CN102012460A - Method and system for measuring alternating current impedance characteristic of material or electronic component under extreme condition - Google Patents
Method and system for measuring alternating current impedance characteristic of material or electronic component under extreme condition Download PDFInfo
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- CN102012460A CN102012460A CN 201010290764 CN201010290764A CN102012460A CN 102012460 A CN102012460 A CN 102012460A CN 201010290764 CN201010290764 CN 201010290764 CN 201010290764 A CN201010290764 A CN 201010290764A CN 102012460 A CN102012460 A CN 102012460A
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Abstract
The invention relates to a method and a system for measuring an alternating current impedance characteristic of a material or an electronic component under the extreme condition. The method comprises the following steps of: 1, arranging a sample in a comprehensive physics property measurement system with the extreme condition; 2, implementing the scanning measurement function by circularly setting measurement parameters of an inductance, capacitance and resistance (LCR) instrument; 3, measuring the alternating current impedance of the sample by using the LCR instrument; and 4, eliminating an error. In the system, the comprehensive physics property measurement system and the LCR instrument are connected with a microcomputer terminal through a general purpose interface bus (GPIB) interface bus. The invention can measure the alternating current impedance characteristics of the samples or devices under the conditions of extremely low temperature and strong magnetic field.
Description
Technical field
Novel a kind of physical property method of testing and the system of relating to of the present invention relates in particular to the method and system of measuring material or electron device ac impedance characteristic under a kind of extreme condition.
Background technology
In numerous material mechanism, the research of extraordinary electron device, need measuring samples or device ac impedance characteristic and then definite its material character or the performance under utmost point low temperature, high-intensity magnetic field condition usually.General ac impedance characteristic measuring equipment because of its temperature that provides with the magnetic field precision is not enough and variation range is narrow, can not satisfy the fundamental research demand of modern material and device; And the measuring equipment of specialty costs an arm and a leg and function singleness.
The comprehensive rerum natura measuring system of U.S. Quantum Design company (Physics Property Measurement System, PPMS) perfect control low temperature and high-intensity magnetic field platform, various rerum natura measurement means such as integrated full automatic electricity, magnetics, calorifics, photoelectricity, pattern are provided; At present, the sign that it has become experimental measurements is widely used in numerous research fields of physics, chemistry and material science, spreads all over nearly all world-class related experiment chamber.Report in " the comprehensive simple and easy description of product handbook of rerum natura measuring system (PPMS); U.S. Quantum Design company ", PPMS itself has vast majority of conventional rerum natura measurement function, but do not possess the ac impedance characteristic measurement function in its expanding function option, as under different a-c cycles to inductance (L), electric capacity (C), resistance (R), impedance (Z), reactance (X), admittance (Y), the electricity of sample lead (G), susceptance (B), loss (D), quality factor (Q), phasing degree parameters such as (θ) is measured.
Summary of the invention
The purpose of this invention is to provide under a kind of extreme condition the method for measuring material or electron device ac impedance characteristic, can be under utmost point low temperature and high-intensity magnetic field condition measuring samples or device ac impedance characteristic.
Another purpose of the present invention is the defective at prior art, and the system of measuring material or electron device ac impedance characteristic is provided under a kind of extreme condition, can be under utmost point low temperature and high-intensity magnetic field condition measuring samples or device ac impedance characteristic.
For realizing purpose of the present invention, the present invention adopts following technical proposals:
Measure the method for material or electron device ac impedance characteristic under a kind of extreme condition, it is characterized in that operation steps is:
A. comprehensive rerum natura measuring system provides required utmost point low temperature and high-intensity magnetic field condition for test, and regulates sample or device and magnetic field angle direction; Testing sample or device are fixed on sample holder or the swingle with double faced adhesive tape and anchor clamps, and sample holder or swingle place in the liquid helium Dewar sample cavity;
B. by circulation LCR instrument measurement parameter is set and realizes the scanning survey function.At present some LCR instrument does not also possess the scanning survey function, or scanning count limited; Data acquisition and analysis system is realized ac impedance characteristic scanning survey function by frequency, amplitude and the Dc bias parameter of GPIB order loop modification AC measurment signal;
C. after sample temperature and magnetic field value reach preset value, utilize the ac impedance characteristic of LCR instrument measurement sample or device;
D. eliminate error: do not adding under the sample situation, measuring respectively that cable between LCR table and sample holder is opened a way and corresponding various a-c cycle impedances during short circuit; Adding under the sample situation then, falling this back of the body end impedance by deduction and obtain more accurate result.
The extremely low temperature temperature range of described extreme condition is 2-380K, and the high-intensity magnetic field scope is 0-9T.
Measure the system of the ac impedance characteristic of material or electron device under a kind of extreme condition, comprise a comprehensive rerum natura measuring system (PPMS), a LCR table and a microcomputer terminal, it is characterized in that: described comprehensive rerum natura measuring system, LCR instrument link to each other with the microcomputer terminal by the gpib interface bus, and this microcomputer terminal comprises a data acquisition analysis system.
In the system of described measuring samples or device ac impedance characteristic, comprehensive rerum natura measuring system, LCR instrument link to each other with the microcomputer terminal by the gpib interface bus, and the microcomputer terminal comprises a data acquisition analysis system.By comprehensive rerum natura measuring system Control Software MultiVu to whole measuring task compile script program.MultiVu writes comprehensive rerum natura measuring system control module M6000 internal memory by gpib bus with shell script, and the temperature of M6000 control liquid helium Dewar sample cavity and magnetic field and sample orientation and transmission order Advise Number control ac impedance characteristic are measured.
Data acquisition and analysis system comprises a software program, and described program comprises the sample measurement environmental parameter in temperature and magnetic field in order to collection, and the control ac impedance characteristic is measured, and can show various data and drawing in real time, realizes data deposit function.Particularly, described software program name is called LCR with PPMS, described program is obtained data such as sample cavity temperature and magnetic field by the comprehensive rerum natura measuring system of comprehensive rerum natura measuring system SCPI (programmable instrument standard command set) command access control module M6000, and accept the order Advise Number that M6000 sends, control LCR instrument measurement ac impedance characteristic.Described program possesses real time data and monitors, draws and the deposit function.
The present invention has the following advantages compared to existing technology:
1. applied widely, the varying magnetic field that can relent is on a large scale measured material sample or electron device ac impedance characteristic, scalable sample or device and magnetic field angle measuring samples or device anisotropy.
2. realize LCR table scan measurement function by software approach, do not retouch and sweep the restriction of counting, flexible setting for parameters.
3. use easy to operately, the automaticity height can operate for a long time.Configure corresponding measuring task shell script before the measurement, only needing simultaneously during measurement, the service data acquisition software gets final product with comprehensive rerum natura measuring system Control Software MultiVu.
4. expand new function on the platform of maturation, cost is low, and technology is reliable.
Description of drawings
Fig. 1 system architecture diagram of the present invention.
Fig. 2 metering circuit connection layout.
Fig. 3 data acquisition and analysis system surface chart.
Fig. 4 LCR table is measured process flow diagram.
Fig. 5 MultiVu measures the shell script exemplary plot.
Embodiment
Preferred embodiment of the present invention accompanying drawings is as follows:
Embodiment one: referring to Fig. 1 and Fig. 2, measure the method for material ac impedance characteristic under this extreme condition, operation steps is:
A. comprehensive rerum natura measuring system 2 provides required utmost point low temperature and high-intensity magnetic field condition for test, and regulates sample 5 and magnetic field angle direction; Testing sample 5 usefulness double faced adhesive tapes and anchor clamps are fixed on sample holder 6 or the swingle, and sample holder 6 or swingle place in liquid helium Dewar 4 sample cavities;
B. by circulation LCR instrument 3 measurement parameters are set and realize the scanning survey function;
C. after sample 5 temperature magnetic field values reach preset value, utilize LCR instrument 3 measuring samples 5 AC impedance;
D. eliminate error: under not load sample or device situation, corresponding various a-c cycle impedances when measuring 6 cables of LCR table 3 and sample holder, 7 open circuits and short circuit respectively; Under load sample 5 situations, fall this back of the body end impedance by deduction and obtain more accurate result then.
The extremely low temperature temperature range of described extreme condition is 2-380K, and the high-intensity magnetic field scope is 0-9T.
Embodiment two: as Fig. 1, Fig. 2 and Fig. 4, measure the system of material ac impedance characteristic under this extreme condition, comprise a comprehensive rerum natura measuring system 2, a LCR instrument 3 and a microcomputer terminal 1, it is characterized in that: described comprehensive rerum natura measuring system 2 links to each other with microcomputer terminal 1 by the gpib interface bus with LCR instrument 3, and this microcomputer terminal 1 comprises a data acquisition analysis system.Described data acquisition and analysis system has gathers the total system data, comprises the temperature of sample 5 and magnetic field value and LCR instrument 3 measurement results with the every numerical value of timely demonstration, and data are drawn, and finish data deposit function.Described data acquisition and analysis system receives message code control LCR table 3 measurement that comprehensive rerum natura measuring system 2 sends by comprehensive rerum natura measuring system Control Software MultiVu setting measurement shell script.Described data acquisition and analysis system is provided with LCR instrument 3 measurement parameters by circulation and realizes the scanning survey function.
Embodiment three: details are as follows for present embodiment:
1. metering circuit connects: sample to be measured is fixed on the sample holder zone line surface with double faced adhesive tape, keep better thermo-contact, utilize elargol to draw two metal lead wires on the sample and be welded to the I-end of the passage 1 in the sample holder respectively and the I-end of passage 3, metal lead wire should be lacked as far as possible and directly be reduced the entire circuit distribution parameter, as shown in Figure 2.The sample holder places on the Dewar sample carrier, and Dewar inside has lead to connect the sample holder to special-purpose socket, is connected to the LCR table by concentric cable.
2. setting measurement shell script: utilize comprehensive rerum natura measuring system Control Software MultiVu to write the measurement shell script, as shown in Figure 5, the 1st behavior scanning heat command, begin to lower the temperature from 300K with 1.5K/ minute speed, and executor Scan is to the order between End Scan on 291 equitemperature spaced points between 300K to 10K, here be and send order Advise Number 21, carry out LCR fixed frequency spot measurement task.The 4th behavior sends order Advise Number 22, and LCR carries out scanning (comprising the measuring-signal frequency, amplitude, Dc bias) measurement function.The magnetic field execution LCR fixed frequency spot measurement task of sweeping is retouched in the 5th behavior.
3. editor's sweep parameter: utilize Window notepad program editing sweep parameter, as: 50,0.5,0; 60, n, 0; 1000, n, n; , first parameter is the test a-c cycle, and second is test AC signal amplitude, and the 3rd is the test signal Dc bias, and parameter current does not change if " n " then represents to keep the LCR table.
4. measure: open the LCR apparent source, connect the GPIB order wire, after treating that instrument initialization preheating finishes, be provided with and measure the impedance type parameter, service data acquisition analysis system software LCR with PPMS chooses " Enable ", and the parameter that the 3rd step was editted copies in the Scan Array frame, click " Set " and be written into sweep parameter, move the shell script of the 2nd step setting at last.
5. data processing: prison shows measurement data in real time, draws, and preserves data, as shown in Figure 3.
Claims (7)
1. measure the method for material or electron device ac impedance characteristic under the extreme condition, it is characterized in that operation steps is:
A. comprehensive rerum natura measuring system (2) provides required utmost point low temperature and high-intensity magnetic field condition for test, and regulates sample (5) or electron device and magnetic field angle direction; Testing sample (5) or device are fixed on sample holder (6) or the swingle with double faced adhesive tape and anchor clamps, and sample holder (6) or swingle place in liquid helium Dewar (4) sample cavity;
B. by circulation LCR instrument (3) measurement parameter is set and realizes the scanning survey function;
C. after sample (5) or device temperature magnetic field value reach preset value, utilize LCR instrument (3) measuring samples (5) or device AC impedance;
D. eliminate error: under not load sample or device situation, measure respectively that cable (7) between LCR table (3) and sample holder (6) is opened a way and corresponding various a-c cycle impedances during short circuit; Under load sample (5) or device situation, fall this back of the body end impedance by deduction and obtain more accurate result then.
2. measure the method for material or electron device ac impedance characteristic as described in requiring as right 1 under the extreme condition, it is characterized in that: the utmost point cryogenic temperature scope of extreme condition: 2-380K.
3. measure the method for material or electron device ac impedance characteristic as described in requiring as right 1 under the extreme condition, it is characterized in that: the high-intensity magnetic field scope of extreme condition: 0-9T.
4. measure the system of material or device ac impedance characteristic under the extreme condition, comprise a comprehensive rerum natura measuring system (2), a LCR instrument (3) and a microcomputer terminal (1), it is characterized in that: described comprehensive rerum natura measuring system (2) links to each other with microcomputer terminal (1) by the gpib interface bus with LCR instrument (3), and this microcomputer terminal (1) comprises a data acquisition analysis system.
5. as the system of measurement material as described in the claim 4 or device ac impedance characteristic, it is characterized in that: described data acquisition and analysis system has the total system of collection data, comprise that the temperature of sample (5) or device and magnetic field value and LCR instrument (3) measurement result are with the every numerical value of timely demonstration, data are drawn, and finish data deposit function.
6. as the system of measurement material as described in the claim 4 or device ac impedance characteristic, it is characterized in that: described data acquisition and analysis system receives message code control LCR table (3) measurement that comprehensive rerum natura measuring system sends by comprehensive rerum natura measuring system Control Software MultiVu setting measurement shell script.
7. as the method and system of measurement material as described in claim 1 and the claim 4 or device ac impedance characteristic, it is characterized in that: described data acquisition and analysis system is provided with LCR instrument (3) measurement parameter by circulation and realizes the scanning survey function.
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| Application Number | Priority Date | Filing Date | Title |
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| CN 201010290764 CN102012460B (en) | 2010-09-21 | 2010-09-21 | Method and system for measuring alternating current impedance characteristic of material or electronic component under extreme condition |
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| CN 201010290764 CN102012460B (en) | 2010-09-21 | 2010-09-21 | Method and system for measuring alternating current impedance characteristic of material or electronic component under extreme condition |
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| CN102012460A true CN102012460A (en) | 2011-04-13 |
| CN102012460B CN102012460B (en) | 2013-01-09 |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104931808A (en) * | 2014-12-08 | 2015-09-23 | 上海大学 | System for automatically measuring material pyroelectric performance under extreme condition |
| CN105067677A (en) * | 2015-08-05 | 2015-11-18 | 西部超导材料科技股份有限公司 | Superconductive wire rod Cu/Sc test device |
| CN108051488A (en) * | 2017-11-28 | 2018-05-18 | 河南师范大学 | A kind of easily 4- collimation methods pressure electrode method |
| CN113654455A (en) * | 2021-09-13 | 2021-11-16 | 哈尔滨工业大学 | Method for testing material strain |
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| CN101592581A (en) * | 2008-05-29 | 2009-12-02 | 索尼株式会社 | Property measurement apparatus and property measurement method |
| WO2010035775A1 (en) * | 2008-09-26 | 2010-04-01 | 株式会社堀場製作所 | Device for measuring physical property of particle |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101592581A (en) * | 2008-05-29 | 2009-12-02 | 索尼株式会社 | Property measurement apparatus and property measurement method |
| WO2010035775A1 (en) * | 2008-09-26 | 2010-04-01 | 株式会社堀場製作所 | Device for measuring physical property of particle |
Non-Patent Citations (1)
| Title |
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| 《现代仪器》 20041231 张焱等 物理性质测量系统(PPMS)的原理及其应用 44-47 1-7 , 第5期 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104931808A (en) * | 2014-12-08 | 2015-09-23 | 上海大学 | System for automatically measuring material pyroelectric performance under extreme condition |
| CN105067677A (en) * | 2015-08-05 | 2015-11-18 | 西部超导材料科技股份有限公司 | Superconductive wire rod Cu/Sc test device |
| CN105067677B (en) * | 2015-08-05 | 2019-03-19 | 西部超导材料科技股份有限公司 | A kind of superconducting wire copper hypergeometric test equipment |
| CN108051488A (en) * | 2017-11-28 | 2018-05-18 | 河南师范大学 | A kind of easily 4- collimation methods pressure electrode method |
| CN113654455A (en) * | 2021-09-13 | 2021-11-16 | 哈尔滨工业大学 | Method for testing material strain |
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