CN101490846B - 多输出电荷耦合器件 - Google Patents

多输出电荷耦合器件 Download PDF

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Publication number
CN101490846B
CN101490846B CN2007800275356A CN200780027535A CN101490846B CN 101490846 B CN101490846 B CN 101490846B CN 2007800275356 A CN2007800275356 A CN 2007800275356A CN 200780027535 A CN200780027535 A CN 200780027535A CN 101490846 B CN101490846 B CN 101490846B
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CN
China
Prior art keywords
ccd
charge coupled
charge
transfer gate
electrically connected
Prior art date
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Expired - Fee Related
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CN2007800275356A
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English (en)
Chinese (zh)
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CN101490846A (zh
Inventor
C·帕克斯
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chu Saisi Imaging Co ltd
Image Sensing Technology Acquisition Group
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Eastman Kodak Co
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Publication of CN101490846A publication Critical patent/CN101490846A/zh
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Publication of CN101490846B publication Critical patent/CN101490846B/zh
Expired - Fee Related legal-status Critical Current
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D44/00Charge transfer devices
    • H10D44/40Charge-coupled devices [CCD]
    • H10D44/45Charge-coupled devices [CCD] having field effect produced by insulated gate electrodes 
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/10Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
    • H04N25/11Arrangement of colour filter arrays [CFA]; Filter mosaics
    • H04N25/13Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
    • H04N25/134Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements based on three different wavelength filter elements
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/447Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by preserving the colour pattern with or without loss of information
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/46Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/71Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/713Transfer or readout registers; Split readout registers or multiple readout registers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/15Charge-coupled device [CCD] image sensors
    • H10F39/153Two-dimensional or three-dimensional array CCD image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/15Charge-coupled device [CCD] image sensors
    • H10F39/158Charge-coupled device [CCD] image sensors having arrangements for blooming suppression
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/805Coatings
    • H10F39/8053Colour filters

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Color Television Image Signal Generators (AREA)
CN2007800275356A 2006-07-20 2007-07-09 多输出电荷耦合器件 Expired - Fee Related CN101490846B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/490,383 2006-07-20
US11/490,383 US7692706B2 (en) 2006-07-20 2006-07-20 Charge summing in multiple output charge-coupled devices in an image sensor
PCT/US2007/015641 WO2008010924A2 (en) 2006-07-20 2007-07-09 Multiple output charge-coupled devices

Publications (2)

Publication Number Publication Date
CN101490846A CN101490846A (zh) 2009-07-22
CN101490846B true CN101490846B (zh) 2011-04-06

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CN2007800275356A Expired - Fee Related CN101490846B (zh) 2006-07-20 2007-07-09 多输出电荷耦合器件

Country Status (7)

Country Link
US (3) US7692706B2 (https=)
EP (1) EP2044628A2 (https=)
JP (1) JP2009545133A (https=)
KR (1) KR20090129980A (https=)
CN (1) CN101490846B (https=)
TW (1) TW200818895A (https=)
WO (1) WO2008010924A2 (https=)

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JP2009089029A (ja) * 2007-09-28 2009-04-23 Fujifilm Corp Ccd型固体撮像素子
WO2012081154A1 (ja) * 2010-12-16 2012-06-21 パナソニック株式会社 撮像装置及び画像処理装置
US8411189B2 (en) * 2011-05-25 2013-04-02 Truesense Imaging, Inc. Multi-purpose architecture for CCD image sensors
US8800130B2 (en) 2011-05-25 2014-08-12 Truesense Imaging, Inc. Methods for producing image sensors having multi-purpose architecture
US8773563B2 (en) 2011-05-25 2014-07-08 Truesense Imaging, Inc. Multi-purpose architecture for CCD image sensors
US8750060B2 (en) 2012-03-05 2014-06-10 Raytheon Company Repair device and method for integrated circuit structured arrays
US8519879B1 (en) * 2012-04-13 2013-08-27 Raytheon Company Precision charge-dump circuit
US9154713B2 (en) 2012-04-19 2015-10-06 Raytheon Company Repartitioned digital pixel
US8878256B2 (en) 2013-01-07 2014-11-04 Semiconductor Components Industries, Llc Image sensors with multiple output structures
US8878255B2 (en) 2013-01-07 2014-11-04 Semiconductor Components Industries, Llc Image sensors with multiple output structures
US9979905B2 (en) * 2015-11-17 2018-05-22 Microsoft Technology Licensing, Llc. Multimode photosensor
CN112889085B (zh) * 2018-10-15 2025-03-21 生物辐射实验室股份有限公司 数字成像中的饱和避免
JP7159090B2 (ja) * 2019-03-20 2022-10-24 株式会社東芝 固体撮像装置及び固体撮像装置の制御方法

Citations (2)

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US4879601A (en) * 1988-11-14 1989-11-07 Polaroid Corporation System and method of providing images from solid state sensor
US6462779B1 (en) * 1998-02-23 2002-10-08 Eastman Kodak Company Constant speed, variable resolution two-phase CCD

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JPS5856458U (ja) * 1981-10-09 1983-04-16 株式会社日立製作所 カラ−固体撮像装置
US4513313A (en) * 1982-12-07 1985-04-23 Canon Kabushiki Kaisha Solid state imaging device
US4807037A (en) * 1987-03-06 1989-02-21 Kabushiki Kaisha Toshiba Low noise CCD image sensor having a plurality of horizontal CCD registers
NL8800627A (nl) * 1988-03-15 1989-10-02 Philips Nv Ladingsgekoppelde inrichting.
US5189498A (en) * 1989-11-06 1993-02-23 Mitsubishi Denki Kabushiki Kaisha Charge coupled device
US5528643A (en) * 1989-11-13 1996-06-18 Texas Instruments Incorporated Charge coupled device/charge super sweep image system and method for making
US5182623A (en) * 1989-11-13 1993-01-26 Texas Instruments Incorporated Charge coupled device/charge super sweep image system and method for making
DE69119624T2 (de) * 1990-03-02 1997-01-16 Sony Corp Festkörperbildabtaster
JP2873046B2 (ja) * 1990-05-01 1999-03-24 チノン株式会社 画像信号処理装置
CA2052148A1 (en) * 1990-09-27 1992-03-28 Tadashi Sugiki Method of driving a solid-state imaging device
JPH06205298A (ja) * 1992-11-06 1994-07-22 Sharp Corp 電荷結合型固体撮像装置
JP3406935B2 (ja) * 1994-01-31 2003-05-19 キヤノン株式会社 撮像装置
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JPH09246519A (ja) 1996-03-14 1997-09-19 Sony Corp 固体撮像装置およびその駆動方法
US5926215A (en) * 1996-10-17 1999-07-20 Eastman Kodak Company Fast readout of a color image sensor
JPH11164205A (ja) * 1997-11-28 1999-06-18 Sony Corp 固体撮像装置およびその駆動方法
JP3548410B2 (ja) * 1997-12-25 2004-07-28 キヤノン株式会社 固体撮像装置および固体撮像装置の信号読み出し方法
JP3214428B2 (ja) * 1998-01-05 2001-10-02 日本電気株式会社 カラーリニアイメージセンサおよびその駆動方法
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US7636119B2 (en) * 2005-12-21 2009-12-22 Eastman Kodak Company Image sensor for still or video photography

Patent Citations (2)

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Publication number Priority date Publication date Assignee Title
US4879601A (en) * 1988-11-14 1989-11-07 Polaroid Corporation System and method of providing images from solid state sensor
US6462779B1 (en) * 1998-02-23 2002-10-08 Eastman Kodak Company Constant speed, variable resolution two-phase CCD

Also Published As

Publication number Publication date
WO2008010924A2 (en) 2008-01-24
US7692706B2 (en) 2010-04-06
WO2008010924A3 (en) 2008-03-06
CN101490846A (zh) 2009-07-22
JP2009545133A (ja) 2009-12-17
EP2044628A2 (en) 2009-04-08
TW200818895A (en) 2008-04-16
US20080018767A1 (en) 2008-01-24
US8098316B2 (en) 2012-01-17
KR20090129980A (ko) 2009-12-17
US20100157119A1 (en) 2010-06-24
US20100157118A1 (en) 2010-06-24
US8102455B2 (en) 2012-01-24

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Owner name: IMAGE SENSOR TECHNOLOGIES ACQUISITION CORPORATION

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Effective date: 20120530

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Owner name: CHUSAISI IMAGING CO., LTD.

Free format text: FORMER NAME: IMAGE SENSOR TECHNOLOGIES ACQUISITION CORPORATION

CP03 Change of name, title or address

Address after: American New York

Patentee after: Chu Saisi Imaging Co.,Ltd.

Address before: California, USA

Patentee before: Image sensing technology acquisition group

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Patentee after: Image sensing technology acquisition group

Address before: American New York

Patentee before: Eastman Kodak Co.

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Termination date: 20120709