CN102445155A - 用于评估涂层的热成像方法和设备 - Google Patents
用于评估涂层的热成像方法和设备 Download PDFInfo
- Publication number
- CN102445155A CN102445155A CN2011102577541A CN201110257754A CN102445155A CN 102445155 A CN102445155 A CN 102445155A CN 2011102577541 A CN2011102577541 A CN 2011102577541A CN 201110257754 A CN201110257754 A CN 201110257754A CN 102445155 A CN102445155 A CN 102445155A
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- Prior art keywords
- coating
- time
- picture frame
- flashlamp
- thickness
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Links
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
- G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0088—Radiation pyrometry, e.g. infrared or optical thermometry in turbines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/48—Thermography; Techniques using wholly visual means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Radiation Pyrometers (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/869,893 US8692887B2 (en) | 2010-08-27 | 2010-08-27 | Thermal imaging method and apparatus for evaluating coatings |
| US12/869,893 | 2010-08-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102445155A true CN102445155A (zh) | 2012-05-09 |
Family
ID=44719289
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011102577541A Pending CN102445155A (zh) | 2010-08-27 | 2011-08-26 | 用于评估涂层的热成像方法和设备 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8692887B2 (enExample) |
| EP (1) | EP2423638A2 (enExample) |
| JP (1) | JP2012047739A (enExample) |
| CN (1) | CN102445155A (enExample) |
| BR (1) | BRPI1103714A2 (enExample) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107037065A (zh) * | 2015-12-09 | 2017-08-11 | 通用电气公司 | 涂层检查方法 |
| CN108106585A (zh) * | 2017-12-21 | 2018-06-01 | 爱德森(厦门)电子有限公司 | 一种金属基材表面覆层的检测装置及方法 |
| CN108955608A (zh) * | 2018-05-18 | 2018-12-07 | 云南电网有限责任公司电力科学研究院 | 绝缘子表面rtv涂层涂覆效果评估方法、装置及系统 |
| CN110073171A (zh) * | 2017-11-24 | 2019-07-30 | 韩国科学技术院 | 对漆膜的厚度分布执行可视化测量的方法及其设备 |
| CN110997160A (zh) * | 2017-08-02 | 2020-04-10 | Sms集团有限公司 | 用于单侧和/或双侧涂覆金属带状基材的装置和方法 |
| CN111412850A (zh) * | 2020-03-23 | 2020-07-14 | 昆明理工大学 | 一种基于单摄像头的高温三维数字图像相关测量系统及方法 |
| CN113125458A (zh) * | 2019-12-30 | 2021-07-16 | 韩国科学技术院 | 钢结构涂层状态的检查与评估方法及系统 |
| CN114140376A (zh) * | 2020-09-04 | 2022-03-04 | 通用电气公司 | 用于生成单个观察图像以分析涂层缺陷的系统和方法 |
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| US9413988B2 (en) | 2012-07-24 | 2016-08-09 | Fluke Corporation | Thermal imaging camera with graphical temperature plot |
| CN102954968A (zh) * | 2012-11-05 | 2013-03-06 | 西安交通大学 | 热障涂层部件电磁涡流热成像无损检测系统及检测方法 |
| EP2962061B1 (en) * | 2013-03-01 | 2017-12-06 | United Technologies Corporation | Flash thermography double wall thickness measurement |
| US8759770B1 (en) | 2013-04-08 | 2014-06-24 | General Electric Company | System and method for qualifying usability risk associated with subsurface defects in a multilayer coating |
| US9500611B2 (en) | 2013-09-26 | 2016-11-22 | General Electric Company | Lamp assembly for a thermographic nondestructive evaluation system |
| US9476798B2 (en) * | 2014-02-21 | 2016-10-25 | General Electric Company | On-line monitoring of hot gas path components of a gas turbine |
| US10768128B2 (en) * | 2014-07-22 | 2020-09-08 | The Boeing Company | Systems and methods of monitoring a thermal protection system |
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| US10690581B2 (en) * | 2015-12-07 | 2020-06-23 | The Boeing Company | Infrared thermographic porosity quantification in composite structures |
| US10332248B1 (en) * | 2016-08-17 | 2019-06-25 | The United States Of America As Represented By The Administator Of The National Aeronautics And Space Administration | Contrast based imaging and analysis computer-implemented method to analyze pulse thermography data for nondestructive evaluation |
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| GB2565079A (en) * | 2017-07-31 | 2019-02-06 | Erodex Uk Ltd | Inspection system and method for turbine vanes and blades |
| US20190064119A1 (en) * | 2017-08-28 | 2019-02-28 | Siemens Energy, Inc. | Laser ultrasonic thermography inspection |
| US10274429B2 (en) * | 2017-09-18 | 2019-04-30 | United Technologies Corporation | Method and system for detecting precursor to coating spallation |
| US10641720B2 (en) * | 2017-10-06 | 2020-05-05 | General Electric Company | Thermal barrier coating spallation detection system |
| EP3710813B1 (en) * | 2017-11-13 | 2023-09-20 | Illumina, Inc. | System and method for large sample analysis of thin film |
| JP7176356B2 (ja) * | 2017-11-27 | 2022-11-22 | 株式会社豊田中央研究所 | 計測装置、計測方法、及びプログラム |
| US11592380B2 (en) * | 2017-12-26 | 2023-02-28 | Robert Bosch Gmbh | System and method for detecting a thickness of a layer |
| JP6907951B2 (ja) * | 2018-01-11 | 2021-07-21 | トヨタ自動車株式会社 | ヒートシンクの検査方法、検査装置及び生産方法、生産システム |
| US10845253B2 (en) * | 2018-04-02 | 2020-11-24 | General Electric Company | Turbine thermal monitoring systems and methods |
| EP3784815A4 (en) * | 2018-04-27 | 2021-11-03 | Applied Materials, Inc. | PROTECTION OF COMPONENTS AGAINST CORROSION |
| US10958843B2 (en) | 2018-05-04 | 2021-03-23 | Raytheon Technologies Corporation | Multi-camera system for simultaneous registration and zoomed imagery |
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| US11268881B2 (en) | 2018-05-04 | 2022-03-08 | Raytheon Technologies Corporation | System and method for fan blade rotor disk and gear inspection |
| US10685433B2 (en) | 2018-05-04 | 2020-06-16 | Raytheon Technologies Corporation | Nondestructive coating imperfection detection system and method therefor |
| US10488371B1 (en) | 2018-05-04 | 2019-11-26 | United Technologies Corporation | Nondestructive inspection using thermoacoustic imagery and method therefor |
| US10943320B2 (en) | 2018-05-04 | 2021-03-09 | Raytheon Technologies Corporation | System and method for robotic inspection |
| US10902664B2 (en) | 2018-05-04 | 2021-01-26 | Raytheon Technologies Corporation | System and method for detecting damage using two-dimensional imagery and three-dimensional model |
| US10914191B2 (en) | 2018-05-04 | 2021-02-09 | Raytheon Technologies Corporation | System and method for in situ airfoil inspection |
| US11079285B2 (en) | 2018-05-04 | 2021-08-03 | Raytheon Technologies Corporation | Automated analysis of thermally-sensitive coating and method therefor |
| US10928362B2 (en) | 2018-05-04 | 2021-02-23 | Raytheon Technologies Corporation | Nondestructive inspection using dual pulse-echo ultrasonics and method therefor |
| CN110702724B (zh) * | 2018-07-09 | 2024-02-20 | 浙江清华柔性电子技术研究院 | 高温风洞的成像方法 |
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| CN1869581A (zh) * | 2005-05-24 | 2006-11-29 | 联合工艺公司 | 热成像方法和设备 |
| CN101055169A (zh) * | 2005-12-16 | 2007-10-17 | 通用电气公司 | 用于无损测定绝缘涂层的方法和装置 |
| US20100032571A1 (en) * | 2008-08-08 | 2010-02-11 | Shelley Paul H | Method for performing mid-ir spectroscopy measurements to measure film coating thickness, weight and/or film composition |
| US7751061B2 (en) * | 2006-07-20 | 2010-07-06 | Nanometrics Incorporated | Non-contact apparatus and method for measuring a property of a dielectric layer on a wafer |
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-
2010
- 2010-08-27 US US12/869,893 patent/US8692887B2/en not_active Expired - Fee Related
-
2011
- 2011-08-10 BR BRPI1103714-8A patent/BRPI1103714A2/pt not_active IP Right Cessation
- 2011-08-23 EP EP11178553A patent/EP2423638A2/en not_active Withdrawn
- 2011-08-23 JP JP2011181048A patent/JP2012047739A/ja active Pending
- 2011-08-26 CN CN2011102577541A patent/CN102445155A/zh active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1869581A (zh) * | 2005-05-24 | 2006-11-29 | 联合工艺公司 | 热成像方法和设备 |
| CN101055169A (zh) * | 2005-12-16 | 2007-10-17 | 通用电气公司 | 用于无损测定绝缘涂层的方法和装置 |
| US7751061B2 (en) * | 2006-07-20 | 2010-07-06 | Nanometrics Incorporated | Non-contact apparatus and method for measuring a property of a dielectric layer on a wafer |
| US20100032571A1 (en) * | 2008-08-08 | 2010-02-11 | Shelley Paul H | Method for performing mid-ir spectroscopy measurements to measure film coating thickness, weight and/or film composition |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107037065A (zh) * | 2015-12-09 | 2017-08-11 | 通用电气公司 | 涂层检查方法 |
| CN110997160A (zh) * | 2017-08-02 | 2020-04-10 | Sms集团有限公司 | 用于单侧和/或双侧涂覆金属带状基材的装置和方法 |
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| EP2423638A2 (en) | 2012-02-29 |
| US20120050537A1 (en) | 2012-03-01 |
| BRPI1103714A2 (pt) | 2013-01-22 |
| US8692887B2 (en) | 2014-04-08 |
| JP2012047739A (ja) | 2012-03-08 |
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