CN101576691A - Method for repairing liquid crystal display device - Google Patents
Method for repairing liquid crystal display device Download PDFInfo
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- CN101576691A CN101576691A CNA2008100369947A CN200810036994A CN101576691A CN 101576691 A CN101576691 A CN 101576691A CN A2008100369947 A CNA2008100369947 A CN A2008100369947A CN 200810036994 A CN200810036994 A CN 200810036994A CN 101576691 A CN101576691 A CN 101576691A
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Abstract
The invention discloses a method for repairing a liquid crystal display device. The method comprises the following steps: cutting a scanning line which has short circuit respectively at two sides of a short-circuit area, separating the scanning line with a public electrode wire having short circuit, realizing the normal work of the scanning line by utilizing two display units at the cutting position of the scanning line as a new scanning line channel, and dividing the public electrode wire into two in an area where the public electrode wire is crossed with a data wire so as to ensure that the public electrode wire is smoothly conductive from left to right and avoid single-line badness caused by the left and right blockage of the public electrode wire. By using the method for preparing the liquid crystal display device, the defect of the data wire passing across a short-circuit area of the scanning line and the public electrode wire is overcome, and the liquid crystal display device can be effectively repaired.
Description
Technical field
The present invention relates to a kind of restorative procedure of liquid crystal indicator, particularly relate to a kind of method of repairing the line defect that sweep trace and public electrode wire be short-circuited.
Background technology
Characteristics such as Thin Film Transistor-LCD (TFT-LCD) is frivolous with it, energy-saving and environmental protection become the main flow of current kinds of displays part development gradually.
Fig. 1 has provided the display unit of a common twisted-nematic (TN, Twist Nematics) type liquid crystal indicator.This display unit is surrounded with the public electrode wire 101, the sweep trace 105 that are arranged in parallel by the data line 102 of homeotropic alignment, and has a thin film transistor (TFT), this thin film transistor (TFT) has source electrode 104, grid 106 and drains 103, wherein source electrode 104 links to each other with data line 102, grid 106 links to each other with sweep trace 105, and drain electrode 103 links to each other with pixel electrode 108 by a contact hole 107.
Fig. 2 is the sectional view along A-A ' direction of Fig. 1, expression be the layered structure of each layer of pixel.From glass substrate 201 upwards, be gate metal layer 202 (simultaneously as sweep trace), gate insulator rete 203, intrinsic amorphous silicon layer 204, doped n+amorphous silicon layer 205, source-drain electrode metal level 206 (simultaneously as data line), passivation layer 207 (the etching passivation layer forms contact hole 208), transparent pixels electrode 209 successively.
Array base palte one side of Thin Film Transistor-LCD is thick with many data lines, sweep trace and public electrode wire, the broken string of each bar data line, sweep trace or public electrode wire and be short-circuited mutually and can make that all line defect appears in display panels, thus the qualification rate of product influenced.In the restorative procedure of various line defects, at present the restorative procedure that is short-circuited at sweep trace and public electrode wire mainly is two kinds: 1. the laser cutting reparation is carried out in short circuit place at sweep trace that is detected and public electrode wire after the G engineering is finished; 2. after checking out the short circuit of sweep trace and public electrode wire, the P inspection cuts off reparation with laser.And in these two kinds of restorative procedures, all exist certain defective:
1, there is the low deficiency of recall rate in first method.
2, exist repairing failure or panel use the back occur laterally light bright line may, thereby influence the quality of liquid crystal indicator.
3, special prosthetic appliance cost of investment is higher.
4, second method can only be repaired the line defect of zone between adjacent two data lines that sweep trace and public electrode wire are short-circuited.If short-circuited region is crossed data line, just can not use existing second kind of restorative procedure.
That is, the former sweep trace and the short circuit of public electrode wire mainly are after the G engineering is finished reparation partly to be cut off in short circuit.But be subjected to the influence of recall rate, cause many sweep traces and data line poor short circuit to flow out.And examine find fatal bad at P, prior art can't well be repaired again.
Summary of the invention
The technical problem to be solved in the present invention is to cross the defective that the line defect of data line can not effectively be repaired in order to overcome prior art for the short-circuited region of sweep trace and public electrode wire, and a kind of restorative procedure that can repair the liquid crystal indicator of occurrence of large-area sweep trace and public electrode wire short circuit is provided.
The present invention solves above-mentioned technical matters by following technical proposals: a kind of restorative procedure of liquid crystal indicator, this liquid crystal indicator comprises array basal plate, this array base palte has many data lines, the multi-strip scanning line, many public electrode wires and a plurality of pixel electrode, wherein above-mentioned data line and above-mentioned public electrode wire, above-mentioned sweep trace is separated out a plurality of display units, wherein in zone that each above-mentioned public electrode wire and above-mentioned data line intersect, there are two public electrode wires, in the zone that each above-mentioned public electrode wire and pixel electrodes are intersected, these two public electrode wires are merged into a public electrode wire; Be short-circuited between an one scan line and a public electrode wire, and short-circuited region is when crossing a data line, its characteristics are that this restorative procedure comprises:
Step 1: this sweep trace that utilizes laser repairing equipment to be short-circuited respectively once cuts off in the both sides of short-circuited region, and it is separated with this public electrode wire of short circuit;
Step 2: determine to be positioned at two display units that these short-circuited region both sides and its grid all link to each other with this sweep trace that is short-circuited, in the zone that the pixel electrode of these two display units and corresponding public electrode wire intersect, merge into one this public electrode wire again cutting and separating be two, and will be wherein be connected cut-out between the adjacent display cell of isolated public electrode wire and these two display units, the one section quilt of this public electrode wire in these two display units split with as the line between these two display units;
Step 3: these two display units are linked to each other with this section public electrode wire that cutting and separating goes out respectively by laser repairing;
Step 4: these two display units drain and gate is separately linked to each other respectively by laser repairing.
Wherein, in the zone that each above-mentioned public electrode wire and above-mentioned data line intersect, leave a space between these two public electrode wires.
Positive progressive effect of the present invention is: for the line defect that the short-circuited region of those sweep traces and public electrode wire is crossed data line, adopt the restorative procedure of liquid crystal indicator provided by the invention, can carry out effective for repairing.
Description of drawings
Fig. 1 is the synoptic diagram of a display unit of a common twisted nematic liquid crystals display device.
Fig. 2 is the sectional view of the liquid crystal indicator of Fig. 1 along A-A ' direction.
Fig. 3 is the synoptic diagram of two adjacent display cells of the liquid crystal indicator among the present invention.
Fig. 4 is the synoptic diagram of an embodiment of the restorative procedure of liquid crystal indicator of the present invention.
Embodiment
Provide preferred embodiment of the present invention below in conjunction with accompanying drawing, to describe technical scheme of the present invention in detail.
Liquid crystal indicator among the present invention comprises array basal plate, and this array base palte has many data lines, multi-strip scanning line, many public electrode wires and a plurality of pixel electrode, and wherein data line and public electrode wire, sweep trace are separated out a plurality of display units.
The synoptic diagram that is two adjacent display units of liquid crystal indicator of the present invention shown in Figure 3.As shown in Figure 3, in the zone that each public electrode wire and data line 301 intersect, have two public electrode wires 302,303, in the zone that each public electrode wire and pixel electrode 304,305 intersect, these two public electrode wires 302,303 are merged into a public electrode wire.And, in the zone that each public electrode wire and data line 301 intersect, leave a space between these two public electrode wires 302,303.
Figure 4 shows that, at the situation of sweep trace and the short circuit of public electrode wire occurrence of large-area, mainly be the situation that short-circuited region is crossed data line, and the reparation operation of a preferred embodiment of the present invention is as follows:
Step 1: this sweep trace 404 that utilizes laser repairing equipment to be short-circuited respectively once cuts off (concrete place of incision 405 as shown in Figure 4) in the both sides of short-circuited region 401, and it is separated with the public electrode wire 406,407 of short circuit;
Step 2: determine to be positioned at this short-circuited region 401 both sides, and two display units 402 that its grid all links to each other with this sweep trace 404 that is short-circuited, 403, at these two display units 402, in the zone that 403 pixel electrode and corresponding public electrode wire intersect, merge into one this public electrode wire again cutting and separating be two public electrode wires 408,409, and will be wherein isolated public electrode wire 409 and these two display units 402, (concrete place of incision 410 as shown in Figure 4) cut off in connection between 403 the adjacent display cell, makes this public electrode wire 409 be positioned at this two display units 402, one section quilt in 403 split with as these two display units 402, line between 403;
Step 3: this section public electrode wire that these two display units 402,403 is gone out with cutting and separating respectively by laser repairing (be public electrode wire 409 a section) links to each other (concrete continuous position 411 as shown in Figure 4);
Step 4: these two display units 402,403 drain and gate is separately linked to each other respectively by laser repairing, the drain electrode 413 that is display unit 402 links to each other with grid 412, and the drain electrode 415 of display unit 403 links to each other with grid 414 (concrete continuous position 416 as shown in Figure 4).
By top reparation operation, the current path of sweep trace following (shown in arrow path among Fig. 4): the right side of the right side cut-out point of the grid 414 → sweep trace 404 of drain electrode 415 → right side display unit 403 of the line segment → right pixel electrode → right side display unit 403 of drain electrode 413 → left pixel electrode of grid 412 → left side display unit 402 of the left side of the left side cut-out point of sweep trace 404 → left side sweep trace correspondence → split from public electrode wire 409.After implementing above-mentioned reparation,, the sweep trace 404 that is short-circuited is separated from public electrode wire 406,407 by twice cut-out that carry out the short-circuited region both sides between sweep trace 404 and public electrode wire 406,407.Simultaneously, realize the reparation of sweep trace 404 broken strings as new sweep trace passage by two display units 402,403.After using this restorative procedure, form bright point defect as two display units 402,403 of the new path of sweep trace.
Be example still, specify the design of this type repair structure and repair operation with liquid crystal indicator shown in Figure 3.In Fig. 3, the width of data line 301,308 is 6um, in two public electrode wires that intersect with data line, above the width of a public electrode wire 302 are 5um, below the width of a public electrode wire 303 are 6um, public electrode wire 302,303 with pixel electrode 304,305 overlapping places are 30um.Transistorized channel laterally width is 20um, and longitudinal length is 6um, and source-drain electrode 306 is 4um with the longitudinal overlap spacing of sweep trace 307.According to top live width size, adjust the energy of laser equipment, the size Control of laser dotting in 5um.Corresponding reparation operation is described with the embodiment of Fig. 4 correspondence.
By top case analysis, the reparation thought of sweep trace provided by the invention as can be known and public electrode wire short circuit is exactly that the sweep trace that is short-circuited is cut off respectively in the both sides of short-circuited region, this sweep trace is separated with the public electrode wire that is short-circuited, utilize the operate as normal of two display units of sweep trace cut-off part then as new sweep trace passage realization sweep trace.Simultaneously, utilizing public electrode wire again is two at the regional split that intersects with data line, has guaranteed conducting smoothly about public electrode wire, and it is bad to avoid occurring the obstructed light line that causes in the public electrode wire left and right sides.
Array design scheme provided by the invention is not only applicable to TN type liquid crystal indicator, be applicable to also that simultaneously other have the liquid crystal indicator of public electrode wire, such as IPS (In Plane Switching) type liquid crystal indicator, VA (Vertical Alignment) type liquid crystal indicator etc.
Though more than described the specific embodiment of the present invention, it will be understood by those of skill in the art that these only illustrate, under the prerequisite that does not deviate from principle of the present invention and essence, can make numerous variations or modification to these embodiments.Therefore, protection scope of the present invention is limited by appended claims.
Claims (2)
1, a kind of restorative procedure of liquid crystal indicator, this liquid crystal indicator comprises array basal plate, this array base palte has many data lines, multi-strip scanning line, many public electrode wires and a plurality of pixel electrode, wherein above-mentioned data line and above-mentioned public electrode wire, above-mentioned sweep trace are separated out a plurality of display units, wherein in zone that each above-mentioned public electrode wire and above-mentioned data line intersect, there are two public electrode wires, in the zone that each above-mentioned public electrode wire and pixel electrodes are intersected, these two public electrode wires are merged into a public electrode wire; Between an one scan line and a public electrode wire, be short-circuited, and short-circuited region is characterized in that this restorative procedure comprises when crossing a data line:
Step 1: this sweep trace that utilizes laser repairing equipment to be short-circuited respectively once cuts off in the both sides of short-circuited region, and it is separated with this public electrode wire of short circuit;
Step 2: determine to be positioned at two display units that these short-circuited region both sides and its grid all link to each other with this sweep trace that is short-circuited, in the zone that the pixel electrode of these two display units and corresponding public electrode wire intersect, merge into one this public electrode wire again cutting and separating be two, and will be wherein be connected cut-out between the adjacent display cell of isolated public electrode wire and these two display units, the one section quilt of this public electrode wire in these two display units split with as the line between these two display units;
Step 3: these two display units are linked to each other with this section public electrode wire that cutting and separating goes out respectively by laser repairing;
Step 4: these two display units drain and gate is separately linked to each other respectively by laser repairing.
2, the restorative procedure of liquid crystal indicator as claimed in claim 1 is characterized in that, in the zone that each above-mentioned public electrode wire and above-mentioned data line intersect, leaves a space between these two public electrode wires.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2008100369947A CN101576691A (en) | 2008-05-06 | 2008-05-06 | Method for repairing liquid crystal display device |
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| CNA2008100369947A CN101576691A (en) | 2008-05-06 | 2008-05-06 | Method for repairing liquid crystal display device |
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| CN101576691A true CN101576691A (en) | 2009-11-11 |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103163704A (en) * | 2013-01-28 | 2013-06-19 | 合肥京东方光电科技有限公司 | Pixel structure, array substrate and manufacture method of array substrate |
| CN107065343A (en) * | 2017-01-04 | 2017-08-18 | 京东方科技集团股份有限公司 | A kind of array base palte and its broken wire repair method, display device |
| CN108628022A (en) * | 2018-06-26 | 2018-10-09 | 深圳市华星光电半导体显示技术有限公司 | A kind of liquid crystal display and preparation method thereof |
| CN114578624A (en) * | 2021-12-29 | 2022-06-03 | 滁州惠科光电科技有限公司 | Array substrate and display panel |
| WO2022166036A1 (en) * | 2021-02-05 | 2022-08-11 | 深圳市华星光电半导体显示技术有限公司 | Array substrate and preparation method therefor, and short circuit repairing method |
-
2008
- 2008-05-06 CN CNA2008100369947A patent/CN101576691A/en active Pending
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103163704A (en) * | 2013-01-28 | 2013-06-19 | 合肥京东方光电科技有限公司 | Pixel structure, array substrate and manufacture method of array substrate |
| CN103163704B (en) * | 2013-01-28 | 2015-11-25 | 合肥京东方光电科技有限公司 | Dot structure, array base palte and manufacture method thereof |
| CN107065343A (en) * | 2017-01-04 | 2017-08-18 | 京东方科技集团股份有限公司 | A kind of array base palte and its broken wire repair method, display device |
| CN108628022A (en) * | 2018-06-26 | 2018-10-09 | 深圳市华星光电半导体显示技术有限公司 | A kind of liquid crystal display and preparation method thereof |
| CN108628022B (en) * | 2018-06-26 | 2020-07-03 | 深圳市华星光电半导体显示技术有限公司 | Liquid crystal display and preparation method thereof |
| WO2022166036A1 (en) * | 2021-02-05 | 2022-08-11 | 深圳市华星光电半导体显示技术有限公司 | Array substrate and preparation method therefor, and short circuit repairing method |
| US11990379B2 (en) | 2021-02-05 | 2024-05-21 | Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. | Array substrate, manufacturing method thereof, and short circuit repair method |
| CN114578624A (en) * | 2021-12-29 | 2022-06-03 | 滁州惠科光电科技有限公司 | Array substrate and display panel |
| CN114578624B (en) * | 2021-12-29 | 2023-01-17 | 滁州惠科光电科技有限公司 | Array substrate and display panel |
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Open date: 20091111 |