CN101581856A - Repairing method of array substrate - Google Patents
Repairing method of array substrate Download PDFInfo
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- CN101581856A CN101581856A CNA2008100375083A CN200810037508A CN101581856A CN 101581856 A CN101581856 A CN 101581856A CN A2008100375083 A CNA2008100375083 A CN A2008100375083A CN 200810037508 A CN200810037508 A CN 200810037508A CN 101581856 A CN101581856 A CN 101581856A
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Abstract
The invention discloses a repairing method of an array substrate, which comprises the following steps: determining two display units at two sides of the array substrate occurring in wire break, cutting and dividing a public electrode wire merged into one into two public electrode wires in a region where pixel electrodes of the two display units are crossed with corresponding public electrode wires, and cutting two ends of a divided public electrode wire close to an outside data wire; respectively connecting the two pixel electrodes with the public electrode wires two ends of which are cut through laser reparation; and respectively connecting respective drain electrodes of the two display units with grids of the two display units through laser reparation. The repairing method can fully perform the wire break reparation to a scanning wire, lowers the design and development cost, and can not occur slight transverse bright line on a liquid crystal panel.
Description
Technical field
The present invention relates to a kind of liquid crystal indicator, particularly relate to the restorative procedure of the array base palte in a kind of liquid crystal indicator.
Background technology
Thin Film Transistor-LCD (TFT-LCD) is the main flow that characteristics such as, energy-saving and environmental protection frivolous with it become current kinds of displays part development gradually.
Fig. 1 has provided the display unit of a common twisted-nematic (TN, Twist Nematic) type liquid crystal indicator.This display unit is surrounded with the public electrode wire 101, the sweep trace 107 that are arranged in parallel by the data line 102 of homeotropic alignment, and has a thin film transistor (TFT), this thin film transistor (TFT) has source electrode 106, grid 108 and drains 104, wherein source electrode 106 links to each other with data line 102, grid 108 links to each other with sweep trace 107, and drain electrode 104 links to each other with pixel electrode by a contact hole 109.
Fig. 2 is the sectional view along A-A ' direction of Fig. 1, expression be the layered structure of each layer of pixel.From glass substrate 201 upwards, be gate metal layer 202 (simultaneously as sweep trace), gate insulator rete 203, intrinsic amorphous silicon layer 204, doped n+amorphous silicon layer 205, source-drain electrode metal level 206 (simultaneously as data line), passivation layer 207 (the etching passivation layer forms contact hole 208), transparent pixels electrode 209 successively.
Array base palte one side among the TFT-LCD is thick with many data lines and controlling grid scan line, and the broken string of each bar data line or controlling grid scan line can make that all line defect appears in the TFT-LCD panel, thereby influences the qualification rate of product.Present controlling grid scan line restorative procedure mainly is two kinds: 1, carry out laser chemical vapor deposition (Laser CVD) film forming at the sweep trace broken string that is detected after the controlling grid scan line engineering is finished and connect reparation; 2, Laser CVD film forming is carried out at substrate surface in the controlling grid scan line broken string corresponding position that detects before array base palte is finished the product warehouse-in, carries out laser repairing after having checked for the first time or after having checked for the second time.
But there is following defective in above-mentioned restorative procedure:
1, all there is the low deficiency of recall rate in above-mentioned two kinds of methods.
2, there is repairing failure or use the back laterally light bright line to occur, influences quality at panel.
3, special prosthetic appliance cost of investment is higher.
Summary of the invention
The technical problem to be solved in the present invention is in order to overcome the defective of the prosthetic appliance that the sweep trace repairing effect is bad in the prior art, the need cost is higher, a kind of restorative procedure of array base palte is provided, this restorative procedure can be absolutely to the sweep trace reparation of breaking, reduced the cost of designing and developing and light horizontal bright line can on liquid crystal panel, not occur.
The present invention solves above-mentioned technical matters by following technical proposals: a kind of restorative procedure of array base palte, this array base palte has many data lines, multi-strip scanning line, many public electrode wires and a plurality of pixel electrode, above-mentioned data line and above-mentioned public electrode wire, above-mentioned sweep trace are separated out a plurality of display units, in the zone that above-mentioned public electrode wire and above-mentioned data line intersect, there are two public electrode wires, in the zone that above-mentioned public electrode wire and pixel electrodes are intersected, these two public electrode wires are merged into a public electrode wire; When broken string takes place the one scan line, it is characterized in that this restorative procedure may further comprise the steps:
S1, definite two display units that the broken string both sides take place, in the zone that the pixel electrode of these two display units and corresponding public electrode wire intersect, the public electrode wire cut-out of merging into one is separated into two public electrode wires, and a public electrode wire after will separating is near the two ends cut-out of outside data line;
S2, the public electrode wire after respectively two pixel electrodes and two ends being cut off by laser repairing link to each other;
S3, continuous two display units drain and gate separately respectively by laser repairing.
Preferably, in the zone that above-mentioned public electrode wire and above-mentioned data line intersect, leave a space between above-mentioned two public electrode wires.
Positive progressive effect of the present invention is:
1, utilizes restorative procedure provided by the invention, can carry out the absolutely reparation of broken string, do not have the restriction that to repair several broken strings.
2, adopt restorative procedure provided by the invention, can both repair one by one, do not exist and occur two restrictions that breakpoint just can't be repaired on the same sweep trace even if a plurality of breakpoints on same controlling grid scan line, occur.
3, adopt restorative procedure provided by the invention, need not reduce the cost of designing and developing in special sweep trace prosthetic appliance investment.
4, utilize restorative procedure provided by the invention, light horizontal bright line can on liquid crystal panel, not occur.
Description of drawings
Fig. 1 is the synoptic diagram of a display unit of an existing twisted nematic liquid crystals display device.
Fig. 2 is the sectional view of the liquid crystal indicator of Fig. 1 along A-A ' direction.
Fig. 3 is the synoptic diagram of two adjacent display cells of the array base palte among the present invention.
Fig. 4 is the synoptic diagram of an embodiment of the restorative procedure of array base palte of the present invention.
Embodiment
Provide preferred embodiment of the present invention below in conjunction with accompanying drawing, to describe technical scheme of the present invention in detail.
The synoptic diagram that is two adjacent display units of array base palte of the present invention shown in Figure 3.As shown in Figure 3, this array base palte has many data lines 301, multi-strip scanning line 307, many public electrode wires 302,303 and a plurality of pixel electrode 304,305, wherein above-mentioned data line 301 and above-mentioned public electrode wire 302,303, above-mentioned sweep trace 307 is separated out a plurality of display units, wherein in zone that each above-mentioned public electrode wire and above-mentioned data line intersect, there are two public electrode wires 302,303, at each above-mentioned public electrode wire 302,303 with pixel electrodes 304,305 zones that intersect, these two public electrode wires 302,303 merge into a public electrode wire.And, in the zone that each public electrode wire 302,303 and data line 301 intersect, leave a space between these two public electrode wires 302,303.
Be example still, specify the design of this type repair structure and repair operation with array base palte shown in Figure 3.In Fig. 3, the width of data line 301 is 6um, in two public electrode wires that intersect with data line, above the width of a public electrode wire 302 are 5um, below the width of a public electrode wire 303 are 6um, public electrode wire 302,303 with pixel electrode 304,305 overlapping places are 30um.Transistorized channel laterally width is 20um, and longitudinal length is 6um, and the longitudinal overlap spacing of source, drain electrode and sweep trace 307 is 4um.According to top live width size, adjust the energy of laser equipment, the size Control of laser dotting in 5um.
As shown in Figure 4, if when broken string B1 take place for one scan line 307, restorative procedure of the present invention may further comprise the steps:
S1, definite two display units that the broken string both sides take place, in the zone that the pixel electrode 304,305 of these two display units and corresponding public electrode wire 302,303 intersect, the public electrode wire of merging into one is cut off Q1 be separated into two public electrode wires, and a public electrode wire after will separating is near the two ends cut-out Q2 of outside data line 301;
S2, the public electrode wire 303 after respectively two pixel electrodes 304,305 and two ends being cut off by the laser repairing H1 that links to each other;
S3, by laser repairing respectively two display units drain electrode 313,315 separately H2 that links to each other with grid 312,314.
By top reparation operation, the data line current path is as follows: the grid 314 → sweep trace 307 of drain electrode 315 → right side display unit of public electrode wire 303 → right pixel electrode 305 → right side display unit of drain electrode 313 → left pixel electrode 304 of grid 312 → left side display unit of sweep trace 307 breakpoint left side → left side sweep trace 317 correspondences → after the cutting apart right sides of breaking.By top reparation operation, the electric signal in sweep trace breakpoint left side is transferred on the sweep trace on breakpoint right side by adjacent display unit, make in this way the repair data line defect after, the display unit on next door forms a bright point defect.
By top case analysis, it is exactly the various conductive layers of sweep trace both sides to be cut off and get ready by laser repairing equipment to handle form conductive channel that sweep trace broken string provided by the invention is as can be known repaired thought, the two ends, the left and right sides that connect the sweep trace breakpoint guarantee conducting smoothly about public electrode wire simultaneously again.
The positive progressive effect that the present invention has is:
1, utilizes restorative procedure provided by the invention, can carry out a hundred per cent broken string is repaired, do not have the restriction that to repair several broken strings.
2, adopt restorative procedure provided by the invention, can both repair one by one, do not exist and occur two restrictions that breakpoint just can't be repaired on the same sweep trace even if a plurality of breakpoints on same controlling grid scan line, occur.
3, adopt restorative procedure provided by the invention, need not reduce the cost of designing and developing in special sweep trace prosthetic appliance investment.
4, utilize restorative procedure provided by the invention, light horizontal bright line can on panel, not occur.
Though more than described the specific embodiment of the present invention, it will be understood by those of skill in the art that these only illustrate, under the prerequisite that does not deviate from principle of the present invention and essence, can make numerous variations or modification to these embodiments.Therefore, protection scope of the present invention is limited by appended claims.
Claims (2)
1, a kind of restorative procedure of array base palte, this array base palte has many data lines, multi-strip scanning line, many public electrode wires and a plurality of pixel electrode, above-mentioned data line and above-mentioned public electrode wire, above-mentioned sweep trace are separated out a plurality of display units, in the zone that above-mentioned public electrode wire and above-mentioned data line intersect, there are two public electrode wires, in the zone that above-mentioned public electrode wire and pixel electrodes are intersected, these two public electrode wires are merged into a public electrode wire; When broken string takes place the one scan line, it is characterized in that this restorative procedure may further comprise the steps:
S1, definite two display units that the broken string both sides take place, in the zone that the pixel electrode of these two display units and corresponding public electrode wire intersect, the public electrode wire cut-out of merging into one is separated into two public electrode wires, and a public electrode wire after will separating is near the two ends cut-out of outside data line;
S2, the public electrode wire after respectively two pixel electrodes and two ends being cut off by laser repairing link to each other;
S3, continuous two display units drain and gate separately respectively by laser repairing.
2, the restorative procedure of array base palte as claimed in claim 1 is characterized in that, in the zone that above-mentioned public electrode wire and above-mentioned data line intersect, leaves a space between above-mentioned two public electrode wires.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2008100375083A CN101581856A (en) | 2008-05-16 | 2008-05-16 | Repairing method of array substrate |
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| CNA2008100375083A CN101581856A (en) | 2008-05-16 | 2008-05-16 | Repairing method of array substrate |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101813840A (en) * | 2010-04-07 | 2010-08-25 | 友达光电股份有限公司 | Repairing method and active element array base plate |
| CN102722057A (en) * | 2011-03-31 | 2012-10-10 | 奇美电子股份有限公司 | Pixel array substrate, liquid crystal display device and method for repairing pixel array substrate |
| US8372696B2 (en) | 2010-03-17 | 2013-02-12 | Au Optronics Corporation | Repair method and active device array substrate |
| CN103257464A (en) * | 2012-12-29 | 2013-08-21 | 南京中电熊猫液晶显示科技有限公司 | Linear defect repairing method of liquid crystal display array substrate |
| CN104460068A (en) * | 2014-12-30 | 2015-03-25 | 南京中电熊猫液晶显示科技有限公司 | Pixel, display device with pixels, and broken line restoration method of display device |
| CN108646476A (en) * | 2018-03-22 | 2018-10-12 | 南京中电熊猫液晶显示科技有限公司 | A kind of broken wire repair method of liquid crystal display panel |
| CN108873529A (en) * | 2018-07-27 | 2018-11-23 | 京东方科技集团股份有限公司 | A kind of array substrate and its restorative procedure, display panel |
| US11402709B2 (en) | 2018-02-06 | 2022-08-02 | Chongqing Boe Optoelectronics Technology Co., Ltd. | Repairing method for broken gate and data line in array substrate and array substrate |
-
2008
- 2008-05-16 CN CNA2008100375083A patent/CN101581856A/en active Pending
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8372696B2 (en) | 2010-03-17 | 2013-02-12 | Au Optronics Corporation | Repair method and active device array substrate |
| CN101813840A (en) * | 2010-04-07 | 2010-08-25 | 友达光电股份有限公司 | Repairing method and active element array base plate |
| CN102722057A (en) * | 2011-03-31 | 2012-10-10 | 奇美电子股份有限公司 | Pixel array substrate, liquid crystal display device and method for repairing pixel array substrate |
| CN103257464A (en) * | 2012-12-29 | 2013-08-21 | 南京中电熊猫液晶显示科技有限公司 | Linear defect repairing method of liquid crystal display array substrate |
| CN103257464B (en) * | 2012-12-29 | 2015-11-25 | 南京中电熊猫液晶显示科技有限公司 | A kind of restorative procedure of line defect of LCD array substrate |
| CN104460068A (en) * | 2014-12-30 | 2015-03-25 | 南京中电熊猫液晶显示科技有限公司 | Pixel, display device with pixels, and broken line restoration method of display device |
| CN104460068B (en) * | 2014-12-30 | 2017-07-11 | 南京中电熊猫液晶显示科技有限公司 | Pixel includes the display device and its broken wire repair method of the pixel |
| US11402709B2 (en) | 2018-02-06 | 2022-08-02 | Chongqing Boe Optoelectronics Technology Co., Ltd. | Repairing method for broken gate and data line in array substrate and array substrate |
| CN108646476A (en) * | 2018-03-22 | 2018-10-12 | 南京中电熊猫液晶显示科技有限公司 | A kind of broken wire repair method of liquid crystal display panel |
| CN108646476B (en) * | 2018-03-22 | 2020-12-25 | 南京中电熊猫液晶显示科技有限公司 | Broken line repairing method of liquid crystal panel |
| CN108873529A (en) * | 2018-07-27 | 2018-11-23 | 京东方科技集团股份有限公司 | A kind of array substrate and its restorative procedure, display panel |
| CN108873529B (en) * | 2018-07-27 | 2021-04-02 | 京东方科技集团股份有限公司 | Array substrate, repairing method thereof and display panel |
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Open date: 20091118 |