CN102004173A - 探针 - Google Patents
探针 Download PDFInfo
- Publication number
- CN102004173A CN102004173A CN2009103064432A CN200910306443A CN102004173A CN 102004173 A CN102004173 A CN 102004173A CN 2009103064432 A CN2009103064432 A CN 2009103064432A CN 200910306443 A CN200910306443 A CN 200910306443A CN 102004173 A CN102004173 A CN 102004173A
- Authority
- CN
- China
- Prior art keywords
- inner pipe
- metal inner
- conductive coil
- probe
- insulation tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 title claims abstract description 34
- 239000002184 metal Substances 0.000 claims abstract description 67
- 229910052751 metal Inorganic materials 0.000 claims abstract description 67
- 238000009413 insulation Methods 0.000 claims abstract description 35
- 230000001939 inductive effect Effects 0.000 claims abstract description 18
- 230000000694 effects Effects 0.000 claims description 6
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 229910017052 cobalt Inorganic materials 0.000 claims description 2
- 239000010941 cobalt Substances 0.000 claims description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 2
- 238000006735 epoxidation reaction Methods 0.000 claims description 2
- 239000011152 fibreglass Substances 0.000 claims description 2
- 229910052742 iron Inorganic materials 0.000 claims description 2
- 229910052759 nickel Inorganic materials 0.000 claims description 2
- 239000011347 resin Substances 0.000 claims description 2
- 229920005989 resin Polymers 0.000 claims description 2
- 238000001914 filtration Methods 0.000 abstract description 8
- 239000003990 capacitor Substances 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 230000008521 reorganization Effects 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06766—Input circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
Claims (9)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200910306443.2A CN102004173B (zh) | 2009-09-01 | 2009-09-01 | 探针 |
US12/752,138 US8283939B2 (en) | 2009-09-01 | 2010-04-01 | Test probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200910306443.2A CN102004173B (zh) | 2009-09-01 | 2009-09-01 | 探针 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102004173A true CN102004173A (zh) | 2011-04-06 |
CN102004173B CN102004173B (zh) | 2014-02-19 |
Family
ID=43623903
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200910306443.2A Expired - Fee Related CN102004173B (zh) | 2009-09-01 | 2009-09-01 | 探针 |
Country Status (2)
Country | Link |
---|---|
US (1) | US8283939B2 (zh) |
CN (1) | CN102004173B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106067426A (zh) * | 2015-04-17 | 2016-11-02 | 株式会社东芝 | 探头、半导体检查装置及它们的制造方法、半导体检查及制造方法 |
CN106093752A (zh) * | 2016-06-20 | 2016-11-09 | 东莞市联洲知识产权运营管理有限公司 | 一种应用于集成电路的测试探针卡 |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2947633B1 (fr) * | 2009-07-02 | 2012-04-13 | Snecma | Dispositif de controle non destructif d'une piece |
US20130328549A1 (en) * | 2012-06-07 | 2013-12-12 | Chung Instrument Electronics Industrial Co., Ltd. | Rotating mobile probe and probing rod using the same |
JP2017142080A (ja) * | 2016-02-08 | 2017-08-17 | 日本電産リード株式会社 | 接触端子、検査治具、及び検査装置 |
USD869305S1 (en) * | 2017-02-10 | 2019-12-10 | Kabushiki Kaisha Nihon Micronics | Probe pin |
JP1592871S (zh) * | 2017-02-10 | 2017-12-11 | ||
KR101954086B1 (ko) | 2017-11-07 | 2019-03-06 | 리노공업주식회사 | 검사 프로브 조립체 및 검사 소켓 |
JP1626667S (zh) * | 2018-02-02 | 2019-03-18 | ||
JP1622968S (zh) * | 2018-02-02 | 2019-01-28 | ||
JP1623279S (zh) * | 2018-02-02 | 2019-01-28 | ||
JP1626668S (zh) * | 2018-02-02 | 2019-03-18 | ||
JP1622970S (zh) * | 2018-02-02 | 2019-01-28 | ||
JP1623280S (zh) * | 2018-02-02 | 2019-01-28 | ||
JP1622969S (zh) * | 2018-02-02 | 2019-01-28 | ||
USD873161S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3893027A (en) * | 1974-06-10 | 1975-07-01 | Tektronix Inc | Electrical test probe |
CN1238571A (zh) * | 1998-01-20 | 1999-12-15 | 株式会社村田制作所 | 介质滤波器和介质双工器 |
US20010024116A1 (en) * | 1998-10-30 | 2001-09-27 | Draving Steven D. | Electronic probe for measuring high impedance tri-state logic circuits |
US6404396B1 (en) * | 1999-03-12 | 2002-06-11 | Thomson-Csf | Dismantling-type antenna, with capacitive load, of whip type, and method of manufacturing a radiating segment of such an antenna |
US20040140822A1 (en) * | 1999-02-25 | 2004-07-22 | Formfactor, Inc. | Integrated circuit tester with high bandwidth probe assembly |
US20050151556A1 (en) * | 2004-01-08 | 2005-07-14 | Chung-Shan Lee | Testing probe and testing jig |
TWI292043B (en) * | 2005-06-13 | 2008-01-01 | Cascade Microtech Inc | Wideband active-passive differential signal probe |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4764722A (en) * | 1985-10-28 | 1988-08-16 | International Business Machines Corporation | Coaxial probe |
US5136237A (en) * | 1991-01-29 | 1992-08-04 | Tektronix, Inc. | Double insulated floating high voltage test probe |
US5235268A (en) * | 1991-11-13 | 1993-08-10 | Harthcock Jerry D | Test and measurement system |
US6466000B1 (en) * | 2000-05-31 | 2002-10-15 | Tektronix, Inc. | Replaceable probe tip holder and measurement probe head |
US6700397B2 (en) * | 2000-07-13 | 2004-03-02 | The Micromanipulator Company, Inc. | Triaxial probe assembly |
US6688906B2 (en) * | 2002-05-28 | 2004-02-10 | Agilent Technologies Inc. | Probes and methods for testing electrical circuits |
EP2180326B1 (en) * | 2008-10-24 | 2017-05-03 | Tyco Electronics Services GmbH | Test probe |
-
2009
- 2009-09-01 CN CN200910306443.2A patent/CN102004173B/zh not_active Expired - Fee Related
-
2010
- 2010-04-01 US US12/752,138 patent/US8283939B2/en not_active Expired - Fee Related
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3893027A (en) * | 1974-06-10 | 1975-07-01 | Tektronix Inc | Electrical test probe |
CN1238571A (zh) * | 1998-01-20 | 1999-12-15 | 株式会社村田制作所 | 介质滤波器和介质双工器 |
US20010024116A1 (en) * | 1998-10-30 | 2001-09-27 | Draving Steven D. | Electronic probe for measuring high impedance tri-state logic circuits |
US20040140822A1 (en) * | 1999-02-25 | 2004-07-22 | Formfactor, Inc. | Integrated circuit tester with high bandwidth probe assembly |
US6404396B1 (en) * | 1999-03-12 | 2002-06-11 | Thomson-Csf | Dismantling-type antenna, with capacitive load, of whip type, and method of manufacturing a radiating segment of such an antenna |
US20050151556A1 (en) * | 2004-01-08 | 2005-07-14 | Chung-Shan Lee | Testing probe and testing jig |
TWI292043B (en) * | 2005-06-13 | 2008-01-01 | Cascade Microtech Inc | Wideband active-passive differential signal probe |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106067426A (zh) * | 2015-04-17 | 2016-11-02 | 株式会社东芝 | 探头、半导体检查装置及它们的制造方法、半导体检查及制造方法 |
CN106093752A (zh) * | 2016-06-20 | 2016-11-09 | 东莞市联洲知识产权运营管理有限公司 | 一种应用于集成电路的测试探针卡 |
CN106093752B (zh) * | 2016-06-20 | 2019-03-12 | 定颖电子(黄石)有限公司 | 一种应用于集成电路的测试探针卡 |
Also Published As
Publication number | Publication date |
---|---|
US20110050261A1 (en) | 2011-03-03 |
CN102004173B (zh) | 2014-02-19 |
US8283939B2 (en) | 2012-10-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: NANTONG MEDICAL APPARATUS CO., LTD. Free format text: FORMER OWNER: BEIJING ZHONGCAI WYSE EDUCATION TECHNOLOGY CO., LTD. Effective date: 20141203 Free format text: FORMER OWNER: HONGFUJIN PRECISE INDUSTRY CO., LTD. Effective date: 20141203 Owner name: BEIJING ZHONGCAI WYSE EDUCATION TECHNOLOGY CO., LT Free format text: FORMER OWNER: HONGFUJIN PRECISE INDUSTRY (SHENZHEN) CO., LTD. Effective date: 20141203 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 100083 HAIDIAN, BEIJING TO: 226351 NANTONG, JIANGSU PROVINCE Free format text: CORRECT: ADDRESS; FROM: 518109 SHENZHEN, GUANGDONG PROVINCE TO: 100083 HAIDIAN, BEIJING |
|
TR01 | Transfer of patent right |
Effective date of registration: 20141203 Address after: 226351, No. 84 East Main Street, stone port town, Nantong, Jiangsu, Tongzhou District Patentee after: NANTONG MEDICAL APPARATUS Co.,Ltd. Address before: 100083 Beijing Haidian District Zhongguancun Road No. 18 smartfortune International Building B706 Patentee before: Beijing Zhongcai Wyse Education Technology Co.,Ltd. Effective date of registration: 20141203 Address after: 100083 Beijing Haidian District Zhongguancun Road No. 18 smartfortune International Building B706 Patentee after: Beijing Zhongcai Wyse Education Technology Co.,Ltd. Address before: 518109 Guangdong city of Shenzhen province Baoan District Longhua Town Industrial Zone tabulaeformis tenth East Ring Road No. 2 two Patentee before: HONG FU JIN PRECISION INDUSTRY (SHENZHEN) Co.,Ltd. Patentee before: HON HAI PRECISION INDUSTRY Co.,Ltd. |
|
C56 | Change in the name or address of the patentee | ||
CP02 | Change in the address of a patent holder |
Address after: 226351, No. 68, South District, Tongzhou District port town, Nantong, Jiangsu Patentee after: NANTONG MEDICAL APPARATUS Co.,Ltd. Address before: 226351, No. 84 East Main Street, stone port town, Nantong, Jiangsu, Tongzhou District Patentee before: NANTONG MEDICAL APPARATUS Co.,Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140219 Termination date: 20180901 |
|
CF01 | Termination of patent right due to non-payment of annual fee |