CN101986376B - Wiring method for checking crossing in process of lighting and ageing whole sheet of OLED substrate glass - Google Patents
Wiring method for checking crossing in process of lighting and ageing whole sheet of OLED substrate glass Download PDFInfo
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- CN101986376B CN101986376B CN2010102953314A CN201010295331A CN101986376B CN 101986376 B CN101986376 B CN 101986376B CN 2010102953314 A CN2010102953314 A CN 2010102953314A CN 201010295331 A CN201010295331 A CN 201010295331A CN 101986376 B CN101986376 B CN 101986376B
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Abstract
The invention discloses a wiring method for checking crossing in the process of lighting and ageing whole sheet of organic light emitting diode (OLED) substrate glass, which comprises the following steps of: 1) spraying codes; 2) ageing a large screen and electrically testing; 3) cutting and splitting; 4) binding, mounting, and dotting glue; 5) ageing a module and testing; and 6) spraying codes and packaging. When the whole sheet of substrate is lighted and aged, a screen of each single grain can be independently lighted and aged. Through circuit control, besides full-screen lighting, a cathode single wire or double wires can be independently lighted, and an anode single wire or double wires also can be independently lighted, so the crossing problem is checked. The method solves the problems in the process of producing OLED modules in the prior art, can check the crossing problem when the whole sheet of OLED substrate is lighted and aged, reduces processes, improves efficiency, and also can reduce pollution to pins and improve the product quality.
Description
Technical field
The present invention relates to the manufacturing process of OLED display, be specifically related to the Wiring method that a kind of full wafer oled substrate glass is lighted inspection string pen when wearing out.
Background technology
The full wafer oled substrate is lighted when wearing out, and use is in the bonnet punching and use the metal probe ways of connecting, lights aging method according to existing full wafer oled substrate, and is as shown in Figure 1, and 1) coding; 2) large stretch of screen is aging; 3) cutting, sliver; 4) control panel electrical measurement; 5) fixed, the paster of nation, some glue; 6) module group aging, test; 7) coding, packing.This method is carried out earlier and can only full framely be lighted, and can not check the problem of string pen; After aging the completion, also need directly contact the pin of simple grain screen with conductive adhesive tape, light every screen separately, check string pen, pollute pin easily and cause the pin corrosion problem, but also many operations.
Summary of the invention
The purpose of this invention is to provide a kind of full wafer oled substrate glass and light the Wiring method of inspection string pen when wearing out; This method has solved the problem that exists in the prior art OLED module production run; Can light the aging string pen problem of checking simultaneously at the full wafer oled substrate; Both reduced flow process, raised the efficiency; Can also reduce pollution, improve the quality of product pin.
The objective of the invention is to realize through following technical proposals that a kind of full wafer oled substrate glass is lighted the Wiring method of inspection string pen when aging, this method comprises the steps:
1) coding: utilize ink jet numbering machine, on the bonnet of each screen of full wafer glass, do coding with printing ink;
2) aging, the electrical measurement of sheet screen: utilize aging machine, full wafer glass is lighted, do demonstration and detect, and light negative electrode single line, negative electrode two-wire, anode single line, anode two-wire respectively, the inspection string pen; The electrical measurement that does not just need to do again the simple grain screen like this behind the cutting splitting is aging, just need directly not touch the lead-in wire of simple grain screen with conductive adhesive tape, thereby has reduced the etching problem that the pollution to simple grain screen lead-in wire causes, and has improved the quality of product.
3) cutting, sliver: utilize cutting machine that full wafer glass is divided into one one screen, fragment into one one screen again with the sliver machine;
4) fixed, the paster of nation, some glue: utilize nation to decide machine, IC is bonded to screen goes up on nation's allocation of leads ends; And with chip mounter polaroid is attached to the front of screen; On the fixed location point of nation, protect glue with point gum machine then;
5) module group aging, test: utilize the module group aging machine, module is lighted aging, utilize the electrical measurement machine to light the detection that module is done demonstration then;
6) coding, packing: utilize ink jet numbering machine, the coding sign is used wrappage then on each module, the good and vacuum seal with the module packing.
The inventive method step 2) further, with negative electrode single line, negative electrode two-wire, anode single line and 4 kinds of lines of anode two-wire of screen cabling, each is lighted respectively with a short-circuit block short circuit then respectively, and its step is following:
1. full frame lighting: the short-circuit block of negative electrode single line, negative electrode two-wire is received on the probe of power cathode simultaneously, the short-circuit block of anode single line, anode two-wire is received on the probe of positive source simultaneously, switch on and light full frame;
2. check negative electrode single line string pen: the short-circuit block of negative electrode single line is received on the probe of power cathode, the short-circuit block of anode single line, anode two-wire is received on the probe of positive source simultaneously, whether energising and inspection have string pen;
3. check negative electrode two-wire string pen: the short-circuit block of negative electrode two-wire is received on the probe of power cathode, the short-circuit block of anode single line, anode two-wire is received on the probe of positive source simultaneously, whether energising and inspection have string pen;
4. check anode single line string pen: the short-circuit block of anode single line is received on the probe of positive source, the short-circuit block of negative electrode single line, negative electrode two-wire is received on the probe of power cathode simultaneously, whether energising and inspection have string pen;
5. check anode two-wire string pen: the short-circuit block of anode two-wire is received on the probe of positive source, the short-circuit block of negative electrode single line, negative electrode two-wire is received on the probe of power cathode simultaneously, whether energising and inspection have string pen.
Said full frame lighting is that the corresponding screen of cover glass Pin locations is punched after being utilized in OLED, and the pin of each screen is used the short-circuit block short circuit on the substrate, is connected energising with short-circuit block through metal probe, thereby realization OLED full wafer base plate glass is lighted aging.
Said short-circuit block connects, and in leads ends negative electrode single line, two-wire is respectively connected into a short-circuit block; One of the short-circuit block of anode single line or two-wire is in leads ends, and another is at the opposite side of leads ends.
The invention has the beneficial effects as follows, reduced the flow process (referring to Fig. 1, Fig. 2) in the OLED module production run, improved production efficiency; Because " screen electrical measurement " in the old flow process polluted pin easily, and flow process of the present invention has been removed the process of " screen electrical measurement ".Therefore, the present invention can also reduce the pollution to pin, improves the quality of product.
Description of drawings
Fig. 1 is the OLED module flow sheet of prior art;
Fig. 2 is an OLED module flow sheet of the present invention.
Embodiment
Below in conjunction with accompanying drawing and embodiment the present invention is elaborated.
As shown in Figure 2, the Wiring method that this full wafer oled substrate glass is lighted inspection string pen when wearing out comprises the steps:
1) coding: utilize ink jet numbering machine, on the bonnet of each screen of full wafer glass, do coding with printing ink;
2) aging, the electrical measurement of sheet screen: utilize aging machine, full wafer glass is lighted, do demonstration and detect, and light negative electrode single line, negative electrode two-wire, anode single line, anode two-wire respectively, the inspection string pen;
3) cutting, sliver: utilize cutting machine that full wafer glass is divided into one one screen, fragment into one one screen again with the sliver machine;
4) fixed, the paster of nation, some glue: utilize nation to decide machine, IC is bonded to screen goes up on nation's allocation of leads ends; And with chip mounter polaroid is attached to the front of screen; On the fixed location point of nation, protect glue with point gum machine then;
5) module group aging, test: utilize the module group aging machine, module is lighted aging, utilize the electrical measurement machine to light the detection that module is done demonstration then;
6) coding, packing: utilize ink jet numbering machine, the coding sign is used wrappage then on each module, the good and vacuum seal with the module packing.
The inventive method step 2) further, with negative electrode single line, negative electrode two-wire, anode single line and 4 kinds of lines of anode two-wire of screen cabling, each is lighted respectively with a short-circuit block short circuit then respectively, and its step is following:
1. full frame lighting: the short-circuit block of negative electrode single line, negative electrode two-wire is received on the probe of power cathode simultaneously, the short-circuit block of anode single line, anode two-wire is received on the probe of positive source simultaneously, switch on and light full frame;
2. check negative electrode single line string pen: the short-circuit block of negative electrode single line is received on the probe of power cathode, the short-circuit block of anode single line, anode two-wire is received on the probe of positive source simultaneously, whether energising and inspection have string pen;
3. check negative electrode two-wire string pen: the short-circuit block of negative electrode two-wire is received on the probe of power cathode, the short-circuit block of anode single line, anode two-wire is received on the probe of positive source simultaneously, whether energising and inspection have string pen;
4. check anode single line string pen: the short-circuit block of anode single line is received on the probe of positive source, the short-circuit block of negative electrode single line, negative electrode two-wire is received on the probe of power cathode simultaneously, whether energising and inspection have string pen;
5. check anode two-wire string pen: the short-circuit block of anode two-wire is received on the probe of positive source, the short-circuit block of negative electrode single line, negative electrode two-wire is received on the probe of power cathode simultaneously, whether energising and inspection have string pen.
Further, full frame lighting is that the corresponding screen of cover glass Pin locations is punched after being utilized in OLED, and the pin of each screen is used the short-circuit block short circuit on the substrate, is connected energising with short-circuit block through metal probe, thereby realization OLED full wafer base plate glass is lighted aging.
Said short-circuit block connects, and in leads ends negative electrode single line, two-wire is respectively connected into a short-circuit block; One of the short-circuit block of anode single line or two-wire is in leads ends, and another is at the opposite side of leads ends.
After metal probe and each short-circuit block all are connected; Through external circuit control; Can realize full frame lighting; Characteristics of the present invention are to realize to light separately single line or the two-wire of negative electrode, the single line or the two-wire of anode, thereby can light when aging the problem of inspection string pen at full wafer oled substrate glass.
After lighting aging the completion, when cutting into the screen of simple grain, can short-circuit block and unnecessary aging boost line be cut away.
Claims (3)
1. full wafer oled substrate glass is lighted the Wiring method of inspection string pen when wearing out, and it is characterized in that this method comprises the steps:
1) coding: utilize ink jet numbering machine, on the bonnet of each screen of full wafer glass, do coding with printing ink;
2) aging, the electrical measurement of sheet screen: utilize aging machine, full wafer glass is lighted, do demonstration and detect, and light negative electrode single line, negative electrode two-wire, anode single line, anode two-wire respectively, the inspection string pen;
3) cutting, sliver: utilize cutting machine that full wafer glass is divided into one one screen, fragment into one one screen again with the sliver machine;
4) fixed, the paster of nation, some glue: utilize nation to decide machine, IC is bonded to screen goes up on nation's allocation of leads ends; And with chip mounter polaroid is attached to the front of screen; On the fixed location point of nation, protect glue with point gum machine then;
5) module group aging, test: utilize the module group aging machine, module is lighted aging, utilize the electrical measurement machine to light the detection that module is done demonstration then;
6) coding, packing: utilize ink jet numbering machine, the coding sign is used wrappage then on each module, the good and vacuum seal with the module packing.
2. full wafer oled substrate glass according to claim 1 is lighted the Wiring method of inspection string pen when wearing out; It is characterized in that; Said step 2) will shield negative electrode single line, negative electrode two-wire, anode single line and 4 kinds of lines of anode two-wire of cabling; Each is lighted respectively with a short-circuit block short circuit then respectively, and its step is following:
1. full frame lighting: the short-circuit block of negative electrode single line, negative electrode two-wire is received on the probe of power cathode simultaneously, the short-circuit block of anode single line, anode two-wire is received on the probe of positive source simultaneously, switch on and light full frame;
2. check negative electrode single line string pen: the short-circuit block of negative electrode single line is received on the probe of power cathode, the short-circuit block of anode single line, anode two-wire is received on the probe of positive source simultaneously, whether energising and inspection have string pen;
3. check negative electrode two-wire string pen: the short-circuit block of negative electrode two-wire is received on the probe of power cathode, the short-circuit block of anode single line, anode two-wire is received on the probe of positive source simultaneously, whether energising and inspection have string pen;
4. check anode single line string pen: the short-circuit block of anode single line is received on the probe of positive source, the short-circuit block of negative electrode single line, negative electrode two-wire is received on the probe of power cathode simultaneously, whether energising and inspection have string pen;
5. check anode two-wire string pen: the short-circuit block of anode two-wire is received on the probe of positive source, the short-circuit block of negative electrode single line, negative electrode two-wire is received on the probe of power cathode simultaneously, whether energising and inspection have string pen.
3. full wafer oled substrate glass according to claim 2 is lighted the Wiring method of inspection string pen when wearing out; It is characterized in that; Said full frame lighting is that the corresponding screen of cover glass Pin locations is punched after being utilized in OLED; The pin of each screen is used the short-circuit block short circuit on the substrate, is connected energising with short-circuit block through metal probe, thereby realization OLED full wafer base plate glass is lighted aging.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102953314A CN101986376B (en) | 2010-09-28 | 2010-09-28 | Wiring method for checking crossing in process of lighting and ageing whole sheet of OLED substrate glass |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102953314A CN101986376B (en) | 2010-09-28 | 2010-09-28 | Wiring method for checking crossing in process of lighting and ageing whole sheet of OLED substrate glass |
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| Publication Number | Publication Date |
|---|---|
| CN101986376A CN101986376A (en) | 2011-03-16 |
| CN101986376B true CN101986376B (en) | 2012-07-25 |
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| KR101952926B1 (en) * | 2018-10-05 | 2019-02-28 | 케이맥(주) | Device and method for aging and vision-inspecting OLED |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005099543A (en) * | 2003-09-26 | 2005-04-14 | Toppoly Optoelectronics Corp | Instrument for measuring planar display device and its operating method |
| US7474115B1 (en) * | 2004-12-28 | 2009-01-06 | Dupont Displays, Inc. | Organic electronic device display defect detection |
| CN101777295A (en) * | 2010-01-29 | 2010-07-14 | 信利半导体有限公司 | Detection line wiring method and manufacturing method of OLED (Organic Light Emitting Diode) display |
| CN101789208A (en) * | 2010-01-29 | 2010-07-28 | 信利半导体有限公司 | Detection line wiring method and manufacturing method of organic light-emitting diode (OLED) displays |
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- 2010-09-28 CN CN2010102953314A patent/CN101986376B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005099543A (en) * | 2003-09-26 | 2005-04-14 | Toppoly Optoelectronics Corp | Instrument for measuring planar display device and its operating method |
| US7474115B1 (en) * | 2004-12-28 | 2009-01-06 | Dupont Displays, Inc. | Organic electronic device display defect detection |
| CN101777295A (en) * | 2010-01-29 | 2010-07-14 | 信利半导体有限公司 | Detection line wiring method and manufacturing method of OLED (Organic Light Emitting Diode) display |
| CN101789208A (en) * | 2010-01-29 | 2010-07-28 | 信利半导体有限公司 | Detection line wiring method and manufacturing method of organic light-emitting diode (OLED) displays |
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