CN101520306A - Spatial carrier based interference confocal measuring device and method - Google Patents

Abstract

The invention relates to a spatial carrier based interference confocal measuring device and a method, belonging to the technical filed of measurement of surface topography. The measuring device comprises a laser, a collimation focusing objective lens, a pinhole, a collimation expander objective lens, a polarization beam splitter, a quarter wave plate, a beam splitter, a detection focusing objective lens, a second microdrive and a collecting objective lens, wherein the rear side of the beam splitter along the direction of a primary optical axis of the laser is sequentially provided with an auxiliary reference lens and a first microdrive, a main reference lens is arranged between the beam splitter and the detection focusing objective lens, a CCD camera is placed on a focus position of the collecting objective lens, and a master control computer is connected with the CCD camera and the first microdrive. The method comprises the steps: establishing displacement and phase relation by a secondary confocal method, introducing a carrier signal by tilting the auxiliary reference lens, obtaining a carrier interferogram, acquiring the phase information of a measured surface by a spatial carrier phase-shifting algorithm, and finally fitting surface topography and three-dimensional profile. The invention is suitable for dynamic, quick and high-precision measurement of micro-structure three-dimensional topography.

Description

Interference confocal measuring apparatus and method based on spatial carrier

Technical field

The invention belongs to the measuring surface form technical field, particularly a kind of ultraprecise that is used for Microstructure Optics element, microstructure mechanical organ, integrated circuit component three-dimensional microstructure, little step, little groove live width and surface shape measuring, dynamically, high speed confocal measuring apparatus and method.

Background technology

Confocal spot scan measurement is to measure one of important technical of three-dimensional microstructure, little step, little groove live width, the degree of depth and surface configuration in micro-optic, micromechanics, the microelectronic.Nineteen fifty-seven M.Minsky proposes the basic fundamental thought that cofocus scanning is measured, and promptly suppresses parasitic light by introducing pinhole detector, realizes axial chromatography.After this, on the cofocus scanning imaging technique basis that M.Minsky proposes, derive polytype confocal measurement principles such as optical fiber confocal micro-measurement, differential confocal scanning survey.

The something in common of the confocal measurement method that optical fiber confocal micro-measurement, differential confocal scanning survey method and Minsky propose is that the two all is based on the measuring method of displacement-light intensity variation relation.Confocal measurement method based on displacement-light intensity variation relation, exist and be subject to the deficiency that the measuring light signal intensity is subject to surface reflectivity difference, measuring workpieces inclination and curved surface profile variable effect, signal intensity and displacement output relation curve that this influence directly causes having demarcated change, thereby can bring bigger measuring error, this measuring principle defective has retrained the application of confocal measuring technique in the measuring with curved surface profile of reflectance varies bigger surface.

Chinese patent publication number 101275822, the name of invention is called second confocal measuring method and the device based on movable phase interfere, discloses a kind of second confocal measuring method and device based on the time movable phase interfere.Utilize the axial chromatography effect of confocal point probe, by the phase information under two kinds of confocal states of twice movable phase interfere acquisition, thereby the parsing that realizes the out of focus displacement is found the solution.Essence based on the confocal measurement method of movable phase interfere is to convert change in displacement to phase change, to realize microstructure and microdisplacement measurement; This method has overcome the deficiency that traditional confocal measuring technique is subject to surface reflectivity difference, measuring workpieces inclination and curved surface profile variable effect.

But the time movable phase interfere need be gathered four width of cloth interferograms, could obtain the tested surface phase place according to the phase shift algorithm.Because four width of cloth interferograms are consuming time longer in the different acquisitions constantly of same position, are subject to factor affecting such as ambient vibration and air turbulence, only are suitable for static measurement; In addition, the multistep phase shift drives by the PZT micrometric displacement and realizes, the mechanism kinematic error directly influences phase shifting accuracy, thereby has limited the raising of measuring accuracy.

Summary of the invention

For overcoming time movable phase interfere confocal measurement, consuming time longer, be subject to the deficiency of factor affecting such as ambient vibration and air turbulence, the present invention proposes a kind of interference confocal measuring apparatus and method based on spatial carrier; Adopt the second confocal method, obtain the out of focus-phase association equation under two kinds of confocal states, thereby the parsing that realizes phase place-displacement relation is found the solution; Adopt spatial carrier movable phase interfere technology, inclination auxiliary reference mirror, introduce the required carrier signal of spatial carrier phase shift, carrier signal is incorporated in the interferogram of measuring light and reference light generation, resolve phase information by the spatial carrier phase shift algorithm, thereby solve the surface profile and the three-dimensional appearance of tested object plane.

The present invention had both kept phase shift confocal detection method and not tilted by surface measurements difference in reflectivity and measuring workpieces and the advantage of curved surface profile variable effect, overcome again in the time phase shift confocal detection and needed the multistep phase shift, length consuming time, big shortcoming affected by environment is applicable to the ultraprecise of micro-structural 3 D pattern, dynamic, measurement at a high speed.

The object of the present invention is achieved like this:

Device of the present invention comprises: laser instrument, collimation focusing objective len, pin hole, collimator and extender object lens, polarization spectroscope, quarter-wave plate, spectroscope, detection focusing objective len, second microdrive, collection object lens; Dispose the auxiliary reference mirror and first microdrive successively along the axial spectroscope of laser instrument key light back, main reference mirror is configured in spectroscope and surveys between the focusing objective len, at the focus place of collecting object lens, place the CCD camera, main control computer is connected with CCD camera, first microdrive.

The present invention also provides a kind of interference confocal measuring method based on spatial carrier, and this method may further comprise the steps:

1) adopts the second confocal method, obtain the phase information under two kinds of confocal states, realize that the parsing of out of focus displacement is found the solution, set up phase place-displacement relation;

2) inclination auxiliary reference mirror is introduced carrier signal, carrier signal is introduced in the interferogram of measuring light and reference light, makes big phase-shift value of continuous image vegetarian refreshments acquisition on the CCD camera, produces carrier wave interference figure;

3) resolve tested object plane phase information by the spatial carrier phase shift algorithm; The interferogram that contains carrier signal is carried out two-dimension fourier transform, each frequency is launched on spectrogram; By frequency domain filtering, intercept required frequency, pass through inverse fourier transform again, obtain tested object plane phase information, thereby solve the surface profile and the three-dimensional appearance information of tested object plane.

This method is based on displacement and movable phase interfere phase transition principle, rather than displacement-intensity-conversion relation, therefore overcome the deficiency that traditional confocal measuring technique is subject to surface reflectivity difference, tested surface obliquity effects, can be applicable to the ultraprecise non-cpntact measurement of bigger surface of difference in reflectivity and curved surface profile.

This method adopts the spatial carrier phase-shifting technique, needing in the phase-shifting interference measuring to have avoided the multistep phase shift, consuming time long, be subject to factor affecting such as ambient vibration and air turbulence, only be suitable for the deficiency of static measurement, be applicable to the micro-structural 3 D pattern dynamically, fast, high-acruracy survey.

Novelty of the present invention is: the deficiency that is subject to surface reflectivity difference, measuring workpieces inclination and curved surface profile variable effect at existing traditional confocal measuring technique, and based on the second confocal measuring method of movable phase interfere long shortcoming consuming time, adopt the second confocal method, obtain the phase-shifted tie-in equation under two kinds of confocal states, thereby the parsing that realizes the out of focus displacement is found the solution, and sets up displacement-phase relation; Adopt spatial carrier movable phase interfere technology, inclination auxiliary reference mirror, introduce the required carrier signal of spatial carrier phase shift, carrier signal is incorporated in the interferogram of measuring light and reference light generation, resolve phase information by the spatial carrier phase shift algorithm, thereby solve the surface profile and the three-dimensional appearance of tested object plane.

Good result of the present invention is:

1) adopt the spatial carrier phase-shifting technique, needing in the phase-shifting interference measuring to have avoided the multistep phase shift, consuming time longer, be subject to factor affecting such as ambient vibration and air turbulence;

2) based on displacement and movable phase interfere phase transition principle, overcome the influence that surface reflectivity difference, tested surface tilt, can be applicable to the ultraprecise non-cpntact measurement of bigger surface of difference in reflectivity and curved surface profile;

3) overcome the deficiency that traditional confocal detection only is suitable for static measurement, be applicable to dynamic, quick, the high-acruracy survey of micro-structural 3 D pattern.

Description of drawings

Fig. 1 is described interference confocal measuring apparatus structural representation based on spatial carrier.

Fig. 2 is described Fourier transform phase extraction method synoptic diagram based on spatial carrier

Among the figure: 1 laser instrument, 2 collimation focusing objective lens, 3 pin holes, 4 collimator and extender object lens, 5 polarization spectroscopes, 6 quarter-wave plates, 7 spectroscopes, 8 auxiliary reference mirrors, 9 first microdrives, 10 main reference mirrors, 11 are surveyed focusing objective len, 12 second microdrives, 13 are collected object lens, 14 CCD cameras, 15 main control computers

Embodiment:

Describe the present invention in conjunction with the accompanying drawings:

As shown in Figure 1, the interference confocal measuring apparatus based on spatial carrier of the present invention comprises: laser instrument 1, collimation focusing objective len 2, pin hole 3, collimator and extender object lens 4, polarization spectroscope 5, quarter-wave plate 6, spectroscope 7, detection focusing objective len 11, second microdrive 12, collection object lens 13; Dispose the auxiliary reference mirror 8 and first microdrive 9 successively along the axial spectroscope of laser instrument 1 key light 7 back, main reference mirror 10 is configured in spectroscope 7 and surveys between the focusing objective len 11, at the focus place of collecting object lens 13, place CCD camera 14, main control computer 15 is connected with CCD camera 14, first microdrive 9.

Wherein, described laser instrument 1 sends linearly polarized light beam, through becoming the approximate ideal plane wave after the collimator and extender mirror group that is made of collimation focusing objective len 2, pin hole 3, collimator and extender object lens 4; Again through becoming circularly polarized light beam after polarization spectroscope 5 and the quarter-wave plate 6; Be divided into two-beam through spectroscope 7, the first bundle light,,, is focused on CCD camera 14 test surfaces through collecting object lens 13 through spectroscope 7 reflections as auxiliary reference light through 8 reflections of auxiliary reference mirror by spectroscope 7 transmissions; The second bundle light is divided into two parts by spectroscope 7 reflections on the reference surface of main reference mirror 10; The reflection of part light as main reference light, through behind the spectroscope 7, gathers on CCD camera 14 test surfaces through collecting object lens meeting 13; Part transmittance, as measuring light, through surveying focusing objective len 11, being focused on the surface measurements, after the surface measurements reflection, through surveying focusing objective len 11, main reference mirror 10, spectroscope 7, enter CCD camera 14 after gleanings mirror 13 is assembled, interfere with main reference light, auxiliary reference light, interference image is by main control computer 15 stores processor.

The effect of first microdrive 9 is inclination auxiliary reference mirrors 8 to introduce carrier signal, and this carrier signal is the result of auxiliary reference light and main reference light interference; Second microdrive 12 effect be move to survey focusing objective len 11, produce second kind of confocal state for the confocal state of initial measurement, thereby obtain the tie-in equation that defocusing amount and phase place are found the solution, realize the calculating of finding the solution that phase place-defocusing amount concerns.First microdrive 9 and second microdrive 12 are by main control computer 15 controls.

The concrete implementation step of the present invention:

The first step adopts the second confocal method, obtains the phase information under two kinds of confocal states, thus the parsing of realization out of focus displacement find the solution, set up phase place-displacement relation;

In second step, inclination auxiliary reference mirror 8 is introduced carrier signal, and this carrier signal is the result of auxiliary reference light and main reference light interference; Carrier signal is introduced in the interferogram of measuring light and reference light, made big phase-shift value of continuous image vegetarian refreshments acquisition on the CCD camera 14, produce carrier wave interference figure;

In the 3rd step, resolve tested object plane phase information by the spatial carrier phase shift algorithm; The interferogram that contains carrier signal is carried out two-dimension fourier transform, because the modulating action of the spatial carrier that auxiliary reference mirror 8 tilts to introduce, each frequency is launched on spectrogram among the carrier wave interference figure; The tilt quantity of auxiliary reference mirror 8 is big more, and the inclination striped is many more, and each frequency spectrum is easy more separately; By frequency domain filtering, intercept required frequency, pass through inverse fourier transform again, obtain the measured surface phase information, thereby simulate measured surface profile and three-dimensional appearance.

Spatial carrier position phase-shifting technique is to add a big inclination in bar graph, thereby makes the continuous image vegetarian refreshments obtain a big phase-shift value, is applicable at a high speed and measures.Carrier signal is introduced by inclination auxiliary reference mirror 8, and this carrier signal is the result of interference of the reference light of auxiliary reference mirror 8 and 10 reflections of main reference mirror.5 formulae express commonly used are as follows

$I_i(x,y)=a+b\cos [2\mathrm{\π}{f}_0(x+\frac{i-1}{4f_0})+\mathrm{\φ}(x,y)],i=\mathrm{1,2,3,4,5}---\left(1\right)$

So phase place on last certain pixel of CCD

$\mathrm{\φ}(i,j)={\tan }^{-1}\left[\frac{2(I_2-I_4)}{2I_3-I_1-I_5}\right]---\left(2\right)$

I wherein ₁, I ₂, I ₃, I ₄, I ₅Light intensity for neighbor pixel.

Further deduct tilting value, again the position is returned in the 2 π scopes mutually; Carrying out the position at last separates parcel mutually and obtains net result.

Want to obtain the precise phase information of each measurement result, need carry out two-dimension fourier transform to the interferogram that contains carrier signal, its interference strength distributes and can be rewritten as

g(x，y)＝a(x，y)+c(x，y)exp(2πif ₀x)+c ^*(x，y)exp(-2πif ₀x) (3)

c(x，y)＝b(x，y)exp[iφ(x，y)]/2 (4)

In the formula, * represents complex conjugate.To g (x, variable x y) carry out fast Fourier transform (FFT) and get:

G(f，x)＝A(f，y)+C(f-f ₀，y)+C ^*(f+f ₀，y) (5)

Because the modulating action of the light carrier that auxiliary reference mirror 8 tilts to introduce, 3 are separated on frequency plane in the following formula.The tilt quantity of auxiliary reference mirror 8 is big more, and the inclination striped is many more, and each frequency spectrum is easy more separately.

Utilize the frequency center to be f ₀Wave filter obtain secondary lobe spectral term C (f-f ₀, y), and by frequency displacement obtain C (f, y), carry out again inverse Fourier transform obtain tested surface phase place c (x, y), as shown in Figure 2.Like this by (4) Shi Kede

$\mathrm{\φ}(x,y)={\tan }^{-1}\frac{\mathrm{Re}\left[c(x,y)\right]}{\mathrm{Im}\left[c(x,y)\right]}---\left(6\right).$

Claims (2)

1, a kind of interference confocal measuring apparatus based on spatial carrier comprises: laser instrument (1), collimation focusing objective len (2), pin hole (3), collimator and extender object lens (4), polarization spectroscope (5), quarter-wave plate (6), spectroscope (7), detection focusing objective len (11), second microdrive (12), collection object lens (13); It is characterized in that, dispose auxiliary reference mirror (8) and first microdrive (9) successively along the axial spectroscope of laser instrument (1) key light (7) back, main reference mirror (10) is configured in spectroscope (7) and surveys between the focusing objective len (11), at the focus place of collecting object lens (13), place CCD camera (14), main control computer (15) is connected with CCD camera (14), first microdrive (9).

2, a kind of interference confocal measuring method based on spatial carrier, this method may further comprise the steps:

1) adopts the second confocal method, obtain the phase information under two kinds of confocal states, realize that the parsing of out of focus displacement is found the solution, set up phase place-displacement relation;

It is characterized in that:

2) inclination auxiliary reference mirror is introduced carrier signal, carrier signal is introduced in the interferogram of measuring light and reference light, makes big phase-shift value of continuous image vegetarian refreshments acquisition on the CCD camera, produces carrier wave interference figure;

3) resolve tested object plane phase information by the spatial carrier phase shift algorithm; The interferogram that contains carrier signal is carried out two-dimension fourier transform, each frequency is launched on spectrogram; By frequency domain filtering, intercept required frequency, pass through inverse fourier transform again, obtain tested object plane phase information, thereby solve the surface profile and the three-dimensional appearance information of tested object plane.

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