CN102169161B - Method for testing capacitive touch chip - Google Patents
Method for testing capacitive touch chip Download PDFInfo
- Publication number
- CN102169161B CN102169161B CN 201010550443 CN201010550443A CN102169161B CN 102169161 B CN102169161 B CN 102169161B CN 201010550443 CN201010550443 CN 201010550443 CN 201010550443 A CN201010550443 A CN 201010550443A CN 102169161 B CN102169161 B CN 102169161B
- Authority
- CN
- China
- Prior art keywords
- parameter
- value
- voltage value
- chip
- capacitive touch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention relates to a method for testing a capacitive touch chip. In the method, a numerical value output by a comparer is compared with a theoretical voltage value to form a parameter, and then the parameter is compared with a preset parameter, therefore, the influence of errors can be overcome, and the defect of incapability of testing a chip because a direct output value is not matched with the preset parameter when the initial of a binary numerical value appearing in a test period is a symbol also can be overcome, and finally whether a chip is qualified or not is accurately judged and rapidly.
Description
Technical field
The present invention relates to a kind of method of touch-control chip, refer in particular to the method for testing of capacitive touch chip.
Background technology
The method of testing of present capacitive touch chip, generally all can use comparer, positive and negative two electrodes that are about to comparer are connected with two electric capacity respectively, and whether the numerical value after comparer output and presupposition theory numerical value just can to judge chip qualified if being made comparisons.Please refer to shown in Figure 1ly, in the method for testing of this kind touch-control chip, if the numerical value of capacitor C 1 equals the numerical value of capacitor C 2, then the numerical value after comparer output should be zero, i.e. C1-C2=0; If the numerical value of capacitor C 1 is greater than the numerical value of capacitor C 2, then the numerical value through comparer output is exactly negative value, i.e. C1-C2＜0; If the numerical value of capacitor C 1 is less than the numerical value of capacitor C 2, then the numerical value through comparer output just is exactly, i.e. C1-C2＞0 is so just can adjust numerical value after comparer is exported by the size of adjusting capacitor C 1 and C2.
When capacitor C 1=C2, the numerical value of exporting through comparer just should be identical in theory, but in actual applications, because the existence of error, both can not be identical, namely or output the result be on the occasion of or output the result be negative value, the magnitude of voltage of supposing first the chip Theoretical Design is positive number U.Volt is so in the result of comparer test output, if greater than U.Volt, we can think high level, represent with numeral one; If less than U.Volt, we can think low level, represent with digital zero.Establishing simultaneously a test period is N time, through magnitude of voltage and the theoretical voltage numerical value U of N continuous time judgement output.After lying prostrate relatively, just can form the new numerical value in N position that is formed by scale-of-two, this new numerical value and parameter preset are made comparisons, if identical, then think qualified chip; If not identical, then think defective chip.If adopt the whether qualified of the direct test chip of above-mentioned classic method, because the new numerical value after the cycle detection and presupposition theory numerical value is just the same just can be considered to qualified after tested, and the impact that is used for error in the reality can not be identical, so just easily cause erroneous judgement, especially in the situation that most significant digit to occur be sign bit, directly output valve and parameter preset are done that to mate completely be the purpose that can't realize test chip.
Therefore, we wish to provide a kind of new method of testing, can effectively eliminate the impact of error, accurately and fast judge the qualified of chip.
Summary of the invention
The actual technical matters to be solved of the present invention is how a kind of method of namely accurately testing fast again capacitive touch chip is provided.
In order to realize above-mentioned purpose of the present invention, the invention provides a kind of method of testing of capacitive touch chip, the positive and negative electrode of described comparer is connected on the power supply after an electric capacity connects with being connected respectively, it comprises comparer, and its step is as follows: the magnitude of voltage of test comparer output in one-period; More above-mentioned magnitude of voltage is with the size of setting the theoretical voltage value and export corresponding parameter value; Thereby the new numerical value that is comprised of the above-mentioned parameter value and preset parameter value are made comparisons by turn and are formed a new binary numeral, detect it whether in the predeterminated voltage value range, thereby judge whether capacitive touch chip is qualified.
The method of testing of capacitive touch chip of the present invention, theoretical voltage value and preset parameter value when effectively utilizing chip design, by repeatedly comparing, overcome the impact of error, and also overcome for the first during for sign bit in the binary numeral that within a test period, occurs, directly output valve and parameter preset can't mate the shortcoming that causes realizing test chip, and the qualified of chip accurately and fast judged in final realization.
Description of drawings
Fig. 1 is the connection diagram of existing capacitance touching control chip testing;
Fig. 2 is the method for testing process flow diagram of capacitive touch chip of the present invention.
Embodiment
The present invention is further illustrated below in conjunction with drawings and Examples.
The method of testing of capacitive touch chip of the present invention need to be utilized comparer, and positive and negative two electrodes that are about to comparer one end are connected on the power supply after an electric capacity connects with being connected respectively, and the other end of comparer is used for output voltage values.
When needs Detection capacitance formula touch-control chip, at first we need test chip magnitude of voltage after comparer output in a test period No, if its theoretical voltage value is Uo volt, preset parameter value be S1, S2, S3 ... .Sn (wherein Sn=0 or 1).Please refer to and Figure 2 shows that method step process flow diagram of the present invention, at first test the magnitude of voltage U that comparer 1 is exported within a test period, establish its be respectively U1, U2, U3 ... .Un; Comparative voltage U1, U2, U3 ... the size of .Un and theoretical voltage value Uo; If above-mentioned output voltage values U then thinks high voltage greater than Uo, represent with parameter 1, if above-mentioned output voltage values U then thinks low-voltage less than Uo, represent with another parameter 0.So we suppose U1＞Uo, U2＞Uo, U3＜Uo ... Un＞Uo, the numerical value that draws this moment so is exactly (110......1); At this moment compare by turn with parameter preset Sn again, also establish this moment preset parameter value for (101......0), if the N position is identical, then export 0, if not identical, then export 1, just formed again a new binary numeral (011......0) after relatively by turn through above-mentioned so; Decimal system numerical value corresponding to above-mentioned new binary numeral convert again to, just can confirm whether chip is qualified thereby make comparisons with the default qualified voltage value range of chip.
Above-mentioned setting theoretical voltage value and preset parameter value and predeterminated voltage value range just can be determined when chip design, and after the new binary numeral that obtains converts corresponding decimal system numerical value to, if its numerical value is then thought qualified chip in chip predeterminated voltage scope; If in described predeterminated voltage scope, then do not think defective chip.
The method of condenser type chip testing of the present invention, because by difference, not only simple, well overcome the impact of error, so can judge accurately the whether qualified of chip; And, even occur in the binary numeral in the method in the situation that most significant digit is sign bit, owing to do not have the matching problem, so can reach the purpose of test chip.
Claims (9)
1. the method for testing of a capacitive touch chip, it comprises comparer, and the positive and negative electrode of described comparer is connected on the power supply after an electric capacity connects with being connected respectively, and its step is as follows:
The magnitude of voltage of test comparer output in one-period;
More above-mentioned magnitude of voltage is with the size of setting the theoretical voltage value and export corresponding parameter value;
Thereby the new numerical value that is comprised of the above-mentioned parameter value and preset parameter value are made comparisons by turn and are formed a new binary numeral, detect it whether in the predeterminated voltage value range, thereby judge whether capacitive touch chip is qualified.
2. the method for claim 1, it is characterized in that: described more above-mentioned magnitude of voltage and the size of setting the theoretical voltage value, if output voltage values is then exported a parameter greater than setting the theoretical voltage value, if output voltage values is then exported another parameter less than setting the theoretical voltage value.
3. method as claimed in claim 2, it is characterized in that: a described parameter is nulling, and another parameter refers to one.
4. the method for claim 1 is characterized in that: relatively the time, both are identical such as a certain position, then export a parameter by turn for described new numerical value and preset parameter value; If not identical, then export another parameter.
5. method as claimed in claim 4 is characterized in that: if both are identical in a certain position of new numerical value and preset parameter value, then output parameter is zero; If not identical, then output parameter one.
6. the method for claim 1, it is characterized in that: the new binary numeral of described formation need convert decimal system numerical value to and could make comparisons with the predeterminated voltage value range.
7. such as the described method of any one in the claim 1 to 6, it is characterized in that: if described new binary numeral in the predeterminated voltage value range, thinks then that capacitive touch chip is qualified.
8. such as the described method of any one in the claim 1 to 6, it is characterized in that: if described new binary numeral not in the predeterminated voltage value range, thinks then that capacitive touch chip is underproof.
9. the method for claim 1, it is characterized in that: described setting theoretical voltage value and preset parameter value and predeterminated voltage value range just can be determined when chip design.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010550443 CN102169161B (en) | 2010-11-19 | 2010-11-19 | Method for testing capacitive touch chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010550443 CN102169161B (en) | 2010-11-19 | 2010-11-19 | Method for testing capacitive touch chip |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102169161A CN102169161A (en) | 2011-08-31 |
| CN102169161B true CN102169161B (en) | 2013-02-06 |
Family
ID=44490395
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201010550443 Expired - Fee Related CN102169161B (en) | 2010-11-19 | 2010-11-19 | Method for testing capacitive touch chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102169161B (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102288901B (en) * | 2011-09-01 | 2016-05-11 | 上海华虹宏力半导体制造有限公司 | A kind of processing method of emulated data |
| CN107238788B (en) * | 2016-03-29 | 2019-12-27 | 深圳市汇顶科技股份有限公司 | Touch chip test system based on matrix capacitor plate and test method thereof |
| CN107037352B (en) * | 2017-04-06 | 2020-01-17 | 芯海科技（深圳）股份有限公司 | Capacitive touch key chip detection calibration system and method |
| CN113376506A (en) * | 2021-05-19 | 2021-09-10 | 深圳天德钰科技股份有限公司 | Chip testing system, driving chip, electronic tag and chip testing method |
| CN113640650B (en) * | 2021-08-13 | 2024-07-02 | 四川中微芯成科技有限公司 | Method and system for testing touch chip |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101621291A (en) * | 2009-08-05 | 2010-01-06 | 松翰科技股份有限公司 | Capacitance type touch control induction circuit |
| CN101796423A (en) * | 2007-05-08 | 2010-08-04 | 新思公司 | Production testing of a capacitive touch sensing device |
| CN101819496A (en) * | 2010-03-22 | 2010-09-01 | 苏州瀚瑞微电子有限公司 | Detection method of capacitance-type touch screen |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4248535B2 (en) * | 2005-07-28 | 2009-04-02 | 富士通マイクロエレクトロニクス株式会社 | Power detection circuit |
| JP5380286B2 (en) * | 2006-07-17 | 2014-01-08 | スキャニメトリクス，インコーポレイテッド | Thin film transistor array having inspection circuit |
-
2010
- 2010-11-19 CN CN 201010550443 patent/CN102169161B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101796423A (en) * | 2007-05-08 | 2010-08-04 | 新思公司 | Production testing of a capacitive touch sensing device |
| CN101621291A (en) * | 2009-08-05 | 2010-01-06 | 松翰科技股份有限公司 | Capacitance type touch control induction circuit |
| CN101819496A (en) * | 2010-03-22 | 2010-09-01 | 苏州瀚瑞微电子有限公司 | Detection method of capacitance-type touch screen |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102169161A (en) | 2011-08-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101477152B (en) | Capacitance detection apparatus and method | |
| CN102169161B (en) | Method for testing capacitive touch chip | |
| CN104459400A (en) | Detection circuit and detection method used for self-contained touch screen | |
| CN102866322B (en) | A kind of touching device detection method | |
| CN107219961B (en) | Capacitance compensation mould group, method, self-tolerant touch-control display panel and device | |
| CN102539895A (en) | USB (universal serial bus) port detecting circuit | |
| CN104020407B (en) | A kind of method of testing of Integrated circuit electrostatic barrier propterty | |
| CN102207899B (en) | Device for testing universal serial bus port | |
| CN103414474B (en) | High-precision small-signal difference analog-digital converter | |
| CN105094448B (en) | Change-over circuit, conversion method and contact panel | |
| CN102185604A (en) | Differential detection circuit for capacitive touch | |
| CN109282856A (en) | It is a kind of while detecting temperature/voltage/current signal single-chip sensor | |
| CN101847070B (en) | Capacitance change detection module taking electric signal change time as detection target | |
| CN103634723A (en) | Audio input circuit and electronic device with audio input | |
| CN102087335B (en) | Circuit signal detection device | |
| CN202929127U (en) | Circuit for detecting three-phase electricity phase sequence and open phase | |
| CN106547332B (en) | Reset circuit of starting power source, power initiation remapping method and its electronic device | |
| CN206749566U (en) | A kind of wake-up circuit | |
| CN103033768A (en) | Power source testing system | |
| CN206451196U (en) | A kind of fingerprint identification module | |
| CN204761416U (en) | AD converting circuit for test system is moved to microbit | |
| CN206004646U (en) | Numeral input multiplex circuit | |
| CN204945294U (en) | With the incremental type encoder offline detection circuit of UVW magnetic-pole signals | |
| US20130009885A1 (en) | Touch control sensing apparatus and method thereof | |
| CN211402533U (en) | Automatic module and system of patrolling and examining of multichannel voltage |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130206 Termination date: 20171119 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |