CN103995202B - A kind of automatic signal method of testing, Apparatus and system - Google Patents
A kind of automatic signal method of testing, Apparatus and system Download PDFInfo
- Publication number
- CN103995202B CN103995202B CN201410222307.6A CN201410222307A CN103995202B CN 103995202 B CN103995202 B CN 103995202B CN 201410222307 A CN201410222307 A CN 201410222307A CN 103995202 B CN103995202 B CN 103995202B
- Authority
- CN
- China
- Prior art keywords
- test
- signal
- vector
- command information
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
Embodiments of the invention provide a kind of automatic signal method of testing, Apparatus and system, relate to electronic product technical field of measurement and test, solve the problem that existing signal testing needs to use manual testing, achieve the automatization of signal testing, increase the range of application of signal testing, enhance the repeatability of signal testing.Meanwhile, work efficiency is greatly improved.The method includes: receive the test command information that user sends；According to the test command information received, obtain schematic diagram and the printed substrate pcb document of measured signal place tested single board；Schematic diagram according to measured signal place tested single board and pcb document, select test template；According to the selection test node command information received, test template selects test node；According to test node and test template, obtain detectable signal by test probe；Detectable signal is analyzed, obtains testing data and resolution chart.The present invention is applied in signal testing.
Description
Technical field
The present invention relates to electronic product technical field of measurement and test, particularly relate to a kind of automatic signal test
Method, Apparatus and system.
Background technology
Modern electronic product, in exploitation and production process, needs product is carried out various test,
It is generally divided into three kinds: functional test, performance test and signal testing.Wherein, functional test and
Also referred to as " Black-box Testing ", its test result is centrifugal pump, one group of array or sentences in performance test
Disconnected result, is therefore referred to as " one-dimensional test ".
Signal testing also referred to as " white-box testing ", its test result be measurand in time
Or after spatial variations and their Mathematical Calculations as a result, it is possible to obtain according to test result
To two dimension or distributed in three dimensions matrix information, the displaying that therefore " white-box testing " can become apparent from
Distribution relation between measurand, it is provided that more object information.
But the realization of " white-box testing " needs more technology, instrument and software kit, because of
This " white-box testing " is although being worth relatively big but applying the most extensive.Simultaneously as it is technical
Reason, " white-box testing " range of application ratio is narrow, and only minority electrons enterprise is at product sample
The machine development phase introduces " white-box testing " on a small quantity." white-box testing " in prior art
It is typically with manual testing, the most inevitably there is efficiency low, poor repeatability, cover
The problem that lid rate is low.
Summary of the invention
Embodiments of the invention provide a kind of automatic signal method of testing, Apparatus and system, solve
The problem that existing signal testing needs to use manual testing, it is achieved that signal testing automatic
Change, increase the range of application of signal testing, enhance the repeatability of signal testing.Meanwhile,
Greatly improve work efficiency.
For reaching above-mentioned purpose, embodiments of the invention adopt the following technical scheme that
First aspect, it is provided that a kind of automatic signal method of testing, it is characterised in that described method
It is applied to automatic signal test software, including:
Receive the test command information that user sends；
According to the described test command information received, obtain measured signal place tested single board
Schematic diagram and printed substrate pcb document；
Schematic diagram according to described measured signal place tested single board and described pcb document, select
Test template；
According to the selection test node command information received, select to survey in described test template
Examination node；
According to described test node and described test template, obtain detection letter by test probe
Number；
Described detectable signal is analyzed, obtains testing data and resolution chart.
In the implementation that the first is possible, in conjunction with first aspect, described according to described test
Node and test template, obtain detection data by test probe and include:
According to described test node and described test template, configure described test node and described survey
Mapping relations between probe header；
According to the selection test vector command information received, select test vector；
Receive vector test command information；
According between described vector test command information and described test node and test probe
Mapping relations, arrange the parameter of test instrunment, self-reacting device and electric arm；
According to described test vector, control institute by described test instrunment and described self-reacting device
State electric arm to be controlled obtaining detectable signal to described test probe.
In the implementation that the second is possible, in conjunction with first aspect or realization that the first is possible
Mode, before described reception vector test command information, also includes:
Obtain test criteria；Wherein, described test criteria is according to described measured signal and tested
Veneer determines；
Described described detectable signal is processed, obtain testing data and resolution chart, including:
Described detectable signal is analyzed the most qualified according to described test criteria；
If described detectable signal is qualified, then according to described detectable signal obtain described test data and
Described resolution chart.
In the implementation that the third is possible, in conjunction with the implementation that the second is possible, described
Method also includes:
If described detectable signal is defective, then perform described according to described test node and test visit
Mapping relations between Tou arrange the parameter of test instrunment, self-reacting device and electric arm, directly
To obtaining described test data and described resolution chart.
In the 4th kind of possible implementation, in conjunction with first aspect, described to described detection letter
Number it is analyzed, after obtaining testing data and resolution chart, also includes:
Judge whether each described test vector has been tested；
If there is the test vector do not tested in described test vector, then basis receives
Test vector command information is selected to select test vector, until each described test vector is all tested
Complete.
In the 5th kind of possible implementation, in conjunction with the 4th kind of possible implementation, described
Method also includes:
If each described test vector has all been tested, then judge whether to receive instruction letter of resurveying
Breath；Wherein, command information of resurveying described in is that customer analysis is when obtaining described test defect of data
Send；
If resurveying command information described in receiving, then perform described according to described measured signal place
The schematic diagram of tested single board and described pcb document select test template, until described user passes through
Analysis obtains testing data qualifier.
Second aspect, it is provided that a kind of automatic signal test device, described device includes:
Receive unit, for receiving the test command information that user sends；
Acquiring unit, for the described test command information received according to described reception unit,
Obtain schematic diagram and the printed substrate pcb document of measured signal place tested single board；
Choose unit, for the described measured signal place quilt got according to described acquiring unit
Survey the schematic diagram of veneer and described pcb document, select test template；
Described choose unit, be additionally operable to according to the selection test node command information received,
Described test template selects test node；
Described acquiring unit, be additionally operable to according to described in choose described test node that unit obtains and
Described test template, obtains detectable signal by test probe；
Processing unit, is carried out point for the described detectable signal that gets described acquiring unit
Analysis, obtains testing data and resolution chart.
In the implementation that the first is possible, in conjunction with second aspect, described acquiring unit includes:
Configuration module, for choosing, described in basis, described test node and the described survey that unit obtains
Die trial plate, configures the mapping relations between described test node and described test probe；
Choose module, for according to the selection test vector command information received, select test
Vector；
Receiver module, is used for receiving vector test command information；
Processing module, for the described vector test instruction letter received according to described receiver module
Mapping relations between described test node and test probe that breath and described configuration module obtain,
The parameter of test instrunment, self-reacting device and electric arm is set；
First acquisition module is for choosing, described in basis, the described test vector that module obtains, logical
Cross described test instrunment and described self-reacting device controls described electric arm and visits described test
Head is controlled obtaining detectable signal.
In the implementation that the second is possible, in conjunction with second aspect or realization that the first is possible
Mode,
Described acquiring unit, is additionally operable to obtain test criteria；Wherein, described test criteria is root
Determine according to described measured signal and tested single board；
Described processing unit, including:
Analyze module, analyze institute for the described test criteria got according to described acquiring unit
State detectable signal the most qualified；
Second acquisition module, if it is qualified, then to obtain described detectable signal for described analysis module
Described test data and described resolution chart are obtained according to described detectable signal.
In the implementation that the third is possible, in conjunction with the implementation that the second is possible,
Described processing module, does not conforms to if obtaining described detectable signal specifically for described analysis module
Lattice, then according to the mapping relations between described test node and test probe arrange test instrunment,
Self-reacting device and the parameter of electric arm.
In the 4th kind of possible implementation, in conjunction with second aspect or any of the above-described possible reality
Existing mode, described device also includes:
Judging unit, is used for judging whether each described test vector has been tested；
Described processing unit, obtains existing in described test vector if being additionally operable to described judging unit
The test vector do not tested, then select according to the selection test vector command information received
Test vector, until each described test vector has all been tested.
In the 5th kind of possible implementation, in conjunction with the 4th kind of possible implementation,
Described judging unit, has all tested if being additionally operable to each described test vector, has then judged
Whether receive command information of resurveying；Wherein, command information of resurveying described in is described in customer analysis
Send during test defect of data；
Described choose unit, if specifically for command information of resurveying described in receiving, then according to institute
Schematic diagram and the described pcb document of stating measured signal place tested single board select test template.
The third aspect, it is provided that a kind of automatic signal test system, described system includes: test sets
Standby, first interface controller, the second interface controller, at least one test instrunment, at least one
Individual self-reacting device, at least one electric arm and at least one test probe, described test sets
Automatic signal test software is installed, wherein in Bei:
Described test equipment is connected with one end of described first interface controller；Described test equipment
It is connected with one end of described second interface controller；
The other end of described first interface controller and one end of at least one test instrunment described
Connecting, the other end of at least one test instrunment described is with at least one test probe described even
Connect；
The other end of described second interface controller and the one of at least one self-reacting device described
End connects, the other end of at least one self-reacting device described and at least one electric arm described
Connect；
Described test equipment, for by described automatic signal test software send test signal to
Described first interface controller and described second interface controller, be additionally operable to receive described first and connect
The described detectable signal received also is analyzed by detectable signal that mouthful controller sends, it is judged that
Whether resend described test signal to described first interface controller and described second interface
Controller；
Described first interface controller at least one test instrunment described in will receive is sent out
The detectable signal sent selects the interface being suitable for send to described test equipment after processing；Also
For sending described test signal at least one test instrunment described, in order to complete tested
The test of the signal on veneer obtains described detectable signal；
Described second interface controller, for will be described in the described test equipment that receive sends
Test signal sends at least one self-reacting device described, in order to described at least one is automatic
Change at least one electric arm described in instrument controlling to complete the signal in described tested single board
Test；
At least one self-reacting device described, for controlling according to the described test signal received
At least one test probe described is controlled described quilt by least one electric arm described
Survey veneer to test, it is thus achieved that described detectable signal.
The automatic signal method of testing of embodiments of the invention offer, Apparatus and system, by answering
Realize the test process to signal testing with automatic signal test software, use and letter automatically is installed
Number the test terminal of software, test instrunment, self-reacting device, electric arm and test probe,
Solve the problem that existing signal testing needs to use manual testing, it is achieved that signal testing
Automatization, increases the range of application of signal testing, enhances the repeatability of signal testing.
Meanwhile, work efficiency is greatly improved.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below
The accompanying drawing used required in embodiment or description of the prior art will be briefly described, aobvious and
Easily insight, the accompanying drawing in describing below is only some embodiments of the present invention, for this area
From the point of view of those of ordinary skill, on the premise of not paying creative work, it is also possible to according to these
Accompanying drawing obtains other accompanying drawing.
Fig. 1 shows for the flow process of a kind of automatic signal method of testing that embodiments of the invention provide
It is intended to；
The flow process of the another kind of automatic signal method of testing that Fig. 2 provides for embodiments of the invention
Schematic diagram；
The flow process of another automatic signal method of testing that Fig. 3 provides for embodiments of the invention
Schematic diagram；
Fig. 4 shows for the structure of a kind of automatic signal test device that embodiments of the invention provide
It is intended to；
The structure of the another kind of automatic signal test device that Fig. 5 provides for embodiments of the invention
Schematic diagram；
The structure of another automatic signal test device that Fig. 6 provides for embodiments of the invention
Schematic diagram；
The knot of a kind of automatic signal test device that Fig. 7 provides for another embodiment of the present invention
Structure schematic diagram；
Fig. 8 shows for the structure of a kind of automatic signal test system that embodiments of the invention provide
It is intended to.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, to the technical side in the embodiment of the present invention
Case is clearly and completely described, it is clear that described embodiment is only the present invention one
Divide embodiment rather than whole embodiments.Based on the embodiment in the present invention, this area is general
The every other embodiment that logical technical staff is obtained under not making creative work premise,
Broadly fall into the scope of protection of the invention.
Embodiments of the invention provide a kind of automatic signal method of testing, and the method is based on terminal
On automatic signal test software realize, with reference to shown in Fig. 1, the method comprises the following steps:
101, automatic signal test device receives the test command information that user sends.
Wherein, this test command information can be by user open a terminal on the most mounted
Produce after automatic signal test software.
102, automatic signal test device is according to the test command information received, and obtains tested
The schematic diagram of signal place tested single board and printed substrate (Printed circuit board, letter
Claim pcb) document.
Wherein, the schematic diagram of measured signal place tested single board and the printed wire of this tested single board
Plate document can be import to terminal in advance by user after, terminal receives test command information
After acquire in the memorizer of terminal.
103, automatic signal test device according to the schematic diagram of measured signal place tested single board and
Pcb document, selects test template.
Wherein, terminal includes various types of test template, and this test template is basis
The type of conventional measured signal and the test template that has been pre-designed, and the most stored
In the terminal.Now, terminal can according to the schematic diagram of measured signal place tested single board and
Pcb document selects the test template matched.
104, automatic signal test device is according to the selection test node command information received,
Test node is selected in test template.
Wherein, test node is the class that measured signal place tested single board needs the signal of test
Type.In advance already configured with various types of test node in test template, the most permissible
The test node matched is selected according to actual measured signal.
105, automatic signal test device is according to test node and test template, is visited by test
Head obtains detectable signal.
Concrete, terminal can be by sending command information to self-reacting device and test instrunment control
Electric arm processed and then electric arm control test detection, it is achieved the test to tested single board, obtain
Obtain detectable signal.
106, automatic signal test device detectable signal is analyzed, obtain test data and
Resolution chart.
Based on the discussion in this enforcement, automatic signal test device can be to be provided with automatic signal
The terminal of test software or can be that hardware device is provided with automatic signal test software and energy
Realizing the physical device of corresponding steps, the title herein for equipment does not make concrete restriction, all
It is that the equipment that can realize corresponding steps all can test device as automatic signal.
The automatic signal method of testing that embodiments of the invention provide, is surveyed by application automatic signal
Examination software realizes the test process to signal testing, uses and is provided with automatic signal test software
Terminal, test instrunment, self-reacting device, electric arm and test probe, solve existing
The problem that signal testing needs to use manual testing, it is achieved that the automatization of signal testing, increases
The range of application of signal testing, enhance the repeatability of signal testing.Meanwhile, greatly
Improve work efficiency.
Embodiments of the invention provide a kind of automatic signal method of testing, and the method is based on terminal
On automatic signal test software realize, with reference to shown in Fig. 2, the method comprises the following steps:
201, automatic signal test device receives the test command information that user sends.
Wherein, this test command information can be by installing in advance in user's manual unlocking terminal
Produce after good automatic signal test software.
202, automatic signal test device is according to the test command information received, and obtains tested
The schematic diagram of signal place tested single board and printed substrate pcb document.
Wherein, the measured signal that user tests as required is by the tested single board of this measured signal
The printed substrate document of schematic diagram and this tested single board imports in advance and is provided with automatic signal survey
In the terminal of examination software, when terminal receives test command information, obtaining in memory should
The schematic diagram of tested single board and the printed substrate document of this tested single board.
203, automatic signal test device according to the schematic diagram of measured signal place tested single board and
Pcb document, selects test template.
Wherein, user imports various conventional different types of test template the most in the terminal.
Now, terminal has only to the schematic diagram according to measured signal place tested single board and the choosing of pcb document
Select the test template that type therewith is identical.Concrete, test template comprises test vector,
Test object, the computer software of test command collection embed interface, just may be used by minimal modifications amount
Complete the program unit of a test assignment.
204, automatic signal test device is according to the selection test node command information received,
Test node is selected in test template.
Wherein, test node command information is selected to trigger on test software corresponding by user
Button produces.Test node is the class that measured signal place tested single board needs the signal of test
Type.In advance already configured with various types of test node in test template, the most permissible
The test node that type therewith is identical is selected according to actual measured signal.
205, automatic signal test device saves according to test node and test template, configuration testing
Mapping relations between point and test probe.
Mapping relations between configuration testing node and test probe can be by choosing before
Test node and test template, by select can measure identical with the type of test node and
The test probe mated with the corresponding information in test template, and test detection and test joint are set
Corresponding relation between point, in order to test tested single board subsequently through test probe.
206, automatic signal test device is according to the selection test vector command information received,
Select test vector.
Wherein, test vector command information is selected to trigger on test software corresponding by user
Producing after button, test vector is to have had multiple test test template is selected when
Vector, now needs the measured signal tested according to actual needs to select and quilt in test template
Survey the test vector of Signal Matching.
Test vector be electrical quantity to two electric physical nodes or a physical space (such as:
Voltage, electric current, electric field intensity, magnetic field intensity etc.), temperature, the physical quantity such as pressure in time
Or the data recording process of spatial variations.Illustrate as a example by two electric physical nodes: test
Vector can be voltage difference Vd of the two electricity physical node or flow through the two electricity physical node
The time dependent process of electric current Id；Say as a example by the electrical quantity of a physical space
Bright: test vector can be to need the space magnetic field/electric field intensity, temperature etc. of test in time
Or the process of the change such as relative tertiary location.The numerical value i.e. test result that test obtains can comprise
The absolute value of real data or the absolute value of actually measured data through certain computing it
After result.Test vector can be the test result result through certain computing, it is also possible to be
Test vector is through the result of certain computing, and test vector has various dimensions, many time points
Test result.
207, automatic signal test device obtains test criteria.
Wherein, test criteria determines according to measured signal and tested single board.
Concrete, test criteria is that user sets previously according to the information needing the measured signal tested
Put default value as test criteria.Meanwhile, can be according to different measured signals and tested list
The quantity of information that the details selection of plate is suitable for is as test criteria, for example, it is possible to arrange test
Criterion is: the information such as voltage max, current minimum.Certainly, it is merely illustrative herein
It can only be these that the information that test criteria is likely to occur does not limits test criteria, in reality
In application, the quantity of information being suitable for can be selected as survey according to actual measured signal and tested single board
Examination criterion.Acquisition test criteria can be actively entered test criteria by user and obtain.
208, automatic signal test device receives vector test command information.
Wherein, this vector test command information can be actively to be triggered automatic signal to survey by user
Examination software produces after corresponding button.
209, automatic signal test device is according to vector test command information and test node and survey
Mapping relations between probe header, arrange the ginseng of test instrunment, self-reacting device and electric arm
Number.
The test vector that terminal starts after receiving vector test command information choosing is surveyed
Examination, and send a signal to test instrunment according to the mapping relations between test node and test probe
And self-reacting device, arrange how self-reacting device controls electric arm, and then control tester
Test probe in device is tested wherein.
210, automatic signal test device is according to test vector, by test instrunment and automatization
Test probe is controlled obtaining detectable signal by instrument controlling electric arm.
Concrete, terminal sends a signal to self-reacting device, self-reacting device by test vector
Control the test detection that electric arm clamps on corresponding test instrunment after receiving signal, and put
Put with the information corresponding position in test vector, thus obtain detectable signal.
211, automatic signal test device is the most qualified according to test criteria analysis detectable signal.
Concrete, whether the numerical value of the detectable signal that can be obtained by judgement is in test criteria
In numerical range, judge that detectable signal is the most qualified；If the numerical value of detectable signal is sentenced in test
According to numerical range in, then detectable signal is qualified；If the numerical value of detectable signal is beyond sentencing in test
According to numerical range in, then detectable signal is defective.Such as, if test criteria is voltage maximum
Value, the most now can compare the magnitude of voltage obtained with this maximum voltage value, if detection letter
Number magnitude of voltage less than or equal to maximum voltage value then detectable signal qualified；If the electricity of detectable signal
Pressure value is defective more than maximum voltage value then detectable signal.
When obtaining multiple detectable signal, can be with the sequencing of acquisition detectable signal for order
Judge that the detectable signal obtained is the most qualified successively.
The analysis result that detectable signal is the most qualified is analyzed according to step 211, if the analysis obtained
Result is that detectable signal is qualified, then perform step 212；If the analysis result obtained is detection letter
Number defective, then return and perform step 208 according to the mapping between test node and test probe
Relation arranges the parameter of test instrunment, self-reacting device and electric arm, until obtaining testing number
According to and resolution chart；
If 212 detectable signals are qualified, then automatic signal test device obtains according to detectable signal
Test data and resolution chart.
If detectable signal is qualified, then can obtain corresponding test data and survey according to detectable signal
Attempt shape, test result is carried out finer analysis.
Further alternative, with reference to shown in Fig. 3, after step 212, following step can also be included
Rapid:
213, automatic signal test device judges whether each test vector has been tested.
The judged result whether each test vector has been tested is judged according to step 213, if
Judged result is to there is the test vector do not tested in test vector, then return and re-execute
Step 206 selects test vector according to the selection test vector command information received, until every
Individual test vector has all been tested；All test, then if judged result is each test vector
Perform step 214 and operation afterwards thereof；
If 214 each test vectors have all been tested, then the judgement of automatic signal test device is
No receive command information of resurveying.
Wherein, command information of resurveying is that customer analysis obtains sending during test defect of data.
Concrete, command information of resurveying can be by user's test data to obtaining and test
The test result that figure obtains with user's expection compares, if the test data obtained and use
The test result difference that family expection needs is relatively big, then user can send command information of resurveying, to protect
The test data of card acquisition and the accuracy of resolution chart.
If receiving command information of resurveying, then return and re-execute step 203 according to measured signal
The schematic diagram of place tested single board and pcb document select test template, until customer analysis obtains
Test data qualifier.
If it should be noted that all of test vector has all been tested and has been not received by resurveying
Command information, then can form test document, completes whole testing engineering project.
By judging that all of test vector has the most all been tested, it is ensured that whole test
Process correct and complete, it is ensured that all of information of measured signal has all been tested, final
To the test data completed and resolution chart, and then obtain testing test document accurately, greatly
Improve work efficiency.
Based on the discussion in this enforcement, automatic signal test device can be to be provided with automatic signal
The terminal of test software or can be that hardware device is provided with automatic signal test software and energy
Realizing the physical device of corresponding steps, the title herein for equipment does not make concrete restriction, all
It is that the equipment that can realize corresponding steps all can test device as automatic signal.
The automatic signal method of testing that embodiments of the invention provide, is surveyed by application automatic signal
Examination software realizes the test process to signal testing, uses and is provided with automatic signal test software
Terminal, test instrunment, self-reacting device, electric arm and test probe, solve existing
The problem that signal testing needs to use manual testing, it is achieved that the automatization of signal testing, increases
The range of application of signal testing, enhance the repeatability of signal testing.Meanwhile, greatly
Improve work efficiency.
Embodiments of the invention provide a kind of automatic signal test device 3, and this device 3 is for real
The automatic signal method of testing that the embodiment of the method for the arbitrary correspondence in existing Fig. 1～Fig. 3 is provided,
With reference to shown in Fig. 4, this device includes: receives unit 31, acquiring unit 32, choose unit
33 and processing unit 34, wherein:
Receive unit 31, for receiving the test command information that user sends.
Acquiring unit 32, for according to receiving the test command information that unit 31 receives, obtaining
Take schematic diagram and the printed substrate pcb document of measured signal place tested single board.
Choose unit 33, tested for the measured signal place got according to acquiring unit 32
The schematic diagram of veneer and pcb document, select test template.
Choose unit 33, be additionally operable to the selection test node command information that basis receives,
Test template selects test node.
Acquiring unit 32, is additionally operable to according to choosing test node and the test mould that unit 33 obtains
Plate, obtains detectable signal by test probe.
Processing unit 34, is analyzed for the detectable signal getting acquiring unit 32,
Obtain testing data and resolution chart.
Concrete, with reference to shown in Fig. 5, acquiring unit 32 includes: configuration module 321, choosing
Delivery block 322, receiver module 323, processing module 324 and the first acquisition module 325, its
In:
Configuration module 321, for according to choosing test node and the test mould that unit 33 obtains
Plate, the mapping relations between configuration testing node and test probe.
Choose module 322, for according to the selection test vector command information received, select
Test vector.
Receiver module 323, is used for receiving vector test command information.
Processing module 324, for the vector test instruction letter received according to receiver module 323
Mapping relations between test node and test probe that breath and configuration module 321 obtain, are arranged
The parameter of test instrunment, self-reacting device and electric arm.
First acquisition module 325 is for according to choosing the test vector that module 322 obtains, logical
Cross test instrunment and self-reacting device controls electric arm and is controlled obtaining to test probe
Detectable signal.
Further, acquiring unit 32, it is additionally operable to obtain test criteria.
Wherein, test criteria determines according to measured signal and tested single board.
Concrete, shown in reference Fig. 6, processing unit 34, including: analyze module 341 He
Second acquisition module 342, wherein:
Analyze module 341, visit for the test criteria analysis got according to acquiring unit 32
Survey signal the most qualified.
Second acquisition module 342, if it is qualified, then to obtain detectable signal for analysis module 341
Test data and resolution chart are obtained according to detectable signal.
Processing module 324, if it is defective to obtain detectable signal specifically for analysis module 341,
Then test instrunment, automatization's instrument are set according to the mapping relations between test node and test probe
Device and the parameter of electric arm.
Further, with reference to shown in Fig. 7, this device also includes: judging unit 35, wherein:
Judging unit 35, is used for judging whether each test vector has been tested.
Processing unit 34, obtains existing in test vector not testing if being additionally operable to judging unit 35
The test vector completed, then according to the selection test vector command information that receives select test to
Amount, until each test vector has all been tested.
Further, it is judged that unit 35, if being additionally operable to each test vector and all having tested, then
Judge whether to receive command information of resurveying.
Wherein, command information of resurveying is to send during customer analysis test defect of data.
Choose unit 33, if specifically for receiving command information of resurveying, then according to tested letter
The schematic diagram of number place tested single board and pcb document select test template.
It should be noted that in the present embodiment automatic signal test device in each unit and
What the implementation of each module and interaction were referred in correlation method embodiment relevant retouches
State.
The automatic signal test device that embodiments of the invention provide, is surveyed by application automatic signal
Examination software realizes the test process to signal testing, uses and is provided with automatic signal test software
Terminal, test instrunment, self-reacting device, electric arm and test probe, solve existing
The problem that signal testing needs to use manual testing, it is achieved that the automatization of signal testing, increases
The range of application of signal testing, enhance the repeatability of signal testing.Meanwhile, greatly
Improve work efficiency.
Embodiments of the invention provide a kind of automatic signal test system, with reference to shown in Fig. 8, wrap
Include: test equipment 41, first interface controller the 42, second interface controller 43, at least
Individual test instrunment 44, at least one self-reacting device 45, at least one electric arm 46 and extremely
A few test probe 47, is provided with automatic signal test software, Fig. 8 in test equipment 41
In to have a test instrunment, a self-reacting device, an electric arm and a test
Probe example, wherein:
Test equipment 41 is connected with one end of first interface controller 42；Test equipment 41 with
One end of second interface controller 43 connects.
The other end of first interface controller 42 connects with one end of at least one test instrunment 44
Connecing, the other end of at least one test instrunment 44 is connected with at least one test probe 47.
The other end of the second interface controller 43 connects with one end of at least one self-reacting device 45
Connecing, the other end of at least one self-reacting device 45 is connected with at least one electric arm 46.
Wherein, test equipment and first controls interface, and test equipment and second controls interface, the
One controls interface and test instrunment, test instrunment and test probe, and second controls interface with automatic
Changing instrument, the connectivity port between self-reacting device and electric arm can be arbitrary can to realize
The hardware interface of the intercommunication of each equipment.
Test equipment 41, for sending test signal to first by automatic signal test software
Interface controller 42 and the second interface controller 43, be additionally operable to receive first interface controller 42
Send detectable signal and the detectable signal received is analyzed, it may be judged whether resend
Test signal is to first interface controller 41 and the second interface controller 42.
First interface controller 42, for sending at least one test instrunment 44 received
Detectable signal select the interface that is suitable for send to test equipment 41 after processing；Also use
In sending test signal at least one test instrunment 44, in order to complete in tested single board
Signal test obtain detectable signal.
Second interface controller 43, for the test letter sent by the test equipment 41 received
Number send at least one self-reacting device 45, in order at least one self-reacting device 45 is controlled
Make at least one electric arm 46 and complete the test to the signal in tested single board.
First interface controller and the second interface controller all can be with receiving general interface buses
(General Purpose Interface Bus, be called for short GPIB), Ethernet, serial ports, parallel port,
One or more signals such as USB (universal serial bus) (Universal Serial Bus is called for short USB)；
Meanwhile, through certain judgement or process can send GPIB, Ethernet, serial ports, parallel port,
One or more signals such as USB.
At least one self-reacting device 45, for controlling at least according to the test signal received
At least one test probe 47 is controlled surveying tested single board by one electric arm 46
Examination, it is thus achieved that detectable signal.
Test instrunment is to provide certain or the instrument of certain several measurement function, and these instruments carry
For GPIB, Ethernet, serial ports, parallel port, USB etc., one or more control interface, permissible
Receive test command, test result is provided；Test instrunment includes but not limited to: oscillograph, frequently
The instruments such as spectrometer, circuit tester, cymometer, programmable power supply.
Self-reacting device can receive the test probe location data that test device transmission comes, suitable
Sequence controls electric arm and carries out 5 axles (X, Y, Z, rotate, tilts) linkage, by test spy
Head moves to corresponding position and keeps certain time to carry out signal testing；One self-reacting device
Simultaneously or multiple electric arms can be controlled according to sequencing.In actual application, from
Dynamicization instrument can also report error reporting to the second interface controller, thus the second Interface Controller
This error reporting is sent to test equipment by device, in order to test equipment resends test signal
To the second interface controller, it is ensured that whole testing process can perform the most smoothly.This false alarm
Announcement can be that self-reacting device detects that the location data received are beyond executable scope etc.
In the case of send.
Electric arm can be a displacement electro-mechanical system, is by self-reacting device control
The mechanical arm of performed standard 5 axle linkage, electric arm has clamping test probe p
Fixture, it is possible to carry out X-axis, Y-axis, Z axis move, and take test probe to tested single board
Any position, if needing fine setting, it is also possible to enter along X-axis, Y-axis, the respective direction of Z axis
Row rotates and tilts, by any one point of test probe pointing space, and can be any one
Individual direction applies active force.
Test probe is used for contacting tested single board circuit node or space, according to the letter of tested node
Number type can be the good conductors (conduction test) such as probe, probe, cable core, electric wire heart yearn
Or non-conductor (sensing test) and induction coil (radiation test) etc., a test is visited
In Tou, the number of pin can be formed by combination.
The automatic signal test system that embodiments of the invention provide, is surveyed by application automatic signal
Examination software realizes the test process to signal testing, uses and is provided with automatic signal test software
Terminal, test instrunment, self-reacting device, electric arm and test probe, solve existing
The problem that signal testing needs to use manual testing, it is achieved that the automatization of signal testing, increases
The range of application of signal testing, enhance the repeatability of signal testing.Meanwhile, greatly
Improve work efficiency.
One of ordinary skill in the art will appreciate that: realize the whole of said method embodiment or portion
Can be completed by the hardware that programmed instruction is relevant step by step, aforesaid program can be stored in
In one computer read/write memory medium, this program upon execution, performs to include that said method is real
Execute the step of example；And aforesaid storage medium includes: ROM, RAM, magnetic disc or CD
Etc. the various media that can store program code.
The above, the only detailed description of the invention of the present invention, but protection scope of the present invention is also
Being not limited to this, any those familiar with the art is at the technology model that the invention discloses
In enclosing, change can be readily occurred in or replace, all should contain within protection scope of the present invention.
Therefore, protection scope of the present invention should be as the criterion with described scope of the claims.
Claims (10)
1. an automatic signal method of testing, it is characterised in that described method is applied to automatic signal
Test software, including:
Receive the test command information that user sends；
According to the described test command information received, obtain the former of measured signal place tested single board
Reason figure and printed substrate pcb document；
Schematic diagram according to described measured signal place tested single board and described pcb document, select to survey
Die trial plate；
According to the selection test node command information received, described test template selects test
Node；Wherein, described test node is the signal that measured signal place tested single board needs test
Type；Described test template is provided with in advance different types of test node, tested according to reality
The test node that signal behavior matches；
According to described test node and described test template, obtain detectable signal by test probe；
Described detectable signal is analyzed, obtains testing data and resolution chart；
Wherein, described according to described test node and test template, obtain detection letter by test probe
Number include: according to described test node and described test template, configure described test node and described survey
Mapping relations between probe header；According to the selection test vector command information received, select test
Vector；Wherein, described selection test vector command information is to trigger on test software corresponding by user
Button after produce, described test vector has multiple described test when described test template is selected
Vector, now needs the measured signal tested according to actual needs to select with described in described test template
The test vector of measured signal coupling；
Receive vector test command information；
According to the mapping between described vector test command information and described test node and test probe
Relation, arranges the parameter of test instrunment, self-reacting device and electric arm；
According to described test vector, control described by described test instrunment and described self-reacting device
Described test probe is controlled obtaining detectable signal by electric arm；
According to described test vector, control described by described test instrunment and described self-reacting device
Described test probe is controlled obtaining detectable signal by electric arm；Wherein, described automatization instrument
After device receives the signal that test vector sends, control described electric arm and clamp corresponding tester
Test probe on device, is placed on described test node, obtains detectable signal；
Before described reception vector test command information, also include:
Obtain test criteria；Wherein, described test criteria is according to described measured signal and tested list
Plate determines；Wherein, described test criteria is that user is previously according to the measured signal needing test
Information arranges default value as test criteria；Or according to different measured signals and tested single board
Details select be suitable for quantity of information as test criteria；
Described described detectable signal is processed, obtain testing data and resolution chart, including:
Described detectable signal is analyzed the most qualified according to described test criteria；
If described detectable signal is qualified, then obtain described test data and institute according to described detectable signal
State resolution chart；
If described detectable signal is defective, then perform described according to described test node and test probe
Between mapping relations the parameter of test instrunment, self-reacting device and electric arm is set, until
To described test data and described resolution chart.
Method the most according to claim 1, it is characterised in that described to described detectable signal
It is analyzed, after obtaining testing data and resolution chart, also includes:
Judge whether each described test vector has been tested；
If described test vector exists the test vector do not tested, then according to the choosing received
Select test vector command information and select test vector, until each described test vector has all been tested.
Method the most according to claim 2, it is characterised in that described method also includes:
If each described test vector has all been tested, then judge whether to receive command information of resurveying；
Wherein, command information of resurveying described in is that customer analysis obtains sending during described test defect of data；
If resurveying command information described in receiving, then perform described according to described measured signal place quilt
Schematic diagram and the described pcb document of surveying veneer select test template, until described user is by analysis
Obtain described test data qualifier.
4. an automatic signal test device, it is characterised in that described device includes:
Receive unit, for receiving the test command information that user sends；
Acquiring unit, for the described test command information received according to described reception unit, obtains
Take schematic diagram and the printed substrate pcb document of measured signal place tested single board；
Choose unit, tested for the described measured signal place got according to described acquiring unit
The schematic diagram of veneer and described pcb document, select test template；
Described choose unit, be additionally operable to according to the selection test node command information received, in institute
State selection test node in test template；
Described acquiring unit, is additionally operable to described in basis choose described test node and the institute that unit obtains
State test template, obtain detectable signal by test probe；
Processing unit, is analyzed for the described detectable signal getting described acquiring unit,
Obtain testing data and resolution chart.
Device the most according to claim 4, it is characterised in that described acquiring unit includes:
Configuration module, for choosing, described in basis, described test node and the described test that unit obtains
Template, configures the mapping relations between described test node and described test probe；
Choose module, for according to the selection test vector command information that receives, select test to
Amount；
Receiver module, is used for receiving vector test command information；
Processing module, for the described vector test command information received according to described receiver module
And the mapping relations between described configuration the module described test node and the test probe that obtain, arrange
The parameter of test instrunment, self-reacting device and electric arm；
First acquisition module, for choosing, described in basis, the described test vector that module obtains, passes through
Described test instrunment and described self-reacting device control described electric arm and carry out described test probe
Control to obtain detectable signal.
6. according to the device described in claim 4 or 5, it is characterised in that
Described acquiring unit, is additionally operable to obtain test criteria；Wherein, described test criteria is basis
Described measured signal and tested single board determine；
Described processing unit, including:
Analyzing module, the described test criteria for getting according to described acquiring unit is analyzed described
Detectable signal is the most qualified；
Second acquisition module, if it is qualified to obtain described detectable signal for described analysis module, then root
Described test data and described resolution chart are obtained according to described detectable signal.
Device the most according to claim 6, it is characterised in that
Described processing module, if it is defective to obtain described detectable signal specifically for described analysis module,
Then test instrunment, automatization are set according to the mapping relations between described test node and test probe
Instrument and the parameter of electric arm.
Device the most according to claim 4, it is characterised in that described device also includes:
Judging unit, is used for judging whether each described test vector has been tested；
Described processing unit, obtains existing not in described test vector if being additionally operable to described judging unit
The test vector tested, then select test according to the selection test vector command information received
Vector, until each described test vector has all been tested.
Device the most according to claim 8, it is characterised in that
Described judging unit, has all tested if being additionally operable to each described test vector, then judgement is
No receive command information of resurveying；Wherein, command information of resurveying described in is to test described in customer analysis
Send during defect of data；
Described choose unit, if specifically for command information of resurveying described in receiving, then according to described
The schematic diagram of measured signal place tested single board and described pcb document select test template.
10. an automatic signal test system, it is characterised in that described system includes: test sets
Standby, first interface controller, the second interface controller, at least one test instrunment, at least one
Self-reacting device, at least one electric arm and at least one test probe, in described test equipment
Automatic signal test software is installed, wherein:
Described test equipment is connected with one end of described first interface controller；Described test equipment with
One end of described second interface controller connects；
The other end of described first interface controller connects with one end of at least one test instrunment described
Connecing, the other end of at least one test instrunment described is connected with at least one test probe described；
The other end of described second interface controller connects with one end of at least one self-reacting device described
Connecing, the other end of at least one self-reacting device described is connected with at least one electric arm described；
Described test equipment, for sending test signal to institute by described automatic signal test software
State first interface controller and described second interface controller, be additionally operable to receive described first interface control
Device processed send detectable signal and the described detectable signal received is analyzed, it may be judged whether weight
The described test signal of new transmission is to described first interface controller and described second interface controller；
Described first interface controller, at least one test instrunment sends described in will receive
Detectable signal select the interface that is suitable for send to described test equipment after processing；It is additionally operable to
Send described test signal at least one test instrunment described, in order to complete in tested single board
Signal test obtain described detectable signal；
Described second interface controller, the described survey that the described test equipment for receiving sends
Trial signal sends at least one self-reacting device described, in order at least one automatization's instrument described
Device controls at least one electric arm described and completes the test to the signal in described tested single board；
At least one self-reacting device described, for controlling institute according to the described test signal received
State at least one electric arm to be controlled at least one test probe described to described tested single board
Test, it is thus achieved that described detectable signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410222307.6A CN103995202B (en) | 2014-05-23 | 2014-05-23 | A kind of automatic signal method of testing, Apparatus and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410222307.6A CN103995202B (en) | 2014-05-23 | 2014-05-23 | A kind of automatic signal method of testing, Apparatus and system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103995202A CN103995202A (en) | 2014-08-20 |
| CN103995202B true CN103995202B (en) | 2017-01-04 |
Family
ID=51309420
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410222307.6A Active CN103995202B (en) | 2014-05-23 | 2014-05-23 | A kind of automatic signal method of testing, Apparatus and system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103995202B (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105444663B (en) * | 2014-09-28 | 2018-07-24 | 中国航空工业集团公司西安飞机设计研究所 | A kind of RVDT design methods based on black box |
| CN106033109B (en) * | 2015-03-11 | 2018-10-23 | 深南电路股份有限公司 | A kind of test method of step circuit boards |
| CN105717442A (en) * | 2016-04-06 | 2016-06-29 | 长沙三帆信息科技有限公司 | Device and method for printed circuit board detection based on schematic diagram assertion |
| CN108919093B (en) * | 2018-07-10 | 2021-06-29 | 郑州云海信息技术有限公司 | Method, device, equipment and storage medium for ICT (information communication technology) pin implantation in PCB (printed circuit board) |
| CN109766391B (en) * | 2019-01-21 | 2024-01-23 | 武汉易万科技有限公司 | Detection system, detection method, and computer-readable medium |
| CN110632403A (en) * | 2019-08-27 | 2019-12-31 | 深圳市菲菱科思通信技术股份有限公司 | Method for automatically testing power supply ripple noise |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5432548A (en) * | 1992-02-20 | 1995-07-11 | Samsung Electronics Co., Ltd. | Apparatus for testing and adjusting audio/video signal waveforms in color television |
| CN201607507U (en) * | 2010-03-08 | 2010-10-13 | 和记奥普泰通信技术有限公司 | Intelligent backboard test system |
| CN101865975A (en) * | 2009-04-16 | 2010-10-20 | 鸿富锦精密工业（深圳）有限公司 | Main board testing system and method |
| CN101876674A (en) * | 2009-04-30 | 2010-11-03 | 鸿富锦精密工业（深圳）有限公司 | Characteristic impedance testing system and method |
| CN102338854A (en) * | 2010-07-27 | 2012-02-01 | 迈普通信技术股份有限公司 | Circuit board test case generation system and method thereof |
| CN103529377A (en) * | 2013-10-11 | 2014-01-22 | 国家电网公司 | Automatic testing system and method for intelligent transformer substation digital protection device |
| CN103698686A (en) * | 2013-12-11 | 2014-04-02 | 华为技术有限公司 | Signal testing method and signal testing equipment |
-
2014
- 2014-05-23 CN CN201410222307.6A patent/CN103995202B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5432548A (en) * | 1992-02-20 | 1995-07-11 | Samsung Electronics Co., Ltd. | Apparatus for testing and adjusting audio/video signal waveforms in color television |
| CN101865975A (en) * | 2009-04-16 | 2010-10-20 | 鸿富锦精密工业（深圳）有限公司 | Main board testing system and method |
| CN101876674A (en) * | 2009-04-30 | 2010-11-03 | 鸿富锦精密工业（深圳）有限公司 | Characteristic impedance testing system and method |
| CN201607507U (en) * | 2010-03-08 | 2010-10-13 | 和记奥普泰通信技术有限公司 | Intelligent backboard test system |
| CN102338854A (en) * | 2010-07-27 | 2012-02-01 | 迈普通信技术股份有限公司 | Circuit board test case generation system and method thereof |
| CN103529377A (en) * | 2013-10-11 | 2014-01-22 | 国家电网公司 | Automatic testing system and method for intelligent transformer substation digital protection device |
| CN103698686A (en) * | 2013-12-11 | 2014-04-02 | 华为技术有限公司 | Signal testing method and signal testing equipment |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103995202A (en) | 2014-08-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103995202B (en) | A kind of automatic signal method of testing, Apparatus and system | |
| CN102156255B (en) | A method of and an arrangement for testing connections on a printed circuit board | |
| US20200300923A1 (en) | Automatic test system of wireless charging system | |
| CN108627721B (en) | Determination and rendering of scan groups | |
| CN103901388B (en) | Parallel detection termination and detection method | |
| CN106556811B (en) | A kind of high-precision magnetic survey method for testing | |
| CN108169564A (en) | A kind of Beam Detector and its detection method | |
| CN110494965B (en) | Inspection system, wafer map display method, and storage medium | |
| CN106771972A (en) | A kind of automatic testing equipment, the system and method for POS mainboard | |
| CN102156237A (en) | Method and device for detecting automotive harnesses | |
| CN107783069A (en) | The on-line calibration system and method for DC measurement in integrated circuit test system | |
| CN108761328A (en) | Electric tool switch test device and system | |
| CN102435928B (en) | Wafer tester and the crystal round test approach of correspondence | |
| CN105842559A (en) | Test result write-in method, test result write-in device, testing system and mobile terminal | |
| CN109738788A (en) | Flying probe tester test method, device, flying probe tester and storage medium | |
| US6064220A (en) | Semiconductor integrated circuit failure analysis using magnetic imaging | |
| CN107171893A (en) | Automatic test platform and its method of testing based on CAN network | |
| Brindley | Automatic test equipment | |
| CN109901055A (en) | A kind of OBD equipment performance test macro | |
| CN102012460B (en) | Method and system for measuring alternating current impedance characteristic of material or electronic component under extreme condition | |
| CN111693922A (en) | Automatic calibration system of impedance tester | |
| CN107167686A (en) | A kind of Intelligent substation merging unit tests corollary apparatus | |
| CN104569901B (en) | A kind of detecting system of intelligent electric energy meter | |
| CN108469546B (en) | Wire impedance testing method and system | |
| CN216646688U (en) | Volt-ampere characteristic analysis and test device for semiconductor laser |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C53 | Correction of patent for invention or patent application | ||
| CB02 | Change of applicant information |
Address after: 8, 14, building 809, Zhongxing Industrial Town, Nanshan District Zhongxing Road, Shenzhen, Guangdong, China 518054, C Applicant after: Shenzhen Yi Ruilai Polytron Technologies Inc Address before: 8, 14, building 809, Zhongxing Industrial Town, Nanshan District Zhongxing Road, Shenzhen, Guangdong, China 518054, C Applicant before: Yi Ruilai Science and Technology Development Co., Ltd. of Shenzhen |
|
| COR | Change of bibliographic data |
Free format text: CORRECT: APPLICANT; FROM: SHENZHEN ERELIA TECHNOLOGIES DEVELOPMENT CO., LTD. TO: SHENZHEN ERELIA TECHNOLOGIES CO., LTD. |
|
| CB02 | Change of applicant information |
Address after: 518054 Nanshan District science and Technology Industrial Park, Guangdong Province, North District, Tsinghua University,, science and technology building, layer 908, No. 9 Applicant after: Shenzhen Yi Ruilai Polytron Technologies Inc Address before: 8, 14, building 809, Zhongxing Industrial Town, Nanshan District Zhongxing Road, Shenzhen, Guangdong, China 518054, C Applicant before: Shenzhen Yi Ruilai Polytron Technologies Inc |
|
| COR | Change of bibliographic data | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |