CN113376506A

CN113376506A - Chip testing system, driving chip, electronic tag and chip testing method

Info

Publication number: CN113376506A
Application number: CN202110545119.7A
Authority: CN
Inventors: 林立家; 朱畅
Original assignee: Shenzhen Tiandeyu Technology Co Ltd
Current assignee: Shenzhen Tiandeyu Technology Co Ltd
Priority date: 2021-05-19
Filing date: 2021-05-19
Publication date: 2021-09-10

Abstract

The application provides a chip test system, includes: the testing machine is used for electrically connecting a driving chip so as to output a testing instruction to the driving chip, so that the driving chip outputs a plurality of functional parameters; the comparison units are used for respectively and electrically connecting the driving chip and the test machine, receiving one of the functional parameters, judging whether the functional parameter is in a preset value range, and outputting a judgment result to the test machine; the test machine is also used for judging whether the drive chip works normally or abnormally according to a plurality of judgment results output by the comparison units. The application also provides a driving chip, an electronic tag and a chip testing method.

Description

Chip testing system, driving chip, electronic tag and chip testing method

Technical Field

The present disclosure relates to the field of parameter testing technologies, and in particular, to a chip testing system, a driving chip, an electronic tag using the driving chip, a chip testing method applied to the chip testing system, and a chip testing method applied to the driving chip.

Background

After the chip is manufactured, the function of the chip needs to be tested by a testing machine. The test machine station is used for sequentially judging whether the plurality of functional parameters meet the requirements so as to judge whether the chip is qualified. Generally, the functional parameters tested on one chip are dozens or even dozens, and the testing period is long as the testing machine tests a plurality of functional parameters in sequence.

Disclosure of Invention

A first aspect of the present application provides a chip testing system, comprising:

the testing machine is used for electrically connecting a driving chip so as to output a testing instruction to the driving chip, so that the driving chip outputs a plurality of functional parameters;

the comparison units are used for respectively and electrically connecting the driving chip and the test machine, receiving one of the functional parameters, judging whether the functional parameter is in a preset value range, and outputting a judgment result to the test machine;

the test machine is also used for judging whether the drive chip works normally or abnormally according to a plurality of judgment results output by the comparison units.

A second aspect of the present application provides a driver chip, where the driver chip is configured to receive a test instruction, and is configured to generate a plurality of functional parameters according to the test instruction;

the driving chip includes:

each comparison unit is used for receiving one of the plurality of functional parameters, judging whether the functional parameter is in a preset numerical range, and generating a judgment result;

and the data processing unit is electrically connected with the comparison units and used for receiving the judgment results output by the comparison units, generating and outputting a test result according to the judgment results, wherein the test result is used for indicating the normal work or abnormal work of the driving chip.

A third aspect of the present application provides an electronic tag comprising:

a display module;

and the driving chip is electrically connected with the display module and is used for outputting a driving signal to drive the display module to display product information.

A fourth aspect of the present application provides a chip testing method for testing a driver chip, including:

outputting a test instruction to the driving chip to enable the driving chip to output a plurality of functional parameters;

receiving the plurality of functional parameters, respectively judging whether the plurality of functional parameters are in a preset numerical range, and generating a plurality of judgment results;

and judging whether the driving chip works normally or abnormally according to the judgment results.

A fifth aspect of the present application provides a chip testing method for testing a driver chip, including:

receiving a test instruction to generate a plurality of functional parameters according to the test instruction;

respectively judging whether the plurality of functional parameters are in a preset numerical range, and generating a plurality of judgment results;

The chip testing system comprises a plurality of comparison units, wherein each comparison unit is used for receiving a functional parameter and judging whether the received functional parameter is located in the preset value range, and outputting a judgment result to the testing machine, and the comparison units can simultaneously judge whether the functional parameters are located in the corresponding preset value ranges. That is, a plurality of comparing units for when the test board outputs the test instruction to the driver chip, the driver chip can output a plurality of functional parameters simultaneously, and a plurality of comparing units can simultaneously judge whether a plurality of functional parameters are located in the corresponding preset value range and return the judgment result to the test board, so that the test board is prevented from outputting the test instruction for multiple times to obtain a plurality of functional parameters in a time-sharing manner, and the test duration of the driver chip is shortened.

Drawings

Fig. 1 is a schematic structural diagram of an electronic tag according to a first embodiment of the present application.

Fig. 2 is a schematic structural diagram of a driver chip and a chip test system according to a first embodiment of the present application.

Fig. 3 is a schematic structural diagram of a driver chip and a chip test system in a modified embodiment of the first embodiment of the present application.

Fig. 4 is a flowchart illustrating a chip testing method according to a first embodiment of the present application.

Fig. 5 is a schematic structural diagram of a driver chip and a tester in a second embodiment of the present application.

Fig. 6 is a schematic structural diagram of a driver chip and a tester in a modified embodiment of the second embodiment of the present application.

Fig. 7 is a flowchart illustrating a chip testing method according to a second embodiment of the present application.

Description of the main elements

Electronic label 10

Driver chip

100, 400

Display module 200

Chip test system 300

Testing machine

310, 500

Comparison units

320, 410

First comparator P1

Second comparators P2, P3

First end value V_up

Second end value V_low

Steps S11, S12, S13, S21, S22, S23

The following detailed description will further illustrate the invention in conjunction with the above-described figures.

Detailed Description

Example one

The electronic tag is mostly used in a scene where product information needs to be displayed, such as a supermarket shelf. Compared with the traditional paper label, the electronic label can change the displayed product information in real time according to the driving signal.

Referring to fig. 1, the electronic tag 10 includes a driving chip 100 and a display module 200. The driving chip 100 is electrically connected to the display module 200, and is configured to output a driving signal to the display module 200 to drive the display module 200 to display product information.

Before the driver chip 100 is shipped, a test is performed to evaluate whether the driver chip 100 is working normally or abnormally. In this embodiment, the driving chip 100 is detected by the chip testing system.

Referring to fig. 2, the chip testing system 300 includes a testing machine 310 and a plurality of comparing units 320. During the operation of the chip testing system 300, the testing machine 310 is electrically connected to the driving chip 100 to output a testing instruction to the driving chip 100, so that the driving chip 100 can output a plurality of functional parameters according to the testing instruction. The plurality of functional parameters may include an operating current IBIAS, a reference voltage VREF, a logic voltage VDD18, analog voltages VCOM, HVR, and the like. During the operation of the chip testing system 300, each comparing unit 320 is electrically connected to the driving chip 100 and the testing machine 310. Each comparing unit 320 is configured to receive one of the plurality of functional parameters, that is, the plurality of comparing units 320 are configured to receive the plurality of functional parameters in a one-to-one correspondence. Each comparing unit 320 is further configured to determine whether the received function parameter is within a preset value range, and output a determination result to the testing machine 310. Each functional parameter has a predetermined range, and different functional parameters have different predetermined ranges. The testing machine 310 is further configured to determine whether the driving chip 100 is working normally or working abnormally according to the plurality of determination results output by the plurality of comparing units 320.

In this embodiment, when all the functional parameters output by the comparing units 320 are within the predetermined range, the testing machine 310 determines that the driver chip 100 is working normally. That is, if any one of the functional parameters is not within the preset value range, the tester 310 determines that the driver chip 100 is abnormal.

In an alternative embodiment, when any one of the functional parameters is not within the predetermined range, the tester 310 does not directly determine that the driver chip 100 is abnormal, but first outputs a calibration command to the driver chip 100, so that the driver chip 100 outputs a calibrated functional parameter. The corrected function parameter is determined whether it is within the preset value range by a comparing unit 320. When the corrected function parameter is within the preset value range, the test machine 310 determines that the driver chip 100 is working normally. If the corrected functional parameter is still not within the preset value range, the test machine 310 determines that the driver chip 100 is abnormal.

In another modified embodiment, if the corrected functional parameter is still not within the preset value range, the testing machine 310 may further output a correction instruction again, so that the driving chip 100 outputs a corrected functional parameter again, and outputs a determination result again through a comparing unit 320, and so on. In this modified embodiment, a threshold of one time count may be set, for example, the threshold of the time count is set to 5 times, that is, the test machine 310 is configured to output the 5-time calibration command, and if the calibrated functional parameter obtained after the 5 th time calibration command is output is still not within the preset value range, the test machine 310 determines that the driver chip 100 is abnormal in operation.

When the functional parameter output by the driver chip 100 at a time is not in the preset value range, the driver chip 100 may not have a problem but may have an error during the output at the time, and the process of outputting the correction instruction and obtaining the corrected functional parameter may perform the correction on the functional parameter output by the driver chip 100 for a limited time, and it is determined whether the functional parameter output before is not in the preset value range by determining whether the corrected functional parameter is in the preset value range because the driver chip 100 itself has a problem or because an error exists, which is beneficial to avoiding misdetermination.

In the present embodiment, each comparing unit 320 includes a first comparator P1. Each first comparator P1 includes a first input terminal, a second input terminal, a third input terminal, and an output terminal. The first input terminal is used for inputting a first terminal value V_upA second input terminal for inputting a second terminal value V_lowAnd the third input end is electrically connected to the driving chip 100 and is used for inputting one of the functional parameters. The first input terminal and the second input terminal can be electrically connected to the driving chip 100 or the testing machine 310 for inputting the first terminal value V_upAnd said second end value V_low. First end value V_upI.e. the upper limit value, the second end value V of the preset numerical range_lowI.e. the lower limit value, the first end value V of the preset numerical range_upAnd a second end value V_lowFor defining said preset range of values.

The first comparator P1 is used for determining whether the functional parameter inputted from the third input terminal is at the first terminal value V_upAnd a second end value V_lowWithin the defined preset numerical range. When the judgment result is yes, the output end of the first comparator P1 outputs a logic signal '1' for indicating that the functional parameter input by the third input end is at the first end value V_upAnd a second end value V_lowWithin the defined preset numerical range. When the judgment result is negative, the output end of the first comparator P1 outputs a logic signal '0' for indicating that the functional parameter input by the third input end is not located at the first end value V_upAnd a second end value V_lowWithin the defined preset numerical range. The logic signals "1" and "0" are the above judgment results. Each first comparator P1 outputs the determination result, the plurality of comparing units 320 includes a plurality of first comparators P1, and the plurality of comparing units 320 outputs a plurality of determination results.

The output end of each first comparator P1 is electrically connected to the testing machine 310, and the testing machine 310 is configured to receive the plurality of determination results and determine whether the driving chip 100 is working normally or abnormally according to the plurality of determination results.

Referring to FIG. 3, in an alternative embodiment, each timeThe comparison unit 320 includes two second comparators P2 and P3. The second comparator P2 has a non-inverting input terminal, an inverting input terminal and an output terminal. The second comparator P3 is identical in structure to the second comparator P2. The inverting input terminal of the second comparator P2 is used for inputting a first terminal value V_upThe inverting input terminal of the second comparator P3 is used for inputting a second terminal V_low. The positive input terminals of the second comparator P2 and the second comparator P3 are electrically connected to each other and then electrically connected to the driving chip 100 for inputting a functional parameter.

First end value V_upI.e. the upper limit value, the second end value V of the preset numerical range_lowI.e. the lower limit value, the first end value V of the preset numerical range_upAnd a second end value V_lowFor defining said preset range of values. The second comparator P2 is used for determining whether the functional parameter inputted from the non-inverting input terminal is smaller than the first terminal V_up. When the judgment result is yes, the output end of the second comparator P2 outputs a logic signal '1' for indicating that the functional parameter input at the non-inverting input end is smaller than the first end value V_up. When the judgment result is negative, the output end of the second comparator P2 outputs a logic signal '0' for indicating that the functional parameter input at the non-inverting input end is not less than the first terminal value V_up. The logic signals "1" and "0" are the above judgment results. The second comparator P3 is used for determining whether the functional parameter inputted from the non-inverting input terminal is greater than the second terminal V_low. When the judgment result is yes, the output end of the second comparator P3 outputs a logic signal '1' for indicating that the functional parameter input at the non-inverting input end is greater than the second end value V_low. When the judgment result is negative, the output end of the second comparator P3 outputs a logic signal '0' for indicating that the functional parameter input at the non-inverting input end is not more than the second end value V_low. The logic signals "1" and "0" are the above judgment results.

Each second comparator outputs one of the determination results, each comparing unit 320 outputs two determination results, and the comparing units 320 output a plurality of determination results. The output end of each second comparator is electrically connected to the test machine 310, and the test machine 310 is configured to receive the multiple determination results and determine whether the driving chip 100 is working normally or working abnormally according to the multiple determination results.

The present embodiment further provides a chip testing method, which is applied to the chip testing system 300, and please refer to fig. 4, the chip testing method includes:

step S11, outputting a test command to the driver chip, so that the driver chip outputs a plurality of functional parameters;

step S12, receiving the plurality of function parameters, respectively determining whether the plurality of function parameters are within a preset numerical range, and generating a plurality of determination results;

and step S13, judging whether the driving chip works normally or abnormally according to the judgment results.

In this embodiment, step S13 specifically includes: and when any judgment result in the plurality of judgment results is that the functional parameter is not in the preset numerical range, judging that the driving chip works abnormally.

In an alternative embodiment, when any one of the determination results is that the functional parameter is not within the preset value range, the chip testing method further includes:

step S14, outputting a calibration command to the driver chip, so that the driver chip outputs a calibrated functional parameter;

and step S15, when the corrected functional parameter is within the preset value range, judging that the driving chip works normally, and when the corrected functional parameter is not within the preset value range, judging that the driving chip works abnormally or outputting a correction instruction again.

The aforementioned steps S11-S15 refer to the functional descriptions of the driver chip 100, the tester 310 and the comparison unit 320, and are not repeated herein.

The chip testing system 300 of the present embodiment includes a plurality of comparing units 320, each of which is configured to receive a function parameter and determine whether the received function parameter is within the preset value range, and output the determination result to the testing machine 310, so that the comparing units 320 can simultaneously determine whether the function parameters are within the corresponding preset value ranges. That is, by the comparing units 320, when the testing machine 310 outputs the testing instruction to the driving chip 100, the driving chip 100 can output a plurality of functional parameters at the same time, and the comparing units 320 can simultaneously determine whether the functional parameters are within the corresponding preset value range and return the determination result to the testing machine 310, so as to prevent the testing machine from outputting the testing instruction multiple times to obtain the functional parameters at different times, which is beneficial to shortening the testing time of the driving chip 100.

Example two

Referring to fig. 5, the driving chip 400 provided in the present embodiment is mainly different from the driving chip 100 in the first embodiment in that: in this embodiment, the driving chip 400 includes a plurality of comparing units 410. That is, in the embodiment, the comparing units 410 belong to functional components packaged in the driving chip 400, but are not externally connected to the driving chip 400. In this embodiment, the driving chip 400 further includes a data processing unit 420. The data processing unit 420 is electrically connected to the comparing units 410 respectively, and is used for cooperating with the comparing units 410 to test the driving chip 400.

In this embodiment, the driving chip 400 is electrically connected to a testing machine 500. The testing machine 500 is used for outputting a testing instruction. The driver chip 400 is configured to receive the test instruction and generate a plurality of functional parameters according to the test instruction.

Each comparing unit 410 is configured to receive one of the function parameters, determine whether the function parameter is within a preset value range, and generate a determination result. In the present embodiment, each comparing unit 410 includes a first comparator P1. Each first comparator P1 includes a first input terminal, a second input terminal, a third input terminal, and an output terminal. The first input terminal is electrically connected to the data processing unit 420 for inputting the first terminal value V_upThe second input terminal is electrically connected to the data processing unit 420 for inputting the second terminal value V_lowAnd the third input end is electrically connected to the data processing unit 420 for inputting a functional parameter. First end value V_upI.e. the upper limit of the preset numerical rangeValue, second end value V_lowI.e. the lower limit value, the first end value V of the preset numerical range_upAnd a second end value V_lowFor defining said preset range of values.

The operation principle of each comparing unit 410 is substantially the same as the judgment principle of the comparing unit 320 shown in fig. 2, and is not described again.

The output end of each first comparator P1 is electrically connected to the data processing unit 420, and the data processing unit 420 is configured to receive the plurality of determination results and generate a test result according to the plurality of determination results. The data processing unit 420 is electrically connected to the testing machine 500, and is configured to output the testing result to the testing machine 500.

In this embodiment, when the determination results output by the comparing units 410 are that all the functional parameters are within the preset value range, the data processing unit 420 determines that the driver chip 400 is working normally, and outputs a test result indicating that the driver chip 400 is working normally to the testing machine 500. That is, if any one of the functional parameters is not within the preset value range, the data processing unit 420 determines that the driver chip 400 is abnormal in operation, and outputs a test result indicating that the driver chip 400 is abnormal in operation to the test machine 500.

In an alternative embodiment, when any one of the plurality of functional parameters is not within the predetermined range, the data processing unit 420 does not directly determine that the driver chip 400 is abnormal, but generates a calibration command first, so that the driver chip 400 generates a calibrated functional parameter. The corrected function parameter is determined whether it is within the preset value range by a comparing unit 410. When the corrected function parameter is within the preset value range, the data processing unit 420 determines that the driving chip 400 is working normally. If the corrected functional parameter is still not within the preset value range, the data processing unit 420 determines that the driving chip 400 is abnormal.

In another modified embodiment, if the corrected function parameter is still not within the preset value range, the data processing unit 420 may further generate a correction instruction again, so that the driver chip 400 generates a corrected function parameter again, and outputs a determination result again through the data processing unit 420, and so on. In this modified embodiment, a threshold of the number of times may be set, for example, the threshold of the number of times is set to 5 times, that is, the data processing unit 420 is configured to generate 5 times of the correction instruction, and if the corrected function parameter obtained after the 5 th generation of the correction instruction is still not within the preset value range, the data processing unit 420 determines that the driver chip 400 operates abnormally.

When the functional parameter output by the driver chip 400 at a time is not in the preset value range, the driver chip 400 may not have a problem but may have an error during the output at the time, and the process of outputting the correction instruction and obtaining the corrected functional parameter may perform the correction on the functional parameter output by the driver chip 400 for a limited time, and it is determined whether the functional parameter output before is not in the preset value range by determining whether the corrected functional parameter is in the preset value range because the driver chip 400 itself has a problem or because an error exists, which is beneficial to avoiding misdetermination.

Referring to fig. 6, each comparing unit includes two second comparators, i.e., a second comparator P2 and a second comparator P3. The second comparator P2 has a non-inverting input terminal, an inverting input terminal and an output terminal. The second comparator P3 is identical in structure to the second comparator P2. The inverting input terminal of the second comparator P2 is used for inputting a first terminal value V_upThe inverting input terminal of the second comparator P3 is used for inputting a second terminal V_low. The non-inverting input terminals of the second comparator P2 and the second comparator P3 are electrically connected to each other and then electrically connected to the data processing unit 420 for inputting a functional parameter.

The specific operation of the comparing unit 410 in fig. 6 is substantially the same as the specific operation of the comparing unit 320 in fig. 3, and is not repeated herein.

The output ends of the second comparator P2 and the second comparator P3 are respectively electrically connected with the data processing unit 420. For outputting the judgment result to the data processing unit 420.

The present embodiment further provides a chip testing method applied to the driving chip 400, please refer to fig. 7, and the chip testing method includes:

step S21, receiving a test instruction to generate a plurality of functional parameters according to the test instruction;

step S22, respectively judging whether the plurality of function parameters are in a preset numerical range, and generating a plurality of judgment results;

and step S23, judging whether the driving chip works normally or abnormally according to the judgment results.

In this embodiment, step S23 specifically includes: and when any judgment result in the plurality of judgment results is that the functional parameter is not in the preset numerical range, judging that the driving chip works abnormally.

step S24, generating a calibration command to generate a calibrated function parameter according to the calibration command;

step S25, when the corrected function parameter is within the preset value range, it is determined that the driver chip is working normally, and when the corrected function parameter is not within the preset value range, it is determined that the driver chip is working abnormally or a correction instruction is generated again.

In the above steps S21-S25, reference may be made to the functional description of the driver chip 400 (including the comparison unit 410 and the data processing unit 420) and the testing machine 500, which are not repeated herein.

On the basis that the driver chip 400 and the chip testing method of the embodiment can achieve all the advantages of the chip testing system 300 of the embodiment, in the embodiment, the plurality of comparing units 410 are located inside the driver chip 400, and the driver chip 400 further includes the data processing unit 420 matched with the driver chip 400, so that the driver chip 400 can conveniently perform self-detection.

Since the comparing units 410 occupy the space of the driving chip 400 in the driving chip 400, compared to the embodiment, the embodiment is advantageous for reducing the volume of the driving chip 100 and reducing the manufacturing cost of the driving chip 100.

It will be appreciated by those skilled in the art that the above embodiments are illustrative only and not intended to be limiting, and that suitable modifications and variations may be made to the above embodiments without departing from the true spirit and scope of the invention.

Claims

1. A chip test system, comprising:

2. The chip testing system according to claim 1, wherein the testing machine determines that the driver chip is working abnormally when any one of the plurality of determination results indicates that the functional parameter is not within the preset value range.

3. The chip testing system according to claim 1, wherein when any one of the plurality of determination results is that the function parameter is not within the preset value range, the testing machine is configured to output a calibration instruction to the driver chip so that the driver chip outputs a calibrated function parameter, when the calibrated function parameter is within the preset value range, the testing machine determines that the driver chip operates normally, and when the calibrated function parameter is not within the preset value range, the testing machine determines that the driver chip operates abnormally or outputs a calibration instruction again.

4. The chip test system according to claim 1, wherein each of the comparing units comprises a first comparator having a first input terminal, a second input terminal, a third input terminal, and an output terminal;

the first input end is used for inputting a first end value, the second input end is used for inputting a second end value, the first end value and the second end value are used for limiting the preset numerical range, the third input end is electrically connected with the driving chip and used for inputting one functional parameter, and the output end is electrically connected with the test machine and used for outputting one judgment result to the test machine.

5. The chip test system according to claim 1, wherein each of the comparison units comprises two second comparators, each of the second comparators having a non-inverting input terminal, an inverting input terminal and an output terminal;

the inverted input ends of the two second comparators are respectively used for inputting a first end value and a second end value, the first end value and the second end value are used for limiting the preset value range, the normal phase input ends of the two second comparators are mutually and electrically connected and are used for inputting one functional parameter, and the output ends of the two second comparators are respectively and electrically connected with the test machine table and are used for respectively outputting one judgment result to the test machine table.

6. The driver chip is characterized in that the driver chip is used for receiving a test instruction and generating a plurality of functional parameters according to the test instruction;

the driving chip includes:

7. The driver chip according to claim 6, wherein when any of the plurality of determination results is that the functional parameter is not within the preset value range, the data processing unit determines that the driver chip is abnormal.

8. The driver chip according to claim 6, wherein when any of the plurality of determination results is that the function parameter is not within the preset value range, the data processing unit is configured to generate a correction instruction, so that the driver chip generates a corrected function parameter, when the corrected function parameter is within the preset value range, the data processing unit determines that the driver chip is working normally, and when the corrected function parameter is not within the preset value range, the data processing unit determines that the driver chip is working abnormally or generates a correction instruction again.

9. The driver chip of claim 6, wherein each of the comparison units comprises a first comparator having a first input terminal, a second input terminal, a third input terminal, and an output terminal;

the first input end is used for inputting a first end value, the second input end is used for inputting a second end value, the first end value and the second end value are used for limiting the preset numerical range, the third input end is used for inputting a functional parameter, and the output end is electrically connected with the data processing unit and used for outputting a judgment result to the data processing unit.

10. The driver chip of claim 6, wherein each of the comparison units comprises two second comparators, each of the second comparators having a non-inverting input terminal, an inverting input terminal, and an output terminal;

the inverting input ends of the two second comparators are respectively used for inputting a first end value and a second end value, the first end value and the second end value are used for limiting the preset value range, the positive phase input ends of the two second comparators are mutually and electrically connected and are used for inputting one functional parameter, and the output ends of the two second comparators are respectively and electrically connected with the data processing unit and are used for respectively outputting one judgment result to the data processing unit.

11. An electronic tag, comprising:

a display module;

the driving chip is electrically connected with the display module, the driving chip is as claimed in any one of claims 6 to 10, and the driving chip is further used for outputting a driving signal to drive the display module to display product information.

12. A chip testing method is used for testing a driving chip, and is characterized by comprising the following steps:

13. The chip testing method according to claim 12, wherein the step of determining whether the driver chip is working normally or abnormally according to the plurality of determination results specifically comprises:

and when any judgment result in the plurality of judgment results is that the functional parameter is not in the preset numerical range, judging that the driving chip works abnormally.

14. The chip testing method according to claim 12, wherein when any one of the plurality of determination results is that the functional parameter is not within the preset value range, the chip testing method further comprises:

outputting a correction instruction to the driving chip to enable the driving chip to output a corrected functional parameter;

and when the corrected functional parameter is not within the preset numerical range, judging that the driving chip works abnormally or outputting a correction instruction again.

15. A chip testing method is used for testing a driving chip, and is characterized by comprising the following steps:

16. The chip testing method according to claim 15, wherein the step of determining whether the driver chip is working normally or abnormally according to the plurality of determination results specifically comprises:

17. The chip testing method according to claim 15, wherein when any one of the plurality of determination results is that the functional parameter is not within the preset value range, the chip testing method further comprises:

generating a correction instruction to generate a corrected functional parameter according to the correction instruction;

and when the corrected functional parameter is not within the preset numerical range, judging that the driving chip works abnormally or generating a correction instruction again.