CN101894779B - 用于半导体处理的方法和装置 - Google Patents
用于半导体处理的方法和装置 Download PDFInfo
- Publication number
- CN101894779B CN101894779B CN201010202703.4A CN201010202703A CN101894779B CN 101894779 B CN101894779 B CN 101894779B CN 201010202703 A CN201010202703 A CN 201010202703A CN 101894779 B CN101894779 B CN 101894779B
- Authority
- CN
- China
- Prior art keywords
- blade
- wafer
- container
- linear driving
- sluice valve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title claims abstract description 84
- 239000004065 semiconductor Substances 0.000 title description 11
- 230000007246 mechanism Effects 0.000 claims abstract description 72
- 230000005540 biological transmission Effects 0.000 claims abstract description 24
- 235000012431 wafers Nutrition 0.000 claims description 79
- 238000005096 rolling process Methods 0.000 claims description 9
- 230000033001 locomotion Effects 0.000 claims description 8
- 239000000758 substrate Substances 0.000 description 25
- 230000009977 dual effect Effects 0.000 description 21
- 238000003860 storage Methods 0.000 description 16
- 230000007723 transport mechanism Effects 0.000 description 10
- 239000010935 stainless steel Substances 0.000 description 7
- 229910001220 stainless steel Inorganic materials 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 238000007789 sealing Methods 0.000 description 6
- 239000004411 aluminium Substances 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 230000015654 memory Effects 0.000 description 4
- 238000005086 pumping Methods 0.000 description 4
- 229920000049 Carbon (fiber) Polymers 0.000 description 3
- 239000004917 carbon fiber Substances 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 3
- 238000006386 neutralization reaction Methods 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- 230000005571 horizontal transmission Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 230000005570 vertical transmission Effects 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- WYEMLYFITZORAB-UHFFFAOYSA-N boscalid Chemical compound C1=CC(Cl)=CC=C1C1=CC=CC=C1NC(=O)C1=CC=CN=C1Cl WYEMLYFITZORAB-UHFFFAOYSA-N 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000005461 lubrication Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000000427 thin-film deposition Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67178—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers vertical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67167—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers surrounding a central transfer chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/139—Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (13)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US49647903P | 2003-08-29 | 2003-08-29 | |
US60/496,479 | 2003-08-29 | ||
US60/496479 | 2003-08-29 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200480024808.8A Division CN101094933A (zh) | 2003-08-29 | 2004-08-27 | 用于半导体处理的方法和装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101894779A CN101894779A (zh) | 2010-11-24 |
CN101894779B true CN101894779B (zh) | 2013-05-01 |
Family
ID=34272490
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201010202703.4A Expired - Lifetime CN101894779B (zh) | 2003-08-29 | 2004-08-27 | 用于半导体处理的方法和装置 |
CN201010202694.9A Pending CN101894778A (zh) | 2003-08-29 | 2004-08-27 | 用于半导体处理的方法和装置 |
CN200480024808.8A Pending CN101094933A (zh) | 2003-08-29 | 2004-08-27 | 用于半导体处理的方法和装置 |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201010202694.9A Pending CN101894778A (zh) | 2003-08-29 | 2004-08-27 | 用于半导体处理的方法和装置 |
CN200480024808.8A Pending CN101094933A (zh) | 2003-08-29 | 2004-08-27 | 用于半导体处理的方法和装置 |
Country Status (4)
Country | Link |
---|---|
US (4) | US20050194096A1 (zh) |
CN (3) | CN101894779B (zh) |
TW (1) | TW200522136A (zh) |
WO (1) | WO2005022602A2 (zh) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6918731B2 (en) | 2001-07-02 | 2005-07-19 | Brooks Automation, Incorporated | Fast swap dual substrate transport for load lock |
CN101894779B (zh) | 2003-08-29 | 2013-05-01 | 交叉自动控制公司 | 用于半导体处理的方法和装置 |
US7458763B2 (en) | 2003-11-10 | 2008-12-02 | Blueshift Technologies, Inc. | Mid-entry load lock for semiconductor handling system |
US10086511B2 (en) | 2003-11-10 | 2018-10-02 | Brooks Automation, Inc. | Semiconductor manufacturing systems |
US20070269297A1 (en) | 2003-11-10 | 2007-11-22 | Meulen Peter V D | Semiconductor wafer handling and transport |
WO2005048313A2 (en) * | 2003-11-10 | 2005-05-26 | Blueshift Technologies, Inc. | Methods and systems for handling workpieces in a vacuum-based semiconductor handling system |
US20070116872A1 (en) * | 2005-11-18 | 2007-05-24 | Tokyo Electron Limited | Apparatus for thermal and plasma enhanced vapor deposition and method of operating |
CN100499059C (zh) * | 2006-08-22 | 2009-06-10 | 资腾科技股份有限公司 | 水平手动式晶舟转换器防护装置 |
JP2010524201A (ja) * | 2007-03-22 | 2010-07-15 | クロッシング オートメイション, インコーポレイテッド | モジュラクラスタツール |
US20110248738A1 (en) * | 2010-04-12 | 2011-10-13 | Sze Chak Tong | Testing apparatus for electronic devices |
KR20140053625A (ko) * | 2012-10-26 | 2014-05-08 | 삼성디스플레이 주식회사 | 유기물 증착 장치 |
JP6086254B2 (ja) * | 2014-09-19 | 2017-03-01 | 日新イオン機器株式会社 | 基板処理装置 |
CN106292194B (zh) * | 2015-05-24 | 2018-03-30 | 上海微电子装备(集团)股份有限公司 | 硅片传输系统 |
CN107644832B (zh) * | 2016-07-20 | 2023-09-29 | 朗姆研究公司 | 用于系统维护期间储存和组织mca特征和晶片传送销的设计 |
KR102650824B1 (ko) * | 2016-10-18 | 2024-03-26 | 매슨 테크놀로지 인크 | 워크피스 처리를 위한 시스템 및 방법 |
US11929276B2 (en) | 2019-02-14 | 2024-03-12 | Persimmon Technologies Corporation | Modular material handling robot platform |
US20230054858A1 (en) * | 2021-08-17 | 2023-02-23 | Changxin Memory Technologies, Inc. | Apparatus and method for transferring wafer, and apparatus for controlling transferring wafer |
Citations (1)
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US5944940A (en) * | 1996-07-09 | 1999-08-31 | Gamma Precision Technology, Inc. | Wafer transfer system and method of using the same |
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-
2004
- 2004-08-27 CN CN201010202703.4A patent/CN101894779B/zh not_active Expired - Lifetime
- 2004-08-27 US US10/927,703 patent/US20050194096A1/en not_active Abandoned
- 2004-08-27 CN CN201010202694.9A patent/CN101894778A/zh active Pending
- 2004-08-27 WO PCT/US2004/028212 patent/WO2005022602A2/en active Application Filing
- 2004-08-27 CN CN200480024808.8A patent/CN101094933A/zh active Pending
- 2004-08-30 TW TW093126013A patent/TW200522136A/zh unknown
-
2007
- 2007-10-30 US US11/929,230 patent/US20080073031A1/en not_active Abandoned
- 2007-10-30 US US11/929,357 patent/US7748944B2/en not_active Expired - Lifetime
-
2010
- 2010-05-07 US US12/776,235 patent/US20100221915A1/en not_active Abandoned
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5944940A (en) * | 1996-07-09 | 1999-08-31 | Gamma Precision Technology, Inc. | Wafer transfer system and method of using the same |
Also Published As
Publication number | Publication date |
---|---|
TW200522136A (en) | 2005-07-01 |
WO2005022602A3 (en) | 2007-08-16 |
US7748944B2 (en) | 2010-07-06 |
US20080089774A1 (en) | 2008-04-17 |
CN101894778A (zh) | 2010-11-24 |
CN101094933A (zh) | 2007-12-26 |
WO2005022602A2 (en) | 2005-03-10 |
US20050194096A1 (en) | 2005-09-08 |
CN101894779A (zh) | 2010-11-24 |
US20100221915A1 (en) | 2010-09-02 |
US20080073031A1 (en) | 2008-03-27 |
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