CN103323792A - LED light bar testing fixture - Google Patents
LED light bar testing fixture Download PDFInfo
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- CN103323792A CN103323792A CN 201210072363 CN201210072363A CN103323792A CN 103323792 A CN103323792 A CN 103323792A CN 201210072363 CN201210072363 CN 201210072363 CN 201210072363 A CN201210072363 A CN 201210072363A CN 103323792 A CN103323792 A CN 103323792A
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Abstract
一种发光二极管灯条测试治具，用于对发光二极管灯条进行电性测试。该发光二极管灯条测试治具包括第一板体、多个电极对、以及电路结构。该第一板体呈平板状，其具有一第一表面。该多个电极对设置在该第一板体的第一表面上，每个电极对包括一个第一电极以及一个第二电极。该电路结构设置在第一板体上或第一板体内，该电路结构与该多个电极对电连接，且该电路结构用于从外界获取电能并通过该多个电极对将电能提供给该多个发光二极管。当该发光二极管灯条测试治具用于测试该多个发光二极管的电性时，该多个第一电极分别与该多个发光二极管的正电极电连接且该多个第二电极分别与该多个发光二极管的负电极电连接。
The utility model relates to a test fixture for a light emitting diode light bar, which is used for conducting an electrical test on the light emitting diode light bar. The light emitting diode strip test fixture includes a first board body, a plurality of electrode pairs, and a circuit structure. The first board is flat and has a first surface. The plurality of electrode pairs are arranged on the first surface of the first board, and each electrode pair includes a first electrode and a second electrode. The circuit structure is arranged on or in the first board, the circuit structure is electrically connected to the plurality of electrode pairs, and the circuit structure is used to obtain electrical energy from the outside and provide electrical energy to the electrode through the plurality of electrode pairs. Multiple LEDs. When the light-emitting diode strip test fixture is used to test the electrical properties of the plurality of light-emitting diodes, the plurality of first electrodes are respectively electrically connected to the positive electrodes of the plurality of light-emitting diodes, and the plurality of second electrodes are respectively connected to the positive electrodes of the plurality of light-emitting diodes. Negative electrodes of the plurality of light emitting diodes are electrically connected.
Description
Technical field
The present invention relates to light emitting diode testing electrical property field, relate to particularly a kind of measurement jig for the light-emitting diode light bar testing electrical property.
Background technology
Than traditional light emitting source, lightweight, the advantages such as volume is little, it is low to pollute, life-span length that light emitting diode (Light Emitting Diode, LED) has, it is used more and more widely as a kind of novel light emitting source.
Usually, light emitting diode need to be tested its electrical parameter, with the yield of guaranteeing light emitting diode or according to the emission wavelength scope it is classified.In the general LED test process, provide a power supply, this power supply includes two electrodes, and these two electrodes are electrically connected with the electrode of light emitting diode, thereby whether the test light emitting diode is good electrically.Yet when the test light-emitting diode light bar electrical the time, need to carry out testing electrical property to a plurality of light emitting diodes on the lamp bar.Therefore, need to repeatedly test a plurality of light emitting diodes with this power supply, this kind method of testing efficient is low, labor intensive.
Summary of the invention
In view of this, the present invention aims to provide the high light-emitting diode light bar measurement jig of a kind of testing efficiency.
A kind of light-emitting diode light bar measurement jig, be used for light-emitting diode light bar is carried out testing electrical property, this light-emitting diode light bar comprises substrate and is arranged on a plurality of light emitting diodes on this substrate, and each light emitting diode has a positive pole and a negative pole.This light-emitting diode light bar measurement jig comprises the first plate body, a plurality of electrode pair and circuit structure.This first plate body is tabular, and it has a first surface.These a plurality of electrode pairs are arranged on the first surface of this first plate body, and each electrode pair comprises first electrode and second electrode.This circuit structure is arranged on the first plate body or in the first plate body, this circuit structure is electrically connected with these a plurality of electrode pairs, and this circuit structure is for obtaining electric energy from the external world and by these a plurality of electrode pairs electric energy being offered this a plurality of light emitting diodes.When this light-emitting diode light bar measurement jig was used for these a plurality of light emitting diodes of test electrical, these a plurality of first electrodes were electrically connected with the positive electrode of these a plurality of light emitting diodes respectively and these a plurality of second electrodes are electrically connected with the negative electrode of these a plurality of light emitting diodes respectively.
Have a plurality of electrode pairs on the first plate body of described light-emitting diode light bar measurement jig, can carry out testing electrical property to a plurality of light emitting diodes on the light-emitting diode light bar simultaneously, need not repeatedly repeated test, testing efficiency is high, and, this kind light-emitting diode light bar measurement jig can repeatedly utilize, thereby reduces testing cost.
Description of drawings
Fig. 1 is the vertical view of the light-emitting diode light bar measurement jig that provides of one embodiment of the invention.
Fig. 2 is that the master of light-emitting diode light bar to be tested looks schematic diagram.
Fig. 3 is the vertical view of the light-emitting diode light bar among Fig. 2.
Fig. 4 is the vertical view of the light-emitting diode light bar in the light-emitting diode light bar measurement jig test pattern 2 that utilizes among Fig. 1.
Fig. 5 is another structural representation of the light-emitting diode light bar measurement jig that provides of the embodiment of the invention.
The main element symbol description
| The light-emitting diode light |
100 |
| The |
11 |
| |
110 |
| The |
12 |
| |
120 |
| |
13 |
| The |
131 |
| The |
132 |
| |
14 |
| The |
16 |
| Support column | 15 |
| Elastomeric element | 17 |
| Light-emitting |
200 |
| |
21 |
| |
22 |
| Anodal | 23 |
| |
24 |
Following embodiment further specifies the present invention in connection with above-mentioned accompanying drawing.
Embodiment
The structural representation of the light-emitting diode light bar measurement jig 100 that Fig. 1 provides for one embodiment of the invention.This light-emitting diode light bar measurement jig 100 is used for light-emitting diode light bar 200 is carried out testing electrical property.
See also Fig. 2 and Fig. 3, in the present embodiment, this light-emitting diode light bar to be tested 200 comprises substrate 21 and is arranged on a plurality of light emitting diodes 22 on this substrate 21, and these a plurality of light emitting diodes 22 are located along the same line.Light emitting diode 22 is encapsulating structure, comprises the structures such as light-emitting diode chip for backlight unit and transparent sealing.Each light emitting diode 22 has a positive pole 23 and a negative pole 24.Distance between the outside surface of the positive pole 23 of each light emitting diode 22 and the outside surface of negative pole 24 is the length of this light emitting diode 22
, the width of each light emitting diode 22 is
, wherein, this Width is mutually vertical with this length direction.
This light-emitting diode light bar measurement jig 100 comprises the first plate body 11, the second plate body 12, a plurality of electrode pair 13 and the circuit structure 14 that are connected with this first plate body 11.
This first plate body 11 all is tabular with this second plate body 12.This first plate body comprises a first surface 110, and this second plate body 12 comprises a second surface 120 relative with this first surface 110.In the present embodiment, be provided with two support columns 15 between the second surface 120 of the first surface 110 of this first plate body 11 and this second plate body 12.These two support columns 15 are arranged on the two ends of this first plate body 11 and this second plate body 12.These two support columns 15 are one-body molded with this first plate body 11 and this second plate body 12.Certainly, these two support columns 15 also can separate with this first plate body 11 and this second plate body 12 and make.This second plate body 12 matches to be used for these a plurality of light emitting diodes 22 of engaging with this first plate body 11.In the present embodiment, the distance between the second surface 120 of the first surface 110 of this first plate body 11 and this second plate body 12 is
, wherein, this distance
Equal the width of this light emitting diode 22
Certainly, this support column 15 also can be one or more.And the distance between this first plate body 11 and this second plate body 12
Also can be greater than the width of this light emitting diode 22
These a plurality of electrode pairs 13 are arranged on the first surface 110 of this first plate body 11.Each electrode pair 13 comprises first electrode 131 and second electrode 132.In the present embodiment, the shape of the first electrode 131 of comprising of each electrode pair 13 and the second electrode 132, size are identical.When this light-emitting diode light bar measurement jig 100 was used for these a plurality of light emitting diodes 22 of test electrical, these a plurality of first electrodes 131 were electrically connected with the positive electrode 23 of these a plurality of light emitting diodes 22 respectively and these a plurality of second electrodes 132 are electrically connected with the negative electrode 24 of these a plurality of light emitting diodes 22 respectively.In the present embodiment, the first electrode 131 of comprising of each electrode pair 13 and the distance between the second electrode 132
Equal the length of this light emitting diode 22
This circuit structure 14 is arranged on the first plate body 11 or in the first plate body 11.This circuit structure 14 is electrically connected with these a plurality of electrode pairs 13.And this circuit structure 14 is for obtaining electric energy from the external world and by these a plurality of electrode pairs 13 electric energy being offered this a plurality of light emitting diodes 22.In the present embodiment, the edge that this circuit structure 14 extends to the first plate body 11 forms golden finger joint 16, thereby golden finger joint 16 can plug with the golden finger interface (not shown) and cooperates and join with extraneous power supply.
See also shown in Figure 4, when this light-emitting diode light bar measurement jig 100 is used for test light-emitting diode light bar 200 electrical, press this light-emitting diode light bar measurement jig 100 downwards, so that the first plate body 11 of light-emitting diode light bar measurement jig 100 engages this a plurality of light emitting diodes 22 with the second plate body 12, until these a plurality of first electrodes 131 are electrically connected with the positive electrode 23 of these a plurality of light emitting diodes 22 respectively and these a plurality of second electrodes 132 are electrically connected with the negative electrode 24 of these a plurality of light emitting diodes 22 respectively.Be electrically connected with external power source by this golden finger joint 16, thereby test the electrical of these a plurality of light emitting diodes 22.If these a plurality of light emitting diodes 22 are entirely bright, then represent the electrically good of these a plurality of light emitting diodes 22, otherwise be bad.
Described light-emitting diode light bar measurement jig 100 can be simultaneously to electrically the testing of a plurality of light emitting diodes 22 on the light-emitting diode light bar 200, and simple to operate, thus improved testing efficiency.And, thereby this kind light-emitting diode light bar measurement jig 100 can repeatedly utilize and reduced testing cost.
Be understandable that, in the present embodiment, can be connected by other structures between this first plate body 11 and this second plate body 12, as shown in Figure 5, be connected by elastomeric element 17 between this first plate body 11 and this second plate body 12.This elastomeric element 17 can be spring, shell fragment or other high-precision web members etc.Because the setting of this elastomeric element 17, the distance between this first plate body 11 and this second plate body 12 can be adjusted, thereby can test better light emitting diode 22 electrical of different in width.
Be understandable that, those skilled in the art also can do other variation in spirit of the present invention, as long as it does not depart from technique effect of the present invention and all can.The variation that these are done according to spirit of the present invention all should be included within the present invention's scope required for protection.
Claims (7)
1. light-emitting diode light bar measurement jig, it is used for light-emitting diode light bar is carried out testing electrical property, this light-emitting diode light bar comprises substrate and is arranged on a plurality of light emitting diodes on this substrate, each light emitting diode has a positive pole and a negative pole, and this light-emitting diode light bar measurement jig comprises:
The first plate body, this first plate body is tabular, and it has a first surface;
A plurality of electrode pairs are arranged on the first surface of this first plate body, and each electrode pair comprises first electrode and second electrode; And
Circuit structure, this circuit structure are arranged on the first plate body or in the first plate body, this circuit structure is electrically connected with these a plurality of electrode pairs, and this circuit structure is for obtaining electric energy from the external world and by these a plurality of electrode pairs electric energy being offered this a plurality of light emitting diodes;
When this light-emitting diode light bar measurement jig was used for these a plurality of light emitting diodes of test electrical, these a plurality of first electrodes were electrically connected with the positive electrode of these a plurality of light emitting diodes respectively and these a plurality of second electrodes are electrically connected with the negative electrode of these a plurality of light emitting diodes respectively.
2. light-emitting diode light bar measurement jig as claimed in claim 1 is characterized in that, these a plurality of light emitting diodes are arranged on the same straight line.
3. light-emitting diode light bar measurement jig as claimed in claim 1 is characterized in that, further comprises second plate body that is connected with the first plate body, and this second plate body matches to be used for these a plurality of light emitting diodes of engaging with this first plate body.
4. light-emitting diode light bar measurement jig as claimed in claim 3, it is characterized in that, this second plate body has a second surface relative with the first surface of this first plate body, be provided with at least one support column between the second surface of the first surface of this first plate body and this second plate body, in order to connect this first plate body and this second plate body.
5. light-emitting diode light bar measurement jig as claimed in claim 4 is characterized in that, the distance between the second surface of the first surface of this first plate body and this second plate body is greater than or equal to the width of this light emitting diode.
6. light-emitting diode light bar measurement jig as claimed in claim 3, it is characterized in that, this second plate body has a second surface relative with the first surface of this first plate body, be provided with elastomeric element between the second surface of the first surface of this first plate body and this second plate body, in order to connect this first plate body and this second plate body.
7. light-emitting diode light bar measurement jig as claimed in claim 1 is characterized in that, the first electrode that each electrode pair comprises and the distance between the second electrode equal the length of this light emitting diode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201210072363 CN103323792A (en) | 2012-03-19 | 2012-03-19 | LED light bar testing fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201210072363 CN103323792A (en) | 2012-03-19 | 2012-03-19 | LED light bar testing fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103323792A true CN103323792A (en) | 2013-09-25 |
Family
ID=49192656
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201210072363 Pending CN103323792A (en) | 2012-03-19 | 2012-03-19 | LED light bar testing fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103323792A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104330749A (en) * | 2014-07-16 | 2015-02-04 | 苏州威盛视信息科技有限公司 | Front-side-illuminating LED light strip test device and method |
| CN111537858A (en) * | 2020-04-22 | 2020-08-14 | 深圳市华星光电半导体显示技术有限公司 | Detection device and detection method |
| CN112967945A (en) * | 2020-04-16 | 2021-06-15 | 重庆康佳光电技术研究院有限公司 | Micro light-emitting diode testing device, manufacturing method, system and testing method |
| CN113314942A (en) * | 2021-05-25 | 2021-08-27 | 天津凯普林光电科技有限公司 | Power-on device of laser component |
-
2012
- 2012-03-19 CN CN 201210072363 patent/CN103323792A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104330749A (en) * | 2014-07-16 | 2015-02-04 | 苏州威盛视信息科技有限公司 | Front-side-illuminating LED light strip test device and method |
| CN104330749B (en) * | 2014-07-16 | 2018-01-05 | 苏州威盛视信息科技有限公司 | Positive luminescence LED lamp bar test device and method |
| CN112967945A (en) * | 2020-04-16 | 2021-06-15 | 重庆康佳光电技术研究院有限公司 | Micro light-emitting diode testing device, manufacturing method, system and testing method |
| CN111537858A (en) * | 2020-04-22 | 2020-08-14 | 深圳市华星光电半导体显示技术有限公司 | Detection device and detection method |
| WO2021212560A1 (en) * | 2020-04-22 | 2021-10-28 | 深圳市华星光电半导体显示技术有限公司 | Detection device and detection method |
| CN113314942A (en) * | 2021-05-25 | 2021-08-27 | 天津凯普林光电科技有限公司 | Power-on device of laser component |
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Legal Events
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| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20130925 |