CN102507623A - 一种非扫描式波长色散型x射线荧光光谱仪 - Google Patents
一种非扫描式波长色散型x射线荧光光谱仪 Download PDFInfo
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- CN102507623A CN102507623A CN2011103114000A CN201110311400A CN102507623A CN 102507623 A CN102507623 A CN 102507623A CN 2011103114000 A CN2011103114000 A CN 2011103114000A CN 201110311400 A CN201110311400 A CN 201110311400A CN 102507623 A CN102507623 A CN 102507623A
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CN102507623B CN102507623B (zh) | 2014-03-05 |
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Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104076053A (zh) * | 2013-03-28 | 2014-10-01 | 日本株式会社日立高新技术科学 | 异物检测装置 |
CN104264228A (zh) * | 2014-10-09 | 2015-01-07 | 北京安科慧生科技有限公司 | 双曲面弯晶、组合式双曲面弯晶及单波长色散 x 射线荧光光谱仪 |
CN109491960A (zh) * | 2018-11-09 | 2019-03-19 | 中国科学院长春光学精密机械与物理研究所 | 一种减小图像畸变的位置读出电路 |
CN110133709A (zh) * | 2019-06-06 | 2019-08-16 | 中国工程物理研究院激光聚变研究中心 | 类δ响应软X射线能谱仪 |
CN110621986A (zh) * | 2017-03-22 | 2019-12-27 | 斯格瑞公司 | 执行x射线光谱分析的方法和x射线吸收光谱仪系统 |
CN112424591A (zh) * | 2018-06-04 | 2021-02-26 | 斯格瑞公司 | 波长色散x射线光谱仪 |
US11215572B2 (en) | 2020-05-18 | 2022-01-04 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements |
US11549895B2 (en) | 2020-09-17 | 2023-01-10 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
US11686692B2 (en) | 2020-12-07 | 2023-06-27 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
US11885755B2 (en) | 2022-05-02 | 2024-01-30 | Sigray, Inc. | X-ray sequential array wavelength dispersive spectrometer |
US11992350B2 (en) | 2022-03-15 | 2024-05-28 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
Citations (5)
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CN1421691A (zh) * | 2002-12-20 | 2003-06-04 | 中国科学院上海光学精密机械研究所 | X射线荧光全息层析成像装置 |
WO2006037248A1 (en) * | 2004-10-05 | 2006-04-13 | Tecan Trading Ag | Combining photon counting and analog detection |
CN101093200A (zh) * | 2007-05-14 | 2007-12-26 | 北京逸东机电技术开发有限公司 | 一种x射线的弯曲晶体连续衍射分光与探测的控制方法及其装置 |
CN201247201Y (zh) * | 2008-07-24 | 2009-05-27 | 天津港东科技发展股份有限公司 | 激光拉曼/荧光光谱仪 |
CN101889192A (zh) * | 2007-10-25 | 2010-11-17 | 纽约州立大学研究基金会 | 单光子光谱仪 |
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2011
- 2011-10-14 CN CN201110311400.0A patent/CN102507623B/zh not_active Expired - Fee Related
Patent Citations (5)
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CN1421691A (zh) * | 2002-12-20 | 2003-06-04 | 中国科学院上海光学精密机械研究所 | X射线荧光全息层析成像装置 |
WO2006037248A1 (en) * | 2004-10-05 | 2006-04-13 | Tecan Trading Ag | Combining photon counting and analog detection |
CN101093200A (zh) * | 2007-05-14 | 2007-12-26 | 北京逸东机电技术开发有限公司 | 一种x射线的弯曲晶体连续衍射分光与探测的控制方法及其装置 |
CN101889192A (zh) * | 2007-10-25 | 2010-11-17 | 纽约州立大学研究基金会 | 单光子光谱仪 |
CN201247201Y (zh) * | 2008-07-24 | 2009-05-27 | 天津港东科技发展股份有限公司 | 激光拉曼/荧光光谱仪 |
Non-Patent Citations (1)
Title |
---|
缪震华: "基于楔条形阳极探测器的单光子成像系统", 《中国博士学位论文全文数据库信息科技辑》, no. 5, 15 May 2009 (2009-05-15) * |
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20140118795A (ko) * | 2013-03-28 | 2014-10-08 | 가부시키가이샤 히다치 하이테크 사이언스 | 이물 검출 장치 |
CN104076053B (zh) * | 2013-03-28 | 2018-06-19 | 日本株式会社日立高新技术科学 | 异物检测装置 |
CN104076053A (zh) * | 2013-03-28 | 2014-10-01 | 日本株式会社日立高新技术科学 | 异物检测装置 |
KR102009051B1 (ko) | 2013-03-28 | 2019-08-08 | 가부시키가이샤 히다치 하이테크 사이언스 | 이물 검출 장치 |
CN104264228A (zh) * | 2014-10-09 | 2015-01-07 | 北京安科慧生科技有限公司 | 双曲面弯晶、组合式双曲面弯晶及单波长色散 x 射线荧光光谱仪 |
CN110621986B (zh) * | 2017-03-22 | 2022-05-17 | 斯格瑞公司 | 执行x射线光谱分析的方法和x射线吸收光谱仪系统 |
CN110621986A (zh) * | 2017-03-22 | 2019-12-27 | 斯格瑞公司 | 执行x射线光谱分析的方法和x射线吸收光谱仪系统 |
CN112424591B (zh) * | 2018-06-04 | 2024-05-24 | 斯格瑞公司 | 波长色散x射线光谱仪 |
CN112424591A (zh) * | 2018-06-04 | 2021-02-26 | 斯格瑞公司 | 波长色散x射线光谱仪 |
CN109491960A (zh) * | 2018-11-09 | 2019-03-19 | 中国科学院长春光学精密机械与物理研究所 | 一种减小图像畸变的位置读出电路 |
CN109491960B (zh) * | 2018-11-09 | 2022-02-22 | 中国科学院长春光学精密机械与物理研究所 | 一种减小图像畸变的位置读出电路 |
CN110133709B (zh) * | 2019-06-06 | 2022-06-14 | 中国工程物理研究院激光聚变研究中心 | 类δ响应软X射线能谱仪 |
CN110133709A (zh) * | 2019-06-06 | 2019-08-16 | 中国工程物理研究院激光聚变研究中心 | 类δ响应软X射线能谱仪 |
US11215572B2 (en) | 2020-05-18 | 2022-01-04 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements |
US11428651B2 (en) | 2020-05-18 | 2022-08-30 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements |
US11549895B2 (en) | 2020-09-17 | 2023-01-10 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
US11686692B2 (en) | 2020-12-07 | 2023-06-27 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
US11992350B2 (en) | 2022-03-15 | 2024-05-28 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
US11885755B2 (en) | 2022-05-02 | 2024-01-30 | Sigray, Inc. | X-ray sequential array wavelength dispersive spectrometer |
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