CN102565655B - The checkout equipment of thin-film solar cells and method - Google Patents
The checkout equipment of thin-film solar cells and method Download PDFInfo
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- CN102565655B CN102565655B CN201110254203.XA CN201110254203A CN102565655B CN 102565655 B CN102565655 B CN 102565655B CN 201110254203 A CN201110254203 A CN 201110254203A CN 102565655 B CN102565655 B CN 102565655B
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Abstract
The present invention relates to a kind of checkout equipment and method of thin-film solar cells, belong to technical field of solar batteries.The automatic checkout equipment of thin-film solar cells, comprise workbench and X-Y-Z shaft movement mechanism, the crossbeam of Y-axis motion is connected with X-axis, it is characterized in that the CCD positioner, the marking mechanism that described X-axis are equipped with automatic original point position, the Z axis of band testing agency this X-axis is also equipped with, form the quaternity machine integrating location, the motion of X-Y-Z axle, detection, mark, this quaternity machine detects the electrical property of each element cell in thin-film solar cells central layer by industrial computer program control, and is detecting tab character on qualified element cell.The present invention integrates location, the motion of X-Y-Z axle, detection, mark, before cutting action, effectively qualified product and defective item clearly can be identified classification, eliminating batch mixing appears in qualified product and defective item possibility when classifying, saving production process, improve production efficiency.
Description
Technical field
The present invention relates to a kind of checkout equipment and method of large format thin-film solar cells, belong to technical field of thin-film solar.
Background technology
Thin-film solar cells is widely applied on small-sized electronic product at present, as calculator, garden lamp, toy etc., thin-film solar cells size used by these products is all smaller, and the solar cell sizes processed from depositing device is all very large, one piece of large thin-film solar cell panel can make a lot of small size solar units batteries (also claiming element cell) simultaneously, therefore the large-sized solar cell to directly producing is needed to cut rear acquisition, in the technological process of production in the past, generally cut after first silk-screen character denotation to detect again, like this defective item is put into and finally goes to judge, make the technological process of production of defective item just the same with qualified product, and the defective property of defective item itself was formed before mark and characterization processes, the shortcoming done like this is that whether qualified product all first will carry out mark, cause technological process many, workload is large, waste material, cost increases, and current this technique can only be mark and detection are separately carried out, for equipment and the method for separate process, Chinese patent 200710072812.7 " solar battery laser marking device " has carried out disclosing fully to big width laser mark marking technique, Chinese patent 201020238307.2 " solar cell automatic testing equipment " has also carried out disclosing fully to monolithic solar cell Automatic Measurement Technique.Although the patent No. is the Chinese patent of ZL200910025718.5 disclose a kind of semiconductor device test separator, the detection of semiconductor device, mark, sorting, braid can be realized on same machine, although have compact conformation, detection efficiency advantages of higher, but this device carries out for single semiconductor device, equipment is complicated, cost is high, is not suitable for detecting the large format thin-film solar cells comprising multiple element cell.
Summary of the invention
The present invention be directed to deficiency of the prior art, design a kind of structure simple, integrate location, motion, detect and the thin-film solar cells testing equipment of mark and method, first detect for the large format thin-film solar cells comprising multiple element cell the technique that rear mark cuts again, realize detecting and automatic checkout equipment that mark is combined and method.
In order to realize above task, the technical solution used in the present invention is: the automatic checkout equipment designing a kind of thin-film solar cells, comprise workbench and X-Y-Z shaft movement mechanism, the crossbeam of Y-axis motion is connected with X-axis, it is characterized in that the CCD positioner described X-axis being equipped with automatic original point position, marking mechanism, the Z axis of band testing agency this X-axis is also equipped with, form collection location, X-Y-Z axle moves, detect, the quaternity machine that mark is integrated, this quaternity machine detects the electrical property of each element cell in thin-film solar cells central layer by industrial computer program control, and detecting tab character on qualified element cell.
Industry control part program Time-sharing control CCD positioner, X-Y-Z shaft movement mechanism and testing agency and marking mechanism, by CCD positioner lock in place initial point, import surveyed area location graphic, described testing agency and marking mechanism move to surveyed area and mark region by X-Y-Z shaft movement mechanism, element cell electrode contact in detection probe and thin film solar central layer, detect the electrical property of each element cell, after all detecting, by marking mechanism tab character on qualified element cell.
The crossbeam of Y-axis motion is equipped with the Rodless cylinder moved along X-axis, drives CCD positioner and marking mechanism to make X-Y axle by described Rodless cylinder and move.Testing agency is arranged on Z axis (or claiming Z axis motion) by fixed head, is moved along X-Y-Z axle three directions by industrial computer program control.
Y-axis motion (abbreviation Y-axis) is primarily of leading screw, guide rail, column, crossbeam and motor composition, and leading screw drives column and the crossbeam be overlapped on column to move along Y-axis.X-axis motion (abbreviation X-axis) is equipped with in the below of the crossbeam of Y-axis motion.The cylinder that the below of X-axis motion is equipped with CCD positioner, marking mechanism and is moved along Z axis, and the end making the cylinder of Z axis motion is with fixed head, testing agency is arranged on the fixed head of cylinder head portions.
Y-axis adopts driven by servomotor leading screw, drives column and crossbeam to move, and crossbeam is provided with the Rodless cylinder doing X-axis and move, Rodless cylinder is equipped with the cylinder moved along Z axis, and testing agency is contained on the cylinder that moves along Z axis.
Testing agency comprises detection probe and probe fixed head, and detection probe is made up of dismountable spring probe.The detection probe of testing agency is single probe or Multi probe, described Multi probe is made up of the multiple spring probes be fixed on probe fixed head, Multi probe can detect polylith element cell simultaneously, single probe can detect one by one to every module unit battery, detection probe can detect multiple parameter simultaneously, as open circuit voltage, operating voltage, short circuit current, operating current etc.
The present invention also provides a kind of automatic testing method of thin-film solar cells, is placed on workbench by thin-film solar cells central layer, and this thin-film solar cells central layer is made up of multiple element cell, it is characterized in that by industrial computer setting program Time-sharing control:
CCD positioner carries out original point position, imports surveyed area position to industrial computer;
Start X, Y-axis motion, testing agency moves to the first surveyed area along X, Y-axis;
The detection probe that Z axis motion promotes in testing agency moves downward, and detection probe contacts with the electrode seal of element cell, the electrical property of detecting unit battery;
Detect complete, Z axis motion pulls detection to move upward, and detection probe disconnects with the electrode of element cell and contacting;
X, Y-axis motion drive testing agency to move to next surveyed area, detect the element cell in this region;
After element cell to all surveyed areas detects, X, Y-axis motion drive marking mechanism to move to mark region, carry out mark to the qualified element cell of detection;
Marking mechanism is tab character on qualified element cell, detects the then not mark of underproof element cell;
Mark is complete, and thin-film solar cells is carried out cutting gradation, visual mark state classification, qualified products packaging and warehousing.
The detection probe of testing agency is single probe or Multi probe, and wherein Multi probe once detects multiple element cell simultaneously, and single probe detects one by one to each element cell.
Y-axis motion comprises leading screw, guide rail, column, crossbeam and motor, and crossbeam is connected with X-axis, and X-axis is equipped with CCD positioner, marking mechanism and the Z axis with testing agency, integrates location, the motion of X-Y-Z axle, detection, mark.
Testing agency is arranged on Z axis by fixed head, is moved along X-Y-Z axle three directions by industrial computer program control.Marking mechanism is arranged on the Rodless cylinder of X-axis motion, is moved along X-Y axle by industrial computer program control.
Control system of the present invention mainly contains industrial computer, CCD automatic positioning control system, detecting and controlling system, X, Y, Z axis operation control system and marking control system, the operation of control system is mainly by carrying out exchanges data and control with CCD automatic positioning control system, detecting and controlling system, X, Y, Z axis operation control system, marking control system after industrial computer setup control program, and concrete control flow is as follows:
1. first give the instruction of CCD automatic positioning control system, after carrying out CCD original point position, by data re-transmission to industrial computer at industrial computer; CCD(Charge-Coupled Device) be a kind of imageing sensor, CCD positioner is the positioner based on ccd image sensor.
2. industrial computer locates the data that return automatically instruction to X, Y, Z axis operation control system according to CCD, and X, Y, Z axis moves to after relative initial point sets first detection position, then data are transferred to industrial computer;
3. industrial computer gives detecting and controlling system according to X, Y, Z axis first detection position return data instruction again, and detection probe starts to detect, and detected rear detecting data re-transmission to industrial computer, industrial computer determines whether qualified products according to detection system;
4. industrial computer gives detection system instruction again, and detection head moves on to next battery unit again to start to detect, periodic duty like this;
5., after treating all to detect, industrial computer is according to the detection qualified product position of record, and give marking control system instruction, labelling head carries out mark to the qualified product setting parameter, after mark completes signal to industrial computer, if defective item, then not mark;
6., after mark all completes, the instruction of industrial computer X, Y, Z axis operation control system, X, Y, Z axis returns origin position.
The invention has the beneficial effects as follows: installation and measuring mechanism and marking mechanism while of on checkout equipment, collection location, motion, detect, mark is integrated, every unit for electrical property parameters of each element cell in thin-film solar cells central layer is detected by testing agency, and automatic classification mark is carried out to element cell, tab character on qualified products, then mark is not carried out to substandard product, before cutting action, effectively qualified product and defective item clearly can be identified classification, eliminate batch mixing appears in qualified product and defective item possibility when classifying, instead of traditional manual detection classification, decrease human error, improve detection accuracy and detection efficiency, decrease film unit battery production operation, reduce production cost, the battery surface secondary pollution avoiding multiple operation human factor to cause and surface breakdown, alleviate product surface and clean difficulty and workload, simultaneously, can utilize marking mechanism that the product informations such as the sequence number of qualified element cell are identified at above battery, realize battery from the trackability of producing the quality state of client's use side.
The present invention also can realize detection, mark simultaneously, be cut into equipment integrally, is applicable to tinuous production and uses.
Accompanying drawing explanation
Fig. 1: structural representation of the present invention.
The cutaway view of Fig. 2: Fig. 1.
Fig. 3: the principle schematic of control system of the present invention.
Fig. 4: the structural representation of embodiment one.
Fig. 5: the structural representation of the embodiment of the present invention two.
The structural representation of parts fixed head 8 in Fig. 6: Fig. 5.
Fig. 7: the structural representation of the embodiment of the present invention three.
The structural representation of parts fixed head 8 in Fig. 8: Fig. 7.
In Fig. 1 to Fig. 8,1, base, 2, leading screw, 3, guide rail, 4, motor, 5, column, 6, detection probe, 7, labelling head, 8, fixed head, 9, cylinder, 10, Rodless cylinder, 11, crossbeam, 12, locating piece, 13, thin-film solar cells central layer, 14, light box, 15, to pop one's head in fixed head, 16, attachment screw, 17, CCD positioner.
Embodiment
The checkout equipment of the thin-film solar cells of the present invention's design, comprise the light box be arranged on base, large format thin-film solar cells central layer is placed on light box, checkout gear has detection head can be driven to carry out X, Y, the motion in Z axis three directions, Y-axis adopts driven by servomotor leading screw, column and crossbeam is driven to move, crossbeam is provided with the Rodless cylinder doing X-axis motion, CCD positioner Rodless cylinder is equipped with, marking mechanism and the cylinder moved along Z axis, and the cylinder moved along Z axis is equipped with testing agency, X-Y-Z shaft movement mechanism controls the motion of detection head and labelling head, and detect each element cell in thin-film solar cells central layer by testing agency, marking mechanism carries out tab character to qualified products, substandard product does not then carry out mark.Change in existing technological process first to the flow process detected again after whole element cell silk-screen character, adopt and first detect, again detection qualified products are carried out character mark (mark content comprises product information or several the contents wherein such as trade mark, battery size, sequence number, output electrode mark), defective item does not carry out mark, come thus clearly to distinguish qualified product and defective item, conveniently directly by visual, substandard product is rejected in follow-up cutting action, save processing step, improve production efficiency.
Large format thin-film solar cells central layer location adopts location, right angle, detects original point position and adopts CCD automatic positioning method.First each parameter detecting set point (is comprised large format solar battery core board size to be detected before detection, element cell gauge size, array typesetting, element cell electrical property criteria for classification etc.) be input to industrial computer, during detection by industrial computer by the check problem pre-set and criteria for classification, element cell on central layer is detected, detect the element cell information obtained and automatically press the position of element cell on central layer stored in industrial computer data storehouse by system, by element cell performance judgment program in industrial computer to detection data analysis, judge the detected state (acceptance or rejection) of each element cell, and store the detection decision state of corresponding battery at industrial computer memory by the relevant position of element cell on central layer, the detection of labelling head to relevant position then controlled according to the detection decision state of element cell by industrial computer judges that qualified element cell carries out mark, as trade mark or the model of company, the product informations such as sequence number and output electrode mark, mark is not carried out to defective element cell, after completing detection and mark, carry out central layer cutting, when sheet gradation broken by element cell, operating personnel directly can be classified to defective item and qualified product by visual: directly choose for not having the defective item of mark and be put in collecting receptacle, qualified product for mark then can load in packaging lacquer disk(-sc), surface slightly do clean just can packaging and warehousing, complete the production process of film unit battery.This checkout gear can also carry out mark classification to the element cell of different performance rank, when established standards parameter value, first performance zones scope is preset to different performance level units battery, after detection, different stage element cell is distinguished by the different mark of mark, directly carries out artificial visual classification process equally when sheet is broken in cutting.For the element cell detecting different size model, only detection probe need be changed.
Embodiment one:
See Fig. 1, Fig. 2, the testing apparatus of thin-film solar cells is primarily of base 1, light box 14, X-axis motion, Y-axis motion, Z axis motion, testing agency, marking mechanism composition, light box 14 is placed on base 1, Y-axis motion mainly contains leading screw 2, guide rail 3, column 5, crossbeam 11 and motor 4 and forms, motor 4 drives the leading screw 2 of position, both sides to move, leading screw 2 drives column 5 above to do Y-axis along guide rail 3 and moves, and the crossbeam 11 be simultaneously connected with two columns also realizes Y-axis and moves.X-axis motion mainly contains Rodless cylinder 10, and Rodless cylinder 10 is fixed on the below of crossbeam 11, and crossbeam 11 drives Rodless cylinder 10 to do Y-axis motion, and Rodless cylinder 10 itself can realize X-axis motion.Z axis motion mainly contains cylinder 9 and fixed head 8 forms, cylinder 9 is fixed on Rodless cylinder 10, cylinder 9 itself can do Z-direction motion, fixed head 8 is arranged on cylinder 9, such fixed head 8 just can realize the motion in X-Y-Z axle three directions, testing agency mainly contains detection probe 6 and probe fixed head 15 forms, detection probe 6 is arranged on probe fixed head 15, probe fixed head 15 attachment screw 16 is fixedly mounted on fixed head 8, detection probe 6 is driven to realize the motion in X-Y-Z axle three directions by fixed head 8, marking mechanism has labelling head 7, labelling head 7 is fixed in X-axis, the motion of X-Y axle can be realized.
The large format thin-film solar cells central layer 13(of the present embodiment or title thin-film solar cells) be of a size of 14 inches × 48 inches, comprise 7 × 16=114 blade unit array, the both positive and negative polarity position of element cell is the both sides of the middle part of element cell, adopt monolithic unit battery measuring method, testing agency is arranged two detection probe 6, the positive and negative electrode of osculating element battery respectively, detection probe 6 is compressible spring probe, be fixed on probe fixed head 15, laser marking, the automatic original point position of CCD, motor 4 is servomotor.Characterization processes flow process is: thin-film solar cells central layer 13 is placed on the spacing position of the locating piece 12 be fixed on light box 14, industrial computer is by CCD lock in place initial point, start working, servomotor 4 drives leading screw 2 to drive column 5 to do Y-axis motion on guides 3, Rodless cylinder 10 does X-axis motion, detection probe 6 is moved to the stop motion of first element cell electrode correspondence position, cylinder 9 promotes fixed head 8 to start to do Z axis motion downwards, stop after detection probe 6 being moved downward simultaneously touch electrode, industrial computer carries out Data Detection, it is qualified to detect, labelling head 7 starts mark, after mark completes, cylinder 9 pulls fixed head 8 to move upward, detection probe 6 is made to leave electrode, if detect defective, labelling head 7 does not work, cylinder 9 pulls fixed head 8 to move upward, next element cell electrode position is arrived again under motor 4 and Rodless cylinder 10 drive, start the detection of next element cell, after whole element cell detects, get back to location initial point, prepare the detection of next block large format thin-film solar cells central layer 13.
Embodiment two:
Large format thin-film solar cells central layer 13 is of a size of 14 inches × 16 inches, comprise 7 × 7=49 blade unit array, the both positive and negative polarity position of element cell is the both sides of the middle part of element cell, adopts and often arranges 7 module unit battery Simultaneous Detections, testing agency is arranged 14 detection probe 6, contact both positive and negative polarity respectively, detection probe 6 is compressible spring probe, is fixed on probe fixed head 15, adopts ink-jet marking, CCD locates automatically, and motor 4 is servomotor.Characterization processes flow process is: thin-film solar cells central layer 13 is placed on the spacing position of the locating piece 12 be fixed on light box 14, industrial computer is by CCD lock in place initial point, start working, servomotor 4 drives leading screw 2 to drive column 5 to do Y-direction motion on guides 3, Rodless cylinder 10 is X to motion, detection probe 6 is moved to the stop motion of first row element cell electrode correspondence position, cylinder 9 promotes fixed head 8 to start to do Z-direction motion downwards, stop after detection probe 6 being moved downward simultaneously touch electrode, industrial computer carries out Data Detection, and record qualified product detection position, detection completes cylinder 9 and pulls fixed head 8 to move upward, cylinder 9 pulls fixed head 8 to move upward, under motor 4 drives, arrive again next row battery electrode position start to detect, detect after all completing, labelling head 7 moves to the last module unit battery marking position detected, start detecting qualified element cell mark, after mark completes, move to next qualified product position, start the mark of next qualified element cell, after whole element cell mark, get back to location initial point, prepare the detection of next block thin-film solar cells central layer 13.
Embodiment three:
Large format thin-film solar cells central layer 13 is of a size of 14 inches × 16 inches, comprise 7 × 7=49 blade unit array, the both positive and negative polarity position of element cell is the both sides of the middle part of element cell, adopt whole Slab element battery Simultaneous Detection, testing agency is arranged 49 groups of 108 detection probe 6, contact both positive and negative polarity respectively, detection probe 6 is compressible spring probe, be fixed on probe fixed head 15, adopt laser marking, motor 4 is servomotor.Characterization processes flow process is: thin-film solar cells central layer 13 is placed on the spacing position of the locating piece 12 be fixed on light box 14, servomotor 4 drives leading screw 2 to drive column 5 to do Y-direction motion on guides 3, industrial computer is by CCD lock in place initial point, when starting working, cylinder 9 promotes fixed head 8 to start to do Z-direction motion downwards, stop after detection probe 6 being moved downward simultaneously touch electrode, industrial computer carries out Data Detection, and record qualified product detection position, detection completes cylinder 9 and pulls fixed head 8 to move upward, labelling head 7 starts the qualified element cell mark of detection, mark completes, prepare the detection of next block thin-film solar cells central layer 13.
Below by reference to the accompanying drawings embodiments of the invention are explained in detail, but the present invention is not limited to above-described embodiment, in the ken that those of ordinary skill in the art possess, various change can also be made under the prerequisite not departing from present inventive concept.
Claims (11)
1. the automatic checkout equipment of a thin-film solar cells, comprise workbench and X-Y-Z shaft movement mechanism, the crossbeam of Y-axis motion is connected with X-axis, it is characterized in that the CCD positioner described X-axis being equipped with automatic original point position, marking mechanism, the Z axis of band testing agency this X-axis is also equipped with, form collection location, X-Y-Z axle moves, detect, the quaternity machine that mark is integrated, this quaternity machine detects the electrical property of each element cell in thin-film solar cells central layer by industrial computer program control, and detecting tab character on qualified element cell, described testing agency is arranged on Z axis by fixed head, moved along X-Y-Z axle three directions by industrial computer program control, thin-film solar cells central layer does not move.
2. the automatic checkout equipment of thin-film solar cells according to claim 1, is characterized in that the detection probe of described testing agency and the element cell electrode contact of thin-film solar cells central layer.
3. the automatic checkout equipment of thin-film solar cells according to claim 1, the crossbeam that it is characterized in that described Y-axis motion is equipped with the Rodless cylinder moved along X-axis, drives CCD positioner and marking mechanism to make X-Y axle move by described Rodless cylinder.
4. the automatic checkout equipment of thin-film solar cells according to claim 1, it is characterized in that described Y-axis motion is primarily of leading screw, guide rail, column, crossbeam and motor composition, leading screw drives column along guide rail movement.
5. the automatic checkout equipment of thin-film solar cells according to claim 3, it is characterized in that the cylinder moved along Z axis is equipped with in the below of described X-axis, testing agency with fixed head, and fixed head is equipped with in the end of this cylinder.
6. the automatic checkout equipment of thin-film solar cells according to claim 5, it is characterized in that described testing agency comprises detection probe and probe fixed head, detection probe is made up of dismountable spring probe.
7. an automatic testing method for thin-film solar cells, is placed on workbench by thin-film solar cells central layer, and this thin-film solar cells central layer is made up of multiple element cell, it is characterized in that by industrial computer setting program Time-sharing control:
CCD positioner carries out original point position, imports surveyed area position to industrial computer;
Start X, Y-axis motion, testing agency moves to the first surveyed area along X, Y-axis;
The detection probe that Z axis motion promotes in testing agency moves downward, and detection probe contacts with the electrode seal of element cell, the electrical property of detecting unit battery;
Detect complete, Z axis motion pulls detection to move upward, and detection probe disconnects with the electrode of element cell and contacting;
X, Y-axis motion drive testing agency to move to next surveyed area, detect the element cell in this region;
After element cell to all surveyed areas detects, detecting tab character on qualified element cell by marking mechanism;
Mark is complete, and thin-film solar cells central layer is carried out cutting gradation, qualified products packaging and warehousing.
8. the automatic testing method of thin-film solar cells according to claim 7, it is characterized in that the detection probe of described testing agency is single probe or Multi probe, wherein Multi probe once detects multiple element cell simultaneously, and single probe detects one by one to each element cell.
9. the automatic testing method of thin-film solar cells according to claim 7, it is characterized in that described Y-axis motion comprises leading screw, guide rail, column, crossbeam and motor, crossbeam is connected with X-axis, and CCD positioner, marking mechanism and the Z axis with testing agency X-axis be equipped with, integrate location, the motion of X-Y-Z axle, detection, mark.
10. the automatic testing method of thin-film solar cells according to claim 7, is characterized in that described testing agency is arranged on Z axis by fixed head, is moved along X-Y-Z axle three directions by industrial computer program control.
The automatic testing method of 11. thin-film solar cells according to claim 7, is characterized in that described marking mechanism is arranged on the Rodless cylinder of X-axis motion, is moved by industrial computer program control along X-Y axle.
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Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101211993A (en) * | 2006-12-31 | 2008-07-02 | 李毅 | Big width laser marking solar cell |
| CN101222001A (en) * | 2007-01-08 | 2008-07-16 | 李毅 | Solar battery laser marking device |
| CN101452972A (en) * | 2007-11-30 | 2009-06-10 | 深圳市大族激光科技股份有限公司 | Amorphous silicon thin-film solar cell laser rose system and rose method |
| CN101493495A (en) * | 2009-03-06 | 2009-07-29 | 江都市东元机电设备有限公司 | Semiconductor device testing and sorting machine |
| CN101590623A (en) * | 2009-06-12 | 2009-12-02 | 杭州机床集团有限公司 | Movable beam type NC grinding machine |
| CN201375950Y (en) * | 2008-11-25 | 2010-01-06 | 上海航天精密机械研究所 | Chemical milling protective colloid coating device |
| CN101700602A (en) * | 2009-11-24 | 2010-05-05 | 宁波市凯博数控机械有限公司 | Portal frame movable type horizontal coordinate numerical control ultrasonic welding machine |
| CN201497798U (en) * | 2009-07-28 | 2010-06-02 | 天津力神电池股份有限公司 | Full-automatic battery performance testing device |
| CN201757776U (en) * | 2010-06-25 | 2011-03-09 | 深圳市创益科技发展有限公司 | Automatic tester for solar cells |
| CN102101391A (en) * | 2009-12-21 | 2011-06-22 | 上海功源电子科技有限公司 | Laser marking method and device based on CCD (Charge Coupled Device) image navigation |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101598764B (en) * | 2008-06-06 | 2012-01-25 | 财团法人工业技术研究院 | Solar cell detection machine station |
| CN101431126B (en) * | 2008-12-11 | 2010-08-11 | 武汉凌云光电科技有限责任公司 | Novel apparatus used for film engraving and dotting of thin-film solar cell |
-
2011
- 2011-08-31 CN CN201110254203.XA patent/CN102565655B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101211993A (en) * | 2006-12-31 | 2008-07-02 | 李毅 | Big width laser marking solar cell |
| CN101222001A (en) * | 2007-01-08 | 2008-07-16 | 李毅 | Solar battery laser marking device |
| CN101452972A (en) * | 2007-11-30 | 2009-06-10 | 深圳市大族激光科技股份有限公司 | Amorphous silicon thin-film solar cell laser rose system and rose method |
| CN201375950Y (en) * | 2008-11-25 | 2010-01-06 | 上海航天精密机械研究所 | Chemical milling protective colloid coating device |
| CN101493495A (en) * | 2009-03-06 | 2009-07-29 | 江都市东元机电设备有限公司 | Semiconductor device testing and sorting machine |
| CN101590623A (en) * | 2009-06-12 | 2009-12-02 | 杭州机床集团有限公司 | Movable beam type NC grinding machine |
| CN201497798U (en) * | 2009-07-28 | 2010-06-02 | 天津力神电池股份有限公司 | Full-automatic battery performance testing device |
| CN101700602A (en) * | 2009-11-24 | 2010-05-05 | 宁波市凯博数控机械有限公司 | Portal frame movable type horizontal coordinate numerical control ultrasonic welding machine |
| CN102101391A (en) * | 2009-12-21 | 2011-06-22 | 上海功源电子科技有限公司 | Laser marking method and device based on CCD (Charge Coupled Device) image navigation |
| CN201757776U (en) * | 2010-06-25 | 2011-03-09 | 深圳市创益科技发展有限公司 | Automatic tester for solar cells |
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