CN101295126A - Lens seat testing device and method - Google Patents
Lens seat testing device and method Download PDFInfo
- Publication number
- CN101295126A CN101295126A CNA2007102005103A CN200710200510A CN101295126A CN 101295126 A CN101295126 A CN 101295126A CN A2007102005103 A CNA2007102005103 A CN A2007102005103A CN 200710200510 A CN200710200510 A CN 200710200510A CN 101295126 A CN101295126 A CN 101295126A
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- microscope base
- proving installation
- unit
- test cell
- testing
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Abstract
The invention relates to a lens base testing device and a testing method. The lens base testing device comprises: a fixing and retaining unit used for fixing and retaining the lens base; a testing unit used for testing the resistance of a coating for preventing electromagnetic interference on the surface of the lens base fixed and retained by the fixing and retaining unit; at least one clamping unit used for clamping and transmitting the lens base; and a control unit used for controlling the distance between the testing unit and the lens base to keep a certain value when the testing unit tests the lens base, simultaneously receiving and processing the test value of the testing unit to detect whether the lens base is quality goods and controlling at least one clamping unit to clamp and move the lens base. Moreover, the invention also relates to the lens base testing method adopting the lens base testing device. By arranging the control unit to control the distance between the testing unit and the lens base in the process of testing, the lens base testing device and the testing method not only realize the automation of the lens base testing, but also achieve better testing quality.
Description
Technical field
The present invention relates to proving installation and method of testing that a kind of microscope base to the camera lens module carries out the surface resistance test.
Background technology
Along with the development of camera technique, the camera lens module is widely used in the camera head of various uses, and the camera lens module combines with various portable electron devices such as mobile phone, computing machine etc., more obtains numerous consumers' favor.
Yet along with the direction of portable electron device towards functional diversities develops, its element also becomes and becomes increasingly complex, and described element need switch on mostly and could work, and this causes described portable electron device to be easy to influence because of electromagnetic interference (EMI) operate as normal.
The camera lens module is widely used in the portable electron device as the element of camera head usually, and it generally comprises eyeglass, microscope base, optical filter and be used for the distance member of eyeglass and optical filter at interval, as pad etc.In camera lens module assembling process, usually need assemblies such as described eyeglass, optical filter and pads again microscope base to be screwed in microscope base to be assembled into a complete camera lens module by the definite sequence microscope base of packing into.In addition, in order to reduce the degree that described camera lens module is subjected to electromagnetic interference (EMI), general last layer anti-electromagnetic interference (EMI) (Flectromagnetic Interference, EMI) coating of also need being coated with in the surface of described microscope base.
After anti-electromagnetic interference (EMI) coating was coated on the surface of microscope base, whether the resistance value that also needs to utilize electrometer (Flectrometer) to test this coating reached requirement, eliminated with the microscope base that will not reach anti-electromagnetic interference (EMI) demand, guaranteed yield of products.And the probe that common way is a staff arrests electrometer is directly tested the resistance value of coating.Yet, because probe tip is very sharp keen, is easy to scratch coating and causes test error, so probe need keep the quality of certain distance to guarantee to test with coating surface during test, be understandable that, adopt the mode of people's manual manipulation will be difficult to the test request that reaches above-mentioned.
In view of this, provide a kind of can be accurately the microscope base proving installation and the method for testing of the resistance of the anti-electromagnetic interference coating of test mirrors seating face is real in necessary efficiently.
Summary of the invention
Below will with specific embodiment illustrate a kind of can be accurately the microscope base proving installation and the method for testing of the resistance of the anti-electromagnetic interference coating of test mirrors seating face efficiently, it can realize the robotization that keeps certain distance and realize this test between test cell and microscope base in the test process.
A kind of microscope base proving installation, described microscope base proving installation comprises: a fixing unit, described fixing unit is in order to the fixing microscope base; A test cell, described test cell is tested in order to the resistance to the anti-electromagnetic interference coating in surface of the microscope base of described fixing unit fixing; At least one grip unit is used for clamping and transmits described microscope base; And control module, the distance of described test cell and described microscope base keeps certain value when in order to control described test cell described microscope base being tested, and receives the test value of handling described test cell simultaneously and whether examine and determine described microscope base be certified products and control described at least one grip unit and described microscope base is carried out clamping and move.
And, a kind of microscope base method of testing that adopts above-mentioned microscope base proving installation, it may further comprise the steps:
The described microscope base of described grip unit clamping also transfers to described fixing unit with described microscope base; Described fixing unit fixes described microscope base; The distance that described control module is controlled between described test cell and described microscope base keeps certain value, by described test cell the resistance of the anti-electromagnetic interference coating in surface of described microscope base is tested simultaneously; Whether described control module receives the test value of handling described test cell and examines and determine described microscope base is certified products.
With respect to prior art, described microscope base proving installation and method of testing, it is by being provided with at least one grip unit with clamping and mobile described microscope base, simultaneously via a control module being set with the distance between test cell and the microscope base in the control test process, not only realize the robotization of microscope base test, also reached preferable test quality.
Description of drawings
Fig. 1 is the structural representation of the microscope base proving installation that provides of first embodiment of the invention.
Fig. 2 is the structural representation of the microscope base proving installation that provides of second embodiment of the invention.
Embodiment
Below in conjunction with accompanying drawing the present invention is described in further detail.
See also Fig. 1, a kind of microscope base proving installation 10 that first embodiment of the invention provides is used for the resistance of the anti-electromagnetic interference coating in the surface of microscope base is tested.Described microscope base proving installation 10 comprises 11, one test cells 12 in a fixing unit, at least one grip unit 133, and a control module 14.
Described fixing unit 11 comprises a holding parts 111 and a platform 112 that is used to carry microscope base 20.This holding parts 111 is used for the described microscope base 20 of fixing, and preferably, this holding parts can be a jaw, and when microscope base 20 was positioned on the platform 112, the holding parts 111 of described fixing unit 11 also was described jaw closure, described microscope base 20 can be fixed.
Described test cell 12 is in order to anti-electromagnetic interference (EMI) (the Flectromagnetic Interference in the surface of the microscope base 20 of described fixing unit 11 fixings, EMI) resistance of coating is tested, it can be an electrometer (Flectrometer), and described electrometer comprises a pair of probe 121.
The described test cell 12 of described control module 14 controls makes it keep certain value with the distance of described microscope base 20 when described microscope base 20 is tested, and receives the test value of the described test cell 12 of processing simultaneously and examines and determine whether described microscope base 20 is certified products.This control module 14 is described at least one grip unit 133 of control further, makes it carry out clamping and mobile to described microscope base 20.
Described grip unit 133 is used for the described microscope base 20 of clamping, it can be a jaw, and preferably, described microscope base proving installation 10 also further comprises a cantilever 18, described grip unit 133 and described test cell 12 are connected in the two ends of described cantilever 18, drive its motion by described cantilever 18.In addition, described microscope base proving installation 10 can further comprise a rotary unit 19, and it is connected on the described cantilever 18, as the middle part of cantilever 18, and can drive described cantilever 18 rotations.Be understandable that this rotary unit 19 can be a servo motor.
The course of work of the microscope base proving installation 10 that the embodiment of the invention one provides is as follows:
The described microscope base 20 of described grip unit 133 clampings also transmits it to described fixing unit 11.As shown in Figure 1, be loaded with several microscope bases 20 in first tray 21, the described cantilever 18 of described control module 14 controls drives described grip unit 133 and moves to this first tray 21, and near described microscope base 20, at this moment, jaw closure by the described grip unit 133 of described control module 14 controls can fix described microscope base 20, thereby the microscope base 20 that can drive described grip unit 133 and clamping thereof via described cantilever 18 again moves to described fixing unit 11.
Described fixing unit 11 fixes described microscope base 20.Particularly, the microscope base 20 that drives described grip unit 133 and clamping thereof when the described cantilever 18 of described control module 14 controls moves to described fixing unit 11, and when being positioned over described microscope base 20 on the platform 112, the jaw closure of described holding parts 111 can fix described microscope base 20.
The distance that described control module 14 described test cells 12 of control and described microscope base are 20 keeps certain value, and the while is tested by the resistance of the anti-electromagnetic interference coating in surface of 12 pairs of described microscope bases 20 of described test cell.Particularly, described control module is controlled described cantilever 18 and is driven described test cell 12, it also is the microscope base 20 that described electrometer moves also close described fixing unit 11 fixings, and control the surface of the probe 121 of described electrometer near described microscope bases 20, when the tip of described probe 121 (indicating) and described microscope base 20 reach certain distance the time, starting described test cell 12, also is the switch of described electrometer, begins the resistance of the anti-electromagnetic interference coating in the surface of described microscope base 20 is tested.What pay particular attention to is that in order to keep testing quality, when the resistance of the anti-electromagnetic interference coating in the surface of 12 pairs of described microscope bases 20 of described test cell was tested, the distance on the surface of the described relatively microscope base 20 of the need described probe 121 of maintenance was constant.
Described control module 14 receives the test value of handling described test cell 12 and examines and determine whether described microscope base 20 is certified products.Particularly, can obtain the reference value of calibrating substandard products and certified products by experimental technique, when described test value is less than or equal to this reference value, can examine and determine with the corresponding microscope base of this measured value 20 via described control module 14 and to be certified products, when described test value during, can examine and determine with the corresponding microscope base 20 of this measured value via described control module 14 and to be substandard products greater than this reference value.
Further, when being substandard products via the described microscope base 20 of described control module 14 calibratings, can be by the described rotary unit 19 of described control module 14 controls, it also is described servo motor rotation and drive described cantilever 18 rotations, make described grip unit 133 move to this and testedly be decided to be the microscope base 20 of substandard products and, thereby can drive these microscope bases 20 to described pallet 22 and placed thereon by described cantilever 18 with its clamping.Correspondingly, when being certified products via the described microscope base 20 of described control module 14 calibratings, can be via driving described microscope base 20 to described pallet 21 and placed thereon by described cantilever 18 with quadrat method.In sum, via pallet 21 and pallet 22 are set, can be with described through microscope base 20 separate processes of calibrating for substandard products or certified products.
See also Fig. 2, the microscope base proving installation 30 that second embodiment of the invention provides is compared with the microscope base proving installation 10 that first embodiment provides, its difference is that described microscope base proving installation 30 comprises a plurality of grip unit such as grip unit 131, grip unit 132 and grip unit 133.Accordingly, described control module 14 control described grip unit 131, grip unit 132 and grip unit 133 make it carry out clamping and mobile to described microscope base 20.
Further, described grip unit 131, grip unit 132 and grip unit 133 are in order to clamping and transmit described microscope base 20, and it is respectively a jaw.Described grip unit 133 is used for clamping through described test cell 12 tests, and is that described control module 14 calibratings are the microscope base 20 of substandard products.In addition, described microscope base proving installation 30 also comprises a cantilever 16, and described grip unit 131 and described grip unit 132 are connected in the two ends of described cantilever 16, and drives its motion by described cantilever 16.Preferably, described microscope base proving installation 30 can comprise a rotary unit 17, and it is connected on the described cantilever 16, as the middle part of cantilever 16, and can drive described cantilever 16 rotations.Be understandable that this rotary unit 17 can be a servo motor.
The course of work of the microscope base proving installation 10 that provides with the embodiment of the invention one is compared, and the difference of the course of work of the microscope base proving installation 30 that embodiment two provides is:
At first, by described grip unit 131 and the described microscope base 20 of grip unit 132 clampings to described fixing unit 11.Particularly, be loaded with several microscope bases 20 in first tray 21, the described cantilever 16 of described control module 14 controls drives described grip unit 131 and moves to this first tray 21 with described grip unit 132, and near described microscope base 20, at this moment, by the jaw closure of the described grip unit 131 of described control module 14 controls with described grip unit 132, described microscope base 20 can be fixed, thereby the microscope base 20 that can drive described grip unit 131 and described grip unit 132 and clamping thereof via described cantilever 16 again moves to described fixing unit 11.
Secondly, when described grip unit 131 or described grip unit 132 are clamped to described fixing unit 11 with described microscope base 20, and after being positioned over described platform 112, can be by the described rotary unit 17 of described control module 14 controls, it also is described servo motor rotation and drive described cantilever 16 certain angle of rotation, make described grip unit 131 or described grip unit 132 depart from certain angle with described fixing unit 11, thereby in the time of can making described test cell 12 move to described fixing unit 11, can not interfere with described grip unit 131 or described grip unit 132.
Further, when being substandard products via the described microscope base 20 of described control module 14 calibratings, can be by the described rotary unit 19 of described control module 14 controls, it also is described servo motor rotation and drive described cantilever 18 rotations, make described grip unit 133 move to this and testedly be decided to be the microscope base 20 of substandard products and, thereby can drive these microscope bases 20 to described pallet 22 and placed thereon by described cantilever 18 with its clamping.Correspondingly, when being certified products via the described microscope base 20 of described control module 14 calibratings, can be by the described rotary unit 17 of described control module 14 controls, it also is described servo motor rotation and drive described cantilever 16 rotations, make described grip unit 131 or described grip unit 132 move to described fixing unit 11, thereby can will these tested microscope base 20 clampings that are decided to be certified products, and move and be positioned on the described pallet 21 by described cantilever 16 by described grip unit 131 or described grip unit 132.
In addition, from the above, described cantilever 16 can drive described grip unit 131 and the grip unit 132 that is connected in its two ends and move to described pallet 21, thereby can be disposable respectively by described grip unit 131 and two microscope bases of described grip unit 132 clampings.Be understandable that described grip unit 131 or described grip unit 132 are positioned over precedence on the described platform 112 with described microscope base 20, can be controlled by described control module 14.
Microscope base proving installation 10 and method of testing that the embodiment of the invention provides, it is by being provided with at least one grip unit, as grip unit 131, grip unit 132 and grip unit 133 microscope base 20 with clamping and as described in moving, simultaneously via a control module 14 being set with the distance between test cell 12 and the microscope base 20 in the control test process, not only realize the robotization of microscope base 20 tests, also reached preferable test quality.
Be understandable that, for the person of ordinary skill of the art, can make other various corresponding changes and distortion by technical conceive according to the present invention, and all these change the protection domain that all should belong to claim of the present invention with distortion.
Claims (9)
1. a microscope base proving installation is used for the resistance of the anti-electromagnetic interference coating of surface of mirror base is tested, and described microscope base proving installation comprises:
A fixing unit, described fixing unit is in order to the fixing microscope base;
A test cell, described test cell is tested in order to the resistance to the anti-electromagnetic interference coating in surface of the microscope base of described fixing unit fixing;
At least one grip unit is used for clamping and transmits described microscope base; And
A control module, the distance of described test cell and described microscope base keeps certain value when in order to control described test cell described microscope base being tested, and receives the test value of handling described test cell simultaneously and whether examine and determine described microscope base be certified products and control described at least one grip unit and described microscope base is carried out clamping and move.
2. microscope base proving installation as claimed in claim 1 is characterized in that, described test cell is an electrometer, and described electrometer comprises a pair of probe.
3. microscope base proving installation as claimed in claim 1 is characterized in that, described fixing unit comprises a holding parts and a platform that is used to carry described microscope base.
4. microscope base proving installation as claimed in claim 3 is characterized in that, described holding parts is a jaw.
5. microscope base proving installation as claimed in claim 1 is characterized in that, described grip unit is a jaw.
6. microscope base proving installation as claimed in claim 1 is characterized in that, described microscope base proving installation further comprises at least one cantilever, and described grip unit is connected in described cantilever and drives its motion by described cantilever.
7. microscope base proving installation as claimed in claim 6 is characterized in that, described microscope base proving installation further comprises at least one rotary unit corresponding to described cantilever, and described rotary unit is arranged at described cantilever and drives described cantilever rotation.
8. microscope base proving installation as claimed in claim 7 is characterized in that, described rotary unit is a servo motor.
9. microscope base method of testing that adopts microscope base proving installation as claimed in claim 1, it may further comprise the steps:
The described microscope base of described grip unit clamping also transfers to described fixing unit with described microscope base;
Described fixing unit fixes described microscope base;
The distance that described control module is controlled between described test cell and described microscope base keeps certain value, by described test cell the resistance of the anti-electromagnetic interference coating in surface of described microscope base is tested simultaneously;
Whether described control module receives the test value of handling described test cell and examines and determine described microscope base is certified products.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007102005103A CN101295126B (en) | 2007-04-25 | 2007-04-25 | Lens seat testing device and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007102005103A CN101295126B (en) | 2007-04-25 | 2007-04-25 | Lens seat testing device and method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101295126A true CN101295126A (en) | 2008-10-29 |
| CN101295126B CN101295126B (en) | 2010-06-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007102005103A Expired - Fee Related CN101295126B (en) | 2007-04-25 | 2007-04-25 | Lens seat testing device and method |
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| Country | Link |
|---|---|
| CN (1) | CN101295126B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103185816A (en) * | 2011-12-29 | 2013-07-03 | 鸿富锦精密工业（深圳）有限公司 | Positioning device |
| CN104704623B (en) * | 2012-10-09 | 2017-07-25 | 东京毅力科创株式会社 | Probe card installation method |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4024397A (en) * | 1970-09-28 | 1977-05-17 | Barnes Engineering Company | Shock resistant encapsulated infrared detector |
| GB2309603B (en) * | 1996-01-26 | 2000-06-21 | Asahi Optical Co Ltd | Electronically controlled camera |
| CN2570732Y (en) * | 2002-10-11 | 2003-09-03 | 徐春云 | Precision measuring instrument |
-
2007
- 2007-04-25 CN CN2007102005103A patent/CN101295126B/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103185816A (en) * | 2011-12-29 | 2013-07-03 | 鸿富锦精密工业（深圳）有限公司 | Positioning device |
| CN103185816B (en) * | 2011-12-29 | 2017-06-23 | 赛恩倍吉科技顾问（深圳）有限公司 | Positioner |
| CN104704623B (en) * | 2012-10-09 | 2017-07-25 | 东京毅力科创株式会社 | Probe card installation method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101295126B (en) | 2010-06-02 |
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