Summary of the invention
The purpose of this invention is to provide a kind of TFT-LCD array base-plate structure and manufacturing approach thereof, effectively solve the MM CAP that the public electrode line structure exists among the existing TFT-LCD little, reduce aperture opening ratio and form technological deficiencies such as big section difference.
To achieve these goals; The invention provides a kind of TFT-LCD array base-plate structure; Comprise the grid line and the data line that are formed on the substrate; Form pixel electrode in the pixel region that said grid line and data line limit, and form thin film transistor (TFT) at infall, said thin film transistor (TFT) comprises gate electrode, gate insulation layer, active layer, source-drain electrode layer and passivation layer; Also comprise being interrupted and be arranged between the said data line and form the public electrode wire of MM CAP with said pixel electrode; Said public electrode wire and said source-drain electrode layer are provided with layer, and said public electrode wire is near offering second passivation layer via hole on the passivation layer on the end position of said data line, and connection electrode is formed on the said passivation layer; Said connection electrode is connected with said public electrode wire through said second passivation layer via hole, and through two adjacent said second passivation layer via hole adjacent said public electrode wire is interconnected.
On the technique scheme basis, said public electrode wire can be arranged between adjacent two grid lines, also can be provided with on the said grid line.
To achieve these goals, the present invention also provides a kind of TFT-LCD array base-plate structure manufacturing approach, comprising:
Step 1, on substrate deposition grid metal level, form gate electrode and grid line figure through composition technology;
Step 2, on the substrate of completing steps 1, deposit gate insulation layer, and form active layer, drain electrode, source electrode, data line and public electrode line graph, wherein public electrode wire is interrupted and is formed between two data lines;
Step 3, on the substrate of completing steps 2 deposit passivation layer, form first passivation layer via hole through composition technology in the drain electrode position, form second passivation layer via hole at public electrode wire near the end position of data line;
Step 4, on the substrate of completing steps 3 the deposit transparent conductive layer; Form the pixel electrode figure and form the connection electrode figure at pixel region through composition technology at the end regions of public electrode wire; Make pixel electrode pass through first passivation layer via hole and be connected, connection electrode is interconnected adjacent public electrode wire through second passivation layer via hole with drain electrode.
Wherein, said step 2 can be specially:
Step 21, on the substrate of completing steps 1 successive sedimentation gate insulation layer and active layer, form active layer pattern through composition technology;
Step 22, sedimentary origin leaks metal level on the substrate of completing steps 21, forms drain electrode, source electrode, data line and public electrode line graph through composition technology, and wherein public electrode wire is interrupted and is formed between two data lines.
Wherein, Said step 2 also can be specially: metal level is leaked in successive sedimentation gate insulation layer, active layer and source on the substrate of completing steps 1; See through composition technology through shadow tone or half and form active layer, drain electrode, source electrode, data line and public electrode line graph, wherein public electrode wire is interrupted and is formed between two data lines.
The present invention proposes a kind of TFT-LCD array base-plate structure and manufacturing approach thereof; Can form the MM CAP of new construction; With five composition technologies is example; Through the first time composition technology form gate electrode and grid line figure, through the second time composition technology form active layer pattern, through the drain electrode of composition technology formation for the third time, source electrode, data line and public electrode line graph; Form first passivation layer via hole in the drain electrode position and form second passivation layer via hole near the end position of data line through the 4th composition technology at public electrode wire; Form pixel electrode and connection electrode through the 5th composition technology at last, make pixel electrode pass through first passivation layer via hole and be connected, connection electrode is interconnected adjacent public electrode wire through second passivation layer via hole with drain electrode.Though the present invention adopts MM CAP structure on public electrode wire equally; But public electrode wire and drain electrode, source electrode and data line are provided with layer; Forming with in a composition technology; Form two parallel-plates of MM CAP by public electrode wire and pixel electrode, the vertical range between two parallel-plates is reduced into the thickness that has only passivation layer, helps the raising of MM CAP.In addition, because the section difference that public electrode wire brings is leaked metal layer thickness for the source, the section of making difference is reduced, and helps the raising of TFT-LCD contrast.Further, because public electrode wire and drain electrode, source electrode and data line are provided with layer, public electrode wire can be arranged on the grid line, when increasing MM CAP, has greatly increased aperture opening ratio.
Compare with prior art TFT-LCD array base-plate structure, the formed storage capacitor construction of TFT-LCD array base-plate structure of the present invention has following advantage:
(1) when identical public electrode line width, the MM CAP that the present invention forms has obvious increase;
(2) when identical MM CAP size, the width of public electrode wire of the present invention is little, has increased aperture opening ratio;
(3) in the time of on public electrode wire is arranged on grid line, the present invention has greatly increased aperture opening ratio when obviously increasing MM CAP.
Through accompanying drawing and embodiment, technical scheme of the present invention is done further detailed description below.
Embodiment
Fig. 1 a is the planimetric map of TFT-LCD array base-plate structure first embodiment of the present invention, Fig. 1 b be among Fig. 1 a A-A to sectional view, Fig. 1 c be among Fig. 1 a B-B to sectional view.Shown in Fig. 1 a, Fig. 1 b and Fig. 1 c; Present embodiment TFT-LCD array base-plate structure comprises grid line 2b, data line 5c and public electrode wire 5d; Grid line 2b and data line 5c define pixel region, and form TFT at infall, and TFT comprises the gate electrode 2a that is connected with grid line 2b, as the active layer 4 of switches conductive medium and the drain electrode 5a and the source electrode 5b of formation TFT raceway groove; Source electrode 5b is connected with data line 5c; Passivation layer 6 on the drain electrode 5a offers the first passivation layer via hole 6a, and pixel electrode 7 is formed on pixel region, and is connected with drain electrode 5a through the first passivation layer via hole 6a; The public electrode wire 5d that is arranged at interval between the data line 5c is provided with layer between adjacent two grid lines and with drain electrode 5a, source electrode 5b and data line 5c; It is near offering the second passivation layer via hole 6b on the passivation layer on the end position of data line 5c 6, connection electrode 8 is provided with layer with pixel electrode 7, and the second passivation layer via hole 6b through two vicinities interconnects public electrode wire 5d.
Fig. 2 a~Fig. 5 c is the manufacturing synoptic diagram of TFT-LCD array base-plate structure of the present invention; Be example with five composition technologies below; Process for making through the TFT-LCD array base-plate structure further specifies technical scheme of the present invention; In following explanation, the alleged composition technology of the present invention comprises technologies such as photoresist coating, mask, exposure, etching.
Fig. 2 a is TFT-LCD array base-plate structure of the present invention planimetric map after the composition technology for the first time, Fig. 2 b be among Fig. 2 a C-C to sectional view.Adopt the method for sputter or thermal evaporation, substrate 1 (like glass substrate or quartz base plate) go up deposition one layer thickness be 500
~4000
the grid metal level.The grid metal level can use metal and alloys thereof such as Cr, W, Ti, Ta, Mo, Al, Cu, and the grid metal level also can be made up of the multiple layer metal film.Through the first time composition technology grid metal level is carried out etching, on
substrate 1,
form gate electrode 2a and
grid line 2b figure, shown in Fig. 2 a, Fig. 2 b.
Fig. 3 a is TFT-LCD array base-plate structure of the present invention planimetric map after the composition technology for the second time, Fig. 3 b be among Fig. 3 a D-D to sectional view.On the substrate of accomplishing gate electrode and grid line pattern through plasma enhanced chemical vapor deposition (abbreviation PECVD) method successive sedimentation thickness be 1000
~4000
gate insulation layer 3, thickness be 1000
~4000
active layer 4,
active layer 4 comprise thickness be 1000
~3000
semiconductor layer He thickness be 300
~600
doping semiconductor layer (ohmic contact layer).Gate insulation layer can be selected oxide, nitride or oxynitrides for use, and corresponding reacting gas can be SiH
4, NH
3, N
2Mixed gas or SiH
2Cl
2, NH
3, N
2Mixed gas, the reacting gas that active layer is corresponding can be SiH
4, H
2Mixed gas or SiH
2Cl
2, H
2Mixed gas.After above-mentioned each layer deposition accomplished, through the second time composition technology
active layer 4 is carried out etching, form
active layer 4 figures, shown in Fig. 3 a, Fig. 3 b.
Fig. 4 a is TFT-LCD array base-plate structure of the present invention planimetric map after the composition technology for the third time, Fig. 4 b be among Fig. 4 a E-E to sectional view, Fig. 4 c be among Fig. 4 a F-F to sectional view.After forming
active layer 4 figures; Method through sputter or thermal evaporation; Deposit thickness be 500
~2500
the source leak metal level, metal level is leaked in the source can select metal and alloys thereof such as Cr, W, Ti, Ta, Mo, Al, Cu for use.Through composition technology for the third time metal level is leaked in the source and carry out etching;
Form drain electrode 5a,
source electrode 5b,
data line 5c and
public electrode wire 5d figure; Be TFT raceway groove figure between
drain electrode 5a and the
source electrode 5b wherein, etch away the doping semiconductor layer in the
active layer 4 fully in the TFT raceway groove figure,
data line 5c is vertical with
grid line 2b;
Public electrode wire 5d is interrupted and is formed between two
data line 5c, shown in Fig. 4 a, Fig. 4 b and Fig. 4 c.
Fig. 5 a is the planimetric map after the 4th composition technology of TFT-LCD array base-plate structure of the present invention, Fig. 5 b be among Fig. 5 a G-G to sectional view, Fig. 5 c be among Fig. 5 a H-H to sectional view.After forming
drain electrode 5a,
source electrode 5b,
data line 5c and
public electrode wire 5d figure, be 700 through PECVD method deposit thickness
~2000
Passivation layer 6,
passivation layer 6 can adopt oxide, nitride or oxynitrides, corresponding reacting gas can be SiH
4, NH
3, N
2Mixed gas or SiH
2Cl
2, NH
3, N
2Mixed gas.Through the 4th composition
technology passivation layer 6 is carried out etching; Form the first passivation layer via
hole 6a in
drain electrode 5a position; Make the first passivation layer via
hole 6a expose
drain electrode 5a; Form the second passivation layer via
hole 6b at
public electrode wire 5d near the end position of
data line 5c, make the second passivation layer via
hole 6b expose
public electrode wire 5d, shown in Fig. 5 a, Fig. 5 b and Fig. 5 c.
At last; Method through sputter or thermal evaporation; Deposit thickness be 300
~600
transparency conducting layer, transparency conducting layer is generally tin indium oxide, indium zinc oxide or aluminum zinc oxide etc.Through the 5th composition technology transparency conducting layer is carried out etching;
Form pixel electrode 7 figures at pixel region;
Pixel electrode 7 is connected with
drain electrode 5a through the first passivation layer via
hole 6a; End regions at
public electrode wire 5d
forms connection electrode 8 figures,
connection electrode 8 is interconnected adjacent
public electrode wire 5d through the second passivation layer via
hole 6b, shown in Fig. 1 a, Fig. 1 b and Fig. 1 c.
Manufacture process by the invention described above TFT-LCD array base-plate structure can be found out; Though TFT-LCD array base-plate structure of the present invention adopts MM CAP (Cst on Common) structure on public electrode wire equally; But public electrode wire and drain electrode, source electrode and data line are provided with layer; Forming with in a composition technology, form two parallel-plates of MM CAP like this by public electrode wire and pixel electrode, the vertical range between two parallel-plates is merely the thickness of passivation layer; Distance between MM CAP the two poles of the earth is dwindled greatly, helps the raising of MM CAP.In addition; Because the section difference that public electrode wire brings is leaked metal layer thickness for the source; And metal layer thickness is leaked in the grid metal layer thickness source that is greater than usually, that is to say that the section difference of public electrode wire this moment is reduced, and the segment difference helps the even orientation of liquid crystal molecule; Reduce light leakage phenomena, therefore help the raising of TFT-LCD contrast.
In the manufacture process of TFT-LCD array base-plate structure of the present invention shown in Fig. 2 a~Fig. 5 c, can also prepare shield bars according to design demand, wherein shield bars can be provided with layer with grid line, also can be provided with layer with public electrode wire.When shield bars and grid line are provided with layer; TFT-LCD array base-plate structure of the present invention composition technology for the first time is specially: adopt the method for sputter or thermal evaporation, on
substrate 1 deposition one layer thickness be 500
~4000
the grid metal level.The grid metal level can use metal and alloys thereof such as Cr, W, Ti, Ta, Mo, Al, Cu, and the grid metal level also can be made up of the multiple layer metal film.Through the first time composition technology grid metal level is carried out etching, on substrate, form gate electrode, grid line and shield bars figure.When shield bars and public electrode wire are provided with layer; TFT-LCD array base-plate structure of the present invention composition technology for the third time is specially: through the method for sputter or thermal evaporation; Deposit thickness be 500
~2500
the source leak metal level; Metal level is leaked in the source can select metal and alloys thereof such as Cr, W, Ti, Ta, Mo, Al, Cu for use; Through composition technology for the third time metal level is leaked in the source and carry out etching; Form drain electrode, source electrode, data line, public electrode wire and shield bars figure; It wherein between drain electrode and the source electrode TFT raceway groove figure; Etch away the doping semiconductor layer in the active layer fully in the TFT raceway groove figure; Data line is vertical with grid line, and public electrode wire is interrupted and is formed between two data lines, and shield bars is set in parallel in an example or two sides of data line.In actual use, when shield bars and the same layer of public electrode wire, shield bars can also be connected with public electrode wire.
In actual use, TFT-LCD array base-plate structure of the present invention also can adopt four composition technology manufacturings to accomplish.In four composition technology; The technology that forms gate electrode and grid line figure, formation first passivation layer via hole and second passivation layer via hole, formation pixel electrode and connection electrode is ditto said; With aforementioned second time composition technology and for the third time composition technology be merged into a composition technology; Be specially: on the substrate of accomplishing gate electrode and grid line pattern through PECVD method successive sedimentation thickness be 1000
~4000
gate insulation layer, thickness be 1000
~4000
active layer, active layer comprise thickness be 1000
~3000
semiconductor layer He thickness be 300
~600
doping semiconductor layer (ohmic contact layer).In the method for accomplishing on the substrate of above-mentioned technology through sputter or thermal evaporation; Deposit thickness be 500
~2500
the source leak metal level, metal level is leaked in the source can select metal and alloys thereof such as Cr, W, Ti, Ta, Mo, Al, Cu for use.Carry out shadow tone (HTM) or half exposure technology afterwards through mask plate; Earlier metal level is leaked in the source and carry out etching; And then the TFT raceway groove figure of double exposure area carries out ashing and etching processing; Forming active layer, drain electrode, source electrode, data line and public electrode line graph, is TFT raceway groove figure between drain electrode and the source electrode wherein, etches away the doping semiconductor layer in the active layer fully in the TFT raceway groove figure; Data line is vertical with grid line, and public electrode wire is interrupted and is formed between two data lines.
Fig. 6 a is the planimetric map of TFT-LCD array base-plate structure second embodiment of the present invention, Fig. 6 b be among Fig. 6 a I-I to sectional view.Shown in Fig. 6 a and Fig. 6 b; The structures such as the gate electrode 2a of present embodiment TFT-LCD array base-plate structure, grid line 2b, active layer 4, drain electrode 5a, source electrode 5b and data line 5c and first embodiment are basic identical; Different is that public electrode wire 5d is arranged on the grid line.Particularly; Grid line 2b and data line 5c define pixel region; And form TFT at infall, and TFT comprises the gate electrode 2a that is connected with grid line 2b, as the active layer 4 of switches conductive medium and the drain electrode 5a and the source electrode 5b of formation TFT raceway groove, source electrode 5b is connected with data line 5c; Passivation layer 6 on the drain electrode 5a offers the first passivation layer via hole 6a; Pixel electrode 7 is formed on pixel region, and is connected with drain electrode 5a through the first passivation layer via hole 6a, and the public electrode wire 5d that is arranged between the data line 5c at interval is positioned on the grid line 2b; And be provided with layer with drain electrode 5a, source electrode 5b and data line 5c; It is near offering the second passivation layer via hole 6b on the passivation layer on the end position of data line 5c 6, connection electrode 8 is provided with layer with pixel electrode 7, and the second passivation layer via hole 6b through two vicinities interconnects public electrode wire 5d.
In the present embodiment,, therefore public electrode wire is arranged on the grid line, when increasing MM CAP, has greatly increased aperture opening ratio because public electrode wire and drain electrode, source electrode and data line are provided with layer.
Said structure is merely the enforcement structure of TFT-LCD array base-plate structure of the present invention, under with public electrode wire and drain electrode, source electrode and the data line guiding theory with layer setting, other array base-plate structure form can be arranged also, repeats no more.
Fig. 7 is the process flow diagram of TFT-LCD array base-plate structure manufacturing approach first embodiment of the present invention, is specially:
Step 11, on substrate deposition grid metal level, through the first time composition technology form gate electrode and grid line figure;
Step 12, on the substrate of completing steps 11 successive sedimentation gate insulation layer and active layer, through the second time composition technology form active layer pattern;
Step 13, sedimentary origin leaks metal level on the substrate of completing steps 12, forms drain electrode, source electrode, data line and public electrode line graph through composition technology for the third time, and wherein public electrode wire is interrupted and is formed between two data lines;
Step 14, on the substrate of completing steps 13 deposit passivation layer, form first passivation layer via hole through the 4th composition technology in the drain electrode position, form second passivation layer via hole at public electrode wire near the end position of data line;
Step 15, on the substrate of completing steps 14 the deposit transparent conductive layer; Form the pixel electrode figure and form the connection electrode figure at pixel region through the 5th composition technology at the end regions of public electrode wire; Make pixel electrode pass through first passivation layer via hole and be connected, make connection electrode interconnect public electrode wire through second passivation layer via hole with drain electrode.
Particularly; Adopt the method for sputter or thermal evaporation, substrate (like glass substrate or quartz base plate) go up deposition one layer thickness be 500
~4000
the grid metal level.The grid metal level can use metal and alloys thereof such as Cr, W, Ti, Ta, Mo, Al, Cu, and the grid metal level also can be made up of the multiple layer metal film.Through the first time composition technology grid metal level is carried out etching, on substrate, form gate electrode and grid line figure.On the substrate of accomplishing gate electrode and grid line pattern through PECVD method successive sedimentation thickness be 1000
~4000
gate insulation layer, thickness be 1000
~4000
active layer, active layer comprise thickness be 1000
~3000
semiconductor layer He thickness be 300
~600
doping semiconductor layer (ohmic contact layer).Gate insulation layer can be selected oxide, nitride or oxynitrides for use.After above-mentioned each layer deposition accomplished, through the second time composition technology active layer is carried out etching, form active layer pattern.After forming active layer pattern; Method through sputter or thermal evaporation; Deposit thickness be 500
~2500
the source leak metal level, metal level is leaked in the source can select metal and alloys thereof such as Cr, W, Ti, Ta, Mo, Al, Cu for use.Through composition technology for the third time metal level is leaked in the source and carry out etching; Form drain electrode, source electrode, data line and public electrode line graph; It wherein between drain electrode and the source electrode TFT raceway groove figure; Etch away the doping semiconductor layer in the active layer fully in the TFT raceway groove figure, data line is vertical with grid line, and public electrode wire is interrupted and is formed between two data lines.After forming drain electrode, source electrode, data line and public electrode line graph; Through PECVD method deposit thickness be 700
~2000
passivation layer, passivation layer can adopt oxide, nitride or oxynitrides.Through the 4th composition technology passivation layer is carried out etching; Form first passivation layer via hole in the drain electrode position; Make first passivation layer via hole expose drain electrode; Form second passivation layer via hole at public electrode wire near the end position of data line, make second passivation layer via hole expose public electrode wire.At last; Method through sputter or thermal evaporation; Deposit thickness be 300
~600
transparency conducting layer, transparency conducting layer is generally tin indium oxide, indium zinc oxide or aluminum zinc oxide etc.Through the 5th composition technology transparency conducting layer is carried out etching; Form the pixel electrode figure at pixel region; Making pixel electrode pass through first passivation layer via hole is connected with drain electrode; End regions at public electrode wire forms the connection electrode figure, and connection electrode is interconnected adjacent public electrode wire through second passivation layer via hole.In technique scheme of the present invention, the alleged composition technology of the present invention comprises technologies such as photoresist coating, mask, exposure, etching.
The invention provides a kind of TFT-LCD array base-plate structure manufacturing approach; Though form MM CAP (Cst on Common) structure on public electrode wire equally; But public electrode wire and drain electrode, source electrode and data line are forming with in a composition technology; Being public electrode wire and drain electrode, source electrode and data line is provided with layer, forms two parallel-plates of MM CAP by public electrode wire and pixel electrode, and the vertical range between two parallel-plates is merely the thickness of passivation layer; Distance between MM CAP the two poles of the earth is dwindled greatly, helps the raising of MM CAP.In addition, because the section difference that public electrode wire brings is leaked metal layer thickness for the source, and metal layer thickness is leaked in the grid metal layer thickness source that is greater than usually, that is to say that the section difference of public electrode wire this moment is reduced, and this will help the raising of TFT-LCD contrast.Further, because public electrode wire and drain electrode, source electrode and data line are provided with layer, public electrode wire can be arranged between two grid lines, also can be arranged on the grid line, when increasing MM CAP, has greatly increased aperture opening ratio.
Fig. 8 is the process flow diagram of TFT-LCD array base-plate structure manufacturing approach second embodiment of the present invention, is specially:
Step 21, on substrate deposition grid metal level, through the first time composition technology form gate electrode, grid line and shield bars figure;
Step 22, on the substrate of completing steps 21 successive sedimentation gate insulation layer and active layer, through the second time composition technology form active layer pattern;
Step 23, sedimentary origin leaks metal level on the substrate of completing steps 22, forms drain electrode, source electrode, data line and public electrode line graph through composition technology for the third time, and wherein public electrode wire is interrupted and is formed between two data lines;
Step 24, on the substrate of completing steps 23 deposit passivation layer, form first passivation layer via hole through the 4th composition technology in the drain electrode position, form second passivation layer via hole at public electrode wire near the end position of data line;
Step 25, on the substrate of completing steps 24 the deposit transparent conductive layer; Form the pixel electrode figure and form the connection electrode figure at pixel region through the 5th composition technology at the end regions of public electrode wire; Make pixel electrode pass through first passivation layer via hole and be connected, make connection electrode interconnect public electrode wire through second passivation layer via hole with drain electrode.
Different with the TFT-LCD array base-plate structure manufacturing approach first embodiment technical scheme of the present invention shown in Figure 7 is; Present embodiment is to form the shield bars pattern in the first time simultaneously in the composition technology; Be that shield bars and grid line are provided with layer, other process is basic identical, repeats no more.
Fig. 9 is the process flow diagram of TFT-LCD array base-plate structure manufacturing approach the 3rd embodiment of the present invention, is specially:
Step 31, on substrate deposition grid metal level, through the first time composition technology form gate electrode and grid line figure;
Step 32, on the substrate of completing steps 31 successive sedimentation gate insulation layer and active layer, through the second time composition technology form active layer pattern;
Step 33, sedimentary origin leaks metal level on the substrate of completing steps 32; Through the drain electrode of composition technology formation for the third time, source electrode, data line, public electrode wire and shield bars figure; Wherein public electrode wire is interrupted and is formed between two data lines, and shield bars is set in parallel in a side or two sides of data line;
Step 34, on the substrate of completing steps 33 deposit passivation layer, form first passivation layer via hole through the 4th composition technology in the drain electrode position, form second passivation layer via hole at public electrode wire near the end position of data line;
Step 35, on the substrate of completing steps 34 the deposit transparent conductive layer; Form the pixel electrode figure and form the connection electrode figure at pixel region through the 5th composition technology at the end regions of public electrode wire; Make pixel electrode pass through first passivation layer via hole and be connected, make connection electrode interconnect public electrode wire through second passivation layer via hole with drain electrode.
Different with the TFT-LCD array base-plate structure manufacturing approach first embodiment technical scheme of the present invention shown in Figure 7 is; Present embodiment is to form the shield bars pattern simultaneously in the composition technology for the third time; Be that shield bars and public electrode wire are provided with layer; Shield bars can also be connected with public electrode wire, and other process is basic identical, repeats no more.
Figure 10 is the process flow diagram of TFT-LCD array base-plate structure manufacturing approach the 4th embodiment of the present invention, is specially:
Step 41, on substrate deposition grid metal level, form gate electrode and grid line figure through composition technology;
Step 42, metal level is leaked in successive sedimentation gate insulation layer, active layer and source on the substrate of completing steps 41; See through composition technology through shadow tone (HTM) or half and form active layer, drain electrode, source electrode, data line and public electrode line graph, wherein public electrode wire is interrupted and is formed between two data lines;
Step 43, on the substrate of completing steps 42 deposit passivation layer, form first passivation layer via hole through composition technology in the drain electrode position, form second passivation layer via hole at public electrode wire near the end position of data line;
Step 44, on the substrate of completing steps 43 the deposit transparent conductive layer; Form the pixel electrode figure and form the connection electrode figure at pixel region through composition technology at the end regions of public electrode wire; Make pixel electrode pass through first passivation layer via hole and be connected, make connection electrode interconnect public electrode wire through second passivation layer via hole with drain electrode.
Different with five composition technologies of TFT-LCD array base-plate structure manufacturing approach first embodiment of the present invention shown in Figure 7, present embodiment is four composition technologies.In four composition technologies of present embodiment; It is identical with aforementioned first embodiment with the technology of grid line figure, formation first passivation layer via hole and second passivation layer via hole, formation pixel electrode and connection electrode to form gate electrode; Different is with among first embodiment the second time composition technology and for the third time composition technology be merged into a composition technology; Be specially: on the substrate of accomplishing gate electrode and grid line pattern through PECVD method successive sedimentation thickness be 1000
~4000
gate insulation layer, thickness be 1000
~4000
active layer, active layer comprise thickness be 1000
~3000
semiconductor layer He thickness be 300
~600
doping semiconductor layer (ohmic contact layer).In the method for accomplishing on the substrate of above-mentioned technology through sputter or thermal evaporation; Deposit thickness be 500
~2500
the source leak metal level, metal level is leaked in the source can select metal and alloys thereof such as Cr, W, Ti, Ta, Mo, Al, Cu for use.Carry out shadow tone (HTM) or half exposure technology afterwards through mask plate; Earlier metal level is leaked in the source and carry out etching; And then the TFT raceway groove figure of double exposure area carries out ashing and etching processing; Forming active layer, drain electrode, source electrode, data line and public electrode line graph, is TFT raceway groove figure between drain electrode and the source electrode wherein, etches away the doping semiconductor layer in the active layer fully in the TFT raceway groove figure; Data line is vertical with grid line, and public electrode wire is interrupted and is formed between two data lines.Further, because public electrode wire and drain electrode, source electrode and data line are provided with layer, public electrode wire can be arranged between two grid lines, also can be arranged on the grid line, when increasing MM CAP, has greatly increased aperture opening ratio.Certainly, present embodiment also can form the shield bars pattern simultaneously in composition technology, repeat no more.
Said method is merely the practical implementation method of TFT-LCD array base-plate structure manufacturing approach of the present invention; Under with public electrode wire and drain electrode, source electrode and data line guiding theory, also can there be other technological process to form required array base-plate structure with layer formation.
What should explain at last is: above embodiment is only unrestricted in order to technical scheme of the present invention to be described; Although the present invention is specified with reference to preferred embodiment; Those of ordinary skill in the art is to be understood that; Can make amendment or be equal to replacement technical scheme of the present invention, and not break away from the spirit and the scope of technical scheme of the present invention.