CN101697002A - Low-resistance printed circuit board test device - Google Patents
Low-resistance printed circuit board test device Download PDFInfo
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- CN101697002A CN101697002A CN200910110537A CN200910110537A CN101697002A CN 101697002 A CN101697002 A CN 101697002A CN 200910110537 A CN200910110537 A CN 200910110537A CN 200910110537 A CN200910110537 A CN 200910110537A CN 101697002 A CN101697002 A CN 101697002A
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- anchor clamps
- test
- probe
- base plate
- circuit board
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Abstract
The invention discloses a low-resistance printed circuit board test device, which comprises a fixture and a plurality of test switch cards. The device is characterized in that a fixture bottom plate of the fixture is provided with a plurality of insertion through holes for inserting network connection pins, and the network connection pins exposed on the fixture bottom plate are correspondingly connected with test probes arranged on the fixture bottom plate one by one through conducting wires; the fixture is provided with a card box, a card socket board of the card box is alternately provided with a plurality of embedding insertion holes which correspond to double rows of the network connection pins on the fixture bottom plate and run through the card socket board; and network points arranged on one side of each of the test switch cards are connected with probe strips, and the probe strips are provided with probes which can be in corresponding insertion connection with the embedding insertion holes on the card socket board. Compared with the prior art, the device has the advantages of having capacity of completely eliminating larger error of contact resistance caused by frequent friction between buses and fully shrouded polarized headers and bus sockets, greatly improving test accuracy, greatly reducing the manufacturing cost for special test fixtures, and greatly improving test efficiency.
Description
Technical field
What the present invention relates to is circuit board testing device, especially a kind of low-resistance printed circuit board test device.
Technical background
As everyone knows, all electric equipments or control system are all wanted the application of printed wiring board, are not short-circuited or open circuit for guaranteeing wiring board, and printed-wiring board (PWB) all need be tested before dispatching from the factory.At present, a kind of special test anchor clamps of being made up of anchor clamps and on-off circuit card connection are adopted in the test of printed-wiring board (PWB) usually.The anchor clamps of this special test anchor clamps are made up of clamping fixture seat and unit clamp usually, unit clamp is made of clamp face plate and anchor clamps base plate, be furnished with test probe and PCB register pin to be measured on the clamp face plate, test probe is connected with the ox horn socket by lead, the on-off circuit card is provided with the winding displacement socket, is connected as a single entity by wire plug connection between the two.Though the special test anchor clamps of this structure can satisfy the test of general printed-wiring board (PWB).But there is following defective in the special test anchor clamps of this structure:
One, since anchor clamps on test probe is connected with the ox horn socket by lead, the connection lead more than and seem very mixed and disorderly, complex structure.
Two, because anchor clamps and on-off circuit card are to be connected by wire plug connection, often plug, make the contact resistance of winding displacement and ox horn become unstable, and then make the measuring accuracy variation, more can't satisfy the test of internal resistance less than 1 ohm low-resistance printed circuit board because of wearing and tearing.
Three, because anchor clamps and on-off circuit card are to be connected by wire plug connection, need often expend a large amount of time in the use inserts an end of winding displacement or extract from the ox horn socket, not only complicated operation, waste time and energy and the inefficiency of makeing mistakes easily, the production setup time of having extended greatly.General factory all is furnished with the special debugging clamper of skilled worker of skilled sectional fixture, causes production cost obviously to improve.
Four, winding displacement and ox horn socket all are consumable accessorys, and therefore it not only can influence the printed-wiring board (PWB) test duration, can influence proper testing when serious, delays client's product time of delivery.
Summary of the invention
Technical matters to be solved by this invention is to remedy above-mentioned the deficiencies in the prior art, proposes a kind of no winding displacement bindiny mechanism, both can satisfy general printed-wiring board (PWB), is applicable to the low-resistance printed circuit board test device of internal resistance less than 1 ohm of printed wire board test again.
The present invention is solved by the following technical programs.
This low-resistance printed circuit board test device comprises: the anchor clamps of being made up of clamp face plate and anchor clamps base plate; Be arranged with some test probes and PCB register pin to be measured on the clamp face plate; Some avris are arranged the Test Switchboard card that is provided with nexus.
The characteristics of this low-resistance printed circuit board test device are:
Arrange on the described anchor clamps base plate and be provided with some plant through holes that supply networks connection cushion to put, network connects pin and is plugged in the plant through hole, and the network that is exposed to the anchor clamps base plate connects pin and connects one to one by the test probe of arranging on lead and the clamp face plate;
Described anchor clamps are furnished with one and constitute the card case by deck plate and support body, are spaced on the deck plate that to be provided with some pins that are connected with double network on the anchor clamps base plate corresponding and through the embedding jack of deck plate.
The nexus that described Test Switchboard edge side is arranged is connected with the probe bar, be arranged with on the probe bar can with the deck plate on embed the probe of the corresponding inserting connection of jack.
Technical matters of the present invention is solved by following further technical scheme.
The anchor clamps base plate of described anchor clamps is provided with register pin, also be provided with on the deck plate of card case with the anchor clamps base plate on the pin-and-hole of register pin corresponding matching.
It is double connection pin that the network of arranging on the described anchor clamps base plate connects pin.
The side that described Test Switchboard is arranged with nexus is connected with the probe bar.
Described probe bar is made of the double pin that arrangement is fixed on the PCB bar, be provided with in the PCB bar and the corresponding connection line of Test Switchboard edge side nexus, each connection line contact that PCB bar dorsal part is arranged and each double pin one end soldering of arrangement connect, and each connection line contact that PCB bar face side is arranged and each double stitch end soldering of arrangement connect.
The present invention's beneficial effect compared with prior art is:
1, it is many and seem very mixed and disorderly, complex structure to connect lead.
The inserting of adopting on-off circuit card probe bar to be connected needle stand with network on the anchor clamps base plate connects, the grafting of ox horn socket and winding displacement, winding displacement and winding displacement socket in the alternative prior art, and it is many to have eliminated in the prior art connection lead, the defective that seems mixed and disorderly;
2, anchor clamps are connected with the direct inserting of on-off circuit card, it has not only reduced the grafting link of on-off circuit card and anchor clamps connection line, and can thoroughly eliminate because the big contact resistance error that produces because of frequent inserting friction between winding displacement and ox horn socket and winding displacement socket greatly improves measuring accuracy;
3, anchor clamps are connected with the direct inserting of on-off circuit card, no longer need can improve testing efficiency greatly because of the plug spent plenty of time of winding displacement.It also can reduce test operation personnel's technical ability requirement greatly, makes the common laborer also can finish the cramp assembling and disassembling debugging operations to the printed wire board test.Be fit to very much PCB factory use of large-scale production;
4, anchor clamps are connected with the direct inserting of on-off circuit card, have not only had the winding displacement and the ox horn socket of rapid wear, have not only simplified the syndeton between on-off circuit card and anchor clamps base plate greatly, and can reduce the manufacturing cost of device.
The concrete structure of low-resistance printed circuit board test device of the present invention is provided in detail by the following drawings and embodiment.
Description of drawings
Fig. 1 is the structural representation of low-resistance printed circuit board test device;
Fig. 2 is the clamp structure synoptic diagram of low-resistance printed circuit board test device shown in Figure 1;
Fig. 3 is the structure for amplifying synoptic diagram at low-resistance printed circuit board test device A shown in Figure 1 position;
Fig. 4 is the Test Switchboard card structure synoptic diagram of low-resistance printed circuit board test device shown in Figure 1.
Among the figure: anchor clamps 1, clamp face plate 11, anchor clamps base plate 12, test probe 13, PCB register pin 14 to be measured, double network connect pin 15, lead 16, dowel hole 17, card case 2, deck plate 21, support body 22, embed jack 23, register pin 24, Test Switchboard card 3, probe bar 31, PCB bar 32, double probe 33.
Embodiment
Embodiment: can be clear that from Fig. 1 and Fig. 2 low-resistance printed circuit board test device comprises: anchor clamps 1, card case 2 and Test Switchboard card 3 are formed.
Described anchor clamps 1 are with clamp structure is basic identical now, constitute by anchor clamps face 11 and anchor clamps base plate 12, be furnished with the test probe 13 and the PCB register pin 14 to be measured of some arrangements on the clamp face plate 11, difference is: anchor clamps base plate 12 is provided with the double network of some confessions and connects the jack that pin 15 is planted, double network connects pin 15 and vertically is plugged in the jack, and the double network that is exposed to 12 sides of anchor clamps base plate connects pin 15 and connects one to one by lead 16 with the test probe 13 that is exposed to clamp face plate 11 back sides; Described anchor clamps base plate 12 is provided with the dowel hole 17 that can cooperate the location with register pin on the card case deck plate.
Described card case 2 is made of deck plate 21 and support body 22, is spaced on the deck plate 21 that to be provided with some pins 15 of being connected with double network on the anchor clamps base plate 12 corresponding and through the embedding jack 23 of deck plate 21.Also be provided with on the deck plate 21 of card case 2 with anchor clamps base plate 12 on the register pin 24 of dowel hole 17 corresponding matching.
Described Test Switchboard card 3 as shown in Figure 4, the side that Test Switchboard card 3 is provided with nexus is connected with probe bar 31.
Described probe bar 31 is made of the double probe 33 that arrangement is fixed on the PCB bar 32, be provided with in the PCB bar 32 and the corresponding connection line (not shown) of Test Switchboard card 3 avris nexus, each connection line contact that PCB bar 32 dorsal parts are arranged and each double probe 33 1 end soldering of arrangement connect, and each connection line contact that 32 sides of PCB bar are arranged and each double probe 33 foot soldering of arrangement connect.
When low-resistance printed circuit board test device of the present invention uses, the register pin 24 that dowel hole on the anchor clamps base plate 12 of anchor clamps 1 17 is aimed on the deck plate 21 that blocks case 2 cooperates insertion, this moment, the double network of anchor clamps base plate 12 bottom surfaces connected the embedding jack 23 that pin 15 can insert deck plate 21 correspondences one by one, then probe bar 31 ends of some Test Switchboard cards 3 corresponding embedding slotted eye 23 from the aligning deck plate 21 of deck plate 21 belows is inserted, the double probe 33 on the bar 31 of popping one's head in this moment can be connected pin 15 conductings connection with the double network on the anchor clamps base plate 12.Finishing anchor clamps 1 by card case 2 is connected with power supply between some Test Switchboard cards 3.
Above content be in conjunction with concrete preferred implementation to further describing that the present invention did, can not assert that concrete enforcement of the present invention is confined to these explanations.For the general technical staff of the technical field of the invention, without departing from the inventive concept of the premise, its framework form can be flexible and changeable, can the subseries product.Just make some simple deduction or replace, all should be considered as belonging to the scope of patent protection that the present invention is determined by claims of being submitted to.
Claims (4)
1. low-resistance printed circuit board test device comprises: the anchor clamps of being made up of clamp face plate and anchor clamps base plate; Be arranged with some test probes and PCB register pin to be measured on the clamp face plate; Some avris are arranged the Test Switchboard card that is provided with nexus, it is characterized in that:
Arrange on the described anchor clamps base plate and be provided with some plant through holes that supply networks connection cushion to put, network connects pin and is plugged in the plant through hole, and the network that is exposed to the anchor clamps base plate connects pin and connects one to one by the test probe of arranging on lead and the clamp face plate;
Described anchor clamps are furnished with one and constitute the card case by deck plate and support body, are spaced on the deck plate that to be provided with some pins that are connected with double network on the anchor clamps base plate corresponding and through the embedding jack of deck plate;
The nexus that described Test Switchboard edge side is arranged is connected with the probe bar, be arranged with on the probe bar can with the deck plate on embed the probe of the corresponding inserting connection of jack.
2. low-resistance printed circuit board test device according to claim 1 is characterized in that:
The anchor clamps base plate of described anchor clamps is provided with register pin, also be provided with on the deck plate of card case with the anchor clamps base plate on the register pin of dowel hole corresponding matching.
3. low-resistance printed circuit board test device according to claim 1 and 2 is characterized in that:
It is that double network connects pin that the network of arranging on the described anchor clamps base plate connects pin.
4. low-resistance printed circuit board test device according to claim 3 is characterized in that:
The probe bar of described Test Switchboard card is made of the double probe that arrangement is fixed on the PCB bar, be provided with in the PCB bar and the corresponding connection line of Test Switchboard edge side nexus, each connection line contact that PCB bar dorsal part is arranged and each double probe one end soldering of arrangement connect, and each connection line contact that PCB bar face side is arranged and each double probe foot soldering of arrangement connect.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101105372A CN101697002B (en) | 2009-10-16 | 2009-10-16 | Low-resistance printed circuit board test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101105372A CN101697002B (en) | 2009-10-16 | 2009-10-16 | Low-resistance printed circuit board test device |
Publications (2)
| Publication Number | Publication Date |
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| CN101697002A true CN101697002A (en) | 2010-04-21 |
| CN101697002B CN101697002B (en) | 2012-08-08 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009101105372A Active CN101697002B (en) | 2009-10-16 | 2009-10-16 | Low-resistance printed circuit board test device |
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| CN (1) | CN101697002B (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101930045A (en) * | 2010-08-19 | 2010-12-29 | 黄道铭 | Special on-off detection device of automobile window control switch connection terminal board |
| CN101949674A (en) * | 2010-08-12 | 2011-01-19 | 友达光电股份有限公司 | Box body slot inspection device and box body slot inspection method |
| CN102183681A (en) * | 2011-05-25 | 2011-09-14 | 中国人民解放军总装备部军械技术研究所 | Handheld circuit board test fixture |
| CN104391239A (en) * | 2014-11-11 | 2015-03-04 | 大族激光科技产业集团股份有限公司 | Integrated circuit of integrated high-voltage switch tube and test switch card circuit |
| CN104793125A (en) * | 2015-04-27 | 2015-07-22 | 许继集团有限公司 | Test device for measuring plates for distributors of photovoltaic header boxes |
| CN108008276A (en) * | 2017-11-29 | 2018-05-08 | 湖北航天技术研究院计量测试技术研究所 | Multichannel transistor array testing auxiliary device |
| CN110865295A (en) * | 2019-10-30 | 2020-03-06 | 武汉光庭信息技术股份有限公司 | Onboard IC pin signal test fixture |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4337500A1 (en) * | 1993-11-03 | 1995-05-04 | Test Plus Electronic Gmbh | Two-part adapter device |
| US6194908B1 (en) * | 1997-06-26 | 2001-02-27 | Delaware Capital Formation, Inc. | Test fixture for testing backplanes or populated circuit boards |
| CN2410648Y (en) * | 2000-01-20 | 2000-12-13 | 慈圣企业股份有限公司 | Improvement of printed circuit board short-circuit or disconnection tester |
| CN201016994Y (en) * | 2007-03-30 | 2008-02-06 | 天津光电新雨电子通信设备有限公司 | PCB testing jig |
-
2009
- 2009-10-16 CN CN2009101105372A patent/CN101697002B/en active Active
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101949674A (en) * | 2010-08-12 | 2011-01-19 | 友达光电股份有限公司 | Box body slot inspection device and box body slot inspection method |
| CN101949674B (en) * | 2010-08-12 | 2012-08-15 | 友达光电股份有限公司 | Box body slot inspection device and box body slot inspection method |
| CN101930045A (en) * | 2010-08-19 | 2010-12-29 | 黄道铭 | Special on-off detection device of automobile window control switch connection terminal board |
| CN102183681A (en) * | 2011-05-25 | 2011-09-14 | 中国人民解放军总装备部军械技术研究所 | Handheld circuit board test fixture |
| CN104391239A (en) * | 2014-11-11 | 2015-03-04 | 大族激光科技产业集团股份有限公司 | Integrated circuit of integrated high-voltage switch tube and test switch card circuit |
| CN104391239B (en) * | 2014-11-11 | 2017-09-19 | 大族激光科技产业集团股份有限公司 | The integrated circuit and test switch card circuit of integrated high voltage switching tube |
| CN104793125A (en) * | 2015-04-27 | 2015-07-22 | 许继集团有限公司 | Test device for measuring plates for distributors of photovoltaic header boxes |
| CN104793125B (en) * | 2015-04-27 | 2018-09-28 | 许继集团有限公司 | A kind of test device of photovoltaic combiner box current divider measurement plate |
| CN108008276A (en) * | 2017-11-29 | 2018-05-08 | 湖北航天技术研究院计量测试技术研究所 | Multichannel transistor array testing auxiliary device |
| CN108008276B (en) * | 2017-11-29 | 2024-01-26 | 湖北航天技术研究院计量测试技术研究所 | Test auxiliary device for multi-channel transistor array |
| CN110865295A (en) * | 2019-10-30 | 2020-03-06 | 武汉光庭信息技术股份有限公司 | Onboard IC pin signal test fixture |
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| Publication number | Publication date |
|---|---|
| CN101697002B (en) | 2012-08-08 |
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Owner name: NANJING PUYISHI ELECTRONIC TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: CHEN JUNTANG Effective date: 20120611 |
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Free format text: CORRECT: ADDRESS; FROM: 518000 SHENZHEN, GUANGDONG PROVINCE TO: 211100 NANJING, JIANGSU PROVINCE |
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Effective date of registration: 20120611 Address after: 211100, Nanjing District, Jiangsu City, Jiangning Science Park Luo village community Tam West Road Applicant after: Chen Juntang Address before: 518000, B, 11D, 1, happy coast, 83 District, Guangdong, Shenzhen, Baoan Applicant before: Chen Juntang |
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Effective date of registration: 20160623 Address after: 211106, 3 Nanjing, Jiangning economic and Technological Development Zone, Jiangsu, Patentee after: Nanjing Xie Chen Electronic Science and Technology Co., Ltd. Address before: 211100, Nanjing District, Jiangsu City, Jiangning Science Park Luo village community Tam West Road Patentee before: Chen Juntang |