CN102252608A - 光学测量方法和装置 - Google Patents
光学测量方法和装置 Download PDFInfo
- Publication number
- CN102252608A CN102252608A CN2011100980171A CN201110098017A CN102252608A CN 102252608 A CN102252608 A CN 102252608A CN 2011100980171 A CN2011100980171 A CN 2011100980171A CN 201110098017 A CN201110098017 A CN 201110098017A CN 102252608 A CN102252608 A CN 102252608A
- Authority
- CN
- China
- Prior art keywords
- workpiece
- headstock
- measured
- profile
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (13)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP10160538.4 | 2010-04-21 | ||
EP10160538.4A EP2284483B1 (en) | 2010-02-25 | 2010-04-21 | Optical measurement method and apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102252608A true CN102252608A (zh) | 2011-11-23 |
CN102252608B CN102252608B (zh) | 2016-01-20 |
Family
ID=44816528
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201110098017.1A Expired - Fee Related CN102252608B (zh) | 2010-04-21 | 2011-04-19 | 光学测量方法和装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US8892398B2 (zh) |
JP (1) | JP2011232336A (zh) |
CN (1) | CN102252608B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113910022A (zh) * | 2021-11-11 | 2022-01-11 | 济南凯特尔机器有限公司 | 一种高效超精密磨削高速刀柄的数控端面外圆磨床 |
CN114599480A (zh) * | 2019-11-25 | 2022-06-07 | 鲁姆斯有限公司 | 抛光波导表面的方法 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2539669A1 (en) * | 2010-02-25 | 2013-01-02 | Tesa Sa | Optical measurement system |
US9494414B2 (en) * | 2013-11-18 | 2016-11-15 | Integrated Packaging Solutions, LLC | Tool measuring apparatus for mounting surface to cast shadow |
US10116123B2 (en) | 2015-12-15 | 2018-10-30 | Ngk Spark Plug Co., Ltd. | Inspection method and apparatus of spark plug insulator |
JP7240937B2 (ja) * | 2019-04-05 | 2023-03-16 | 株式会社ミツトヨ | 光学式測定装置および光学式測定方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN85106386A (zh) * | 1985-08-24 | 1987-03-18 | 株式会社三丰制作所 | 光学测量系统 |
CN1065330A (zh) * | 1991-03-28 | 1992-10-14 | 电子科技大学 | 一种测量物体直径的方法及其设备 |
US5335183A (en) * | 1991-01-21 | 1994-08-02 | Toyoda Koki Kabushiki Kaisha | Method and apparatus for determining profile of cylindrical object |
US6161055A (en) * | 1993-05-17 | 2000-12-12 | Laser Measurement International Inc. | Method of determining tool breakage |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3749500A (en) | 1970-12-23 | 1973-07-31 | Gen Electric | Optical caliper and edge detector-follower for automatic gaging |
JPS5156665A (ja) * | 1974-11-13 | 1976-05-18 | Nhk Spring Co Ltd | Ichikenshutsusochi |
US5825017A (en) * | 1980-03-27 | 1998-10-20 | Sensor Adaptive Machines Inc. | Method and apparatus for determining dimensions |
CH666547A5 (de) * | 1984-12-20 | 1988-07-29 | Fischer Ag Georg | Optisch-elektronisches messverfahren, eine dafuer erforderliche einrichtung und deren verwendung. |
GB2180640A (en) * | 1985-09-13 | 1987-04-01 | Tesa Metrology Ltd | Optical measurement apparatus |
GB9107037D0 (en) | 1991-04-04 | 1991-05-22 | Tesa Metrology Ltd | Improvements in or relating to electro-optical measurement apparatus |
EP0648358A4 (en) | 1992-05-18 | 1995-12-13 | Sensor Adaptive Mach | METHODS AND APPARATUS FOR CONTROLLING LATHES AND OTHER TOOL MACHINES. |
US5383021A (en) * | 1993-04-19 | 1995-01-17 | Mectron Engineering Company | Optical part inspection system |
US6141105A (en) * | 1995-11-17 | 2000-10-31 | Minolta Co., Ltd. | Three-dimensional measuring device and three-dimensional measuring method |
JP3235485B2 (ja) * | 1995-11-17 | 2001-12-04 | ミノルタ株式会社 | 3次元計測のための分光装置 |
JPH09280834A (ja) * | 1996-04-10 | 1997-10-31 | Ricoh Co Ltd | 形状測定装置 |
JP3593302B2 (ja) * | 1999-06-15 | 2004-11-24 | 株式会社ミツトヨ | 画像測定装置及び方法 |
US6781703B1 (en) * | 2002-01-11 | 2004-08-24 | Schmitt Measurement Systems, Inc. | Wireframe algorithm and non-contact gauging apparatus |
DE60202435T2 (de) * | 2002-02-04 | 2005-12-22 | Area Sistemi S.R.L. | Optische Methode und Vorrichtung zur Messung geometrischer Grössen |
DE102004045418A1 (de) | 2004-03-16 | 2005-10-06 | Waldrich Siegen Werkzeugmaschinen Gmbh | Verfahren und Vorrichtung zum Schleifen einer Walze |
US20070091174A1 (en) | 2005-09-30 | 2007-04-26 | Topcon Corporation | Projection device for three-dimensional measurement, and three-dimensional measurement system |
CN101196389B (zh) * | 2006-12-05 | 2011-01-05 | 鸿富锦精密工业(深圳)有限公司 | 影像量测系统及方法 |
JP5117787B2 (ja) * | 2007-08-13 | 2013-01-16 | 株式会社トプコン | 光画像計測装置 |
US7777900B2 (en) * | 2007-10-23 | 2010-08-17 | Gii Acquisition, Llc | Method and system for optically inspecting parts |
US8724089B2 (en) * | 2009-04-16 | 2014-05-13 | Wensheng Hua | Compressed scan systems |
-
2011
- 2011-03-28 US US13/073,229 patent/US8892398B2/en not_active Expired - Fee Related
- 2011-04-19 CN CN201110098017.1A patent/CN102252608B/zh not_active Expired - Fee Related
- 2011-04-21 JP JP2011094655A patent/JP2011232336A/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN85106386A (zh) * | 1985-08-24 | 1987-03-18 | 株式会社三丰制作所 | 光学测量系统 |
US5335183A (en) * | 1991-01-21 | 1994-08-02 | Toyoda Koki Kabushiki Kaisha | Method and apparatus for determining profile of cylindrical object |
CN1065330A (zh) * | 1991-03-28 | 1992-10-14 | 电子科技大学 | 一种测量物体直径的方法及其设备 |
US6161055A (en) * | 1993-05-17 | 2000-12-12 | Laser Measurement International Inc. | Method of determining tool breakage |
Non-Patent Citations (1)
Title |
---|
李怀峰等: "GPIB激光自动测径系统及逻辑分析仪的应用", 《中国测试技术》 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114599480A (zh) * | 2019-11-25 | 2022-06-07 | 鲁姆斯有限公司 | 抛光波导表面的方法 |
CN114599480B (zh) * | 2019-11-25 | 2024-03-19 | 鲁姆斯有限公司 | 抛光波导表面的方法 |
CN113910022A (zh) * | 2021-11-11 | 2022-01-11 | 济南凯特尔机器有限公司 | 一种高效超精密磨削高速刀柄的数控端面外圆磨床 |
Also Published As
Publication number | Publication date |
---|---|
CN102252608B (zh) | 2016-01-20 |
JP2011232336A (ja) | 2011-11-17 |
US8892398B2 (en) | 2014-11-18 |
US20110264406A1 (en) | 2011-10-27 |
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Legal Events
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C41 | Transfer of patent application or patent right or utility model | ||
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Effective date of registration: 20151123 Address after: Swiss Chrissy M Applicant after: Tesa Sa Address before: Swiss Lei Lawrence Applicant before: Tesa SA |
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