CN102062617B - Method and device for generating reference quantity and measurement system - Google Patents
Method and device for generating reference quantity and measurement system Download PDFInfo
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- CN102062617B CN102062617B CN 201010590348 CN201010590348A CN102062617B CN 102062617 B CN102062617 B CN 102062617B CN 201010590348 CN201010590348 CN 201010590348 CN 201010590348 A CN201010590348 A CN 201010590348A CN 102062617 B CN102062617 B CN 102062617B
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Abstract
The invention discloses a method and a device for generating reference quantity and a measurement system. The method for generating the reference quantity comprises the following steps of: acquiring physical quantity of an environment of the electronic measurement system; and obtaining the reference quantity according to the physical quantity. By the method and the device, the output of the measurement system can accurately reflect the actual output of a measurement device.
Description
Technical field
The present invention relates to fields of measurement, in particular to a kind of production method of datum quantity and device, measuring system.
Background technology
Fig. 1 is the schematic diagram according to the measuring system of correlation technique.
Wherein, the output V1 of measuring system changes and monotone variation with distance x, and V1 changes with temperature T.V1 (a, T1) is that distance is a, the output of the system when temperature is T1.In some applications, in order to take out system's output of a～x distance, Vref=V1 (a, T1) be can set, then by subtracter A2, V1 and Vref poor output V2, that is: V2=|V1-Vref| got.But in this measuring system, because V1 varies with temperature, and Vref fixes, so after temperature became T2 by T1, the voltage that V2 represents was no longer the actual output of the system of a～x.
Often can not reflect that for datum quantity in correlation technique external environment changes, so cause utilizing output that datum quantity produces often can not reflected measurement the problem of the actual output of measurement mechanism in system, effective solution is not yet proposed at present.
Summary of the invention
Often can not reflect that for datum quantity in correlation technique external environment changes, and then cause utilizing output that datum quantity produces often can not reflected measurement the actual output of measurement mechanism in system problem and the present invention is proposed, for this reason, fundamental purpose of the present invention is to provide a kind of production method of datum quantity and device, measuring system, to address the above problem.
To achieve these goals, according to an aspect of the present invention, provide a kind of production method of datum quantity.The production method of this datum quantity comprises: the physical quantity of obtaining electronic measurement system environment of living in; Obtain datum quantity according to described physical quantity.
To achieve these goals, according to a further aspect in the invention, provide a kind of generation device of datum quantity.The generation device of this datum quantity comprises: acquiring unit, for the physical quantity of obtaining electronic measurement system environment of living in; Control module obtains datum quantity according to described physical quantity.
To achieve these goals, according to a further aspect in the invention, provide a kind of generation device of datum quantity.The generation device of this datum quantity comprises: acquiring unit, for the physical quantity of obtaining electronic measurement system environment of living in; Control module obtains the benchmark intermediate quantity according to described physical quantity; Digital-analogue converting device is used for described datum quantity intermediate quantity is carried out digital-to-analogue conversion, obtains datum quantity.
To achieve these goals, according to a further aspect in the invention, provide a kind of measuring system.This measuring system comprises: proving installation, be used for carrying out test operation, and obtain the first output valve; According to the generation device of datum quantity of the present invention, for generation of datum quantity; Substracting unit is used for obtaining the second output valve according to described the first output valve and described datum quantity, as the output valve of described test macro.
By the present invention, adopt and obtain temperature signal; Obtain the method for datum quantity according to described temperature signal, can consider that temperature is on the impact of datum quantity, solved in correlation technique datum quantity and often can not reflect that external environment changes, and then cause utilizing output that datum quantity produces often can not reflected measurement the problem of the actual output of measurement mechanism in system, and then reached and make datum quantity can reflect that external environment changes so that the accurate effect of the actual output of reflected measurement device of the output of measuring system.
Description of drawings
Accompanying drawing described herein is used to provide a further understanding of the present invention, consists of the application's a part, and illustrative examples of the present invention and explanation thereof are used for explaining the present invention, do not consist of improper restriction of the present invention.In the accompanying drawings:
Fig. 1 is the schematic diagram according to the measuring system of correlation technique;
Fig. 2 is the schematic diagram according to the generation device of the datum quantity of first embodiment of the invention;
Fig. 3 is the schematic diagram according to the generation device of the datum quantity of second embodiment of the invention;
Fig. 4 is the schematic diagram according to the measuring system of the embodiment of the present invention;
Fig. 5 is the process flow diagram according to the production method of the datum quantity of the embodiment of the present invention; And
Fig. 6 is the schematic diagram according to the measurement mechanism of the embodiment of the present invention.
Embodiment
Need to prove, in the situation that do not conflict, embodiment and the feature in embodiment in the application can make up mutually.Describe below with reference to the accompanying drawings and in conjunction with the embodiments the present invention in detail.
Fig. 2 is the schematic diagram according to the generation device of the datum quantity of first embodiment of the invention.
As shown in Figure 2, the generation device of this datum quantity comprises: acquiring unit, for the physical quantity of obtaining electronic measurement system environment of living in; Control module obtains datum quantity according to described physical quantity.
Wherein, acquiring unit comprises temperature sensor, is used for obtaining temperature signal, and wherein, this temperature signal also can adopt other devices or mode to obtain; Control module is used for obtaining datum quantity according to described temperature signal.
Preferably, above-mentioned control module can comprise single-chip microcomputer, wherein, has the digital-to-analogue conversion module in this single-chip microcomputer.
Wherein, above-mentioned control module also can not comprise the digital-to-analogue conversion module, and at this moment, the generation device of datum quantity comprises: temperature sensor, be used for obtaining temperature signal, wherein, if the temperature sensor of numeral output can directly obtain temperature value, if the temperature sensor of simulation output, also need output signal is carried out analog to digital conversion, for example, use the analog-to-digital conversion module in analog to digital converter or single-chip microcomputer to change; Control module, datum quantity in the middle of being used for obtaining according to described temperature signal; Digital-analogue converting device is used for described datum quantity intermediate quantity is carried out digital-to-analogue conversion, obtains datum quantity.
In the generation device of above-mentioned datum quantity, digital-analogue converting device can be digital-to-analogue conversion module or integrator.
Above-mentioned datum quantity can be reference voltage and/or reference current.
At first be described as an example of reference voltage example:
As shown in Figure 2, A3 is control module, such as single-chip microcomputer etc.; T is temperature signal, for example the output of thermistor equitemperature sensor; M is the M signal that Vref produces, and is generally digital quantity, signals such as PWM, digit pulse; A4 is the reference voltage generation unit; Vref is temperature variant reference voltage, control module A3 receives the voltage signal Vt of temperature, and obtain the intermediate quantity of reference voltage according to described voltage signal Vt, wherein, the intermediate quantity of this reference voltage is the directly reference voltage of output of control module A3, and then conversion equipment A4 obtains reference voltage according to the intermediate quantity of this reference voltage.
Wherein, conversion equipment A4 can be DA module or integrator.
The below is described as an example of reference voltage example:
Fig. 3 is the schematic diagram according to the generation device of the datum quantity of second embodiment of the invention.
Wherein, A3 is control module, such as single-chip microcomputer etc.; T is temperature signal, for example the output of thermistor equitemperature sensor; M is the M signal that Iref produces, and is generally digital quantity, signals such as PWM, digit pulse; A4 is the reference current generation unit; Iref is temperature variant reference current.
As shown in Figure 3, control module A3 receives the current signal It of temperature, and obtains the intermediate quantity of reference current according to described current signal It, and then conversion equipment A4 obtains reference current according to the intermediate quantity of this reference current.
Similarly, A4 can be the DA module, also can be integrator.The DA module response time is fast, and precision is high, the convenient application, and integration is good, but general cost is higher; The integrator response time is slow, and ratio of precision is lower, but cost is low.
In some systems, A3 and A4 can integrate, such as with single-chip microcomputer of DA module etc.
During normal operation, control module A3 gathers the T signal, after then control module A3 carries out internal arithmetic, produces temperature variant reference voltage V ref by A4.The internal arithmetic of V3 is such as the method such as tabling look-up, and table 1 is temperature form example.When temperature T satisfies: during T1＜T＜T2, Vref=Vref1 (1.2V); When temperature T satisfies: during T3＜T＜T4, Vref=Vref3 (2.4V).
Table 1
| Temperature | T1(-40℃) | T2(-20℃) | T3(0℃) | T4(20℃) | T5(40℃) | T6(60℃) |
| Output voltage | Vref1(1.2V) | Vref2(1.8V) | Vref3(2.4V) | Vref4(3V) | Vref5(3.6V) | Vref6(4.2V) |
The present invention can produce temperature variant benchmark Vref.
Fig. 4 is the schematic diagram according to the measuring system of the embodiment of the present invention.
In this embodiment, be described as an example of voltage example, need to prove, measuring system of the present invention is not limited to the situation of voltage, and corresponding to above-mentioned device embodiment, measuring system of the present invention is the same situation that is applicable to electric current also.
As shown in Figure 2, control module A3 receives the voltage signal Vt of temperature, and obtains the intermediate quantity of reference voltage according to described voltage signal Vt, and then conversion equipment A4 obtains reference voltage according to the intermediate quantity of this reference voltage.Wherein, conversion equipment A4 can be DA module or integrator.
Measurement mechanism A1 is used for carrying out the measurement operation, obtains the first output valve;
Substracting unit A2 obtains the second output valve as the output valve of this measuring system for the reference voltage that the first output valve and conversion equipment A4 according to measurement mechanism A1 output obtain.
In this embodiment, owing to having considered the impact of temperature on reference voltage, and according to the variation of temperature, reference voltage is adjusted, thereby can be made the measuring system output of reflected measurement device accurately.
Fig. 5 is the process flow diagram according to the production method of the datum quantity of the embodiment of the present invention.
Step S502 obtains the physical quantity of electronic measurement system environment of living in.
For example, can be the temperature signal that obtains this electronic measurement system environment of living in.
Wherein, after obtaining temperature signal, the method can also comprise: obtain the benchmark intermediate quantity according to described temperature signal; Described datum quantity intermediate quantity is carried out digital-to-analogue conversion, obtain described datum quantity.
Step S504 obtains datum quantity according to described physical quantity.For example, obtain datum quantity according to the above-mentioned temperature signal of mentioning
Preferably, above-mentioned method can also comprise:
Obtain the first output valve of measuring system; And
Obtain the second output valve according to described the first output valve and described datum quantity.
Preferably, obtaining datum quantity according to described temperature signal comprises: utilize the temperature value and the corresponding relation between datum quantity that prestore to obtain described datum quantity according to described temperature signal.
Preferably, described datum quantity comprises reference voltage and/or reference current.
Fig. 6 is the schematic diagram according to the measurement mechanism of the embodiment of the present invention.
As shown in Figure 6, this measurement mechanism is the schematic diagram of the embodiment of above-mentioned measurement mechanism A1.Wherein, A1 can be distance measuring equipment, as shown in the figure, the variation apart from x can be converted into the variation of output signal V1.The telefault L negative feedback that afterwards access operational amplifier A 10 in parallel with capacitor C.VSIN is sinewave output, and its amplitude is subjected to affect apart from x.Operational amplifier A 12 is used for limiting the sinusoidal wave rise time with feedback element A14.The output VA2 of A13 is transformed to square wave by phase inverter A15, and then square wave drove LC shunt circuit generation vibration afterwards through R2.Can control the amplitude of VSIN by the size of adjusting R2.VSIN is by output direct current signal V1 after rectification unit A16.
In addition, A1 can be device for pressure measurement in addition, the variation of pressure x is converted into the variation of output signal V1; A1 also can be Vibration-Measuring System, the variation of vibratory output x is converted into the variation of output signal V1.
A2 can be subtraction circuit, also can realize the system of subtraction function for other, for example the subtraction program in single-chip microcomputer.
the present embodiment is with the physical quantity of temperature as electronic measurement system environment of living in, above-mentioned method namely, device, system is all described as an example of the raising measuring accuracy example with compensates, but for the technician in electronic surveying field, only need temperature change be the environmental physics amount (humidity for example of other influences electronic measurement system measuring accuracy, air pressure, height above sea level etc.), namely can the variation of these physical quantitys be compensated to the error that electronic measurement system brings, and only limit to temperature sensor is changed into the sensor of other environmental physics amounts for the change of above-described embodiment, the form that uses of tabling look-up is replaced by the corresponding table of other environmental physics amounts and datum quantity output voltage.
As can be seen from the above description, the invention enables datum quantity can reflect that external environment changes, and and then make the accurately actual output of reflected measurement device of output of measuring system.
The above is only the preferred embodiments of the present invention, is not limited to the present invention, and for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any modification of doing, be equal to replacement, improvement etc., within all should being included in protection scope of the present invention.
Claims (1)
1. a measuring system, is characterized in that, comprising:
Measurement mechanism is used for carrying out test operation, obtains the first output valve;
The generation device of datum quantity, for generation of datum quantity, wherein said datum quantity produces in the following manner: obtain the physical quantity of measuring system environment of living in, and obtain datum quantity according to described physical quantity;
Substracting unit is used for obtaining the second output valve according to described the first output valve and described datum quantity, as the output valve of described measuring system,
Wherein, described measurement mechanism comprises:
The first operational amplifier (A10);
The first resistance (R1), first end ground connection, the second end is connected with the positive input of described the first operational amplifier (A10);
The second resistance (R2), first end is connected with the reverse input end of described the first operational amplifier (A10);
Phase inverter (A15);
The second operational amplifier (A13), positive input is connected with the output terminal of described the first operational amplifier (A10), reverse input end is connected via the output terminal of feedback element (A14) with described the second operational amplifier (A13), and the output terminal of described the second operational amplifier (A13) is transformed to square wave via phase inverter (A15), then the second end of described the second resistance of square wave input (R2) shakes to drive by the LC shunt circuit generation that forms that is connected in parallel of electric capacity (C) and inductance (L); The first end of the parallel connection of described electric capacity (C) and described inductance (L) is connected to first node, wherein, described first node is the node between described the second resistance (R2) and described the first operational amplifier (A10), be output as sinewave output after described electric capacity (C) and described inductance (L) parallel connection, described the second operational amplifier (A13) is used for limiting the sinusoidal wave rise time with feedback element (A14); Can control sinusoidal wave amplitude by the size of adjusting the second resistance (R2);
Wherein, this sinusoidal wave amplitude is subjected to the impact of physical quantity distance X, and described measurement mechanism is converted into the variation of described distance X the variation of described the first output valve; And
Rectification unit (A16) is connected to the second end of the parallel connection of described electric capacity (C) and described inductance (L), and sinewave output is by described the first output valve of output after rectification unit (A16).
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1964080A (en) * | 2006-11-30 | 2007-05-16 | 武汉电信器件有限公司 | A SCM-based bias voltage temperature compensation device of APD detector and its control flow |
| CN201327703Y (en) * | 2008-12-12 | 2009-10-14 | 天马微电子股份有限公司 | Temperature compensating device and liquid crystal display module |
| CN101610081A (en) * | 2009-07-16 | 2009-12-23 | 东莞市大普通信技术有限公司 | Temperature compensating crystal oscillator |
| CN101799536A (en) * | 2010-04-02 | 2010-08-11 | 深圳市度彼电子有限公司 | Method and equipment for improving accuracy of laser distance measuring instrument |
-
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- 2010-12-15 CN CN 201010590348 patent/CN102062617B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1964080A (en) * | 2006-11-30 | 2007-05-16 | 武汉电信器件有限公司 | A SCM-based bias voltage temperature compensation device of APD detector and its control flow |
| CN201327703Y (en) * | 2008-12-12 | 2009-10-14 | 天马微电子股份有限公司 | Temperature compensating device and liquid crystal display module |
| CN101610081A (en) * | 2009-07-16 | 2009-12-23 | 东莞市大普通信技术有限公司 | Temperature compensating crystal oscillator |
| CN101799536A (en) * | 2010-04-02 | 2010-08-11 | 深圳市度彼电子有限公司 | Method and equipment for improving accuracy of laser distance measuring instrument |
Non-Patent Citations (1)
| Title |
|---|
| 许国忠，饶连周.基于单片机ADuC845的pH计的设计.《三明学院学报》.2009,第26卷(第2期), * |
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