CN101457126A - Chemico-mechanical polishing liquid - Google Patents
Chemico-mechanical polishing liquid Download PDFInfo
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- CN101457126A CN101457126A CNA2007101723633A CN200710172363A CN101457126A CN 101457126 A CN101457126 A CN 101457126A CN A2007101723633 A CNA2007101723633 A CN A2007101723633A CN 200710172363 A CN200710172363 A CN 200710172363A CN 101457126 A CN101457126 A CN 101457126A
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- polishing fluid
- polishing
- dioxide
- silicon
- abrasive grains
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Abstract
The present invention discloses a chemical machinery polishing solution which contains seat grinding granule and water, and n-vinyl-2-pyrrolidone polymeric compound. The polishing solution provided in the invention has low polycrystalline silicon removal rate, and removal rate selection ratio between polycrystalline silicon and silicon dioxide, which can reduce depression and improve plainness efficiency of polycrystalline silicon significantly.
Description
Technical field
The present invention relates to a kind of chemical mechanical polishing liquid.
Background technology
For the polishing of polysilicon, be mainly used in two kinds of chips at present, a kind of is DRAM, a kind of is Flash.During using, the latter often in to the polishing of polysilicon, can relate to polishing to silicon-dioxide.
In the prior art, be that the alkaline slurry of abrasive grains is come polishing polycrystalline silicon layer and silicon-dioxide (as HDP) layer mainly to contain silicon-dioxide, its removal rate of polysilicon often than silicon-dioxide to remove speed much higher, easily cause the excessive removal of polysilicon and produce depression, influence technology subsequently.
US2003/0153189A1 discloses a kind of chemical mechanical polishing liquid and using method thereof that is used for the polysilicon polishing.This polishing fluid comprises a kind of polymeric surfactant and a kind of abrasive grains that is selected from aluminum oxide and cerium oxide, and this polymeric surfactant is the polycarboxylate tensio-active agent.Can make the polishing speed in polysilicon surface bulk zone be much higher than polishing speed in the groove with this slurry, thereby reduce depression.US2003/0216003 A1 and US2004/0163324 A1 disclose the method for a kind of Flash of manufacturing.Comprising a kind of polishing fluid of polishing polycrystalline silicon, comprise at least a containing-N (OH) in this polishing fluid ,-NH (OH) ,-NH
2(OH) compound of group.The polysilicon of this slurry selects ratio greater than 50 with the polishing of silicon-dioxide.US2004/0014321 A1 discloses a kind of acid polishing slurry that comprises abrasive grains and oxygenant, uses this slurry can improve polysilicon and selects ratio with the polishing of silicon-dioxide.US2004/0123528 A1 discloses a kind of acid polishing slurry that comprises abrasive grains and anionic compound.This anionic compound can reduce the removal speed of protective layer film, improves the removal rate selection ratio of polysilicon and protective layer film.US2005/0130428 A1 and CN 1637102 A disclose a kind of slurry that is used for multi crystal silicon chemical mechanical polishing.This slurry comprises one or more can form passivation layer on polysilicon layer nonionogenic tenside and a kind ofly can form that second passivation layer can reduce silicon nitride or silicon oxide is removed the second surface promoting agent of speed.This ionic surfactant pack is drawn together oxyethane～propylene oxide block copolymer alcohol and/or oxyethane～propylene oxide triblock polymer.This slurry can be with the removal rate selection of polysilicon and isolator than reducing about 50% at least.
Summary of the invention
Technical problem to be solved by this invention is to remove the removal speed of speed far above silicon-dioxide in order to overcome the polysilicon that prior art is used for the chemical mechanical polishing liquid of polishing polycrystalline silicon and silicon dioxide layer, easily cause the excessive removal of polysilicon and produce the defective of depression, have lower polysilicon and remove speed and polysilicon removal rate selection ratio and provide a kind of, can reduce the chemical mechanical polishing liquid of depression silicon-dioxide.
Polishing fluid of the present invention contains abrasive grains and water, also contains vinylpyrrolidinone polymer, the multipolymer that is selected from polyvinylpyrrolidone and/or vinyl pyrrolidone and vinyl acetate between to for plastic that described vinylpyrrolidinone polymer is preferable.The multipolymer of described polyvinylpyrrolidone and/or vinyl pyrrolidone and vinyl acetate can significantly reduce removal rate of polysilicon, but do not influence the removal speed of silicon-dioxide, thereby reduce the selection ratio of polysilicon and silicon-dioxide, reduce depression, significantly improve the planarization efficiency of polysilicon.
Wherein, what the molecular weight of the multipolymer of described polyvinylpyrrolidone and/or vinyl pyrrolidone and vinyl acetate was preferable is 1000～1000000, and better is 1000～500000.What the content of the multipolymer of described polyvinylpyrrolidone and/or vinyl pyrrolidone and vinyl acetate was preferable is mass percent 0.0001～3%, and better is mass percent 0.001～1%.
Wherein, described abrasive grains can be selected from one or more in silicon-dioxide, cerium dioxide, titanium dioxide and the polymer abrasive grains of silicon-dioxide, aluminium coating of silicon-dioxide, aluminum oxide, adulterated al.That the particle diameter of abrasive grains is preferable is 20～150nm, and that better is 30～120nm.What the content of described abrasive grains was preferable is mass percent 0.1～30%, is preferably mass percent 1～20%.
Wherein, the pH of described polishing fluid is preferably 7～12.
In the polishing fluid of the present invention, can also contain other conventional additives of this area, as pH regulator agent, viscosity modifier and defoamer etc.
Polishing fluid of the present invention is by the simple uniform mixing of mentioned component, and adopting the pH regulator agent to be adjusted to suitable pH value afterwards can make.The pH regulator agent can be selected the conventional pH regulator agent in this area for use, as potassium hydroxide, ammoniacal liquor and nitric acid etc.Among the present invention, agents useful for same and raw material are all commercially available to be got.
Positive progressive effect of the present invention is: polishing fluid of the present invention has lower polysilicon and removes speed and polysilicon to the removal rate selection ratio of silicon-dioxide, can reduce depression, significantly improves the planarization efficiency of polysilicon.
Embodiment
Mode below by embodiment further specifies the present invention, but does not therefore limit the present invention among the described scope of embodiments.
Embodiment 1～6
Table 1 has provided polishing fluid 1～6 of the present invention, by prescription in the table, each component is mixed, and surplus is a water, adopts potassium hydroxide and nitric acid to be adjusted to suitable pH value afterwards and can make each polishing fluid.
Table 1 polishing fluid 1～6 prescription of the present invention
Effect embodiment
Table 2 has provided contrast polishing fluid 1 and polishing fluid of the present invention 1～6, by prescription in the table, each component is mixed, and surplus is a water, adopts potassium hydroxide and nitric acid to be adjusted to suitable pH value afterwards and can make each polishing fluid.
Above-mentioned each polishing fluid is used for polishing polycrystalline silicon and silicon-dioxide, and the processing parameter of polishing is: overdraft 3psi, the rotating speed 70rpm of polishing disk (14 inches of diameters), rubbing head rotating speed 80rpm, polishing slurries flow velocity 200ml/min, polishing pad are politex, and polishing machine is Logitech LP50.The result is as shown in table 2.
Table 2 contrast polishing fluid 1 and polishing fluid of the present invention 1～6 prescription reach the removal speed to polysilicon and silicon-dioxide (HDP)
By contrasting polishing fluid 1 and polishing fluid of the present invention 1 contrast in the table 2 as seen, behind the adding polyvinylpyrrolidone, it is constant substantially that silicon-dioxide is removed speed, and polysilicon removal speed reduces significantly, and polysilicon also reduces significantly to the selection ratio of silicon-dioxide thereupon.The abrasive grains content of polishing fluid 2～6 and pH have different the variation, and lower polysilicon is removed speed and lower polysilicon is selected ratio to the polishing of silicon-dioxide but all have.
Claims (11)
1. a chemical mechanical polishing liquid contains abrasive grains and water, it is characterized in that: it also contains vinylpyrrolidinone polymer.
2. polishing fluid as claimed in claim 1 is characterized in that: described vinylpyrrolidinone polymer is the multipolymer of polyvinylpyrrolidone and/or vinyl pyrrolidone and vinyl acetate.
3. polishing fluid as claimed in claim 2 is characterized in that: the molecular weight of the multipolymer of described polyvinylpyrrolidone or vinyl pyrrolidone and vinyl acetate is 1000～1000000.
4. polishing fluid as claimed in claim 3 is characterized in that: the molecular weight of the multipolymer of described polyvinylpyrrolidone or vinyl pyrrolidone and vinyl acetate is 1000～500000.
5. polishing fluid as claimed in claim 1 is characterized in that: the content of the multipolymer of described polyvinylpyrrolidone and/or vinyl pyrrolidone and vinyl acetate is mass percent 0.0001～3%.
6. polishing fluid as claimed in claim 5 is characterized in that: the content of the multipolymer of described polyvinylpyrrolidone and/or vinyl pyrrolidone and vinyl acetate is mass percent 0.001～1%.
7. polishing fluid as claimed in claim 1 is characterized in that: described abrasive grains is selected from one or more in silicon-dioxide, cerium dioxide, titanium dioxide and the polymer abrasive grains of silicon-dioxide, aluminium coating of silicon-dioxide, aluminum oxide, adulterated al.
8. polishing fluid as claimed in claim 1 is characterized in that: the content of described abrasive grains is mass percent 0.1～30%.
9. polishing fluid as claimed in claim 8 is characterized in that: the content of described abrasive grains is mass percent 1～20%.
10. polishing fluid as claimed in claim 1 is characterized in that: the particle diameter of described abrasive grains is 30～120nm.
11. polishing fluid as claimed in claim 1 is characterized in that: the pH of described polishing fluid is 7～12.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200710172363 CN101457126B (en) | 2007-12-14 | 2007-12-14 | Chemico-mechanical polishing liquid |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200710172363 CN101457126B (en) | 2007-12-14 | 2007-12-14 | Chemico-mechanical polishing liquid |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101457126A true CN101457126A (en) | 2009-06-17 |
| CN101457126B CN101457126B (en) | 2013-10-02 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN 200710172363 Active CN101457126B (en) | 2007-12-14 | 2007-12-14 | Chemico-mechanical polishing liquid |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102101976A (en) * | 2009-12-18 | 2011-06-22 | 安集微电子（上海）有限公司 | Chemical mechanical polishing solution |
| CN102127372A (en) * | 2010-12-17 | 2011-07-20 | 天津理工大学 | Nano polishing solution for chemically mechanical polishing of vanadium oxide and application thereof |
| WO2019129107A1 (en) * | 2017-12-27 | 2019-07-04 | 安集微电子（上海）有限公司 | Chemical mechanical polishing solution |
| CN112552824A (en) * | 2019-09-26 | 2021-03-26 | 福吉米株式会社 | Polishing composition and polishing method |
-
2007
- 2007-12-14 CN CN 200710172363 patent/CN101457126B/en active Active
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102101976A (en) * | 2009-12-18 | 2011-06-22 | 安集微电子（上海）有限公司 | Chemical mechanical polishing solution |
| WO2011072493A1 (en) * | 2009-12-18 | 2011-06-23 | 安集微电子（上海）有限公司 | Chemical-mechanical polishing liquid |
| CN102127372A (en) * | 2010-12-17 | 2011-07-20 | 天津理工大学 | Nano polishing solution for chemically mechanical polishing of vanadium oxide and application thereof |
| CN102127372B (en) * | 2010-12-17 | 2013-10-23 | 天津理工大学 | Nano polishing solution for chemically mechanical polishing of vanadium oxide and application thereof |
| WO2019129107A1 (en) * | 2017-12-27 | 2019-07-04 | 安集微电子（上海）有限公司 | Chemical mechanical polishing solution |
| CN109971358A (en) * | 2017-12-27 | 2019-07-05 | 安集微电子（上海）有限公司 | A kind of chemical mechanical polishing liquid |
| CN112552824A (en) * | 2019-09-26 | 2021-03-26 | 福吉米株式会社 | Polishing composition and polishing method |
| CN112552824B (en) * | 2019-09-26 | 2023-07-11 | 福吉米株式会社 | Polishing composition and polishing method |
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| Publication number | Publication date |
|---|---|
| CN101457126B (en) | 2013-10-02 |
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