CN101889195B - Atr探针 - Google Patents

Atr探针 Download PDF

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Publication number
CN101889195B
CN101889195B CN2008801191579A CN200880119157A CN101889195B CN 101889195 B CN101889195 B CN 101889195B CN 2008801191579 A CN2008801191579 A CN 2008801191579A CN 200880119157 A CN200880119157 A CN 200880119157A CN 101889195 B CN101889195 B CN 101889195B
Authority
CN
China
Prior art keywords
photoconduction
atr
face
reception
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2008801191579A
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English (en)
Chinese (zh)
Other versions
CN101889195A (zh
Inventor
哈孔·米克尔森
安德烈亚斯·米勒
帕特里克·亨齐
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Endress and Hauser Conducta GmbH and Co KG
Original Assignee
Endress and Hauser Conducta Gesellschaft fuer Mess und Regeltechnik mbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Endress and Hauser Conducta Gesellschaft fuer Mess und Regeltechnik mbH and Co KG filed Critical Endress and Hauser Conducta Gesellschaft fuer Mess und Regeltechnik mbH and Co KG
Publication of CN101889195A publication Critical patent/CN101889195A/zh
Application granted granted Critical
Publication of CN101889195B publication Critical patent/CN101889195B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N2021/434Dipping block in contact with sample, e.g. prism
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/85Investigating moving fluids or granular solids
    • G01N21/8507Probe photometers, i.e. with optical measuring part dipped into fluid sample
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/08Optical fibres; light guides
CN2008801191579A 2007-12-04 2008-12-02 Atr探针 Expired - Fee Related CN101889195B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102007058611A DE102007058611A1 (de) 2007-12-04 2007-12-04 ATR-Sonde
DE102007058611.8 2007-12-04
PCT/EP2008/066656 WO2009071557A2 (de) 2007-12-04 2008-12-02 Atr-sonde

Publications (2)

Publication Number Publication Date
CN101889195A CN101889195A (zh) 2010-11-17
CN101889195B true CN101889195B (zh) 2013-05-22

Family

ID=40377380

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2008801191579A Expired - Fee Related CN101889195B (zh) 2007-12-04 2008-12-02 Atr探针

Country Status (5)

Country Link
US (1) US20100303413A1 (pt-PT)
EP (1) EP2217912A2 (pt-PT)
CN (1) CN101889195B (pt-PT)
DE (1) DE102007058611A1 (pt-PT)
WO (1) WO2009071557A2 (pt-PT)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011085615A1 (de) 2010-11-09 2012-07-12 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG ATR Sonde zur Untersuchung eines Mediums mittels einer optischen Strahlung
GB201214364D0 (en) * 2012-08-13 2012-09-26 Element Six N V A nosepiece for an optical probe and an optical probe comprising said nosepiece
CN103398948B (zh) * 2013-08-14 2015-09-16 武汉大学 一种用于傅里叶变换红外光谱仪的atr探头
DE102016008886B4 (de) * 2016-07-20 2020-09-17 Spectrolytic GmbH ATR-Spektrometer
CN111650153B (zh) * 2020-05-22 2022-10-25 复旦大学 一种近红外光谱成像装置用探头

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0206433A2 (en) * 1985-06-25 1986-12-30 The Dow Chemical Company Methods for measuring the light absorbance of a fluid medium
US5170056A (en) * 1991-02-28 1992-12-08 Galileo Electro-Optics Corporation Optical fiber coupled devices for remote spectroscopy in the infrared
US5991029A (en) * 1998-04-06 1999-11-23 Axiom Analytical, Inc. Attenuated total reflecance probe employing large incidence angles
EP1026497A2 (de) * 1999-02-06 2000-08-09 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. Optoelektronischer Sensor
DE19856591C2 (de) * 1998-12-08 2001-03-08 Basf Ag Vorrichtung zur spektroskopischen Analyse eines fluiden Mediums mittels abgeschwächter Reflexion
CN1397794A (zh) * 2002-08-21 2003-02-19 北京大学 一种检测生物体组织红外光谱的方法及其专用装置
DE102005052223B3 (de) * 2005-10-30 2007-06-14 Küpper, Lukas, Dipl.-Phys. Temperaturfeste Infrarot-Messsonde

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GB1321783A (en) * 1971-03-11 1973-06-27 Miles Lab Illumination and light receiving device
DE3113248A1 (de) * 1981-04-02 1982-10-14 Eppendorf Gerätebau Netheler + Hinz GmbH, 2000 Hamburg Verfahren zur uebergabe von fluessigkeiten aus behaeltern und vorrichtung zur durchfuehrung des verfahrens
EP0145877B1 (de) * 1983-11-04 1989-08-02 Hartmann & Braun Aktiengesellschaft Fotometer zur kontinuierlichen Analyse eines Mediums (Gas oder Flüssigkeit)
AU583337B2 (en) * 1985-01-14 1989-04-27 Sumitomo Electric Industries, Ltd. Fiberscope
EP0221011A3 (de) 1985-09-26 1989-11-02 Ciba-Geigy Ag Analysenverfahren, unter Verwendung der abgeschwächten Totalreflexion
DE3673378D1 (de) * 1986-01-30 1990-09-13 Dow Chemical Co Faseroptische sonde.
DE3813258A1 (de) * 1988-04-20 1989-11-02 Siemens Ag Verfahren zur beruehrungslosen und zerstoerungsfreien pruefung von absorptionsfaehigen materialien und vorrichtung zu seiner durchfuehrung
SE502148C2 (sv) * 1993-12-03 1995-08-28 Bexelius Anordning för mätning av mängden fast substans i ett fluidum med ljus
US5459316A (en) * 1994-01-31 1995-10-17 Axiom Analytical, Inc. Immersion probe for infrared internal reflectance spectroscopy
DE9403540U1 (de) * 1994-03-03 1994-05-05 Zeiss Carl Jena Gmbh Tauchsonde
US5552604A (en) 1994-05-13 1996-09-03 Donald W. Sting Optical sensing with crystal assembly sensing tip
US5625459A (en) * 1995-03-03 1997-04-29 Galileo Electro-Optics Corporation Diffuse reflectance probe
US5773825A (en) 1995-09-22 1998-06-30 Axiom Analytical, Inc. Bi-layer attenuated total reflectance device providing optimized absorbance linearity
DE19541686B4 (de) * 1995-11-08 2009-08-06 Kaltenbach & Voigt Gmbh & Co. Kg Vorrichtung zum Erkennen von Karies, Plaque oder bakteriellem Befall an Zähnen
AU763861B2 (en) * 1998-05-19 2003-07-31 Spectrx, Inc. Apparatus and method for determining tissue characteristics
US6573984B2 (en) * 1998-06-30 2003-06-03 Lj Laboratories Llc Apparatus and method for measuring optical characteristics of teeth
US6420708B2 (en) 2000-03-10 2002-07-16 Wilks Enterprise, Inc. Spectroscopy analyzer using a detector array
CA2463151A1 (en) * 2001-10-11 2003-04-17 Sentelligence, Inc. Low-cost on-line and in-line spectral sensors based on solid-state source and detector combinations
JP2006091008A (ja) * 2004-08-25 2006-04-06 Ceratec Japan Co Ltd 光学成分計
GB2423816A (en) * 2005-03-01 2006-09-06 Spectraprobe Ltd High Temperature ATR Probe
DE102006004916B3 (de) * 2006-02-01 2007-06-14 GEA Process Engineering (NPS) Ltd., Eastleigh Vorrichtung zur optischen Messung von Stoffkonzentrationen
DE102006036409B4 (de) 2006-04-06 2011-06-22 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG, 70839 ATR-Sonde zur Untersuchung eines Mediums mit Infrarotstrahlung
DE102006052208B3 (de) * 2006-11-01 2007-12-06 Loptek Glasfasertechnik Gmbh & Co. Kg Faseroptische Retroreflexsonde

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0206433A2 (en) * 1985-06-25 1986-12-30 The Dow Chemical Company Methods for measuring the light absorbance of a fluid medium
US5170056A (en) * 1991-02-28 1992-12-08 Galileo Electro-Optics Corporation Optical fiber coupled devices for remote spectroscopy in the infrared
US5991029A (en) * 1998-04-06 1999-11-23 Axiom Analytical, Inc. Attenuated total reflecance probe employing large incidence angles
DE19856591C2 (de) * 1998-12-08 2001-03-08 Basf Ag Vorrichtung zur spektroskopischen Analyse eines fluiden Mediums mittels abgeschwächter Reflexion
EP1026497A2 (de) * 1999-02-06 2000-08-09 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. Optoelektronischer Sensor
CN1397794A (zh) * 2002-08-21 2003-02-19 北京大学 一种检测生物体组织红外光谱的方法及其专用装置
DE102005052223B3 (de) * 2005-10-30 2007-06-14 Küpper, Lukas, Dipl.-Phys. Temperaturfeste Infrarot-Messsonde

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
付时雨等.ATR-UV/Vis光谱传感技术原理及其应用于制浆过程分析.《造纸科学与技术》.2004,第23卷(第6期),95-111. *

Also Published As

Publication number Publication date
EP2217912A2 (de) 2010-08-18
CN101889195A (zh) 2010-11-17
WO2009071557A2 (de) 2009-06-11
WO2009071557A3 (de) 2009-10-15
DE102007058611A1 (de) 2009-06-10
US20100303413A1 (en) 2010-12-02

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Granted publication date: 20130522

Termination date: 20201202