CN102031065B - 无磨料的化学机械抛光组合物 - Google Patents
无磨料的化学机械抛光组合物 Download PDFInfo
- Publication number
- CN102031065B CN102031065B CN2010102981564A CN201010298156A CN102031065B CN 102031065 B CN102031065 B CN 102031065B CN 2010102981564 A CN2010102981564 A CN 2010102981564A CN 201010298156 A CN201010298156 A CN 201010298156A CN 102031065 B CN102031065 B CN 102031065B
- Authority
- CN
- China
- Prior art keywords
- methacrylic acid
- weight
- acid
- composition
- acidic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/04—Aqueous dispersions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/32115—Planarisation
- H01L21/3212—Planarisation by chemical mechanical polishing [CMP]
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Dispersion Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/586,642 | 2009-09-25 | ||
| US12/586,642 US20110073800A1 (en) | 2009-09-25 | 2009-09-25 | Abrasive-free chemical mechanical polishing compositions |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102031065A CN102031065A (zh) | 2011-04-27 |
| CN102031065B true CN102031065B (zh) | 2013-09-11 |
Family
ID=43779265
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010102981564A Expired - Fee Related CN102031065B (zh) | 2009-09-25 | 2010-09-21 | 无磨料的化学机械抛光组合物 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20110073800A1 (enExample) |
| JP (1) | JP2011082512A (enExample) |
| KR (1) | KR20110033786A (enExample) |
| CN (1) | CN102031065B (enExample) |
| TW (1) | TW201127924A (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9376594B2 (en) | 2012-03-16 | 2016-06-28 | Fujimi Incorporated | Polishing composition |
| SG11201500924PA (en) | 2012-08-31 | 2015-04-29 | Fujimi Inc | Polishing composition and method for producing substrate |
| US20140308814A1 (en) * | 2013-04-15 | 2014-10-16 | Applied Materials, Inc | Chemical mechanical polishing methods and systems including pre-treatment phase and pre-treatment compositions |
| CN104002252B (zh) * | 2014-05-21 | 2016-06-01 | 华侨大学 | 超细磨料生物高分子柔性抛光膜及其制备方法 |
| US10181408B2 (en) * | 2017-01-31 | 2019-01-15 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing method for tungsten using polyglycols and polyglycol derivatives |
| CN113969173B (zh) * | 2021-09-23 | 2022-05-13 | 易安爱富(武汉)科技有限公司 | 一种ITO/Ag/ITO复合金属层薄膜的蚀刻液 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1455784A (zh) * | 1999-04-30 | 2003-11-12 | 综研化学株式会社 | 丙烯酸类聚合物的制造方法 |
| US20060110924A1 (en) * | 2004-11-24 | 2006-05-25 | Tirthankar Ghosh | Abrasive-free chemical mechanical polishing compositions and methods relating thereto |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001300285A (ja) * | 2000-04-18 | 2001-10-30 | Sanyo Chem Ind Ltd | 研磨用砥粒分散剤及び研磨用スラリー |
| DE60124940T2 (de) * | 2000-09-21 | 2007-09-20 | Rohm And Haas Co. | Methoden und zusammensetzungen betreffend polare monomere und mehrwärtige kationen |
| US6433061B1 (en) * | 2000-10-24 | 2002-08-13 | Noveon Ip Holdings Corp. | Rheology modifying copolymer composition |
| US7288616B2 (en) * | 2002-01-18 | 2007-10-30 | Lubrizol Advanced Materials, Inc. | Multi-purpose polymers, methods and compositions |
-
2009
- 2009-09-25 US US12/586,642 patent/US20110073800A1/en not_active Abandoned
-
2010
- 2010-09-16 KR KR1020100090903A patent/KR20110033786A/ko not_active Withdrawn
- 2010-09-21 TW TW099131937A patent/TW201127924A/zh unknown
- 2010-09-21 CN CN2010102981564A patent/CN102031065B/zh not_active Expired - Fee Related
- 2010-09-24 JP JP2010213450A patent/JP2011082512A/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1455784A (zh) * | 1999-04-30 | 2003-11-12 | 综研化学株式会社 | 丙烯酸类聚合物的制造方法 |
| US20060110924A1 (en) * | 2004-11-24 | 2006-05-25 | Tirthankar Ghosh | Abrasive-free chemical mechanical polishing compositions and methods relating thereto |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2011082512A (ja) | 2011-04-21 |
| TW201127924A (en) | 2011-08-16 |
| KR20110033786A (ko) | 2011-03-31 |
| CN102031065A (zh) | 2011-04-27 |
| US20110073800A1 (en) | 2011-03-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130911 Termination date: 20150921 |
|
| EXPY | Termination of patent right or utility model |