CN101824599A - 采用真空熔铸法制备铬靶的方法 - Google Patents
采用真空熔铸法制备铬靶的方法 Download PDFInfo
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- CN101824599A CN101824599A CN 201010181628 CN201010181628A CN101824599A CN 101824599 A CN101824599 A CN 101824599A CN 201010181628 CN201010181628 CN 201010181628 CN 201010181628 A CN201010181628 A CN 201010181628A CN 101824599 A CN101824599 A CN 101824599A
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- 238000000034 method Methods 0.000 title claims abstract description 21
- 238000005266 casting Methods 0.000 title claims abstract description 11
- 238000003723 Smelting Methods 0.000 claims abstract description 9
- 230000006698 induction Effects 0.000 claims abstract description 8
- 239000011651 chromium Substances 0.000 claims description 39
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 9
- 229910052804 chromium Inorganic materials 0.000 claims description 9
- 238000002844 melting Methods 0.000 claims description 7
- 230000008018 melting Effects 0.000 claims description 7
- 238000002360 preparation method Methods 0.000 claims description 6
- 239000013078 crystal Substances 0.000 abstract description 4
- 238000001816 cooling Methods 0.000 abstract description 3
- 238000010438 heat treatment Methods 0.000 abstract description 3
- 239000000463 material Substances 0.000 abstract description 2
- 230000002349 favourable effect Effects 0.000 abstract 1
- 230000006911 nucleation Effects 0.000 abstract 1
- 238000010899 nucleation Methods 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 238000004663 powder metallurgy Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
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Application Number | Priority Date | Filing Date | Title |
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CN2010101816288A CN101824599B (zh) | 2010-05-24 | 2010-05-24 | 采用真空熔铸法制备铬靶的方法 |
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CN2010101816288A CN101824599B (zh) | 2010-05-24 | 2010-05-24 | 采用真空熔铸法制备铬靶的方法 |
Publications (2)
Publication Number | Publication Date |
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CN101824599A true CN101824599A (zh) | 2010-09-08 |
CN101824599B CN101824599B (zh) | 2012-07-04 |
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CN2010101816288A Expired - Fee Related CN101824599B (zh) | 2010-05-24 | 2010-05-24 | 采用真空熔铸法制备铬靶的方法 |
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CN (1) | CN101824599B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105695946A (zh) * | 2014-11-28 | 2016-06-22 | 宁波江丰电子材料股份有限公司 | 透光基板的镀膜方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1074843A (zh) * | 1993-02-17 | 1993-08-04 | 冶金工业部钢铁研究总院 | 磁控溅射铬靶的制造方法 |
JP2001073125A (ja) * | 1999-09-08 | 2001-03-21 | Nikko Materials Co Ltd | Co−Ta系合金スパッタリングターゲット及びその製造方法 |
CN1415779A (zh) * | 2002-10-28 | 2003-05-07 | 天津大学 | 溅射法生产高稳定性金属膜电阻器用的高阻靶材制造方法 |
JP2004052094A (ja) * | 2002-07-24 | 2004-02-19 | Toshiba Corp | スパッタリングターゲット,硬質被膜および硬質被膜部材 |
CN101195882A (zh) * | 2007-12-26 | 2008-06-11 | 安泰科技股份有限公司 | 一种磁控溅射Co-Cr-Ta合金靶的制造方法 |
CN101519765A (zh) * | 2009-03-19 | 2009-09-02 | 金川集团有限公司 | 一种半导体及显示器用高纯铜溅射靶材的制造方法 |
-
2010
- 2010-05-24 CN CN2010101816288A patent/CN101824599B/zh not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1074843A (zh) * | 1993-02-17 | 1993-08-04 | 冶金工业部钢铁研究总院 | 磁控溅射铬靶的制造方法 |
JP2001073125A (ja) * | 1999-09-08 | 2001-03-21 | Nikko Materials Co Ltd | Co−Ta系合金スパッタリングターゲット及びその製造方法 |
JP2004052094A (ja) * | 2002-07-24 | 2004-02-19 | Toshiba Corp | スパッタリングターゲット,硬質被膜および硬質被膜部材 |
CN1415779A (zh) * | 2002-10-28 | 2003-05-07 | 天津大学 | 溅射法生产高稳定性金属膜电阻器用的高阻靶材制造方法 |
CN101195882A (zh) * | 2007-12-26 | 2008-06-11 | 安泰科技股份有限公司 | 一种磁控溅射Co-Cr-Ta合金靶的制造方法 |
CN101519765A (zh) * | 2009-03-19 | 2009-09-02 | 金川集团有限公司 | 一种半导体及显示器用高纯铜溅射靶材的制造方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105695946A (zh) * | 2014-11-28 | 2016-06-22 | 宁波江丰电子材料股份有限公司 | 透光基板的镀膜方法 |
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CN101824599B (zh) | 2012-07-04 |
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Address after: 710075 No. 273 fish Road, Xi'an, Shaanxi Patentee after: SHAANXI SIRUI ADVANCED MATERIALS Co.,Ltd. Address before: 710075 No. 273 fish Road, Xi'an, Shaanxi Patentee before: SHAANXI SIRUI INDUSTRIES Co.,Ltd. |
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Address after: 710075, No. 87, No. 12, Xi'an hi tech Zone, Shaanxi, China Patentee after: SHAANXI SIRUI ADVANCED MATERIALS Co.,Ltd. Address before: 710075 No. 273 fish Road, Xi'an, Shaanxi Patentee before: SHAANXI SIRUI ADVANCED MATERIALS Co.,Ltd. |
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Addressee: Li Jun Document name: Notification of qualified procedures |
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Granted publication date: 20120704 |