CN102169161A - Method for testing capacitive touch chip - Google Patents
Method for testing capacitive touch chip Download PDFInfo
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- CN102169161A CN102169161A CN201010550443XA CN201010550443A CN102169161A CN 102169161 A CN102169161 A CN 102169161A CN 201010550443X A CN201010550443X A CN 201010550443XA CN 201010550443 A CN201010550443 A CN 201010550443A CN 102169161 A CN102169161 A CN 102169161A
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Abstract
The invention relates to a method for testing a capacitive touch chip. In the method, a numerical value output by a comparer is compared with a theoretical voltage value to form a parameter, and then the parameter is compared with a preset parameter, therefore, the influence of errors can be overcome, and the defect of incapability of testing a chip because a direct output value is not matched with the preset parameter when the initial of a binary numerical value appearing in a test period is a symbol also can be overcome, and finally whether a chip is qualified or not is accurately judged and rapidly.
Description
Technical field
The present invention relates to a kind of method of touch-control chip, refer in particular to the method for testing of capacitance touching control chip.
Background technology
The method of testing of present capacitance touching control chip, generally all can use comparer, positive and negative two electrodes that are about to comparer are connected with two electric capacity respectively, and whether numerical value after comparer output and presupposition theory numerical value just can to judge chip qualified if being made comparisons.Please refer to shown in Figure 1ly, in the method for testing of this kind touch-control chip, if the numerical value of capacitor C 1 equals the numerical value of capacitor C 2, then the numerical value after comparer output should be zero, i.e. C1-C2=0; If the numerical value of capacitor C 1 is greater than the numerical value of capacitor C 2, then the numerical value through comparer output is exactly negative value, i.e. C1-C2＜0; If the numerical value of capacitor C 1 is less than the numerical value of capacitor C 2, then the numerical value through comparer output just is exactly, i.e. C1-C2＞0 is so just can adjust numerical value after comparer is exported by the size of adjusting capacitor C 1 and C2.
When capacitor C 1=C2, the numerical value of exporting through comparer just should be identical in theory, but in actual applications, because the existence of error, both can not be identical, promptly or the result of output be on the occasion of or the result of output be negative value, earlier the magnitude of voltage of hypothesis chip Design Theory is positive number U.Volt is so in the result of comparer test output, if greater than U.Volt, we can think high level, represent with numeral one; If less than U.Volt, we can think low level, represent with digital zero.Establishing a test period simultaneously is N time, through the magnitude of voltage and the theoretical voltage numerical value U of N continuous time judgement output.After lying prostrate relatively, just can form the new numerical value of forming by scale-of-two in N position, this new numerical value and parameter preset are made comparisons,, then think qualified chip if identical; If inequality, then think defective chip.If adopt the whether qualified of the direct test chip of above-mentioned classic method, because the new numerical value after the cycle detection and presupposition theory numerical value is just the same just can be considered to qualified after tested, and the influence that is used for error in the reality can not be identical, so just cause erroneous judgement easily, especially occurring under the situation that most significant digit is a sign bit, directly output valve and parameter preset are being done that to mate completely be the purpose that can't realize test chip.
Therefore, we wish to provide a kind of new method of testing, can effectively eliminate the influence of error, accurately and fast judge the qualified of chip.
Summary of the invention
The actual technical matters to be solved of the present invention is how a kind of promptly accurate method of quick testing capacitor formula touch-control chip again is provided.
In order to realize above-mentioned purpose of the present invention, the invention provides a kind of method of testing of capacitance touching control chip, it comprises comparer, its step is as follows: the magnitude of voltage of test comparer output in one-period; More above-mentioned magnitude of voltage is with the size of setting the theoretical voltage value and export the relevant parameters value; Thereby new numerical value of being made up of above-mentioned parameter and preset parameter value are made comparisons by turn and are formed a new binary numeral, detect it whether in the predeterminated voltage value range, thereby judge whether the touch-control chip is qualified.
The method of testing of capacitance touching control chip of the present invention, theoretical voltage value and preset parameter value when effectively utilizing chip design, by repeatedly comparing, overcome the influence of error, and also overcome at the first during in the binary numeral that in a test period, occurs for sign bit, directly output valve and parameter preset can't mate the shortcoming that causes realizing test chip, and the qualified of chip accurately and fast judged in final realization.
Description of drawings
Fig. 1 is the connection diagram of existing capacitance touching control chip testing;
Fig. 2 is the method for testing process flow diagram of capacitance touching control chip of the present invention.
Embodiment
The present invention is further illustrated below in conjunction with drawings and Examples.
The method of testing of capacitance touching control chip of the present invention need be utilized comparer, and positive and negative two electrodes that are about to comparer one end are connected on the power supply respectively with after two electric capacity are connected, and the other end of comparer is used for output voltage values.
When needs detected the capacitance touching control chip, at first we needed test chip magnitude of voltage after comparer output in a test period No, and establishing its theoretical voltage value is the Uo volt, preset parameter value be S1, S2, S3 ... .Sn (wherein Sn=0 or 1).Please refer to and Figure 2 shows that method step process flow diagram of the present invention, at first test the magnitude of voltage U that comparer 1 is exported in a test period, establish its be respectively U1, U2, U3 ... .Un; Comparative voltage U1, U2, U3 ... the size of .Un and theoretical voltage value Uo; If above-mentioned output voltage values U then thinks high voltage greater than Uo, represent with parameter 1, if above-mentioned output voltage values U then thinks low-voltage less than Uo, represent with another parameter 0.So we suppose U1＞Uo, U2＞Uo, U3＜Uo ... Un＞Uo, the numerical value that draws this moment is exactly (110......1) so; At this moment compare by turn with parameter preset Sn again, also establish this moment preset parameter value for (101......0), if the N position is identical, then export 0, if inequality, then export 1, just formed a new binary numeral (011......0) again through the above-mentioned back of comparing by turn so; Convert above-mentioned new binary numeral to corresponding decimal system numerical value again, just can confirm whether chip is qualified thereby make comparisons with the default qualified voltage value range of chip.
Above-mentioned setting theoretical voltage value and preset parameter value and predeterminated voltage value range just can be determined when chip design, and after the new binary numeral that obtains converts corresponding decimal system numerical value to, if its numerical value in chip predeterminated voltage scope, is then thought qualified chip; If not in described predeterminated voltage scope, then think defective chip.
The method of condenser type chip testing of the present invention, because by difference, not only simple, well overcome the influence of error, so can judge the whether qualified of chip accurately; And, even occur in the binary numeral in the method under the situation that most significant digit is a sign bit, owing to do not have the matching problem, so can reach the purpose of test chip.
Claims (10)
1. the method for testing of a capacitance touching control chip, it comprises comparer, its step is as follows:
The magnitude of voltage of test comparer output in one-period;
More above-mentioned magnitude of voltage is with the size of setting the theoretical voltage value and export the relevant parameters value;
Thereby new numerical value of being made up of above-mentioned parameter and preset parameter value are made comparisons by turn and are formed a new binary numeral, detect it whether in the predeterminated voltage value range, thereby judge whether the touch-control chip is qualified.
2. the method for claim 1, it is characterized in that: described more above-mentioned magnitude of voltage and the size of setting the theoretical voltage value, if output voltage values greater than the theoretical voltage value, is then exported a parameter, if output voltage values less than the theoretical voltage value, is then exported another parameter.
3. method as claimed in claim 2 is characterized in that: a described parameter is a nulling, and another parameter is meant one.
4. the method for claim 1 is characterized in that: relatively the time, both are identical as a certain position, then export a parameter by turn for described new numerical value and parameter preset; If inequality, then export another parameter.
5. method as claimed in claim 4 is characterized in that: if both are identical in a certain position of new numerical value and parameter preset, then output parameter is zero; If inequality, then output parameter one.
6. the method for claim 1, it is characterized in that: the new binary numeral of described formation need convert decimal system numerical value to and could make comparisons with the predeterminated voltage value range.
7. as any described method in the claim 1 to 6, it is characterized in that: if described new binary numeral in the predeterminated voltage numerical range, thinks that then the touch-control chip is qualified.
8. as any described method in the claim 1 to 6, it is characterized in that: if described new binary numeral not in the predeterminated voltage numerical range, thinks that then the touch-control chip is underproof.
9. the method for claim 1, it is characterized in that: described setting theoretical voltage value and preset parameter value and predeterminated voltage value range just can be determined when chip design.
10. the method for claim 1, it is characterized in that: the positive and negative electrode of described comparer is connected on the power supply respectively with after two electric capacity are connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN 201010550443 CN102169161B (en) | 2010-11-19 | 2010-11-19 | Method for testing capacitive touch chip |
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| CN 201010550443 CN102169161B (en) | 2010-11-19 | 2010-11-19 | Method for testing capacitive touch chip |
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| CN102169161A true CN102169161A (en) | 2011-08-31 |
| CN102169161B CN102169161B (en) | 2013-02-06 |
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| CN 201010550443 Expired - Fee Related CN102169161B (en) | 2010-11-19 | 2010-11-19 | Method for testing capacitive touch chip |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102288901A (en) * | 2011-09-01 | 2011-12-21 | 上海宏力半导体制造有限公司 | Method for processing emulated data |
| CN107037352A (en) * | 2017-04-06 | 2017-08-11 | 芯海科技（深圳）股份有限公司 | A kind of capacitance type touch control keys chip detection calibration system and method |
| CN107238788A (en) * | 2016-03-29 | 2017-10-10 | 深圳市汇顶科技股份有限公司 | Touch chip test system and its method of testing based on grid capacitive plate |
| CN113376506A (en) * | 2021-05-19 | 2021-09-10 | 深圳天德钰科技股份有限公司 | Chip testing system, driving chip, electronic tag and chip testing method |
| CN113640650A (en) * | 2021-08-13 | 2021-11-12 | 四川中微芯成科技有限公司 | Method and system for testing touch chip |
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| US20090201042A1 (en) * | 2006-07-17 | 2009-08-13 | Scanimetrics Inc. | Thin film transistor array having test circuitry |
| CN101621291A (en) * | 2009-08-05 | 2010-01-06 | 松翰科技股份有限公司 | Capacitance type touch control induction circuit |
| CN101796423A (en) * | 2007-05-08 | 2010-08-04 | 新思公司 | Production testing of a capacitive touch sensing device |
| CN101819496A (en) * | 2010-03-22 | 2010-09-01 | 苏州瀚瑞微电子有限公司 | Detection method of capacitance-type touch screen |
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2010
- 2010-11-19 CN CN 201010550443 patent/CN102169161B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US20070024333A1 (en) * | 2005-07-28 | 2007-02-01 | Fujitsu Limited | Power detection circuit for non-contact IC card or RFID tag |
| US20090201042A1 (en) * | 2006-07-17 | 2009-08-13 | Scanimetrics Inc. | Thin film transistor array having test circuitry |
| CN101796423A (en) * | 2007-05-08 | 2010-08-04 | 新思公司 | Production testing of a capacitive touch sensing device |
| CN101621291A (en) * | 2009-08-05 | 2010-01-06 | 松翰科技股份有限公司 | Capacitance type touch control induction circuit |
| CN101819496A (en) * | 2010-03-22 | 2010-09-01 | 苏州瀚瑞微电子有限公司 | Detection method of capacitance-type touch screen |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102288901A (en) * | 2011-09-01 | 2011-12-21 | 上海宏力半导体制造有限公司 | Method for processing emulated data |
| CN102288901B (en) * | 2011-09-01 | 2016-05-11 | 上海华虹宏力半导体制造有限公司 | A kind of processing method of emulated data |
| CN107238788A (en) * | 2016-03-29 | 2017-10-10 | 深圳市汇顶科技股份有限公司 | Touch chip test system and its method of testing based on grid capacitive plate |
| CN107238788B (en) * | 2016-03-29 | 2019-12-27 | 深圳市汇顶科技股份有限公司 | Touch chip test system based on matrix capacitor plate and test method thereof |
| CN107037352A (en) * | 2017-04-06 | 2017-08-11 | 芯海科技（深圳）股份有限公司 | A kind of capacitance type touch control keys chip detection calibration system and method |
| CN107037352B (en) * | 2017-04-06 | 2020-01-17 | 芯海科技（深圳）股份有限公司 | Capacitive touch key chip detection calibration system and method |
| CN113376506A (en) * | 2021-05-19 | 2021-09-10 | 深圳天德钰科技股份有限公司 | Chip testing system, driving chip, electronic tag and chip testing method |
| CN113640650A (en) * | 2021-08-13 | 2021-11-12 | 四川中微芯成科技有限公司 | Method and system for testing touch chip |
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| CN102169161B (en) | 2013-02-06 |
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