TWI437228B - Holder testing apparatus and testing method - Google Patents
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Description
本發明涉及一種測試裝置及測試方法,尤其涉及一種對鏡頭模組之鏡座進行表面電阻測試之測試裝置及測試方法。 The invention relates to a testing device and a testing method, in particular to a testing device and a testing method for performing surface resistance testing on a lens holder of a lens module.
隨著攝像技術之發展,鏡頭模組於各種用途之攝像裝置中得到廣泛之應用,鏡頭模組與各種可擕式電子裝置如手機、電腦等之結合,更得到眾多消費者之青睞。 With the development of camera technology, the lens module has been widely used in various types of camera devices. The combination of the lens module and various portable electronic devices such as mobile phones and computers has been favored by many consumers.
然,隨著可擕式電子裝置朝著功能多樣化之方向發展,其元件亦變得越來越複雜,且該元件大多需通電才能工作,這導致該可擕式電子裝置很容易因為電磁干擾而影響正常工作。 However, as portable electronic devices are moving toward functional diversification, their components are becoming more and more complex, and most of the components need to be powered to work, which makes the portable electronic device susceptible to electromagnetic interference. And affect normal work.
鏡頭模組作為攝像裝置之必需元件而廣泛地應用於各種可擕式電子裝置中,其一般包括鏡片、鏡座、濾光片及影像感測器等。鏡片之設計方法請參閱Chao等人於2000 IEEE Ultrasonics Symposium上發表之論文Aspheric lens design。為了降低該影像感測器受電磁干擾之程度,一般還需於該鏡座之表面塗上一層防電磁干擾(Electromagnetic Interference,EMI)塗層。 The lens module is widely used in various portable electronic devices as an essential component of an imaging device, and generally includes a lens, a lens holder, a filter, an image sensor, and the like. For the design method of the lens, please refer to the paper Aspheric lens design published by Chao et al. in 2000 IEEE Ultrasonics Symposium. In order to reduce the degree of electromagnetic interference of the image sensor, it is generally required to apply an anti-electromagnetic interference (EMI) coating on the surface of the mirror holder.
當鏡座之表面塗上防電磁干擾(EMI)塗層後,利用靜電計(Electrometer)測試該塗層之電阻值是否達到要求來判斷該鏡座 是否為良品。通常之做法為抽樣並用人工方式操作靜電計來測試樣品塗層之電阻值,這種方法既耗費時間且測量誤差較大,良品率較低。 After the surface of the mirror base is coated with an electromagnetic interference (EMI) coating, the electrostat is used to test whether the resistance value of the coating meets the requirements. Whether it is good. The usual practice is to sample and manually operate the electrometer to test the resistance of the sample coating. This method is time consuming and has large measurement errors and low yield.
有鑒於此,有必要提供一種能快速準確測試鏡座表面防電磁幹擾干擾塗層之電阻率,提高良品率之自動化鏡座測試裝置及自動化測試方法。 In view of this, it is necessary to provide an automatic mirror mount test device and an automated test method capable of quickly and accurately testing the resistivity of the surface of the mirror mount against electromagnetic interference interference coatings and improving the yield.
下面將以具體實施例說明一種能準確快捷之測試鏡座表面防電磁干擾塗層電阻之自動化鏡座測試裝置及自動化鏡座測試方法。 In the following, an automatic mirror test device and an automated mirror test method capable of accurately and quickly testing the surface of the mirror mount against electromagnetic interference coatings will be described.
一種鏡座測試裝置,用於對複數個鏡座表面之防電磁干擾塗層之電阻進行測試,其中,該鏡座測試裝置包括:一承載平臺,該承載平臺承載該複數個鏡座組成之陣列,以及一測試單元,該承載平臺於其所在座標平面內移動,依次將該複數個鏡座移至與該測試單元對準,該測試單元依次對該複數個鏡座表面之防電磁干擾塗層之電阻進行測試。 A lens holder testing device for testing resistance of an electromagnetic interference preventing coating on a plurality of lens holder surfaces, wherein the lens holder testing device comprises: a carrying platform, the carrying platform carrying the array of the plurality of lens holders And a test unit, the carrier platform moves in a coordinate plane thereof, and sequentially moves the plurality of lens holders to be aligned with the test unit, and the test unit sequentially performs an electromagnetic interference coating on the surface of the plurality of lens holders. The resistance is tested.
該鏡座測試裝置進一步包括一控制單元,用以控制該承載平臺於其所在平面座標內移動,依次將該複數個鏡座移至與該測試單元對準,該測試單元依次對該複數個鏡座表面之防電磁干擾塗層之電阻進行測試,該測試單元將測試結果及其對應之鏡座之位置編碼值送至該控制單元。該控制單元接收該測試結果判斷其對應之鏡座是否為良品,記錄下非良品鏡座之位置編碼值,該鏡座測試裝置進一步包括一移除裝置,該移除裝置具有一夾頭,該控制單元控制該移除裝置,用以夾持該非良品鏡座並將其移走。 The lens holder test device further includes a control unit for controlling the movement of the carrier platform within the plane coordinates thereof, and sequentially moving the plurality of lens holders to be aligned with the test unit, and the test unit sequentially processes the plurality of mirrors The resistance of the anti-electromagnetic interference coating on the seat surface is tested, and the test unit sends the test result and the position code value of the corresponding mirror base to the control unit. The control unit receives the test result to determine whether the corresponding lens holder is a good product, and records the position code value of the non-good lens holder. The lens holder testing device further includes a removing device, and the removing device has a chuck. The control unit controls the removal device to clamp the non-good lens holder and remove it.
以及,一種採用上述鏡座測試裝置之鏡座測試方法,其包括以下步驟:(1)提供一該鏡座測試裝置;(2)該測試單元依次對該複數個鏡座測量,並將測量結果與對應之鏡座之位置編碼值依次送至該控制單元;(3)該控制單元依據該測試結果判斷其對應之鏡座是否為良品,記錄下非良品鏡座之位置編碼值;(4)該控制單元依非良品鏡座之位置編碼值,控制該非良品鏡座與該夾持單元對準,進而控制該夾持單元將與其對準之非良品鏡座移走。 And a lens holder test method using the above-mentioned lens holder test device, comprising the steps of: (1) providing a test stand test device; (2) the test unit sequentially measuring the plurality of lens mounts, and measuring the result And the position code value of the corresponding lens holder is sequentially sent to the control unit; (3) the control unit determines whether the corresponding lens holder is a good product according to the test result, and records the position code value of the non-good lens holder; (4) The control unit controls the non-good lens holder to be aligned with the clamping unit according to the position coded value of the non-good lens holder, thereby controlling the clamping unit to remove the non-good lens holder aligned with the clamping unit.
相對於先前技術,該鏡座測試裝置及測試方法,其藉由自動化控制探針依次對複數個鏡座之快速測量,大大提高了量測之效率,甚至可達到不抽樣而全部進行測量之目標,更加提高了良品率。 Compared with the prior art, the mirror test device and the test method quickly measure the efficiency of the measurement by using the automatic control probe to quickly measure the plurality of lens holders, and even achieve the goal of not measuring all of the samples without sampling. , which has improved the yield rate.
10,20‧‧‧鏡座測試裝置 10,20‧‧‧Mirror test device
11,21‧‧‧承載平臺 11,21‧‧‧bearing platform
12,22‧‧‧測試單元 12,22‧‧‧Test unit
13‧‧‧控制單元 13‧‧‧Control unit
14‧‧‧移除單元 14‧‧‧Remove unit
15‧‧‧基座 15‧‧‧Base
16‧‧‧支架 16‧‧‧ bracket
17‧‧‧槓桿 17‧‧‧Leverage
110,210‧‧‧鏡座 110,210‧‧‧ mirror base
121,221‧‧‧探針 121,221‧‧‧ probe
131‧‧‧電源 131‧‧‧Power supply
132‧‧‧訊號處理單元 132‧‧‧Signal Processing Unit
133‧‧‧位置資料記憶體 133‧‧‧Location data memory
141‧‧‧夾頭 141‧‧‧ chuck
18‧‧‧伺服馬達 18‧‧‧Servo motor
圖1係本發明第一實施例提供之鏡座測試裝置之結構示意圖。 1 is a schematic structural view of a lens holder testing device according to a first embodiment of the present invention.
圖2係本發明第二實施例提供之鏡座測試裝置之結構示意圖。 2 is a schematic structural view of a lens holder testing device according to a second embodiment of the present invention.
下面將結合圖式對本發明作進一步詳細說明。 The invention will now be described in further detail with reference to the drawings.
請參閱圖1,本發明第一實施例提供之一種鏡座測試裝置10,用於對鏡座110之外圓周表面之防電磁干擾塗層之電阻進行測試。該鏡座測試裝置10包括一承載平臺11、一測試單元12及一控制單 元13。 Referring to FIG. 1, a first embodiment of the present invention provides a lens holder testing device 10 for testing the resistance of an electromagnetic interference coating on the outer circumferential surface of the lens holder 110. The lens holder testing device 10 includes a carrying platform 11 , a testing unit 12 and a control list Yuan 13.
該承載平臺11用以承載複數個鏡座110所組成之陣列。該承載平臺11可於其所在平面內移動,優選地,該鏡座測試裝置10還包括一基座15與兩個獨立之步進馬達(圖未示),該承載平臺11連接該兩個步進馬達,該控制單元13與該兩個獨立之步進馬達電連接,以提供電脈衝給該兩個獨立之步進馬達電脈衝以驅動該承載平臺11相對於該基座15分別沿圖1所示之X軸與Y軸座標移動。 The carrying platform 11 is configured to carry an array of a plurality of lens mounts 110. The carrying platform 11 is movable in a plane in which it is located. Preferably, the mirror testing device 10 further includes a base 15 and two independent stepping motors (not shown). The carrying platform 11 connects the two steps. Into the motor, the control unit 13 is electrically connected to the two independent stepping motors to provide electrical pulses to the two independent stepping motor electrical pulses to drive the carrying platform 11 relative to the base 15 respectively along FIG. The X-axis and Y-axis coordinates shown are moved.
該測試單元12位於該承載平臺11上方,與該控制單元13電連接,用以對該複數個鏡座110之表面防電磁干擾(Electromagnetic Interference,EMI)塗層之電阻進行測試,優選地,該測試單元12可為一靜電計(Electrometer),且該靜電計包括一對探針121。 The test unit 12 is located above the carrying platform 11 and is electrically connected to the control unit 13 for testing the resistance of the surface of the plurality of mirror mounts 110, preferably The test unit 12 can be an electrometer and the electrometer includes a pair of probes 121.
具體地,該承載平臺11於其所在平面座標內移動,如圖1所示之X、Y軸座標平面內移動,依次將該複數個鏡座110移至與該測試單元12對準,該探針121接觸該鏡座110外圓周面任意兩點,以測量該鏡座110外圓周面防電磁干擾塗層之電阻,然後,該測試單元12依次對下一鏡座110外圓周面防電磁干擾塗層之電阻進行測試。 Specifically, the carrying platform 11 moves within the coordinate coordinates of the plane, and moves in the X and Y axis coordinate planes as shown in FIG. 1 , and the plurality of lens mounts 110 are sequentially moved to be aligned with the testing unit 12 . The needle 121 contacts any two points on the outer circumferential surface of the lens holder 110 to measure the resistance of the outer circumferential surface of the lens holder 110 against electromagnetic interference coating. Then, the testing unit 12 sequentially prevents electromagnetic interference on the outer circumferential surface of the next lens holder 110. The resistance of the coating was tested.
該控制單元13包括一電源131、一電阻訊號處理單元132與一位置資料記憶體133,具體地,該電源131分別提供電脈衝給該兩個獨立之步進馬達使其工作以驅動該承載平臺11於該X軸座標方向與Y軸座標方向移動。 The control unit 13 includes a power source 131, a resistance signal processing unit 132 and a position data memory 133. Specifically, the power source 131 provides electrical pulses to the two independent stepping motors to operate the carrier platform. 11 moves in the X-axis coordinate direction and the Y-axis coordinate direction.
該測試單元12與該電阻訊號處理單元132電連接,該測試單元12依次對該複數個鏡座110外圓周面防電磁干擾塗層之電阻進行測試,並依次將該測試結果與對應之鏡座110之位置編碼值分別送至該電阻訊號處理單元132與位置資料記憶體133。優選地,該測試結果為電阻值,該電阻訊號處理單元132具有一預設之基準值,該電阻訊號處理單元133接收該測試結果,並將其與該基準值比較,從而判斷該測試結果是否於良品值範圍內,以此判斷其對應之鏡座110是否為良品,該位置資料記憶體133記錄下非良品鏡座110之位置編碼值。優選地,該非良品鏡座110之位置編碼值為其位置編碼值,具體地,圖1給出6個該鏡座110,其位置編碼值依次為(1,1)、(1,2)、(1,3)、(2,1)、(2,2)及(2,3)。該測試單元12預先存儲該複數個鏡座110之位置編碼值,該測試單元12依次對該鏡座110外圓周面防電磁干擾塗層之電阻進行測試,並依次將對應鏡座110之位置編碼值送至該位置資料記憶體133。 The test unit 12 is electrically connected to the resistance signal processing unit 132. The test unit 12 sequentially tests the resistance of the outer circumferential surface of the plurality of lens holders 110, and sequentially compares the test result with the corresponding lens holder. The position code values of 110 are sent to the resistance signal processing unit 132 and the position data memory 133, respectively. Preferably, the test result is a resistance value, the resistance signal processing unit 132 has a preset reference value, and the resistance signal processing unit 133 receives the test result and compares it with the reference value to determine whether the test result is Within the range of the good value, it is determined whether the corresponding lens mount 110 is a good product, and the position data memory 133 records the position code value of the non-good lens mount 110. Preferably, the position code value of the non-good lens holder 110 is its position code value. Specifically, FIG. 1 shows six lens holders 110, and the position code values are (1, 1), (1, 2), (1,3), (2,1), (2,2), and (2,3). The test unit 12 pre-stores the position code values of the plurality of lens holders 110. The test unit 12 sequentially tests the resistance of the outer circumferential surface of the lens holder 110 against the electromagnetic interference coating, and sequentially encodes the position of the corresponding lens holder 110. The value is sent to the location data memory 133.
該鏡座測試裝置10進一步包括一移除裝置14,該移除裝置14包括一對夾頭141,用以移走該複數個鏡座110中之非良品鏡座110。具體地,該控制單元13依據該記錄下之非良品鏡座110之位置編碼值,控制該承載平臺12於該X、Y軸座標平面內移動,依次將該非良品鏡座110移至與該一對夾頭141對準,該一對夾頭141依次將其夾起並移開。 The mount test apparatus 10 further includes a removal device 14 that includes a pair of collets 141 for removing the non-conformal mirror mount 110 of the plurality of mounts 110. Specifically, the control unit 13 controls the loading platform 12 to move in the coordinate plane of the X and Y axes according to the position coded value of the non-good lens holder 110, and sequentially moves the non-good lens holder 110 to the one. Aligning the collet 141, the pair of collets 141 sequentially pick up and remove them.
優選地,該鏡座測試裝置進一步包括一支架16,其固定於該基座15上,該測試單元12與該移除單元14分別連接到一槓桿17之兩端 ,該槓桿17與該支架16之間連接一伺服馬達18,該控制單元13提供一電流給該伺服馬達18使其旋轉,從而可帶動該槓桿17繞該支架16旋轉,從而使得該測試單元12與該移除單元14互相調換位置,該控制單元13依此控制該測試單元12對該複數個鏡座110進行電阻測試或者控制該移除單元14對該非良品鏡座110進行移除。 Preferably, the lens holder testing device further includes a bracket 16 fixed to the base 15, and the testing unit 12 and the removing unit 14 are respectively connected to two ends of a lever 17. A servo motor 18 is connected between the lever 17 and the bracket 16. The control unit 13 supplies a current to the servo motor 18 to rotate, so that the lever 17 can be rotated around the bracket 16, thereby causing the test unit 12 to rotate. The removal unit 14 exchanges positions with each other, and the control unit 13 controls the test unit 12 to perform resistance test on the plurality of lens holders 110 or control the removal unit 14 to remove the non-good lens holder 110.
本發明提供之第一實施例之鏡座測試裝置10之鏡座測試方法之步驟如下:(1)提供該鏡座測試裝置10;(2)該測試單元12依次對該複數個鏡座110測量,並將測量結果依次送至該控制單元13;(3)該控制單元13依據該測試結果判斷其對應之鏡座是否為良品,記錄下非良品鏡座之位置編碼值;(4)該控制單元13依非良品鏡座之位置編碼值,控制該移除單元14將該非良品鏡座移走。 The steps of the lens holder testing method of the lens holder testing device 10 of the first embodiment provided by the present invention are as follows: (1) providing the lens holder testing device 10; (2) the testing unit 12 sequentially measuring the plurality of lens holders 110 And the measurement result is sent to the control unit 13 in sequence; (3) the control unit 13 determines whether the corresponding lens holder is a good product according to the test result, and records the position code value of the non-good lens holder; (4) the control The unit 13 controls the removal unit 14 to remove the non-good lens holder according to the position code value of the non-good lens holder.
本發明提供之第一實施例之鏡座測試裝置10及鏡座測試方法,其藉由設置一測試單元12、承載複數個鏡座110之承載平臺11與一移除裝置14,並經由該控制單元1413以控制該承載平臺11移動實現該測試單元12對複數個鏡座110進行防電磁干擾塗層之電阻測試之自動化,並控制該承載平臺移動實現自動化移除非良品鏡座110,從而實現了對複數個鏡座之快速測量,降低測試時間,大大提高了測試之效率,甚至可達到不抽樣而全部進行測量之目標,更加提高了良品率。 The present invention provides a lens holder testing device 10 and a lens holder testing method according to a first embodiment, which are provided by a test unit 12, a carrying platform 11 carrying a plurality of lens mounts 110, and a removing device 14, and via the control The unit 1413 controls the movement of the carrying platform 11 to realize the automation of the resistance test of the electromagnetic interference coating of the plurality of lens holders 110 by the testing unit 12, and controls the movement of the carrying platform to automatically remove the non-good lens holder 110, thereby realizing The rapid measurement of a plurality of mirror holders reduces the test time, greatly improves the efficiency of the test, and even achieves the goal of not measuring all of the samples, and further improves the yield.
請參閱圖2提供之第二實施例之鏡座測試裝置20,其與該第一實施例之鏡座測試裝置10之不同點在於,該測試單元22包括多對探針221,該承載平臺21上承載複數個鏡座210,該複數個鏡座210成陣列排布,該測試單元具有多對探針221,該多對探針221可另對該陣列之一列或者一行之該複數個鏡座210進行防電磁干擾塗層之電阻測試,更加節省測試時間,提高測試效率。 Please refer to the lens holder testing device 20 of the second embodiment provided in FIG. 2, which is different from the lens holder testing device 10 of the first embodiment in that the testing unit 22 includes a plurality of pairs of probes 221, and the carrying platform 21 Carrying a plurality of lens holders 210, the plurality of lens holders 210 are arranged in an array, the test unit has a plurality of pairs of probes 221, and the plurality of pairs of probes 221 may further comprise one or more rows of the plurality of lens holders of the array 210 conducts resistance test of anti-electromagnetic interference coating, which saves test time and improves test efficiency.
綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。 In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.
10‧‧‧鏡座測試裝置 10‧‧‧Mirror mount tester
11‧‧‧承載平臺 11‧‧‧Loading platform
12‧‧‧測試單元 12‧‧‧Test unit
13‧‧‧控制單元 13‧‧‧Control unit
14‧‧‧移除單元 14‧‧‧Remove unit
15‧‧‧基座 15‧‧‧Base
16‧‧‧支架 16‧‧‧ bracket
17‧‧‧槓桿 17‧‧‧Leverage
110‧‧‧鏡座 110‧‧‧ mirror base
121‧‧‧探針 121‧‧‧Probe
131‧‧‧電源 131‧‧‧Power supply
132‧‧‧訊號處理單元 132‧‧‧Signal Processing Unit
133‧‧‧位置資料記憶體 133‧‧‧Location data memory
141‧‧‧夾頭 141‧‧‧ chuck
18‧‧‧伺服馬達 18‧‧‧Servo motor
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW96142378A TWI437228B (en) | 2007-11-09 | 2007-11-09 | Holder testing apparatus and testing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW96142378A TWI437228B (en) | 2007-11-09 | 2007-11-09 | Holder testing apparatus and testing method |
Publications (2)
Publication Number | Publication Date |
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TW200921095A TW200921095A (en) | 2009-05-16 |
TWI437228B true TWI437228B (en) | 2014-05-11 |
Family
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Application Number | Title | Priority Date | Filing Date |
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TW96142378A TWI437228B (en) | 2007-11-09 | 2007-11-09 | Holder testing apparatus and testing method |
Country Status (1)
Country | Link |
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TW (1) | TWI437228B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN114076850B (en) * | 2020-08-14 | 2023-12-15 | 富准精密模具(嘉善)有限公司 | Resistance detection device |
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2007
- 2007-11-09 TW TW96142378A patent/TWI437228B/en not_active IP Right Cessation
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TW200921095A (en) | 2009-05-16 |
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