CN102209890B - 检测传感器、检测传感器的振子 - Google Patents
检测传感器、检测传感器的振子 Download PDFInfo
- Publication number
- CN102209890B CN102209890B CN200980144356XA CN200980144356A CN102209890B CN 102209890 B CN102209890 B CN 102209890B CN 200980144356X A CN200980144356X A CN 200980144356XA CN 200980144356 A CN200980144356 A CN 200980144356A CN 102209890 B CN102209890 B CN 102209890B
- Authority
- CN
- China
- Prior art keywords
- vibrator
- vibrators
- detection sensor
- detection
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N5/00—Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid
- G01N5/02—Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid by absorbing or adsorbing components of a material and determining change of weight of the adsorbent, e.g. determining moisture content
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/02—Analysing fluids
- G01N29/036—Analysing fluids by measuring frequency or resonance of acoustic waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/40—Concentrating samples
- G01N1/405—Concentrating samples by adsorption or absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/025—Change of phase or condition
- G01N2291/0256—Adsorption, desorption, surface mass change, e.g. on biosensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
- G01N33/0031—General constructional details of gas analysers, e.g. portable test equipment concerning the detector comprising two or more sensors, e.g. a sensor array
Landscapes
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Acoustics & Sound (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008-287018 | 2008-07-11 | ||
| JP2008287018A JP5130422B2 (ja) | 2008-11-07 | 2008-11-07 | 検出センサ |
| PCT/JP2009/005587 WO2010052841A1 (ja) | 2008-11-07 | 2009-10-23 | 検出センサ、検出センサの振動子 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102209890A CN102209890A (zh) | 2011-10-05 |
| CN102209890B true CN102209890B (zh) | 2013-02-20 |
Family
ID=42152654
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200980144356XA Expired - Fee Related CN102209890B (zh) | 2008-11-07 | 2009-10-23 | 检测传感器、检测传感器的振子 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8258675B2 (enExample) |
| JP (1) | JP5130422B2 (enExample) |
| CN (1) | CN102209890B (enExample) |
| WO (1) | WO2010052841A1 (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5242347B2 (ja) * | 2008-11-11 | 2013-07-24 | 独立行政法人産業技術総合研究所 | 検出センサ |
| WO2014123519A1 (en) | 2013-02-06 | 2014-08-14 | Empire Technology Development Llc | Devices, systems, and methods for detecting odorants |
| JP2014190771A (ja) * | 2013-03-26 | 2014-10-06 | National Institute Of Advanced Industrial & Technology | 質量測定方法及び質量測定装置 |
| WO2014171927A1 (en) * | 2013-04-16 | 2014-10-23 | Empire Technology Development Llc | Graded structure films |
| US9702846B2 (en) | 2013-11-08 | 2017-07-11 | Taiwan Semiconductor Manufacturing Company, Ltd. | Biosensor device and related method |
| US20160349216A1 (en) * | 2014-01-30 | 2016-12-01 | Empire Technology Development Llc | Odor sensors |
| US20170040971A1 (en) * | 2014-01-30 | 2017-02-09 | Empire Technology Development Llc | Crystal oscillators and methods for fabricating the same |
| CN105067471B (zh) * | 2015-07-24 | 2017-12-29 | 中国科学院上海微系统与信息技术研究所 | 一种微悬臂谐振结构传感器及其制造方法 |
| JP6764281B2 (ja) * | 2016-08-09 | 2020-09-30 | 太陽誘電株式会社 | ガスセンサ |
| JP6863009B2 (ja) * | 2017-03-31 | 2021-04-21 | I−Pex株式会社 | 物質検出素子 |
| JP7206389B2 (ja) * | 2018-12-12 | 2023-01-17 | マイクロ モーション インコーポレイテッド | 平面的振動部材、密度計、及び振動式密度計を動作させる方法 |
| KR102739123B1 (ko) * | 2018-12-28 | 2024-12-06 | 삼성전자주식회사 | 공진기 및 그 제조방법과, 공진기를 포함하는 스트레인 센서 및 센서 어레이 |
| US20210041287A1 (en) | 2019-08-09 | 2021-02-11 | Apple Inc. | On-Bed Differential Piezoelectric Sensor |
| US11896136B2 (en) | 2019-09-19 | 2024-02-13 | Apple Inc. | Pneumatic haptic device having actuation cells for producing a haptic output over a bed mattress |
| US20210255082A1 (en) * | 2020-02-19 | 2021-08-19 | Tdk Corporation | Methods and Devices for Detecting Particles Using a Cantilever Sensor |
| US11771406B2 (en) | 2020-08-12 | 2023-10-03 | Apple Inc. | In-bed temperature array for menstrual cycle tracking |
| US11874189B2 (en) | 2021-07-02 | 2024-01-16 | Applied Materials, Inc. | MEMS resonator sensor substrate for plasma, temperature, stress, or deposition sensing |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1269885A (zh) * | 1998-11-02 | 2000-10-11 | 株式会社明电舍 | Qcm(石英晶体微量天秤)传感器 |
| WO2004061427A1 (ja) * | 2002-12-27 | 2004-07-22 | Japan Science And Technology Agency | マルチカンチレバーの振動周波数の計測方法及び装置 |
| CN1678899A (zh) * | 2002-09-05 | 2005-10-05 | 学校法人东京药科大学 | 水晶振子型纳米管传感器 |
| WO2008069247A1 (ja) * | 2006-12-05 | 2008-06-12 | National University Corporation Gunma University | 質量測定装置及びカンチレバ |
| JP2008241619A (ja) * | 2007-03-28 | 2008-10-09 | Gunma Univ | カンチレバー、バイオセンサ、及びプローブ顕微鏡 |
| WO2008126519A1 (ja) * | 2007-03-22 | 2008-10-23 | Shinshu University | センサー |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5162691A (en) * | 1991-01-22 | 1992-11-10 | The United States Of America As Represented By The Secretary Of The Army | Cantilevered air-gap type thin film piezoelectric resonator |
| US5856722A (en) * | 1996-01-02 | 1999-01-05 | Cornell Research Foundation, Inc. | Microelectromechanics-based frequency signature sensor |
| JP3348687B2 (ja) * | 1998-05-22 | 2002-11-20 | 住友金属工業株式会社 | 振動波検出方法及び装置 |
| US7369115B2 (en) * | 2002-04-25 | 2008-05-06 | Immersion Corporation | Haptic devices having multiple operational modes including at least one resonant mode |
| JP2007240252A (ja) | 2006-03-07 | 2007-09-20 | National Institute Of Advanced Industrial & Technology | 検出センサ、振動子 |
| KR100975010B1 (ko) * | 2008-02-29 | 2010-08-09 | 성균관대학교산학협력단 | 다중 크기 압전 마이크로 칸티레버 공진자 어레이를 이용한 물리센서 및 그 제작방법 |
| US8199389B2 (en) * | 2008-03-10 | 2012-06-12 | Ricoh Company, Ltd. | Vibration elements |
-
2008
- 2008-11-07 JP JP2008287018A patent/JP5130422B2/ja not_active Expired - Fee Related
-
2009
- 2009-10-23 WO PCT/JP2009/005587 patent/WO2010052841A1/ja not_active Ceased
- 2009-10-23 CN CN200980144356XA patent/CN102209890B/zh not_active Expired - Fee Related
-
2011
- 2011-04-28 US US13/096,409 patent/US8258675B2/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1269885A (zh) * | 1998-11-02 | 2000-10-11 | 株式会社明电舍 | Qcm(石英晶体微量天秤)传感器 |
| CN1678899A (zh) * | 2002-09-05 | 2005-10-05 | 学校法人东京药科大学 | 水晶振子型纳米管传感器 |
| WO2004061427A1 (ja) * | 2002-12-27 | 2004-07-22 | Japan Science And Technology Agency | マルチカンチレバーの振動周波数の計測方法及び装置 |
| WO2008069247A1 (ja) * | 2006-12-05 | 2008-06-12 | National University Corporation Gunma University | 質量測定装置及びカンチレバ |
| WO2008126519A1 (ja) * | 2007-03-22 | 2008-10-23 | Shinshu University | センサー |
| JP2008241619A (ja) * | 2007-03-28 | 2008-10-09 | Gunma Univ | カンチレバー、バイオセンサ、及びプローブ顕微鏡 |
Non-Patent Citations (1)
| Title |
|---|
| JP特开2008-241619A 2008.10.09 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102209890A (zh) | 2011-10-05 |
| JP2010112888A (ja) | 2010-05-20 |
| JP5130422B2 (ja) | 2013-01-30 |
| US20110266919A1 (en) | 2011-11-03 |
| WO2010052841A1 (ja) | 2010-05-14 |
| US8258675B2 (en) | 2012-09-04 |
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Legal Events
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|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20150915 Address after: Tokyo, Japan, Japan Patentee after: Independent Administrative Corporation Industrial Comprehansive Technologles Institute Address before: Tokyo, Japan, Japan Patentee before: Independent Administrative Corporation Industrial Comprehansive Technologles Institute Patentee before: Olympus Corporation |
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| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130220 Termination date: 20181023 |