CN110427067A - A method of improving current sample precision with analog circuit - Google Patents

A method of improving current sample precision with analog circuit Download PDF

Info

Publication number
CN110427067A
CN110427067A CN201910687919.5A CN201910687919A CN110427067A CN 110427067 A CN110427067 A CN 110427067A CN 201910687919 A CN201910687919 A CN 201910687919A CN 110427067 A CN110427067 A CN 110427067A
Authority
CN
China
Prior art keywords
temperature
current
voltage
output
error
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201910687919.5A
Other languages
Chinese (zh)
Other versions
CN110427067B (en
Inventor
李泽宏
王为
赵念
李铭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guizhou Hengxin Microelectronics Technology Co Ltd
Original Assignee
Guizhou Hengxin Microelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guizhou Hengxin Microelectronics Technology Co Ltd filed Critical Guizhou Hengxin Microelectronics Technology Co Ltd
Priority to CN201910687919.5A priority Critical patent/CN110427067B/en
Publication of CN110427067A publication Critical patent/CN110427067A/en
Application granted granted Critical
Publication of CN110427067B publication Critical patent/CN110427067B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/02Means for indicating or recording specially adapted for thermometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/34Testing dynamo-electric machines
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/565Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • G05F1/567Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation

Abstract

The invention discloses a kind of methods that current sample precision is improved with analog circuit, belong to field of power electronics.Including current sampling circuit, temperature sampling circuit, the several parts of accuracy compensation structure.Current sampling circuit acquisition current signal is simultaneously input to accuracy compensation structure, and temperature sampling circuit acquires environment temperature, and is output to temperature compensation structure.After the two groups of sampled signals exported from current sampling circuit and temperature sampling circuit enter accuracy compensation structure, carries out corresponding operation and obtain compensated accurate current value and export.Wherein accuracy compensation structure can be adjusted according to the distortion feature of specific current sampling module: if linear distortion, can be added in proportion the output voltage (electric current) of temperature sampling circuit, be reduced to above current sampling signal;If non-linear distortion can carry out voltage (electric current) value of personalized increase and decrease response according to the difference of each temperature spot.

Description

A method of improving current sample precision with analog circuit
Technical field
The present invention relates to power electronics fields, and in particular to a kind of current sample precision of being improved with analog circuit Method.
Background technique
In electric machine controller, need to sample phase current to realize more precise control.Existing current sample Mode mainly has resistance sampling and Hall to sample two kinds.Wherein the cost of resistance sampling is low, applicability is good, but this mode has Certain power loss, most importantly the temperature drift of high-power precision resistance is very serious.Another Hall sample mode is then It can measure that high current, power dissipation are smaller, but although this sample mode has carried out certain temperature-compensating, sampling Precision still will receive temperature influence, reduce sampling precision.In view of this no matter any sample mode is if it is desired to obtain high Accurately sampled result has to carry out temperature-compensating to sampled data.Therefore, the invention proposes one kind to pass through analog circuit The method for carrying out temperature-compensating to improve current sample precision.
Summary of the invention
For sampling precision in above-mentioned temperature sampling scheme be affected by temperature and there is a phenomenon where drifting about, the present invention Propose a kind of method for carrying out temperature-compensating with analog circuit to improve sampling precision.
The technical solution of the present invention is as follows: a kind of method for improving current sample precision with analog circuit, this method include Current sampling module, temperature sampling module, the several parts of accuracy compensation structure;
The current sampling module sampling precision will receive the device and circuit structure of temperature influence, and collected electric current is believed Breath is converted to voltage or electric current is output to accuracy compensation structure;
The temperature sampling module is temperature sensitive, accurately temperature sensor, and one reaction environment temperature letter of generation The voltage or current signal of breath are transmitted to accuracy compensation structure;
The accuracy compensation structure carries out the temperature information that temperature collecting module collects to judge processing and obtain at this At a temperature of the voltage that needs to compensate or size of current, and by the voltage or electric current of the voltage or electric current and current sampling module output Signal carries out operation and exports a linear response by the voltage or current signal of sample rate current size: Vout.
Preferably, the temperature sampling module exports a voltage or electric current in a linear relationship with temperature, is input to essence Collocation structure is spent, accuracy compensation structure judges temperature spot according to the voltage or electric current, bent further according to the error of current sampling module Line determines the voltage for needing to compensate or size of current;If error is in a linear relationship with temperature, linear superposition compensation way is used; If error and temperature are in non-linear relation, segmented compensation mode is used.
Preferably, when error and temperature are in a linear relationship, using linear superposition compensation way;In this case, quasi- True current sampling signal output is Vout, and the sampled signal of actual current sampling module is Vcs, and temperature signal VT then has:
Vref is the DC voltage of required compensation, and b and c are coefficient;The accuracy compensation structure includes: under this compensation way Operational amplifier A, first resistor R1, second resistance R2,3rd resistor R3, the 4th resistance R4, the 5th resistance R5, the 6th resistance R6;
R1, R2, R3, R4 are connected to the positive input of operational amplifier, another termination DC voltage of R1, and R2 other end jointing temp is adopted The output of sample circuit, the output of another termination current sampling circuit of R3, the other end ground connection of R4, R5 and R6 connect operational amplifier Negative input, R5 the other end ground connection, R6 it is another termination operational amplifier output end;So constitute voltage adder Device realizes the addition in proportion of three voltages, finally obtains accurately compensated current sampling signal.As a result are as follows:
If error curve is positively correlated with temperature, the output of temperature sampling module is also positively correlated with temperature to be connect according to Fig. 2 Circuit can be obtained required, but if error curve is positively correlated with temperature, and the output of temperature sampling module and temperature are in negative Correlation, then should output by temperature sampling module and its institute's connecting resistance be connected to the negative input of cloud amplifier, carry out subtraction Operation;Other situations are also so analyzed, if the relationships such as quadratic power, differential, integral, which are presented, in error and temperature can also be used amplifier Concrete operation circuit is built, realizes function.
Preferably, when error and temperature are in non-linear relation, using segmented compensation mode, using at least one comparator And the number of compensation precision and comparator is closely related, the output of temperature sampling circuit is connected to the input terminal of each comparator, Another input of comparator terminates obstructed reference voltage V1, V2, V3, V4 ...;If the voltage of temperature sampling module output To increase and raised voltage with temperature, then V1, V2, V3, V4 ... are successively increased according to certain step-length, on the contrary then successively drop It is low;The output of each comparator controls a NMOS tube as switch, controls the switch of reference current all the way, reference current comes From in the image current of Iref;By taking the first via as an example: the source termination power of MP0, drain terminal and grid are connected to Iref, are formed certainly Biasing;The grid that the grid of MP0 is connected to all PMOS in back forms current mirror, the mirroring ratios of current mirror according to V1, V2, V3, The step-length of V4 ... and the error of the temperature spot representated by them are configured;The source of MP1 connects supply voltage, the drain electrode of MP1 The drain electrode of MN1 is connect, the upper end of the source level connecting resistance R12 of MN1, the grid of MN1 connects the output of comparator COMP1, by comparator The control of COMP1;V1 connects the positive input terminal of COMP1 in the first via, and temperature sampling circuit connects the negative input end of COMP1, if temperature Raising reduces the output of temperature sampling circuit, as low as V1 hereinafter, then to be high, MN1 is connected for comparator output, the electric current on MP1 It is injected into R12, increases the voltage on R12;To which the value of error compensation increases;Other each roads are connected according to this road, if temperature It is increased to some value, error reduces, then it should reduce compensated voltage, so temperature sampling circuit is in the corresponding base of the temperature spot Quasi- voltage should be connected to the negative input end of comparator, and the output of temperature sampling circuit is connected to the positive input terminal of the comparator, when Temperature is increased to the point, turns off the road electric current, so that the voltage on resistance R12 be made to reduce;Per image current value setting all the way It is the error voltage that should be increased or decreased relative to previous temperature spot divided by R;If the image ratio of a certain relative datum electric current of crying Example is 1:K, and the datum mark on the road wants that the error voltage to previous datum mark is VN, then having:
The connection type of each comparator input terminal depending on temperature reach the apparent error compensation should increase or reduce depending on;
There is a reference current Iref1 to flow through on R12 first, i.e., compensates a DC voltage first, occurrence is according to error feelings Condition determines that then the electric current of all branches forms a total error compensating voltage, the voltage input to operation after flowing through R12 The positive input of amplifier A2;The negative input that cloud calculates amplifier A2 is connected to its output, and is connected to one end of R7, is formed Unit gain negative-feedback influences the voltage on R12 by late-class circuit by the clamped of A2 and isolation;Current sampling circuit Output be connected to R8, the other end and R9 of R7, R8 are connected to the card input terminal of operational amplifier A1, and the other end of R9 is grounded operation The negative input of amplifier connects R10 and R11, R10 other end ground connection, the output and conduct of another termination operational amplifier of R11 The output of whole system;R7, R8, R9, R10, R11 and operational amplifier A1 composition adder operation circuit same as above, will mend The error voltage repaid is added to be formed and accurately export with the output of current sampling circuit.
Compared with prior art, the application has the following advantages:
The current sampling circuit can be any type sample circuits such as resistance sampling, Hall current sampling, belong to we First input stage of system in case;The sampled result of the sample circuit is affected by temperature and there is a certain error, is led to Subsequent collocation structure is crossed to be modified.
The temperature sampling circuit can acquire environment temperature, and export voltage (or electric current) signal, the signal It is worth in a linear relationship with temperature;Temperature sampling circuit belongs to second input stage in this programme system.Temperature sampling circuit institute The current or voltage signal of output is transferred in collocation structure, is compensated to the sampled result of current sampling module.
The collocation structure can take a variety of compensation ways, and different sample circuits has the characteristics that different, sampling The deviation that precision occurs is also different.Scheme provided by the present application be suitable for institute it is in need offer temperature-compensating applied field Scape, no matter sampling error and temperature is in a linear relationship or non-linear relation.It is used if error and temperature are in a linear relationship Linear superposition compensation way is shown in embodiment one;If error and temperature are in non-linear relation or can not be with functions come error of fitting Segmented compensation mode then can be used in curve, sees embodiment two.
Detailed description of the invention
Fig. 1 is a kind of scheme framework that current sample precision is improved with analog circuit proposed by the present invention;
Fig. 2 is the linear superposition collocation structure of typical current sample error and temperature line relationship;
Fig. 3 is the segmented compensation structure of current sample error and temperature at non-linear relation.
Specific embodiment
Below according to drawings and examples, detailed description of the present invention working principle.
A kind of scheme improving current sample precision with analog circuit proposed by the present invention includes current sampling circuit, temperature Spend sample circuit, the several parts of accuracy compensation structure.
Temperature sampling can be realized by Thermosensors such as NTC resistance, diodes.By taking NTC resistance as an example, with a benchmark Electric current (not varying with temperature) flows through NTC resistance, and resistance both end voltage is reduced with the raising of temperature, the voltage, that is, linear it is anti- Answer temperature value.This value can be input in accuracy compensation structure, can also by certain conversion, plus, subtract structure for the electricity Pressure is converted to be increased and raised voltage or the electric current in a linear relationship with temperature with temperature, is specifically depended on the circumstances.
Current sampling circuit can be realized with sampling resistor or Hall element.The collected reflection of institute is by sample rate current size Voltage (or electric current) signal will receive the influence of temperature and generate certain error.Compared with actual value may it is higher may also It can be relatively low.
It needs to test current sample structure before design accuracy collocation structure, to obtain sampling error with temperature The relation curve of variation.Then how much voltage (or electric current) should be compensated to institute under a certain temperature by being determined according to curve In the signal measured, to obtain actual exact value.Wherein simplest situation is exactly error and temperature line relationship.Below It will be divided into two embodiments with the case where nonlinearity erron the case where linearity error and discuss.
When the error of the output of current sampling circuit and actual value is linear, the relationship of true value and sampled value can be with table It states are as follows:
Wherein Vout is actual response by the voltage of sample rate current size, the i.e. output of temperature-compensation circuit, and Vcs is current sample The output of circuit, the information which is reflected contain certain error, and VT is the voltage value in a linear relationship with temperature, and Vref is The DC voltage value of required compensation, b and c are coefficient.According to this relational expression, accuracy compensation structure can be designed as shown in Fig. 2, Two voltages are proportionally added by voltage adder.Obtain accurate output valve.
If error curve is positively correlated with temperature, the output of temperature sampling module and temperature are also positively correlated according to Fig. 2 Connect circuit can be obtained it is required, but if error curve is positively correlated with temperature, and the output and temperature of temperature sampling module It is negatively correlated, then should output by temperature sampling module and its institute's connecting resistance be connected to the negative input of cloud amplifier, carry out Subtraction.Other situations are also so analyzed.If error is presented the relationships such as quadratic power, differential, integral with temperature and can also be used Amplifier builds concrete operation circuit, realizes function.
Since to vary with temperature relationship extremely complex for the sampling error of specific sample circuit, be difficult with a certain specific function come Fitting, in other words, error still be can not ignore after fitting, that is, it is higher to can be used compensation precision, relatively more flexible and can be more general Time the segmented compensation mode applied to various error compensations.
The number of compensation precision and comparator is closely related in this scheme of segmented compensation, for convenience of understanding, with Fig. 3 In for four comparators, the output of temperature sampling circuit is connected to the input terminal of each comparator, and another of comparator is defeated Enter and terminate obstructed reference voltage V1, V2, V3, V4 ..., if the voltage of temperature sampling module output is to increase and rise with temperature High voltage, then V1, V2, V3, V4 ... are successively increased according to certain step-length, on the contrary then successively reduce.Each comparator Output control a NMOS tube as switch, the switch of control reference current all the way, mirror image of the reference current from Iref Electric current.By taking the first via as an example: the source termination power of MP0, drain terminal and grid are connected to Iref, form automatic biasing.The grid of MP0 The grid for being connected to all PMOS in back forms current mirror, the mirroring ratios of current mirror are according to V1, V2, V3, V4 ... step-length and The error of temperature spot representated by them is configured.The source of MP1 connects supply voltage.The drain electrode of MP1 connects the drain electrode of MN1.MN1 Source level connecting resistance R12 upper end, the grid of MN1 connects the output of comparator COMP1, by the control of comparator COMP1.The first via Middle V1 connects the positive input terminal of COMP1, and temperature sampling circuit connects the negative input end of COMP1, if temperature raising makes temperature sampling circuit Output reduce, as low as V1 hereinafter, then comparator output be height, MN1 conducting, the electric current on MP1 is injected into R12, makes on R12 Voltage increases.To which the value of error compensation increases.Other each roads are connected according to this road, if temperature is increased to some value, error subtracts It is small, then it should reduce compensated voltage, compare so temperature sampling circuit should be connected in the corresponding reference voltage of the temperature spot The negative input end of device, and the output of temperature sampling circuit is connected to the positive input terminal of the comparator, when temperature is increased to the point, shutdown The road electric current, so that the voltage on resistance R12 be made to reduce.Previous temperature spot is arranged with respect to per image current value all the way to answer The error voltage (being set as VN) of the increase (or reduction) is divided by R.If the mirroring ratios of a certain relative datum electric current of crying are 1:K, and The datum mark on the road wants that the error voltage to previous datum mark is VN, then having:
The connection type of each comparator input terminal depending on temperature reach the apparent error compensation should increase or reduce depending on.
There is a reference current Iref1 to flow through on R12 first, i.e., compensates a DC voltage first, occurrence is according to accidentally Poor situation determines that then the electric current of all branches forms the voltage that an overall error compensates after flowing through R12, which arrives The positive input of operational amplifier A2.The negative input of operational amplifier A2 is connected to its output, and is connected to one end of R7, Form unit gain negative-feedback.By the clamped of A2 and isolation, influence the voltage on R12 by late-class circuit.Current sample The output of circuit is connected to R8.The other end and R9 of R7, R8 are connected to the positive input of operational amplifier A1, another termination of R9 Ground.The negative input of operational amplifier connects R10 and R11, R10 other end ground connection, the output of another termination operational amplifier of R11 And the output as whole system.R7, R8, R9, R10, R11 and operational amplifier A1 constitute addition fortune as a upper embodiment Circuit is calculated, the error voltage of compensation is added to be formed with the output of current sampling circuit accurately exports.
In order to improve the compensation precision of accuracy compensation structure, need to reduce the step-length between V1, V2, V3 ..., simultaneously Increase the number of comparator.Concrete condition is adjusted according to using needs.
It is understood that the present invention is not limited to the accurate configuration being illustrated above and components.Claims are not being departed from Protection scope on the basis of, can be to method and structure above the step of sequence, details and operation make various modifications, change and Optimization.

Claims (4)

1. a kind of method for improving current sample precision with analog circuit, it is characterised in that: this method includes current sample mould Block, temperature sampling module, the several parts of accuracy compensation structure;
The current sampling module sampling precision will receive the device and circuit structure of temperature influence, and collected electric current is believed Breath is converted to voltage or electric current is output to accuracy compensation structure;
The temperature sampling module is temperature sensitive, accurately temperature sensor, and one reaction environment temperature letter of generation The voltage or current signal of breath are transmitted to accuracy compensation structure;
The accuracy compensation structure carries out the temperature information that temperature collecting module collects to judge processing and obtain at this At a temperature of the voltage that needs to compensate or size of current, and by the voltage or electric current of the voltage or electric current and current sampling module output Signal carries out operation and exports a linear response by the voltage or current signal of sample rate current size: Vout.
2. the method according to claim 1 for improving current sample precision with analog circuit, it is characterised in that: the temperature It spends sampling module and exports a voltage or electric current in a linear relationship with temperature, be input to accuracy compensation structure, accuracy compensation knot Structure judges temperature spot according to the voltage or electric current, further according to current sampling module error curve determine need the voltage that compensates or Size of current;If error is in a linear relationship with temperature, linear superposition compensation way is used;If error and temperature are in nonlinear dependence System then uses segmented compensation mode.
3. the method according to claim 2 for improving current sample precision with analog circuit, it is characterised in that: work as error When in a linear relationship with temperature, using linear superposition compensation way;In this case, accurate current sampling signal, which exports, is Vout, the sampled signal of actual current sampling module are Vcs, temperature signal VT, then have:
Vref is the DC voltage of required compensation, and b and c are coefficient;
The accuracy compensation structure includes: operational amplifier A, first resistor R1, second resistance R2, third under this compensation way Resistance R3, the 4th resistance R4, the 5th resistance R5, the 6th resistance R6;
R1, R2, R3, R4 are connected to the positive input of operational amplifier, another termination DC voltage of R1, and R2 other end jointing temp is adopted The output of sample circuit, the output of another termination current sampling circuit of R3, the other end ground connection of R4, R5 and R6 connect operational amplifier Negative input, R5 the other end ground connection, R6 it is another termination operational amplifier output end;So constitute voltage adder Device realizes the addition in proportion of three voltages, finally obtains accurately compensated current sampling signal,
As a result are as follows:
If error curve is positively correlated with temperature, the output of temperature sampling module is also positively correlated with temperature to be connect according to Fig. 2 Circuit can be obtained required, but if error curve is positively correlated with temperature, and the output of temperature sampling module and temperature are in negative Correlation, then should output by temperature sampling module and its institute's connecting resistance be connected to the negative input of cloud amplifier, carry out subtraction Operation;Other situations are also so analyzed, if the relationships such as quadratic power, differential, integral, which are presented, in error and temperature can also be used amplifier Concrete operation circuit is built, realizes function.
4. the method according to claim 2 for improving current sample precision with analog circuit, it is characterised in that: work as error When being in non-linear relation with temperature, using segmented compensation mode, using at least one comparator and compensation precision and comparator Number is closely related, and the output of temperature sampling circuit is connected to the input terminal of each comparator, another input terminal of comparator Meet obstructed reference voltage V1, V2, V3, V4 ...;If the voltage of temperature sampling module output is raised with temperature raising Voltage, then V1, V2, V3, V4 ... are successively increased according to certain step-length, on the contrary then successively reduce;Each comparator it is defeated A NMOS tube is controlled out as switch, controls the switch of reference current all the way, reference current is from IrefImage current; By taking the first via as an example: the source termination power of MP0, drain terminal and grid are connected to Iref, form automatic biasing;After the grid of MP0 is connected to The grid of all PMOS in side forms current mirror, the mirroring ratios of current mirror are according to V1, V2, V3, V4 ... step-length and their institutes The error of the temperature spot of representative is configured;The source of MP1 connects supply voltage, and the drain electrode of MP1 connects the drain electrode of MN1, the source level of MN1 The upper end of connecting resistance R12, the grid of MN1 connect the output of comparator COMP1, by the control of comparator COMP1;V1 connects in the first via The positive input terminal of COMP1, temperature sampling circuit connect the negative input end of COMP1, if temperature increases the output for making temperature sampling circuit It reduces, as low as V1 hereinafter, then to be high, MN1 is connected for comparator output, the electric current on MP1 is injected into R12, makes the voltage liter on R12 It is high;To which the value of error compensation increases;Other each roads are connected according to this road, if temperature is increased to some value, error reduces, then answers Reduce compensated voltage, so in the corresponding reference voltage of the temperature spot should to be connected to bearing for comparator defeated for temperature sampling circuit Enter end, and the output of temperature sampling circuit is connected to the positive input terminal of the comparator, and when temperature is increased to the point, it is electric to turn off the road Stream, so that the voltage on resistance R12 be made to reduce;Being arranged with respect to previous temperature spot per image current value all the way should increase Or the error voltage of reduction is divided by R;If the mirroring ratios of a certain relative datum electric current of crying are 1:K, and the datum mark on the road is thought pair The error voltage of previous datum mark is VN, then having:
The connection type of each comparator input terminal depending on temperature reach the apparent error compensation should increase or reduce depending on;
There is a reference current Iref1 to flow through on R12 first, i.e., compensates a DC voltage first, occurrence is according to error feelings Condition determines that then the electric current of all branches forms a total error compensating voltage, the voltage input to operation after flowing through R12 The positive input of amplifier A2;The negative input that cloud calculates amplifier A2 is connected to its output, and is connected to one end of R7, is formed Unit gain negative-feedback influences the voltage on R12 by late-class circuit by the clamped of A2 and isolation;Current sampling circuit Output be connected to R8, the other end and R9 of R7, R8 are connected to the card input terminal of operational amplifier A1, and the other end of R9 is grounded operation The negative input of amplifier connects R10 and R11, R10 other end ground connection, the output and conduct of another termination operational amplifier of R11 The output of whole system;R7, R8, R9, R10, R11 and operational amplifier A1 composition adder operation circuit same as above, will mend The error voltage repaid is added to be formed and accurately export with the output of current sampling circuit.
CN201910687919.5A 2019-07-29 2019-07-29 Method for improving current sampling precision by using analog circuit Active CN110427067B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910687919.5A CN110427067B (en) 2019-07-29 2019-07-29 Method for improving current sampling precision by using analog circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910687919.5A CN110427067B (en) 2019-07-29 2019-07-29 Method for improving current sampling precision by using analog circuit

Publications (2)

Publication Number Publication Date
CN110427067A true CN110427067A (en) 2019-11-08
CN110427067B CN110427067B (en) 2024-04-16

Family

ID=68411056

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910687919.5A Active CN110427067B (en) 2019-07-29 2019-07-29 Method for improving current sampling precision by using analog circuit

Country Status (1)

Country Link
CN (1) CN110427067B (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112034233A (en) * 2020-08-31 2020-12-04 国网山东省电力公司电力科学研究院 High-precision alternating current testing device and method
CN112234886A (en) * 2020-08-27 2021-01-15 贵州恒芯微电子科技有限公司 Reverse excitation method of starting all-in-one machine
CN112526203A (en) * 2020-11-25 2021-03-19 中国船舶重工集团公司第七一六研究所 High-precision 4-20mA current signal acquisition circuit
CN113156192A (en) * 2021-02-26 2021-07-23 苏州优赛思电子科技有限公司 Current sampling device of high-voltage system of new energy vehicle
CN113257179A (en) * 2021-05-24 2021-08-13 中科芯集成电路有限公司 Zero-temperature-drift current circuit for built-in resistor of LED display driving chip
CN114336853A (en) * 2021-12-29 2022-04-12 西安华泰半导体科技有限公司 Equalizing circuit structure for multi-lithium battery pack time-sharing multiplexing sampling circuit
CN114879775A (en) * 2022-05-25 2022-08-09 上海迈振电子科技有限公司 Temperature control method, device, system, equipment and storage medium
CN115728547A (en) * 2022-10-10 2023-03-03 烟台东方威思顿电气有限公司 Open TMR array sensor access type direct current electric energy meter and precision compensation method

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5956627A (en) * 1997-07-08 1999-09-21 Uniden San Diego Research & Development Center, Inc. Temperature compensated power control circuit
JP2000009490A (en) * 1998-06-29 2000-01-14 Mitsubishi Heavy Ind Ltd Magnetostriction-type displacement detection device
JP2000137062A (en) * 1998-10-30 2000-05-16 Denso Corp Method and device for detecting residual capacity of secondary battery
CN101629973A (en) * 2009-06-09 2010-01-20 中国人民解放军国防科学技术大学 High-precision current sampling circuit without operational amplifier for low voltage power supply
CN201682428U (en) * 2008-08-30 2010-12-22 技领半导体(上海)有限公司 Converter adjusting output voltage
DE102010030866A1 (en) * 2009-07-30 2011-02-03 GM Global Technology Operations, Inc., Detroit Multiphase DC / DC boost converter
CN102353481A (en) * 2011-06-30 2012-02-15 华南理工大学 Method and device for complementing temperature and pressure of pressure sensor based on two-dimensional orthogonal function
WO2016067953A1 (en) * 2014-10-30 2016-05-06 ソニー株式会社 Receiving device and method
CN105738685A (en) * 2016-02-23 2016-07-06 南京中旭电子科技有限公司 Hall current sensor of digital signal output
CN106125813A (en) * 2016-08-01 2016-11-16 河北大学 A kind of high stability constant-current source of portable wide amount limit
CN106535401A (en) * 2016-11-18 2017-03-22 贵州恒芯微电子科技有限公司 Linear constant-current power supply for AC LED
CN106771486A (en) * 2016-12-20 2017-05-31 电子科技大学 A kind of current sampling circuit
CN109885121A (en) * 2019-03-22 2019-06-14 西安微电子技术研究所 A kind of current/frequency conversion circuit

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5956627A (en) * 1997-07-08 1999-09-21 Uniden San Diego Research & Development Center, Inc. Temperature compensated power control circuit
JP2000009490A (en) * 1998-06-29 2000-01-14 Mitsubishi Heavy Ind Ltd Magnetostriction-type displacement detection device
JP2000137062A (en) * 1998-10-30 2000-05-16 Denso Corp Method and device for detecting residual capacity of secondary battery
CN201682428U (en) * 2008-08-30 2010-12-22 技领半导体(上海)有限公司 Converter adjusting output voltage
CN101629973A (en) * 2009-06-09 2010-01-20 中国人民解放军国防科学技术大学 High-precision current sampling circuit without operational amplifier for low voltage power supply
DE102010030866A1 (en) * 2009-07-30 2011-02-03 GM Global Technology Operations, Inc., Detroit Multiphase DC / DC boost converter
CN102353481A (en) * 2011-06-30 2012-02-15 华南理工大学 Method and device for complementing temperature and pressure of pressure sensor based on two-dimensional orthogonal function
WO2016067953A1 (en) * 2014-10-30 2016-05-06 ソニー株式会社 Receiving device and method
CN105738685A (en) * 2016-02-23 2016-07-06 南京中旭电子科技有限公司 Hall current sensor of digital signal output
CN106125813A (en) * 2016-08-01 2016-11-16 河北大学 A kind of high stability constant-current source of portable wide amount limit
CN106535401A (en) * 2016-11-18 2017-03-22 贵州恒芯微电子科技有限公司 Linear constant-current power supply for AC LED
CN106771486A (en) * 2016-12-20 2017-05-31 电子科技大学 A kind of current sampling circuit
CN109885121A (en) * 2019-03-22 2019-06-14 西安微电子技术研究所 A kind of current/frequency conversion circuit

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112234886A (en) * 2020-08-27 2021-01-15 贵州恒芯微电子科技有限公司 Reverse excitation method of starting all-in-one machine
CN112034233A (en) * 2020-08-31 2020-12-04 国网山东省电力公司电力科学研究院 High-precision alternating current testing device and method
CN112526203A (en) * 2020-11-25 2021-03-19 中国船舶重工集团公司第七一六研究所 High-precision 4-20mA current signal acquisition circuit
CN113156192A (en) * 2021-02-26 2021-07-23 苏州优赛思电子科技有限公司 Current sampling device of high-voltage system of new energy vehicle
CN113257179A (en) * 2021-05-24 2021-08-13 中科芯集成电路有限公司 Zero-temperature-drift current circuit for built-in resistor of LED display driving chip
CN113257179B (en) * 2021-05-24 2023-02-28 中科芯集成电路有限公司 Zero-temperature-drift current circuit for built-in resistor of LED display driving chip
CN114336853A (en) * 2021-12-29 2022-04-12 西安华泰半导体科技有限公司 Equalizing circuit structure for multi-lithium battery pack time-sharing multiplexing sampling circuit
CN114336853B (en) * 2021-12-29 2023-11-28 西安华泰半导体科技有限公司 Equalization circuit structure for multiplexing sampling circuit during multi-lithium battery component
CN114879775A (en) * 2022-05-25 2022-08-09 上海迈振电子科技有限公司 Temperature control method, device, system, equipment and storage medium
CN115728547A (en) * 2022-10-10 2023-03-03 烟台东方威思顿电气有限公司 Open TMR array sensor access type direct current electric energy meter and precision compensation method

Also Published As

Publication number Publication date
CN110427067B (en) 2024-04-16

Similar Documents

Publication Publication Date Title
CN110427067A (en) A method of improving current sample precision with analog circuit
CN100470436C (en) Piecewise linearly compensated CMOS bandgap voltage reference
US9935598B2 (en) Differential amplifier design as the preamp of DMM
US20070103174A1 (en) Direct current test apparatus
US8680839B2 (en) Offset calibration technique to improve performance of band-gap voltage reference
CN113253712B (en) Test loading control system and calibration method
CN202433200U (en) High-accuracy data acquisition circuit for automotive resistance sensor
Larsen A new self-balancing DC-substitution RF power meter
CN114895231B (en) High-end voltage differential sampling calibration system and method
CN111352022A (en) Current calibration device and correction method for power supply channel in test system
CN111736651A (en) Temperature compensation constant current source circuit and temperature compensation method
US6750641B1 (en) Method and circuit for temperature nonlinearity compensation and trimming of a voltage reference
JP3081751B2 (en) Electric quantity measuring device
CN101772708A (en) Voltage transformation circuit
US7268711B1 (en) Method and circuit for amplitude compensation in a digital-to-analog converter
CN209841948U (en) Adjustable Hall voltage sensor
CN101887081B (en) Bridge zero adjustment circuit
CN106841751B (en) Voltage rise and fall quantitative detection circuit/device
CN210377196U (en) Circuit structure for improving current adoption precision by using analog circuit
US4612496A (en) Linear voltage-to-current converter
Lopez-Martin et al. Analysis of a negative impedance converter as a temperature compensator for bridge sensors
CN113702724A (en) Circuit and method for eliminating leakage current of charge test circuit
CN103178708B (en) Static charge source and method for calibrating same
JP2018021868A (en) Sensor device
CN101988960B (en) Digital electric meter capable of dynamically compensating and correcting reading

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant