CN203455435U - Open-circuit and short-circuit testing device for single-sided printed circuit board - Google Patents
Open-circuit and short-circuit testing device for single-sided printed circuit board Download PDFInfo
- Publication number
- CN203455435U CN203455435U CN201320558935.2U CN201320558935U CN203455435U CN 203455435 U CN203455435 U CN 203455435U CN 201320558935 U CN201320558935 U CN 201320558935U CN 203455435 U CN203455435 U CN 203455435U
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- circuit
- short
- cover plate
- test
- open
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- Expired - Lifetime
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Abstract
The utility model discloses an open-circuit and short-circuit testing device for a single-sided printed circuit board. The testing device comprises a complete short-circuit testing cover plate and a complete open-circuit testing cover plate. Each of the complete short-circuit testing cover plate and the complete open-circuit testing cover plate is provided with testing pins having the same quantity and positions with connecting pins of a circuit board to be tested, wherein the testing pins of the complete short-circuit testing cover plate are connected, while the testing pins of the complete open-circuit testing cover plate are disconnected. The beneficial effects of the utility model are that the open-circuit and short-circuit tests of the dense circuit board are achieved by the complete short-circuit testing cover plate and the complete open-circuit testing cover plate, so that the testing device is low in cost and simple in production, preventing the investment in the fixtures which is expensive in price and maintenance; and the production cost is reduced, and the reliability of the finished products is improved.
Description
Technical field
This utility model relates to a kind of proving installation of circuit board, particularly a kind of single-clad board open circuit and short-circuit test device.
Background technology
Traditional printed circuit board test device adopts the epoxy plate of multilayer to make test needle plate, because test probe is rapid wear product, so conventionally adopt fixed sleeving on needle plate when proving installation is made, then place test probe in sleeve pipe, so virtually increased the distance between probe and probe.And lightening along with electronic product, the circuit of printed circuit board is more and more intensive, especially IC(semiconductor element) pin width, spacing be 0.2mm substantially, even less, traditional measurement jig cannot complete test at all.Product is without on off test, the product quality used of cannot guaranteeing to deliver to customer, and the market risk is huge.And make high-precision proving installation ten of thousands unit easily, and because test probe is meticulous, easily fracture, the maintenance cost in later stage is high, has increased production cost.
Summary of the invention
Utility model object: the purpose of this utility model is to provide a kind ofly tests to realize the open circuit of the semiconductor element that circuit is intensive and the single-clad board of short-circuit test open circuit and short-circuit test device by full open test and dead-short-circuit.
Technical scheme: a kind of single-clad board open circuit and short-circuit test device, comprise dead-short-circuit testing cover plate and full open test cover plate, described dead-short-circuit testing cover plate with on full open test cover plate, be respectively equipped with and the test pin that connecting pin quantity is identical, position is identical on circuit board under test, test pin mutual conduction on described dead-short-circuit testing cover plate, the test pin on described full open test cover plate disconnects mutually.
Described dead-short-circuit testing cover plate test surfaces is processed with ring groove, and described ring groove connects respectively tests pin on dead-short-circuit testing cover plate, in described ring groove, is installed with conducting resinl.During test, by conducting resinl, connect and respectively test pin, realize dead-short-circuit test
In order more effectively to isolate each connecting pin of circuit board under test, the test pin on described full open test cover plate is separate square through hole.During test, the connecting pin of circuit board under test is placed in corresponding through hole.
Method of testing: use full open test cover plate to test while testing for the first time, if show that standard-sized sheet road explanation product is not short-circuited, have short circuit to occur as test shows in connection description product, product is defective products; The complete qualified circuit board of open test is for the first time carried out to dead-short-circuit test for the second time, if show dead-short-circuit, illustrate that circuit do not open a way badly, if having open circuit generation in measurement circuit open circuit explanation product, product is bad; Twice test be qualified product final decision OK all, can guarantee that product is without open circuit, poor short circuit.
Beneficial effect: realized the intensive open circuit of circuit board and the test of short circuit of circuit by dead-short-circuit testing cover plate and full open test cover plate, cost is low, makes simply, has avoided the high tool expense of price and maintenance cost to drop into.Reduce production cost, improved the reliability of the product that dispatches from the factory.
Accompanying drawing explanation
Fig. 1 is the structural representation of the utility model dead-short-circuit testing cover plate;
Fig. 2 is the structural representation of the full open test cover plate of the utility model.
Embodiment
Below in conjunction with accompanying drawing, the utility model is described in further detail.
As shown in Figure 1, the dead-short-circuit testing cover plate 1 of a kind of single-clad board open circuit and short-circuit test device, described dead-short-circuit testing cover plate 1 is provided with and the test pin 3 that connecting pin quantity is identical, position is identical on circuit board under test, test pin 3 mutual conduction on described dead-short-circuit testing cover plate 1.Described dead-short-circuit testing cover plate 1 test surfaces is processed with ring groove 4, and described ring groove 4 connects respectively tests pin 3 on dead-short-circuit testing cover plates 1, in described ring groove 4, is installed with conducting resinl.
As shown in Figure 2, the full open test cover plate 2 of a kind of single-clad board open circuit and short-circuit test device, described full open test cover plate 2 is respectively equipped with and the test pin 3 that connecting pin quantity is identical, position is identical on circuit board under test, and the test pin 3 on described full open test cover plate 2 disconnects mutually.Test pin 3 on described full open test cover plate 2 is separate square through hole.
Claims (3)
1. a single-clad board is opened a way and short-circuit test device, it is characterized in that: comprise dead-short-circuit testing cover plate (1) and full open test cover plate (2), described dead-short-circuit testing cover plate (1) with on full open test cover plate (2), be respectively equipped with and the test pin (3) that connecting pin quantity is identical, position is identical on circuit board under test, test pin (3) mutual conduction on described dead-short-circuit testing cover plate (1), the test pin (3) on described full open test cover plate (2) disconnects mutually.
2. according to single-clad board open circuit and short-circuit test device described in claim 1, it is characterized in that: described dead-short-circuit testing cover plate (1) test surfaces is processed with ring groove (4), described ring groove (4) connects respectively tests pin (3) on dead-short-circuit testing cover plate (1), and described ring groove is installed with conducting resinl in (4).
3. according to single-clad board open circuit and short-circuit test device described in claim 1, it is characterized in that: the test pin (3) on described full open test cover plate (2) is separate square through hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320558935.2U CN203455435U (en) | 2013-09-10 | 2013-09-10 | Open-circuit and short-circuit testing device for single-sided printed circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320558935.2U CN203455435U (en) | 2013-09-10 | 2013-09-10 | Open-circuit and short-circuit testing device for single-sided printed circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203455435U true CN203455435U (en) | 2014-02-26 |
Family
ID=50135301
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320558935.2U Expired - Lifetime CN203455435U (en) | 2013-09-10 | 2013-09-10 | Open-circuit and short-circuit testing device for single-sided printed circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203455435U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103675583A (en) * | 2013-09-10 | 2014-03-26 | 镇江华印电路板有限公司 | A single-side printed circuit board open circuit and short circuit testing apparatus |
| CN103869212A (en) * | 2014-03-24 | 2014-06-18 | 广州杰赛科技股份有限公司 | Needle-mark-free testing method |
-
2013
- 2013-09-10 CN CN201320558935.2U patent/CN203455435U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103675583A (en) * | 2013-09-10 | 2014-03-26 | 镇江华印电路板有限公司 | A single-side printed circuit board open circuit and short circuit testing apparatus |
| CN103869212A (en) * | 2014-03-24 | 2014-06-18 | 广州杰赛科技股份有限公司 | Needle-mark-free testing method |
| CN103869212B (en) * | 2014-03-24 | 2016-08-17 | 广州杰赛科技股份有限公司 | A kind of no needle mark method of testing |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |