switching motherboard etc.) switching between the realization different device, concrete situation this paper enumerates no longer one by one.
Multiple test function that testing apparatus according to the present invention is integrated; Can carry out dissimilar tests; Test macro of the present invention also can be called multisystem concurrent testing (MPT); In practical application, employed interface can be identical with conventional ICT or similar when many assemblies circuit board is tested for the user; At chunk the interface is set; Increase the setting edit box that does not belong to which IFT kernel on the same group, that is to say that each group (can be a circuit board under test; The perhaps part in circuit board under test); Can specify arbitrarily by which test kernel and test,, specify each testing process to want the display mode and the test parameter of test contents, test result at the test interface of software.Test interface also will show the testing progress of each testing process in the test process.The gordian technique of The software adopted is that bottom layer driving has partly adopted multithreading, and each thread is responsible for driving an IFT hardware-core, and corresponding circuit board is tested; Because the travelling speed of computing machine is a lot of soon with respect to the test speed of IFT hardware, almost is independent of each other mutually between the different threads.So the test speed of each thread, just the test speed of each IFT hardware-core can not receive the influence of other threads yet.Concrete implementation method is: behind the test interface hit testing, will be carried out the test of whole testing process by testing server; In testing server, can create several threads according to there being several system kernels in the system, each thread is all carried out whole testing process one time.In testing process; Can travel through the group in the whole test file,, carry out corresponding test by the test kernel of appointment respectively according to the test kernel of appointment in editing interface; And be delivered to the testing software interface to the progress of test, simultaneously test interface shows testing progress synchronously.After the testing process of all kernels all is finished, testing server also will be delivered to test interface to each test result, and the test result by each group of test interface demonstration is delivered to test result in the statistical software simultaneously.Whole like this test flow performing finishes.
Integrated many cover IFT hardware-core (can dispose according to actual needs in a MPT; Common configuration be 2 covers (double-core) or 4 cover (4 nuclear) IFT hardware-core); Every cover IFT hardware-core; Select configuration to comprise the signal source board, switching motherboard etc. of ICT part according to user's needs, comprise each hardware module of FCT part, and the switching motherboard of responsible ICT and FCT switching etc.According to actual board under test, make special I FT test needle-bar then, form complete PCBA high speed test MPT system based on multithreading, multisystem concurrent testing.
Functional block diagram as shown in Figure 8, editing interface are responsible for creating the Board Under Test data file, debug the Board Under Test data simultaneously.The Board Under Test data of creating can be delivered to test interface, are tested by test interface.Testing server (SERV) is all called in editor and test, in testing server, carries out and tests relevant operation, and testing server also will call the calibration data after debugging and the calibration procedure calibration simultaneously.Testing server calls the bottom dynamic link library and comes connected system hardware, and drives bottom hardware work.Debugging is connected the bottom dynamic link library with calibration procedure, accomplish the function of calibration system hardware, debug hardware.The calibration data that generates in debugging and the calibration testing is called in startup self-detection, connects bottom hardware through the bottom dynamic link library, and the hardware when start in the self-checking system is checked the state of hardware in the system.
Measuring technology provided by the invention can be used for the test (for example, can test PCBA) of multiple circuit board, is based on multithreading, multisystem parallel high-speed on-line testing scheme.In same testing apparatus, integrated a plurality of IFT testing hardware system; Utilize the software multithreading, adopt different threads to drive different IFT testing hardware systems,, carry out concurrent testing simultaneously different circuit board under test; Like this, a multisystem concurrent testing MPT can reach the effect that logical ICT of many Daeporis and FCT test simultaneously, has greatly improved test speed, reduces the equipment input and the test cost of labor of the production test of PCBA simultaneously greatly.For example, a traditional air-conditioning plate production line needs 2 ICT tests of configuration and 6 FCT tests, 8 testers.If adopt the MPT equipment of dual system, maximum 4 MPT equipment, 4 testers can accomplish ICT that original 8 people can accomplish and the test of FCT, have saved 4 equipment, 4 testers.
In sum, the present invention can be by hyperthread (Hyper-Threading is called for short HT) technology; Make CPU can carry out multiple thread simultaneously, let CPU bring into play bigger efficient, and can let single processor can both use Thread-Level Parallelism to calculate; And then compatible multithreading operation system and software, the standby time of minimizing CPU, the operational efficiency of the CPU of raising; Thereby arrange in pairs or groups multi-functional testing apparatus, realize parallel test, and can accomplish dissimilar tests through single testing apparatus; Improve the efficient of test, avoided circuit board between distinct device, to shift, significantly reduced the time cost and the human cost of test.
The above is merely preferred embodiment of the present invention, and is in order to restriction the present invention, not all within spirit of the present invention and principle, any modification of being done, is equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (10)
1. a circuit board detection method is characterized in that, comprising:
In system each testing apparatus in a plurality of testing apparatuss has been distributed under the situation of thread; Said each testing apparatus is being distributed under the control of thread separately; This testing apparatus corresponding electrical circuits plate is tested, and wherein, said a plurality of testing apparatuss are tested with parallel mode.
2. circuit board detection method according to claim 1 is characterized in that each testing apparatus comprises a plurality of proving installations, and said a plurality of proving installations are used for circuit board is carried out different tests.
3. circuit board detection method according to claim 2 is characterized in that, said a plurality of proving installations comprise online tester ICT and functional tester FCT.
4. circuit board detection method according to claim 3 is characterized in that, when each testing apparatus is tested a circuit board; ICT by this testing apparatus tests earlier; FCT by this testing apparatus tests afterwards, wherein, and after the ICT of this testing apparatus test is accomplished; By the shutoff that is connected of the change-over switch plate of this testing apparatus with ICT with the master system of this testing apparatus; And with the conducting that is connected of FCT with the master system of this testing apparatus, and after the FCT test was accomplished, the discharge circuit of this FCT discharged to this circuit board.
5. circuit board detection method according to claim 2 is characterized in that, when each testing apparatus is tested a circuit board, calls a plurality of proving installations of this testing apparatus according to predefined procedure this circuit board is tested.
6. a circuit board testing system is characterized in that, comprising:
A plurality of testing apparatuss are used for circuit board is tested;
Processor is used to create thread, and controls said a plurality of testing apparatus through the thread that operation is created circuit board is tested, and wherein, said processor is controlled said a plurality of testing apparatus and tested with parallel mode.
7. circuit board testing according to claim 6 system; It is characterized in that; Each testing apparatus comprises a plurality of proving installations, and said a plurality of proving installations are used for circuit board is carried out different tests, and each testing apparatus comprises line tester ICT and functional tester FCT.
8. circuit board testing according to claim 7 system is characterized in that each ICT comprises:
Multiple power supplies is used for the predetermined test position of circuit board is applied desired level;
The AD Acquisition Circuit is used for the voltage and/or the electric current of the detected element output of collecting circuit board;
Signal condition and amplifying circuit are used for sending to the master system that is connected with said a plurality of proving installations afterwards to carry out the signal format adjustment from the collection result of said AD Acquisition Circuit.
9. circuit board testing according to claim 7 system is characterized in that each FCT comprises:
Power module is used for working power to the detected element of circuit board being provided;
Digital I/O module is used for to the detected element of circuit board the signal input being provided;
Signal source module is used to provide reference signal;
Signal acquisition module is used for said detected element based on the input of said signal and the result of output compares with reference signal from said signal source module, and comparing result is exported to the master system that is connected with said a plurality of proving installations;
Discharge module is used for after this FCT accomplishes a circuit board testing, this circuit board being carried out discharge operation;
Communication module is used to realize communicating by letter between this FCT and the circuit-under-test plate.
10. circuit board testing according to claim 6 system is characterized in that each testing apparatus further comprises:
The change-over switch plate is connected with ICT with said FCT, and is connected to said master system; Be used for when each testing apparatus is tested a circuit board, control is tested by the ICT of this testing apparatus earlier, and the FCT by this testing apparatus tests afterwards; Wherein, After the ICT of this testing apparatus test is accomplished, by the shutoff that is connected of the change-over switch plate of this testing apparatus with ICT with the master system of this testing apparatus, and with the conducting that is connected of FCT with the master system of this testing apparatus.
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