CN102062617A - Method and device for generating reference quantity and measurement system - Google Patents
Method and device for generating reference quantity and measurement system Download PDFInfo
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- CN102062617A CN102062617A CN 201010590348 CN201010590348A CN102062617A CN 102062617 A CN102062617 A CN 102062617A CN 201010590348 CN201010590348 CN 201010590348 CN 201010590348 A CN201010590348 A CN 201010590348A CN 102062617 A CN102062617 A CN 102062617A
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Abstract
The invention discloses a method and a device for generating reference quantity and a measurement system. The method for generating the reference quantity comprises the following steps of: acquiring physical quantity of an environment of the electronic measurement system; and obtaining the reference quantity according to the physical quantity. By the method and the device, the output of the measurement system can accurately reflect the actual output of a measurement device.
Description
Technical field
The present invention relates to fields of measurement, in particular to a kind of production method of datum quantity and device, measuring system.
Background technology
Fig. 1 is the synoptic diagram according to the measuring system of correlation technique.
Wherein, the output V1 of measuring system changes and monotone variation with distance x, and V1 changes with temperature T.(a is that distance is a, the output of the system when temperature is T1 T1) to V1.In some applications, in order to take out system's output of a～x distance, (a T1), gets difference output V2, that is: V2=|V1-Vref| by subtracter A2 with V1 and Vref then can to set Vref=V1.But in this measuring system, owing to V1 varies with temperature, and Vref fixes, so after temperature became T2 by T1, the voltage that V2 represents no longer was the actual output of the system of a～x.
Often can not reflect that at datum quantity in the correlation technique external environment changes, so cause utilizing output that datum quantity produces often can not the reflected measurement system in the problem of actual output of measurement mechanism, effective solution is not proposed at present as yet.
Summary of the invention
Often can not reflect that at datum quantity in the correlation technique external environment changes, and then cause utilizing output that datum quantity produces often can not the reflected measurement system in measurement mechanism actual output problem and the present invention is proposed, for this reason, fundamental purpose of the present invention is to provide a kind of production method of datum quantity and device, measuring system, to address the above problem.
To achieve these goals, according to an aspect of the present invention, provide a kind of production method of datum quantity.The production method of this datum quantity comprises: the physical quantity of obtaining electronic measurement system environment of living in; Obtain datum quantity according to described physical quantity.
To achieve these goals, according to a further aspect in the invention, provide a kind of generation device of datum quantity.The generation device of this datum quantity comprises: acquiring unit is used to obtain the physical quantity of electronic measurement system environment of living in; Control module obtains datum quantity according to described physical quantity.
To achieve these goals, according to a further aspect in the invention, provide a kind of generation device of datum quantity.The generation device of this datum quantity comprises: acquiring unit is used to obtain the physical quantity of electronic measurement system environment of living in; Control module obtains the benchmark intermediate quantity according to described physical quantity; Digital-analogue converting device is used for described datum quantity intermediate quantity is carried out digital-to-analogue conversion, obtains datum quantity.
To achieve these goals, according to a further aspect in the invention, provide a kind of measuring system.This measuring system comprises: proving installation, be used to carry out test operation, and obtain first output valve; According to the generation device of datum quantity of the present invention, be used to produce datum quantity; Substracting unit is used for obtaining second output valve according to described first output valve and described datum quantity, as the output valve of described test macro.
By the present invention, adopt and obtain temperature signal; Obtain the method for datum quantity according to described temperature signal, can consider the influence of temperature to datum quantity, solved in the correlation technique datum quantity and often can not reflect that external environment changes, and then cause utilizing output that datum quantity produces often can not the reflected measurement system in the problem of actual output of measurement mechanism, and then reached and make datum quantity can reflect that external environment changes so that the accurate effect of the actual output of reflected measurement device of the output of measuring system.
Description of drawings
Accompanying drawing described herein is used to provide further understanding of the present invention, constitutes the application's a part, and illustrative examples of the present invention and explanation thereof are used to explain the present invention, do not constitute improper qualification of the present invention.In the accompanying drawings:
Fig. 1 is the synoptic diagram according to the measuring system of correlation technique;
Fig. 2 is the synoptic diagram according to the generation device of the datum quantity of first embodiment of the invention;
Fig. 3 is the synoptic diagram according to the generation device of the datum quantity of second embodiment of the invention;
Fig. 4 is the synoptic diagram according to the measuring system of the embodiment of the invention;
Fig. 5 is the process flow diagram according to the production method of the datum quantity of the embodiment of the invention; And
Fig. 6 is the synoptic diagram according to the measurement mechanism of the embodiment of the invention.
Embodiment
Need to prove that under the situation of not conflicting, embodiment and the feature among the embodiment among the application can make up mutually.Describe the present invention below with reference to the accompanying drawings and in conjunction with the embodiments in detail.
Fig. 2 is the synoptic diagram according to the generation device of the datum quantity of first embodiment of the invention.
As shown in Figure 2, the generation device of this datum quantity comprises: acquiring unit is used to obtain the physical quantity of electronic measurement system environment of living in; Control module obtains datum quantity according to described physical quantity.
Wherein, acquiring unit comprises temperature sensor, is used to obtain temperature signal, and wherein, this temperature signal also can adopt other devices or mode to obtain; Control module is used for obtaining datum quantity according to described temperature signal.
Preferably, above-mentioned control module can comprise single-chip microcomputer, wherein, has the digital-to-analogue conversion module in this single-chip microcomputer.
Wherein, above-mentioned control module also can not comprise the digital-to-analogue conversion module, and at this moment, the generation device of datum quantity comprises: temperature sensor, be used to obtain temperature signal, wherein, if the temperature sensor of numeral output can directly obtain temperature value, if the temperature sensor of simulation output, also need output signal is carried out analog to digital conversion, for example, use the analog-to-digital conversion module in analog to digital converter or the single-chip microcomputer to change; Control module is used for obtaining middle datum quantity according to described temperature signal; Digital-analogue converting device is used for described datum quantity intermediate quantity is carried out digital-to-analogue conversion, obtains datum quantity.
In the generation device of above-mentioned datum quantity, digital-analogue converting device can be digital-to-analogue conversion module or integrator.
Above-mentioned datum quantity can be reference voltage and/or reference current.
At first be that example is described with the reference voltage:
As shown in Figure 2, A3 is a control module, for example single-chip microcomputer etc.; T is a temperature signal, for example the output of thermistor equitemperature sensor; M is the M signal that Vref produces, and is generally digital quantity, for example signal such as PWM, digit pulse; A4 is the reference voltage generation unit; Vref is temperature variant reference voltage, control module A3 receives the voltage signal Vt of temperature, and obtain the intermediate quantity of reference voltage according to described voltage signal Vt, wherein, the intermediate quantity of this reference voltage is the directly reference voltage of output of control module A3, and conversion equipment A4 obtains reference voltage according to the intermediate quantity of this reference voltage then.
Wherein, conversion equipment A4 can be DA module or integrator.
Be that example is described below with the reference voltage:
Fig. 3 is the synoptic diagram according to the generation device of the datum quantity of second embodiment of the invention.
Wherein, A3 is a control module, for example single-chip microcomputer etc.; T is a temperature signal, for example the output of thermistor equitemperature sensor; M is the M signal that Iref produces, and is generally digital quantity, for example signal such as PWM, digit pulse; A4 is the reference current generation unit; Iref is temperature variant reference current.
As shown in Figure 3, control module A3 receives the current signal It of temperature, and obtains the intermediate quantity of reference current according to described current signal It, and conversion equipment A4 obtains reference current according to the intermediate quantity of this reference current then.
Similarly, A4 can be the DA module, also can be integrator.The DA module response time is fast, the precision height, and convenient the application, integration is good, but general cost is higher; The integrator response time is slow, and ratio of precision is lower, but cost is low.
In some systems, A3 and A4 can integrate, such as the single-chip microcomputer of band DA module etc.
During operate as normal, control module A3 gathers the T signal, after control module A3 carries out internal arithmetic then, produces temperature variant reference voltage V ref by A4.The internal arithmetic of V3 method such as for example table look-up, table 1 is a temperature form example.When temperature T satisfies: during T1＜T＜T2, Vref=Vref1 (1.2V); When temperature T satisfies: during T3＜T＜T4, Vref=Vref3 (2.4V).
Table 1
| Temperature | T1(-40℃) | T2(-20℃) | T3(0℃) | T4(20℃) | T5(40℃) | T6(60℃) |
| Output voltage | Vref1(1.2V) | Vref2(1.8V) | Vref3(2.4V) | Vref4(3V) | Vref5(3.6V) | Vref6(4.2V) |
The present invention can produce temperature variant benchmark Vref.
Fig. 4 is the synoptic diagram according to the measuring system of the embodiment of the invention.
In this embodiment, be that example is described with voltage, need to prove that measuring system of the present invention is not limited to voltage condition, corresponding to above-mentioned device embodiment, the situation that is applicable to electric current that measuring system of the present invention is also same.
As shown in Figure 2, control module A3 receives the voltage signal Vt of temperature, and obtains the intermediate quantity of reference voltage according to described voltage signal Vt, and conversion equipment A4 obtains reference voltage according to the intermediate quantity of this reference voltage then.Wherein, conversion equipment A4 can be DA module or integrator.
Measurement mechanism A1 is used to carry out measuring operation, obtains first output valve;
Substracting unit A2 is used for obtaining the output valve of second output valve as this measuring system according to the reference voltage that first output valve of measurement mechanism A1 output and conversion equipment A4 obtain.
In this embodiment, owing to considered the influence of temperature to reference voltage, and according to variation of temperature reference voltage is adjusted, thereby can make the measuring system output of reflected measurement device accurately.
Fig. 5 is the process flow diagram according to the production method of the datum quantity of the embodiment of the invention.
Step S502 obtains the physical quantity of electronic measurement system environment of living in.
For example, can be the temperature signal that obtains this electronic measurement system environment of living in.
Wherein, after obtaining temperature signal, this method can also comprise: obtain the benchmark intermediate quantity according to described temperature signal; Described datum quantity intermediate quantity is carried out digital-to-analogue conversion, obtain described datum quantity.
Step S504 obtains datum quantity according to described physical quantity.For example, obtain datum quantity according to the above-mentioned temperature signal of mentioning
Preferably, above-mentioned method can also comprise:
Obtain first output valve of measuring system; And
Obtain second output valve according to described first output valve and described datum quantity.
Preferably, obtaining datum quantity according to described temperature signal comprises: utilize the temperature value and the corresponding relation between the datum quantity that prestore to obtain described datum quantity according to described temperature signal.
Preferably, described datum quantity comprises reference voltage and/or reference current.
Fig. 6 is the synoptic diagram according to the measurement mechanism of the embodiment of the invention.
As shown in Figure 6, this measurement mechanism is the synoptic diagram of the embodiment of above-mentioned measurement mechanism A1.Wherein, A1 can be distance measuring equipment, as shown in the figure, the variation apart from x can be converted into the variation of output signal V1.Telefault L and the negative feedback that inserts operational amplifier A 10 after capacitor C is in parallel.VSIN is sinewave output, and its amplitude is subjected to influence apart from x.Operational amplifier A 12 is used for limiting the sinusoidal wave rise time with feedback element A14.The output VA2 of A13 is transformed to square wave by phase inverter A15, and square wave drove the LC shunt circuit afterwards through R2 and produces vibration then.Can control the amplitude of VSIN by the size of adjusting R2.VSIN is by output direct current signal V1 behind the rectification unit A16.
In addition, A1 can be device for pressure measurement in addition, the variation of pressure x is converted into the variation of output signal V1; A1 also can be Vibration-Measuring System, the variation of vibratory output x is converted into the variation of output signal V1.
A2 can be subtraction circuit, also can realize the system of subtraction function for other, for example the subtraction program in the single-chip microcomputer.
Present embodiment is with the physical quantity of temperature as electronic measurement system environment of living in, just above-mentioned method, device, system is that example is described with compensates to improve measuring accuracy all, but for the technician in electronic surveying field, only needing influences the environmental physics amount (humidity for example of electronic measurement system measuring accuracy with temperature change for other, air pressure, height above sea level etc.), promptly can the variation of these physical quantitys be compensated to the error that electronic measurement system brings, and only limit to temperature sensor is changed into the sensor of other environmental physics amounts for the change of the foregoing description, the form that uses of tabling look-up is replaced by the corresponding tables of other environmental physics amounts and datum quantity output voltage.
As can be seen from the above description, the invention enables datum quantity can reflect that external environment changes, and and then make the accurately actual output of reflected measurement device of output of measuring system.
The above is the preferred embodiments of the present invention only, is not limited to the present invention, and for a person skilled in the art, the present invention can have various changes and variation.Within the spirit and principles in the present invention all, any modification of being done, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (10)
1. the production method of a datum quantity is characterized in that, comprising:
Obtain the physical quantity of electronic measurement system environment of living in; And
Obtain datum quantity according to described physical quantity.
2. the production method of datum quantity according to claim 1 is characterized in that, described physical quantity is a temperature signal, wherein:
After obtaining temperature signal, described method also comprises:
Obtain the benchmark intermediate quantity according to described temperature signal,
Wherein, obtaining datum quantity according to described temperature signal comprises:
Described datum quantity intermediate quantity is carried out digital-to-analogue conversion, obtain described datum quantity.
3. the production method of datum quantity according to claim 1 is characterized in that, described method also comprises:
Obtain first output valve of measuring system; And
Obtain second output valve according to described first output valve and described datum quantity.
4. according to the production method of claim 2 or 3 described datum quantities, it is characterized in that described datum quantity comprises reference voltage and/or reference current.
5. the generation device of a datum quantity is characterized in that, comprising:
Acquiring unit is used to obtain the physical quantity of electronic measurement system environment of living in; And
Control module obtains datum quantity according to described physical quantity.
6. the generation device of datum quantity according to claim 5 is characterized in that,
Described acquiring unit comprises:
Temperature sensor is used to obtain temperature signal,
Wherein, described control module is used for obtaining datum quantity according to described temperature signal.
7. the generation device of datum quantity according to claim 5 is characterized in that, control module comprises single-chip microcomputer, wherein, has the digital-to-analogue conversion module in described single-chip microcomputer.
8. the generation device of a datum quantity is characterized in that, comprising:
Acquiring unit is used to obtain the physical quantity of electronic measurement system environment of living in;
Control module obtains the benchmark intermediate quantity according to described physical quantity; And
Digital-analogue converting device is used for described datum quantity intermediate quantity is carried out digital-to-analogue conversion, obtains datum quantity.
9. the generation device of datum quantity according to claim 8 is characterized in that,
Described acquiring unit comprises:
Temperature sensor is used to obtain temperature signal;
Wherein, described control module is used for obtaining described middle datum quantity according to described temperature signal, and described digital-analogue converting device is used for that described datum quantity intermediate quantity is carried out digital-to-analogue conversion and obtains described datum quantity.
10. a measuring system is characterized in that, comprising:
Proving installation is used to carry out test operation, obtains first output valve;
According to the generation device of each described datum quantity in the claim 5 to 9, be used to produce datum quantity;
Substracting unit is used for obtaining second output valve according to described first output valve and described datum quantity, as the output valve of described test macro.
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|---|---|---|---|---|
| CN1964080A (en) * | 2006-11-30 | 2007-05-16 | 武汉电信器件有限公司 | A SCM-based bias voltage temperature compensation device of APD detector and its control flow |
| CN201327703Y (en) * | 2008-12-12 | 2009-10-14 | 天马微电子股份有限公司 | Temperature compensating device and liquid crystal display module |
| CN101610081A (en) * | 2009-07-16 | 2009-12-23 | 东莞市大普通信技术有限公司 | Temperature compensating crystal oscillator |
| CN101799536A (en) * | 2010-04-02 | 2010-08-11 | 深圳市度彼电子有限公司 | Method and equipment for improving accuracy of laser distance measuring instrument |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1964080A (en) * | 2006-11-30 | 2007-05-16 | 武汉电信器件有限公司 | A SCM-based bias voltage temperature compensation device of APD detector and its control flow |
| CN201327703Y (en) * | 2008-12-12 | 2009-10-14 | 天马微电子股份有限公司 | Temperature compensating device and liquid crystal display module |
| CN101610081A (en) * | 2009-07-16 | 2009-12-23 | 东莞市大普通信技术有限公司 | Temperature compensating crystal oscillator |
| CN101799536A (en) * | 2010-04-02 | 2010-08-11 | 深圳市度彼电子有限公司 | Method and equipment for improving accuracy of laser distance measuring instrument |
Non-Patent Citations (1)
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Address after: 4 / F, building 1, No.14 Jiuxianqiao Road, Chaoyang District, Beijing 100020 Patentee after: Beijing Jingwei Hengrun Technology Co., Ltd Address before: 100101 1-2 / F, commercial building, No.23, anxiangli, Chaoyang District, Beijing Patentee before: Beijing Jingwei HiRain Technologies Co.,Ltd. |
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