CN110427067B - Method for improving current sampling precision by using analog circuit - Google Patents

Method for improving current sampling precision by using analog circuit Download PDF

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Publication number
CN110427067B
CN110427067B CN201910687919.5A CN201910687919A CN110427067B CN 110427067 B CN110427067 B CN 110427067B CN 201910687919 A CN201910687919 A CN 201910687919A CN 110427067 B CN110427067 B CN 110427067B
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temperature
current
voltage
sampling circuit
output
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CN110427067A (en
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李泽宏
王为
赵念
李铭
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Guizhou E Chip Microelectronics Technology Co ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/02Means for indicating or recording specially adapted for thermometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/34Testing dynamo-electric machines
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/565Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • G05F1/567Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation

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  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

The invention discloses a method for improving current sampling precision by using an analog circuit, and belongs to the field of power electronics. The device comprises a current sampling circuit, a temperature sampling circuit and an accuracy compensation structure. The current sampling circuit collects current signals and inputs the current signals to the precision compensation structure, and the temperature sampling circuit collects ambient temperature and outputs the ambient temperature to the temperature compensation structure. After two groups of sampling signals output from the current sampling circuit and the temperature sampling circuit enter the precision compensation structure, corresponding operation is carried out to obtain a compensated accurate current value and output the compensated accurate current value. The precision compensation structure can be adjusted according to the distortion characteristics of a specific current sampling module: if the temperature is linearly distorted, the output voltage (current) of the temperature sampling circuit can be proportionally added and subtracted to the current sampling signal; if nonlinear distortion is adopted, the voltage (current) value of the personalized increase and decrease response can be performed according to the difference of each temperature point.

Description

Method for improving current sampling precision by using analog circuit
Technical Field
The invention relates to the technical field of power electronics, in particular to a method for improving current sampling precision by using an analog circuit.
Background
In motor controllers, phase currents need to be sampled to achieve more accurate control. The existing current sampling mode mainly comprises two types of resistance sampling and Hall sampling. The resistor sampling has low cost and good applicability, but the mode has certain power loss, and most importantly, the temperature drift of the high-power precision resistor is very serious. In another hall sampling mode, a large current can be measured, and power dissipation is smaller, but the sampling accuracy of the hall sampling mode is still affected by temperature although the hall sampling mode performs certain temperature compensation, so that the sampling accuracy is reduced. It appears that in any sampling mode, the sampled data must be temperature compensated if a high precision sampling result is desired. Therefore, the invention provides a method for improving the current sampling precision by performing temperature compensation through an analog circuit.
Disclosure of Invention
Aiming at the phenomenon that the sampling precision is influenced by temperature to drift in the temperature sampling scheme, the invention provides a method for improving the sampling precision by using an analog circuit to perform temperature compensation.
The technical scheme of the invention is as follows: a method for improving the current sampling precision by using an analog circuit comprises a current sampling circuit, a temperature sampling circuit and a precision compensation structure;
the current sampling circuit is used for sampling devices and circuit structures with the accuracy affected by temperature, converting the acquired current information into voltage or current and outputting the voltage or current to the accuracy compensation structure;
the temperature sampling circuit is a temperature sensor which is sensitive and accurate to temperature, and generates a voltage or current signal which reflects the environmental temperature information and transmits the voltage or current signal to the precision compensation structure;
the precision compensation structure judges and processes the temperature information acquired by the temperature acquisition module to obtain voltage or current which needs to be compensated at the temperature, calculates the compensated voltage or current and a voltage or current signal output by the current sampling circuit, and outputs a voltage signal which linearly reflects the sampled current: vout or current signal.
Preferably, the temperature sampling circuit outputs a voltage or current in linear relation with temperature, the voltage or current is input to the precision compensation structure, the precision compensation structure judges a temperature point according to the compensated voltage or current, and then the voltage or current to be compensated is determined according to an error curve of the current sampling circuit; if the error and the temperature are in a linear relation, adopting a linear superposition compensation mode; if the error and the temperature are in nonlinear relation, a piecewise compensation mode is adopted.
Preferably, when the error and the temperature are in a linear relation, a linear superposition compensation mode is adopted; in this case, the accurate current sampling signal output is Vout, the actual current sampling circuit sampling signal is Vcs, and the temperature signal is VT, and then there are:
Vout=Vref+bVcs+cVT
vref is the DC voltage to be compensated, b and c are coefficients; the precision compensation structure described in this compensation mode includes: the operational amplifier A, the first resistor R1, the second resistor R2, the third resistor R3, the fourth resistor R4, the fifth resistor R5 and the sixth resistor R6;
r1, R2, R3, R4 are connected to the positive input end of the operational amplifier, the other end of R1 is connected with direct current voltage, the other end of R2 is connected with the output of the temperature sampling circuit, the other end of R3 is connected with the output of the current sampling circuit, the other end of R4 is grounded, R5 and R6 are connected to the negative input end of the operational amplifier, the other end of R5 is grounded, and the other end of R6 is connected with the output end of the operational amplifier; thus, a voltage adder is formed, the proportional addition of three voltages is realized, and finally, an accurate compensated current sampling signal is obtained. The results were:
if the error curve is positively correlated with temperature, the output of the temperature sampling circuit is positively correlated with temperature, and the output of the temperature sampling circuit and the resistor connected with the output of the temperature sampling circuit are connected to the negative input end of the operational amplifier for subtraction operation; and other conditions are analyzed in the same way, if the error and the temperature show quadratic, differential, integral and other relations, a specific operation circuit can be built by using the operational amplifier, so that the function is realized.
Preferably, when the error and the temperature are in a nonlinear relation, a piecewise compensation mode is adopted, at least one comparator is adopted, the compensation precision is closely related to the number of the comparators, the output of the temperature sampling circuit is connected to the input end of each comparator, and the other input end of the comparator is connected with different reference voltages V1, V2, V3 and V4 … …; if the voltage output by the temperature sampling circuit is the voltage which rises along with the rise of the temperature, V1, V2, V3 and V4 … … rise in turn according to a certain step length, and otherwise, fall in turn; the output of each comparator controls an NMOS tube as a switch, controls the switch of one path of reference current, and the reference current is the mirror current of Iref; taking the first path as an example: MP0 has its source end connected to power supply and its drain end connected to the grid electrode to form self bias; the grid electrode of MP0 is connected with the grid electrodes of all PMOS at the back to form a current mirror, and the mirror proportion of the current mirror is set according to the step sizes of V1, V2, V3 and V4 … … and the errors of the temperature points represented by the step sizes; the source end of MP1 is connected with the power supply voltage, the drain electrode of MP1 is connected with the drain electrode of MN1, the source stage of MN1 is connected with the upper end of resistor R12, the grid electrode of MN1 is connected with the output of comparator COMP1, and is controlled by comparator COMP 1; v1 in the first path is connected with the positive input end of COMP1, the temperature sampling circuit is connected with the negative input end of COMP1, if the output of the temperature sampling circuit is reduced due to temperature rise and is lower than V1, the output of the comparator is high, MN1 is conducted, current on MP1 is injected into R12, and the voltage on R12 is increased; whereby the value of the error compensation increases; the other paths are connected according to the path, if the temperature rises to a certain value and the error is reduced, the compensated voltage is reduced, so that the reference voltage corresponding to the temperature point of the temperature sampling circuit is connected to the negative input end of the comparator, the output of the temperature sampling circuit is connected to the positive input end of the comparator, and when the temperature rises to the point, the current of the path is turned off, so that the voltage on the resistor R12 is reduced; the mirror current value of each path is set to be the error voltage that should be increased or decreased with respect to the previous temperature point divided by R; if the mirror proportion of a certain path relative to the reference current is 1: k, and the reference point of the road wants the error voltage to the previous reference point to be VN, then there are:
I=K*I ref =V N /R 12
the connection mode of the input end of each comparator depends on whether the temperature reaches the point and the error compensation is increased or decreased;
r12 is provided with a reference current Iref1 to flow, namely, a direct current voltage is compensated, the specific value is determined according to the error condition, and then the currents of all branches flow through R12 to form a total error compensation voltage, and the compensation voltage is input to the positive input end of the operational amplifier A2; the negative input end of the operational amplifier A2 is connected to the output of the operational amplifier A2 and connected to one end of R7 to form a unit gain negative feedback, and the voltage on R12 is not influenced by a later-stage circuit through the clamping and isolation of A2; the output of the current sampling circuit is connected to R8, the other ends of R7 and R8 and R9 are connected to the positive input end of an operational amplifier A1, and the other end of R9 is grounded; the addition circuit is composed of R7, R8, R9, R10, R11 and the operational amplifier A1 as above, and adds the compensated error voltage and the output of the current sampling circuit to form an accurate output.
Compared with the prior art, the application has the following advantages:
the current sampling circuit can be any kind of sampling circuit such as resistance sampling, hall current sampling and the like, and belongs to the first input stage of the system in the scheme; the sampling result of the sampling circuit is affected by temperature and has a certain error, and is corrected by a later compensation structure.
The temperature sampling circuit can collect the ambient temperature and output a voltage (or current) signal, and the signal value and the temperature are in a linear relation; the temperature sampling circuit belongs to the second input stage in the system of the scheme. And the current or voltage signal output by the temperature sampling circuit is transmitted to the compensation structure to compensate the sampling result of the current sampling circuit.
The compensation structure can adopt various compensation modes, different sampling circuits have different characteristics, and deviations of sampling precision are different. The scheme provided by the application is suitable for all application scenes needing to provide temperature compensation, and whether sampling errors and temperature are in linear relation or nonlinear relation. If the error and the temperature are in a linear relation, adopting a linear superposition compensation mode, wherein the first embodiment is shown; if the error is nonlinear with temperature or the error curve cannot be fitted by a function, a piecewise compensation approach can be used, see embodiment two.
Drawings
FIG. 1 is a schematic diagram of an analog circuit for improving current sampling accuracy;
FIG. 2 is a schematic diagram of a typical linear superposition compensation architecture in which current sampling error is linear with temperature;
FIG. 3 is a segmented compensation structure with current sampling error in a non-linear relationship with temperature.
Detailed Description
The working principle of the present invention is described in detail below based on the drawings and the embodiments.
The invention provides a scheme for improving current sampling precision by using an analog circuit, which comprises a current sampling circuit, a temperature sampling circuit and a precision compensation structure.
Temperature sampling may be achieved by NTC resistors, diodes Guan Dengwen sensitive devices. Taking the NTC resistor as an example, a reference current (which does not change with temperature) flows through the NTC resistor, and the voltage across the resistor decreases with increasing temperature, i.e. the linear reaction temperature value. This value can be input into the precision compensation structure, or the voltage can be converted into a voltage rising with the rise of temperature or a current having a linear relation with the temperature through a certain conversion, addition and subtraction structure, according to the situation.
The current sampling circuit may be implemented with a sampling resistor or a hall element. The acquired voltage (or current) signal reflecting the magnitude of the sampled current may be affected by temperature to produce certain errors. May be higher or lower than the actual value.
The current sampling structure needs to be tested before the precision compensation structure is designed to obtain a relation curve of sampling errors along with temperature changes. It is then determined from the curve how much voltage (or current) should be compensated into the measured signal at a certain temperature to get an actual accurate value. The simplest of these is that the error is linear with temperature. The case of linear error and the case of nonlinear error are discussed in two embodiments below.
When the error between the output of the current sampling circuit and the actual value is linear, the relationship between the actual value and the sampling value can be expressed as:
Vout=Vref+bVcs+cVT
wherein Vout is the voltage which truly reflects the magnitude of the sampled current, namely the output of the temperature compensation circuit, vcs is the output of the current sampling circuit, the information reflected by the voltage contains a certain error, VT is the voltage value which is in linear relation with the temperature, vref is the direct current voltage value which needs to be compensated, and b and c are coefficients. According to this relation, the precision compensation structure can be designed such that the two voltages are added proportionally by a voltage adder as shown in fig. 2. An accurate output value is obtained.
If the error curve is positively correlated with temperature, the output of the temperature sampling circuit is positively correlated with temperature, and the circuit is connected with the temperature sampling circuit according to fig. 2, but if the error curve is positively correlated with temperature and the output of the temperature sampling circuit is negatively correlated with temperature, the output of the temperature sampling circuit and the resistor connected with the output of the temperature sampling circuit are connected with the negative input end of the operational amplifier to perform subtraction operation. Other cases were also analyzed. If the error and the temperature show the quadratic, differential, integral and other relations, a specific operation circuit can be built by using the operational amplifier to realize the functions.
Because the sampling error of a specific sampling circuit has a very complex relation with the temperature change, the specific sampling circuit is difficult to fit by a specific function, or the error after the fitting is still not negligible, namely, a sectional compensation mode which has higher compensation precision, is relatively more flexible and can be more commonly applied to various error compensation can be adopted.
In the scheme of the sectional compensation, the compensation precision is closely related to the number of comparators, for convenience of understanding, taking four comparators in fig. 3 as examples, the output of the temperature sampling circuit is connected to the input end of each comparator, the other input end of the comparator is connected to different reference voltages V1, V2, V3 and V4 … …, if the voltage output by the temperature sampling circuit is a voltage rising along with the temperature rise, then V1, V2, V3 and V4 … … rise in turn according to a certain step length, and otherwise decrease in turn. The output of each comparator controls an NMOS tube as a switch, controls the switch of a reference current, and the reference current is the mirror current of Iref. Taking the first path as an example: MP0 has its source terminal connected to the power supply and its drain terminal connected to the gate terminal to form a self-bias. The gate of MP0 is connected to the gates of all PMOS to form a current mirror, and the mirror proportion of the current mirror is set according to the step sizes of V1, V2, V3 and V4 … … and the errors of the temperature points represented by the current mirror. The source of MP1 is connected with the power supply voltage. The drain of MP1 is connected with the drain of MN 1. The source of MN1 is connected with the upper end of the resistor R12, the gate of MN1 is connected with the output of the comparator COMP1, and the gate is controlled by the comparator COMP 1. The V1 in the first path is connected with the positive input end of COMP1, the temperature sampling circuit is connected with the negative input end of COMP1, if the output of the temperature sampling circuit is reduced due to temperature rise and is lower than V1, the output of the comparator is high, MN1 is conducted, current on MP1 is injected into R12, and the voltage on R12 is increased. So that the value of the error compensation increases. The other paths are connected according to the path, if the temperature rises to a certain value and the error is reduced, the compensated voltage is reduced, so that the reference voltage corresponding to the temperature point of the temperature sampling circuit is connected to the negative input end of the comparator, the output of the temperature sampling circuit is connected to the positive input end of the comparator, and when the temperature rises to the point, the current is turned off, so that the voltage on the resistor R12 is reduced. The mirror current value of each path is set to the error voltage (set to VN) that should be increased (or decreased) with respect to the previous temperature point divided by R. If the mirror proportion of a certain path relative to the reference current is 1: k, and the reference point of the road wants the error voltage to the previous reference point to be VN, then there are:
I=K*I ref =V N /R 12
the connection at the input of each comparator depends on whether the temperature reaches this point and whether the error compensation should be increased or decreased.
A reference current Iref1 is first applied to R12, i.e. a dc voltage is first compensated, the specific value is determined according to the error condition, and then the currents of all branches are applied to R12 to form a total error-compensated voltage, which is input to the positive input terminal of the operational amplifier A2. The negative input of the operational amplifier A2 is connected to its output and to one end of R7 to form a unity gain negative feedback. The voltage on R12 is not affected by the subsequent circuit by the clamping and isolation of A2. The output of the current sampling circuit is connected to R8. The other ends of R7 and R8 and R9 are connected to the positive input end of the operational amplifier A1, and the other end of R9 is grounded. The negative input end of the operational amplifier is connected with R10 and R11, the other end of R10 is grounded, and the other end of R11 is connected with the output of the operational amplifier and serves as the output of the whole system. The addition circuit is formed by R7, R8, R9, R10, R11 and the operational amplifier A1 as in the previous embodiment, and the compensated error voltage is added to the output of the current sampling circuit to form an accurate output.
In order to improve the compensation accuracy of the accuracy compensation structure, the step size between V1, V2, V3 and … … needs to be reduced, and the number of comparators needs to be increased. The specific conditions are adjusted according to the application requirements.
It is to be understood that the invention is not limited to the precise arrangements and instrumentalities shown above. Various modifications, changes and optimizations may be made in the sequence of steps, details and operation of the above methods and structures without departing from the scope of the claims.

Claims (1)

1. A method for improving current sampling accuracy with an analog circuit, comprising: the method adopts a current sampling circuit, a temperature sampling circuit and an accuracy compensation structure;
the sampling precision of the current sampling circuit is affected by the temperature of the device and the circuit structure, and the collected current information is converted into voltage or current and output to the precision compensation structure;
the temperature sampling circuit is a temperature sensor which is sensitive and accurate to temperature, and generates a voltage or current signal which reflects the environmental temperature information and transmits the voltage or current signal to the precision compensation structure;
the precision compensation structure judges and processes the temperature information acquired by the temperature acquisition module to obtain voltage or current which needs to be compensated at the temperature, calculates the compensated voltage or current and a voltage or current signal output by the current sampling circuit, and outputs a voltage signal which linearly reflects the sampled current: vout or current signal;
the temperature sampling circuit outputs a voltage or current which is in linear relation with temperature and inputs the voltage or current into the precision compensation structure, the precision compensation structure judges a temperature point according to the compensated voltage or current, and then the voltage or current which needs to be compensated is determined according to an error curve of the current sampling circuit; if the error and the temperature are in a linear relation, adopting a linear superposition compensation mode; if the error and the temperature are in a nonlinear relation, adopting a piecewise compensation mode;
when the error and the temperature are in a linear relation, a linear superposition compensation mode is adopted; in this case, the accurate current sampling signal is output as Vout, the sampling signal of the actual current sampling circuit is Vcs, and the temperature signal isThen there are:
Vout=Vref+bVcs+cVT
vref is the DC voltage to be compensated, b and c are coefficients;
the precision compensation structure described in this compensation mode includes: operational amplifier A, first resistor R1, second resistor
R2, third resistor R3, fourth resistor R4, fifth resistor R5, sixth resistor R6;
r1, R2, R3 and R4 are connected to the positive input end of the operational amplifier A, the other end of the R1 is connected with direct current voltage, the other end of the R2 is connected with the output of the current sampling circuit, the other end of the R3 is connected with the output of the temperature sampling circuit, the other end of the R4 is grounded, R5 and R6 are connected with the negative input end of the operational amplifier A, the other end of the R5 is grounded, and the other end of the R6 is connected with the output end of the operational amplifier A; thus, a voltage adder is formed, the proportional addition of three voltages is realized, and finally, an accurate compensated current sampling signal is obtained; the results were:
if the error curve is positively correlated with the temperature, the output of the temperature sampling circuit is positively correlated with the temperature, but if the error curve is positively correlated with the temperature and the output of the temperature sampling circuit is negatively correlated with the temperature, the output of the temperature sampling circuit and the resistor connected with the output of the temperature sampling circuit are connected to the negative input end of the operational amplifier A to perform subtraction operation; other conditions are analyzed in the same way, if the error and the temperature show quadratic, differential and integral relations, an operational circuit which is specifically used for realizing the compensation function is built by utilizing an operational amplifier, so that the function is realized;
when the error and the temperature are in a nonlinear relation, a piecewise compensation mode is adopted, at least one comparator is adopted, the compensation precision is closely related to the number of the comparators, the output of the temperature sampling circuit is connected to the input end of each comparator, and the other input end of the comparator is connected with different reference voltages V1, V2, V3 and V4 … …; if the voltage output by the temperature sampling circuit is the voltage which rises along with the rise of the temperature, V1, V2, V3 and V4 … … rise in turn according to a certain step length, and otherwise, fall in turn; the output of each comparator controls an NMOS tube as a switch, controls the switch of a reference current, and the reference current is from I ref Is a mirror current of (a); taking the first path as an example: MP0 source terminal is connected with power supply, drain terminal is connected with grid electrode I ref Forming a self-bias; the grid electrode of MP0 is connected with the grid electrodes of all PMOS at the back to form a current mirror, and the mirror proportion of the current mirror is set according to the step sizes of V1, V2, V3 and V4 … … and the errors of the temperature points represented by the step sizes; the source end of MP1 is connected with the power supply voltage, the drain electrode of MP1 is connected with the drain electrode of MN1, the source stage of MN1 is connected with the upper end of resistor R12, the grid electrode of MN1 is connected with the output of comparator COMP1, and is controlled by comparator COMP 1; v1 in the first path is connected with the positive input end of COMP1, the temperature sampling circuit is connected with the negative input end of COMP1, if the output of the temperature sampling circuit is reduced due to temperature rise and is lower than V1, the output of the comparator is high, MN1 is conducted, current on MP1 is injected into R12, and the voltage on R12 is increased; whereby the value of the error compensation increases; according to this connection, if the temperature rises to a certain value and the error decreases, the compensated electricity should be decreasedThe voltage is that the reference voltage corresponding to the temperature point of the temperature sampling circuit should be connected to the negative input end of the comparator, the output of the temperature sampling circuit is connected to the positive input end of the comparator, when the temperature rises to the temperature point, the current is turned off, so that the voltage on the resistor R12 is reduced; the mirror current value of each path is set to be the error voltage that should be increased or decreased with respect to the previous temperature point divided by R; if the mirror proportion of a certain path relative to the reference current is 1: k, and the error voltage of the reference point of the road relative to the previous reference point is VN, then there are:
I=K*I ref =V N /R 12
the connection mode of the input end of each comparator depends on whether the temperature reaches the point and the error compensation is increased or decreased;
r12 is provided with a reference current Iref1 to flow, namely, a direct current voltage is compensated, the specific value is determined according to the error condition, and then the currents of all branches flow through R12 to form a total error compensation voltage, and the compensation voltage is input to the positive input end of the operational amplifier A2; the negative input end of the operational amplifier A2 is connected to the output of the operational amplifier A2 and connected to one end of R7 to form a unit gain negative feedback, and the voltage on R12 is not influenced by a later-stage circuit through the clamping and isolation of A2; the output of the current sampling circuit is connected to R8, the other ends of R7 and R8 and R9 are connected to the positive input end of the operational amplifier A1, and the other end of R9 is grounded; r7, R8, R9, R10, R11 and the operational amplifier A1 form an addition operational circuit, and the compensated error voltage is added with the output of the current sampling circuit to form an accurate output.
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Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5956627A (en) * 1997-07-08 1999-09-21 Uniden San Diego Research & Development Center, Inc. Temperature compensated power control circuit
JP2000009490A (en) * 1998-06-29 2000-01-14 Mitsubishi Heavy Ind Ltd Magnetostriction-type displacement detection device
JP2000137062A (en) * 1998-10-30 2000-05-16 Denso Corp Method and device for detecting residual capacity of secondary battery
CN101629973A (en) * 2009-06-09 2010-01-20 中国人民解放军国防科学技术大学 High-precision current sampling circuit without operational amplifier for low voltage power supply
CN201682428U (en) * 2008-08-30 2010-12-22 技领半导体(上海)有限公司 Converter adjusting output voltage
DE102010030866A1 (en) * 2009-07-30 2011-02-03 GM Global Technology Operations, Inc., Detroit Multiphase DC / DC boost converter
CN102353481A (en) * 2011-06-30 2012-02-15 华南理工大学 Method and device for complementing temperature and pressure of pressure sensor based on two-dimensional orthogonal function
WO2016067953A1 (en) * 2014-10-30 2016-05-06 ソニー株式会社 Receiving device and method
CN105738685A (en) * 2016-02-23 2016-07-06 南京中旭电子科技有限公司 Hall current sensor of digital signal output
CN106125813A (en) * 2016-08-01 2016-11-16 河北大学 A kind of high stability constant-current source of portable wide amount limit
CN106535401A (en) * 2016-11-18 2017-03-22 贵州恒芯微电子科技有限公司 Linear constant-current power supply for AC LED
CN106771486A (en) * 2016-12-20 2017-05-31 电子科技大学 A kind of current sampling circuit
CN109885121A (en) * 2019-03-22 2019-06-14 西安微电子技术研究所 A kind of current/frequency conversion circuit

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5956627A (en) * 1997-07-08 1999-09-21 Uniden San Diego Research & Development Center, Inc. Temperature compensated power control circuit
JP2000009490A (en) * 1998-06-29 2000-01-14 Mitsubishi Heavy Ind Ltd Magnetostriction-type displacement detection device
JP2000137062A (en) * 1998-10-30 2000-05-16 Denso Corp Method and device for detecting residual capacity of secondary battery
CN201682428U (en) * 2008-08-30 2010-12-22 技领半导体(上海)有限公司 Converter adjusting output voltage
CN101629973A (en) * 2009-06-09 2010-01-20 中国人民解放军国防科学技术大学 High-precision current sampling circuit without operational amplifier for low voltage power supply
DE102010030866A1 (en) * 2009-07-30 2011-02-03 GM Global Technology Operations, Inc., Detroit Multiphase DC / DC boost converter
CN102353481A (en) * 2011-06-30 2012-02-15 华南理工大学 Method and device for complementing temperature and pressure of pressure sensor based on two-dimensional orthogonal function
WO2016067953A1 (en) * 2014-10-30 2016-05-06 ソニー株式会社 Receiving device and method
CN105738685A (en) * 2016-02-23 2016-07-06 南京中旭电子科技有限公司 Hall current sensor of digital signal output
CN106125813A (en) * 2016-08-01 2016-11-16 河北大学 A kind of high stability constant-current source of portable wide amount limit
CN106535401A (en) * 2016-11-18 2017-03-22 贵州恒芯微电子科技有限公司 Linear constant-current power supply for AC LED
CN106771486A (en) * 2016-12-20 2017-05-31 电子科技大学 A kind of current sampling circuit
CN109885121A (en) * 2019-03-22 2019-06-14 西安微电子技术研究所 A kind of current/frequency conversion circuit

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