CN101424870B - Lens seat testing device and method - Google Patents
Lens seat testing device and method Download PDFInfo
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- CN101424870B CN101424870B CN2007102023239A CN200710202323A CN101424870B CN 101424870 B CN101424870 B CN 101424870B CN 2007102023239 A CN2007102023239 A CN 2007102023239A CN 200710202323 A CN200710202323 A CN 200710202323A CN 101424870 B CN101424870 B CN 101424870B
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- microscope base
- microscope
- control module
- proving installation
- test cell
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Abstract
The invention relates to a microscope base testing device and a testing method thereof, which are used for automatically testing the resistance of anti-electromagnetic interference coating layers on the surfaces of a plurality of microscope bases. The microscope base testing device comprises a bearing platform, a control unit and a testing unit. The bearing platform is used for bearing an array formed by the microscope bases; the control unit is used for controlling the bearing platform to move within a plane coordinate where the control unit is positioned and aligning with the microscope bases and the testing units, so that the testing unit is used for testing the resistance of the anti-electromagnetic interference coating layers on the surfaces of the microscope bases in sequence and sending testing results to the controlling unit to judge whether the microscope bases are qualified or not. The microscope base testing device further comprises a removing unit; and the control unit controls the removing unit to remove the unqualified microscope bases.
Description
Technical field
The present invention relates to a kind of proving installation and method of testing, relate in particular to proving installation and method of testing that a kind of microscope base to the camera lens module carries out the surface resistance test.
Background technology
Along with the development of camera technique, the camera lens module is widely used in the camera head of various uses, and the camera lens module combines with various portable electron devices such as mobile phone, computing machine etc., more obtains numerous consumers' favor.
Yet along with the direction of portable electron device towards functional diversities develops, its element also becomes and becomes increasingly complex, and described element need switch on mostly and could work, and this causes described portable electron device to be easy to influence because of electromagnetic interference (EMI) operate as normal.
The camera lens module is usually as the element of camera head and be widely used in the portable electron device, and it generally comprises eyeglass, microscope base, optical filter and image sensor etc.The method for designing of eyeglass sees also the paper Aspheric lens design that people such as Chao deliver in IEEE system in 2000, ultrasound wave meeting (2000 IEEE UltrasonicsSymposium).In order to reduce the degree that described image sensor is subjected to electromagnetic interference (EMI), general last layer anti-electromagnetic interference (EMI) (Electromagnetic Interference, EMI) coating of also need being coated with in the surface of described microscope base.
After anti-electromagnetic interference (EMI) coating was coated on the surface of microscope base, whether the resistance value of utilizing electrometer (Electrometer) to test this coating reaches requirement was judged whether this microscope base is non-defective unit.Common way is sampling and comes the resistance value of specimen coating with manual type operation of electrostatic meter, be understandable that, this method both expended time in and measuring error bigger, yields is lower.
In view of this, be necessary to provide the resistivity of the anti-electromagnetic interference coating of a kind of seating face of test mirrors quick and precisely, improve the robotization microscope base proving installation and the automated testing method of yields.
Summary of the invention
Below will with specific embodiment illustrate a kind of can be accurately the robotization microscope base proving installation and the robotization microscope base method of testing of the resistance of the anti-electromagnetic interference coating of test mirrors seating face efficiently.
A kind of microscope base proving installation, be used for the resistance of the anti-electromagnetic interference coating of a plurality of surface of mirror base is tested, it is characterized in that, described microscope base proving installation comprises: a carrying platform, described carrying platform carries the array that described a plurality of microscope base is formed, and test cell, described carrying platform moves in its place coordinate plane, successively described a plurality of microscope bases are moved to described test cell and aim at, described test cell is tested the resistance of the anti-electromagnetic interference coating of described a plurality of surface of mirror base successively.
Described microscope base proving installation further comprises a control module, move in its place planimetric coordinates in order to control described carrying platform, successively described a plurality of microscope bases are moved to described test cell and aim at, described test cell is tested the resistance of the anti-electromagnetic interference coating of described a plurality of surface of mirror base successively, and described test cell is delivered to described control module with the position encoded value of test result and corresponding microscope base thereof.Described control module receives described test result and judges whether its corresponding microscope base is non-defective unit, record is the position encoded value of non-non-defective unit microscope base down, described microscope base proving installation comprises that further removes a device, the described device that removes has a chuck, the described device that removes of described control module control is removed in order to the described non-non-defective unit microscope base of clamping and with it.
And, a kind of microscope base method of testing that adopts above-mentioned microscope base proving installation, it may further comprise the steps:
(1) provides a described microscope base proving installation;
(2) described carrying platform moves in its place planimetric coordinates, successively described a plurality of microscope bases are aimed at described test cell, described test cell is tested the resistance of the anti-electromagnetic interference coating of described a plurality of surface of mirror base successively, and the position encoded value of test result and corresponding microscope base is delivered to described control module successively;
(3) described control module judges that according to described test result whether its corresponding microscope base is non-defective unit, notes the position encoded value of non-non-defective unit microscope base;
(4) described control module is controlled described non-non-defective unit microscope base and is aimed at described grip unit according to the position encoded value of non-non-defective unit microscope base, and then controls the non-non-defective unit microscope base that described grip unit will aim at it and remove.
With respect to prior art, described microscope base proving installation and method of testing, it successively to the quick measurement of a plurality of microscope bases, has improved the efficient that measures by robotization control probe greatly, even can reach unsample and the target all measured, improved yields more.
Description of drawings
Fig. 1 is the structural representation of the microscope base proving installation that provides of first embodiment of the invention.
Fig. 2 is the structural representation of the microscope base proving installation that provides of second embodiment of the invention.
Embodiment
Below in conjunction with accompanying drawing the present invention is described in further detail.
See also Fig. 1, a kind of microscope base proving installation 10 that first embodiment of the invention provides is used for the resistance of the anti-electromagnetic interference coating of the external peripheral surface of microscope base 110 is tested.Described microscope base proving installation 10 comprises a carrying platform 11, a test cell 12 and a control module 13.
Described carrying platform 11 is in order to carry the array that a plurality of microscope bases 110 are formed.Described carrying platform 11 can move in its plane, place, preferably, described microscope base proving installation 10 also comprises independently step motor (figure does not show) of a pedestal 15 and two, described carrying platform 11 connects described two step motor, described control module 13 with described two independently step motor be electrically connected, with provide electric pulse to described two independently the step motor electric pulse move along X-axis shown in Figure 1 and Y-axis coordinate respectively with respect to described pedestal 15 to drive described carrying platform 11.
Described test cell 12 is positioned at described carrying platform 11 tops, be electrically connected with described control module 13, prevent electromagnetic interference (EMI) (Electromagnetic Interference in order to surface to described a plurality of microscope bases 110, EMI) resistance of coating is tested, preferably, described test cell 12 can be an electrometer (Electrometer), and described electrometer comprises a pair of probe 121.
Particularly, described carrying platform 11 moves in its place planimetric coordinates, move in X as shown in Figure 1, the Y-axis coordinate plane, successively described a plurality of microscope bases 110 are moved to described test cell 12 and aim at, any 2 points of described probe 121 described microscope base 110 outer circumference surfaces of contact, to measure the resistance of the anti-electromagnetic interference coating of described microscope base 110 outer circumference surfaces, then, described test cell 12 is tested the resistance of the anti-electromagnetic interference coating of next microscope base 110 outer circumference surfaces successively.
Described control module 13 comprises a power supply 131, a resistance information processing unit 132 and a positional information storer 133, particularly, described power supply 131 provide respectively electric pulse to described two independently step motor its work is moved at described X-axis coordinate direction and Y-axis coordinate direction to drive described carrying platform 11.
Described test cell 12 is electrically connected with described resistance information processing unit 132, described test cell 12 is tested the resistance of the anti-electromagnetic interference coating of described a plurality of microscope base 110 outer circumference surfaces successively, and successively the described test result and the position encoded value of the microscope base 110 of correspondence is delivered to described resistance information processing unit 132 and positional information storer 133 respectively.Preferably, described test result is a resistance value, described resistance information processing unit 132 has a preset reference value, described resistance information processing unit 133 receives described test result, and relatively with itself and described reference value, thereby judge that described test result whether in non-defective unit value scope, judges with this whether its corresponding microscope base 110 is non-defective unit, and described positional information storer 133 is noted the position encoded value of non-non-defective unit microscope base 110.Preferably, the position encoded value of described non-non-defective unit microscope base 110 is its position encoded value, and particularly, Fig. 1 provides 6 described microscope bases 110, and its position encoded value is followed successively by (1,1), (1,2), (1,3), (2,1), (2,2) and (2,3).Described test cell 12 is stored the position encoded value of described a plurality of microscope base 110 in advance, described test cell 12 is tested the resistance of the anti-electromagnetic interference coating of described microscope base 110 outer circumference surfaces successively, and successively the position encoded value of corresponding microscope base 110 is delivered to described positional information storer 133.
Described microscope base proving installation 10 comprises that further removes a device 14, and the described device 14 that removes comprises a pair of chuck 141, in order to remove the non-non-defective unit microscope base 110 in described a plurality of microscope base 110.Particularly, described control module 13 is according to the position encoded value of the non-non-defective unit microscope base 110 under the described record, controlling described carrying platform 12 moves in described X, Y-axis coordinate plane, successively described non-non-defective unit microscope base 110 is moved to described a pair of chuck 141 and aim at, described a pair of chuck 141 picks up it and remove successively.
Preferably, described microscope base proving installation further comprises a support 16, it is fixed on the described pedestal 15, described test cell 12 removes the two ends that unit 14 is connected respectively to a lever 17 with described, be connected a servo motor 18 between described lever 17 and the described support 16, described control module 13 provides an electric current to make its rotation to described servo motor, thereby can drive described lever 17 around described support 16 rotations, thereby make described test cell 12 and the described unit 14 mutual reversing of position that remove, described control module is controlled 12 pairs of described a plurality of microscope bases 110 of described test cell according to this and is carried out resistance test or control the described 13 pairs of described non-non-defective unit microscope bases 110 in unit that remove removing.
The step of the microscope base method of testing of the microscope base proving installation 10 of first embodiment provided by the invention is as follows:
(1) provides described microscope base proving installation 10;
(2) described test cell 12 is measured described a plurality of microscope bases 110 successively, and test result is delivered to described control module 13 successively;
(3) described control module 13 judges that according to described test result whether its corresponding microscope base is non-defective unit, notes the position encoded value of non-non-defective unit microscope base;
(4) described control module 13 is controlled the described unit 14 that removes described non-non-defective unit microscope base is removed according to the position encoded value of non-non-defective unit microscope base.
The microscope base proving installation 10 of first embodiment provided by the invention and microscope base method of testing, it is by being provided with a test cell 12, carry the carrying platform 11 of a plurality of microscope bases 110 and one and remove device 14, and move and realize that 12 pairs of a plurality of microscope bases 110 of described test cell prevent the robotization of the resistance test of electromagnetic interference coating to control described carrying platform 11 via described control module 14, and control described carrying platform and move and realize that robotization removes non-non-defective unit microscope base 110, thereby realized quick measurement to a plurality of microscope bases, reduce the test duration, improved the efficient of test greatly, even can reach unsample and the target all measured, improved yields more.
See also the microscope base proving installation 20 of second embodiment that Fig. 2 provides, the difference of the microscope base proving installation 10 of itself and described first embodiment is, described test cell comprises many to probe 221, the a plurality of microscope bases 210 of carrying on the described carrying platform 21,210 one-tenth array arrangements of described a plurality of microscope base, described test cell has many to probe 221, describedly manyly can be simultaneously prevent the resistance test of electromagnetic interference coating to row of described array or described a plurality of microscope bases 210 of delegation to probe 221, save the test duration more, improve testing efficiency.
Be understandable that, for the person of ordinary skill of the art, can make other various corresponding changes and distortion by technical conceive according to the present invention, and all these change the protection domain that all should belong to claim of the present invention with distortion.
Claims (9)
1. microscope base proving installation is used for the resistance of the anti-electromagnetic interference coating of a plurality of surface of mirror base is tested, and it is characterized in that described microscope base proving installation comprises:
A carrying platform, described carrying platform carry the array that described a plurality of microscope base is formed;
A control module is controlled described carrying platform and is moved in its place planimetric coordinates; And
A test cell, it is electrically connected with described control module, described carrying platform carries described a plurality of microscope base and moves in its place planimetric coordinates, successively described a plurality of microscope bases are aimed at described test cell, described test cell is tested the resistance of the anti-electromagnetic interference coating of described a plurality of surface of mirror base successively, and the position encoded value of described test result and the microscope base corresponding with it is delivered to described control module.
2. microscope base proving installation as claimed in claim 1, it is characterized in that, described microscope base proving installation further comprises the step motor of two independent controls, described carrying platform connects described two step motor, described control module with described two independently step motor be electrically connected, with provide electric pulse to described two independently step motor move along two the vertical change in coordinate axis direction in its plane, place to drive described carrying platform.
3. microscope base proving installation as claimed in claim 1 is characterized in that, described test cell is an electrometer, and described electrometer comprises a pair of probe.
4. microscope base proving installation as claimed in claim 2, it is characterized in that, described control module comprises a power supply, a resistance information processing unit, a positional information storer, described power supply provides electric pulse to described two step motor, move along two the vertical change in coordinate axis direction in its plane, place in order to drive described carrying platform, described test cell is delivered to described resistance information processing unit and positional information storer with the position encoded value of test result and the microscope base corresponding with it respectively.
5. microscope base proving installation as claimed in claim 1 is characterized in that, described microscope base proving installation comprises that further removes a device, and the described device that removes has a chuck.
6. microscope base proving installation as claimed in claim 5, it is characterized in that, described microscope base proving installation further comprises a pedestal, a support and a lever, described support is positioned on the described pedestal, described lever is fixed on the described support, the connecting portion of described lever and described support has a servo motor, describedly remove the two ends that device and described test cell are connected respectively to described lever, described control module is electrically connected with described servo motor, described control module provides an electric current to make its rotation to described servo motor, rotate around described support to drive described lever, so that described test cell and the described mutual reversing of position in unit that removes, to control described microscope base proving installation test or to remove described microscope base.
7. microscope base method of testing, it may further comprise the steps:
(1) provide a microscope base proving installation, it comprises the carrying platform of the array that a test cell, a grip unit, a control module and a plurality of microscope bases of a carrying are formed;
(2) described carrying platform moves in its place planimetric coordinates, successively described a plurality of microscope bases are aimed at described test cell, described test cell is tested the resistance of the anti-electromagnetic interference coating of described a plurality of surface of mirror base successively, and the position encoded value of test result and corresponding microscope base is delivered to described control module successively;
(3) described control module judges that according to described test result whether its corresponding microscope base is non-defective unit, notes the position encoded value of non-non-defective unit microscope base;
(4) described control module is controlled described grip unit described non-non-defective unit microscope base is removed according to the position encoded value of non-non-defective unit microscope base.
8. microscope base method of testing as claimed in claim 7, described control module comprises a resistance information processing unit, a positional information storer, described test cell is delivered to described resistance information processing unit and positional information storer with the position encoded value of described test result and the microscope base corresponding with it respectively, described resistance information processing unit judges whether its corresponding microscope base is non-defective unit, the position encoded value of non-non-defective unit microscope base under the described position encoded value processor for recording according to described test result.
9. microscope base method of testing as claimed in claim 8, described resistance information processing unit has a preset reference value, described resistance information unit receives described test result, and relatively with itself and described reference value, judge that it whether in the resistance value scope of non-defective unit, judges according to this whether the microscope base of described test result correspondence is non-defective unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007102023239A CN101424870B (en) | 2007-10-31 | 2007-10-31 | Lens seat testing device and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007102023239A CN101424870B (en) | 2007-10-31 | 2007-10-31 | Lens seat testing device and method |
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| Publication Number | Publication Date |
|---|---|
| CN101424870A CN101424870A (en) | 2009-05-06 |
| CN101424870B true CN101424870B (en) | 2011-09-28 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2007102023239A Expired - Fee Related CN101424870B (en) | 2007-10-31 | 2007-10-31 | Lens seat testing device and method |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102262186A (en) * | 2010-05-28 | 2011-11-30 | 深圳富泰宏精密工业有限公司 | Antenna testing jig |
| TWI684007B (en) * | 2016-05-18 | 2020-02-01 | 佳思科技有限公司 | Static dissipation structure of semiconductor test fixture |
| CN109089107B (en) * | 2017-06-14 | 2021-12-24 | 宁波舜宇光电信息有限公司 | Batch camera module testing equipment and testing system thereof |
| CN112596335A (en) * | 2017-07-13 | 2021-04-02 | 宁波舜宇光电信息有限公司 | Transmission system for camera module test |
| TWI640409B (en) * | 2017-08-01 | 2018-11-11 | 蔡宜興 | Micro resistance inspection device and inspection method thereof |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4514086A (en) * | 1982-01-05 | 1985-04-30 | Stine Edward V | Apparatus for measuring refractive properties of lenses and other transmissive devices |
| CN2570732Y (en) * | 2002-10-11 | 2003-09-03 | 徐春云 | Precision measuring instrument |
| CN1639577A (en) * | 2002-03-22 | 2005-07-13 | 电子科学工业公司 | Test probe alignment apparatus |
-
2007
- 2007-10-31 CN CN2007102023239A patent/CN101424870B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4514086A (en) * | 1982-01-05 | 1985-04-30 | Stine Edward V | Apparatus for measuring refractive properties of lenses and other transmissive devices |
| CN1639577A (en) * | 2002-03-22 | 2005-07-13 | 电子科学工业公司 | Test probe alignment apparatus |
| CN2570732Y (en) * | 2002-10-11 | 2003-09-03 | 徐春云 | Precision measuring instrument |
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| CN101424870A (en) | 2009-05-06 |
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