CN102565843A - 检测装置和放射线检测系统 - Google Patents

检测装置和放射线检测系统 Download PDF

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Publication number
CN102565843A
CN102565843A CN2011102960666A CN201110296066A CN102565843A CN 102565843 A CN102565843 A CN 102565843A CN 2011102960666 A CN2011102960666 A CN 2011102960666A CN 201110296066 A CN201110296066 A CN 201110296066A CN 102565843 A CN102565843 A CN 102565843A
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CN
China
Prior art keywords
unit
drive wire
conductive layer
pick
wire
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CN2011102960666A
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English (en)
Chinese (zh)
Inventor
川锅润
望月千织
渡边实
石井孝昌
藤吉健太郎
和山弘
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Publication of CN102565843A publication Critical patent/CN102565843A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/243—Modular detectors, e.g. arrays formed from self contained units

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
CN2011102960666A 2010-09-30 2011-09-28 检测装置和放射线检测系统 Pending CN102565843A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010-222588 2010-09-30
JP2010222588A JP2012079860A (ja) 2010-09-30 2010-09-30 検出装置及び放射線検出システム

Publications (1)

Publication Number Publication Date
CN102565843A true CN102565843A (zh) 2012-07-11

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CN2011102960666A Pending CN102565843A (zh) 2010-09-30 2011-09-28 检测装置和放射线检测系统

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US (1) US20120080605A1 (https=)
JP (1) JP2012079860A (https=)
CN (1) CN102565843A (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109786399A (zh) * 2017-11-13 2019-05-21 群创光电股份有限公司 检测装置
CN110115027A (zh) * 2016-12-20 2019-08-09 佳能株式会社 放射线成像装置和放射线成像系统
WO2021254037A1 (zh) * 2020-06-17 2021-12-23 京东方科技集团股份有限公司 探测基板及射线探测器

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JP5700973B2 (ja) * 2010-08-05 2015-04-15 キヤノン株式会社 検出装置及び放射線検出システム
US9935152B2 (en) * 2012-12-27 2018-04-03 General Electric Company X-ray detector having improved noise performance
JP6242211B2 (ja) * 2013-12-26 2017-12-06 キヤノン株式会社 撮像装置および撮像システム
KR102277379B1 (ko) * 2015-02-25 2021-07-14 삼성디스플레이 주식회사 터치 패널 및 그 제조 방법
US10295875B2 (en) * 2017-05-12 2019-05-21 A.U. Vista, Inc. TFT array having conducting lines with low resistance
JP2019145596A (ja) * 2018-02-16 2019-08-29 シャープ株式会社 アクティブマトリクス基板及びそれを備えたｘ線撮像パネルと製造方法
JPWO2021100338A1 (https=) * 2019-11-20 2021-05-27

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JP2009005374A (ja) * 2008-07-18 2009-01-08 Canon Inc 光電変換装置の駆動方法
CN101467256A (zh) * 2006-06-09 2009-06-24 佳能株式会社 放射线成像装置和放射线成像系统

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JPH0964182A (ja) * 1995-08-25 1997-03-07 Hitachi Ltd 半導体集積回路装置およびその製造方法
JP3447947B2 (ja) * 1998-03-20 2003-09-16 株式会社東芝 Ｘ線撮像装置
JP3631380B2 (ja) * 1998-08-28 2005-03-23 株式会社東芝 半導体装置及びその製造方法
JP3683463B2 (ja) * 1999-03-11 2005-08-17 シャープ株式会社 アクティブマトリクス基板、その製造方法、及び、該基板を用いたイメージセンサ
JP2002076360A (ja) * 2000-09-04 2002-03-15 Canon Inc 半導体装置及びその製造方法、放射線撮像システム
US6847039B2 (en) * 2001-03-28 2005-01-25 Canon Kabushiki Kaisha Photodetecting device, radiation detecting device, and radiation imaging system
JP2003060029A (ja) * 2001-08-08 2003-02-28 Canon Inc 半導体装置、放射線検出装置および光検出装置
US7034309B2 (en) * 2001-11-13 2006-04-25 Canon Kabushiki Kaisha Radiation detecting apparatus and method of driving the same
US7214945B2 (en) * 2002-06-11 2007-05-08 Canon Kabushiki Kaisha Radiation detecting apparatus, manufacturing method therefor, and radiation image pickup system
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JP4323827B2 (ja) * 2003-02-14 2009-09-02 キヤノン株式会社 固体撮像装置及び放射線撮像装置
JP5159065B2 (ja) * 2005-08-31 2013-03-06 キヤノン株式会社 放射線検出装置、放射線撮像装置および放射線撮像システム
JP4991459B2 (ja) * 2007-09-07 2012-08-01 キヤノン株式会社 撮像装置及び放射線撮像システム
JP2010003820A (ja) * 2008-06-19 2010-01-07 Fujifilm Corp 電磁波検出素子
TWI415283B (zh) * 2009-02-18 2013-11-11 Au Optronics Corp Ｘ射線感測器及其製作方法
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Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1925162A (zh) * 2005-08-31 2007-03-07 佳能株式会社 辐射检测设备、辐射成像设备和辐射成像系统
CN101467256A (zh) * 2006-06-09 2009-06-24 佳能株式会社 放射线成像装置和放射线成像系统
JP2009005374A (ja) * 2008-07-18 2009-01-08 Canon Inc 光電変換装置の駆動方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110115027A (zh) * 2016-12-20 2019-08-09 佳能株式会社 放射线成像装置和放射线成像系统
CN109786399A (zh) * 2017-11-13 2019-05-21 群创光电股份有限公司 检测装置
US10879295B2 (en) 2017-11-13 2020-12-29 Innolux Corporation Detection device
CN109786399B (zh) * 2017-11-13 2022-04-05 睿生光电股份有限公司 检测装置
WO2021254037A1 (zh) * 2020-06-17 2021-12-23 京东方科技集团股份有限公司 探测基板及射线探测器
US11830895B2 (en) 2020-06-17 2023-11-28 Boe Technology Group Co., Ltd. Detection substrate and ray detector

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Publication number Publication date
JP2012079860A (ja) 2012-04-19
US20120080605A1 (en) 2012-04-05

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