CN101243522B - 用于定位x射线透镜的设备和方法以及包含所述设备的x射线装置 - Google Patents
用于定位x射线透镜的设备和方法以及包含所述设备的x射线装置 Download PDFInfo
- Publication number
- CN101243522B CN101243522B CN2006800303099A CN200680030309A CN101243522B CN 101243522 B CN101243522 B CN 101243522B CN 2006800303099 A CN2006800303099 A CN 2006800303099A CN 200680030309 A CN200680030309 A CN 200680030309A CN 101243522 B CN101243522 B CN 101243522B
- Authority
- CN
- China
- Prior art keywords
- ray
- goniometer
- positioning equipment
- lens
- positioning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Wire Bonding (AREA)
Abstract
Description
Claims (19)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05018216.1 | 2005-08-22 | ||
EP05018216A EP1758132B1 (en) | 2005-08-22 | 2005-08-22 | Apparatus and method for positioning an X-ray lens and X-ray device incorporating said apparatus |
PCT/EP2006/008142 WO2007022917A1 (en) | 2005-08-22 | 2006-08-17 | Apparatus and method for positioning an x-ray lens and x-ray device incorporating said apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101243522A CN101243522A (zh) | 2008-08-13 |
CN101243522B true CN101243522B (zh) | 2011-01-12 |
Family
ID=35645322
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2006800303099A Expired - Fee Related CN101243522B (zh) | 2005-08-22 | 2006-08-17 | 用于定位x射线透镜的设备和方法以及包含所述设备的x射线装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7769136B2 (zh) |
EP (1) | EP1758132B1 (zh) |
JP (1) | JP2009505111A (zh) |
CN (1) | CN101243522B (zh) |
AT (1) | ATE423382T1 (zh) |
DE (1) | DE602005012824D1 (zh) |
WO (1) | WO2007022917A1 (zh) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5783785B2 (ja) | 2010-06-02 | 2015-09-24 | キヤノン株式会社 | X線導波路 |
EP2458328B1 (de) * | 2010-11-24 | 2016-01-27 | Leica Geosystems AG | Konstruktionsvermessungsgerät mit einer automatischen Lotpunktfindungs-Funktionalität |
EP2474810A1 (de) * | 2011-01-11 | 2012-07-11 | Leica Geosystems AG | Vermessungsgerät mit einer dynamischen Anzielfunktionalität |
EP2541194A1 (de) * | 2011-07-01 | 2013-01-02 | Hexagon Technology Center GmbH | Konstruktionsvermessungsgerät zum Verfolgen, Vermessen und Markieren von Kanten und Eckpunkten aneinandergrenzender Oberflächen |
DE102013202487A1 (de) * | 2013-02-15 | 2014-08-21 | Bruker Nano Gmbh | Vorrichtung zur räumlichen Ausrichtung einer Röntgenoptik und Apparatur mit einer solchen |
KR101519475B1 (ko) * | 2014-07-17 | 2015-05-13 | 주식회사 벡트론 | X-선 집속을 위한 복합굴절렌즈의 홀더 조작장치 |
DE102014219601B4 (de) * | 2014-08-13 | 2023-06-29 | Bruker Nano Gmbh | Verfahren zum Scannen einer Probe mittels einer Röntgenoptik und eine Apparatur zum Scannen einer Probe |
CN109524284A (zh) * | 2018-11-28 | 2019-03-26 | 深圳先进技术研究院 | 一种放射治疗x射线源及x射线源装置 |
DE102022105838B3 (de) * | 2022-03-14 | 2023-08-17 | Helmut Fischer GmbH Institut für Elektronik und Messtechnik | Justiereinheit für eine Röntgenoptik in einem Röntgenfluoreszenzgerät sowie Röntgenfluoreszenzgerät |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5192869A (en) * | 1990-10-31 | 1993-03-09 | X-Ray Optical Systems, Inc. | Device for controlling beams of particles, X-ray and gamma quanta |
CN1202810A (zh) * | 1995-10-05 | 1998-12-23 | 株式会社东芝 | X射线摄像装置 |
US6504901B1 (en) * | 1998-07-23 | 2003-01-07 | Bede Scientific Instruments Limited | X-ray focusing apparatus |
US6888920B2 (en) * | 2002-09-03 | 2005-05-03 | Basil Eric Blank | Low-cost, high precision goniometric stage for x-ray diffractography |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62106352A (ja) * | 1985-11-01 | 1987-05-16 | Natl Inst For Res In Inorg Mater | 走査型x線顕微鏡 |
JPH0631887B2 (ja) * | 1988-04-28 | 1994-04-27 | 株式会社東芝 | X線ミラー及びその製造方法 |
JP3016439B2 (ja) * | 1991-02-18 | 2000-03-06 | 理学電機株式会社 | コリメータを備えたx線発生装置 |
JP3190989B2 (ja) * | 1991-04-02 | 2001-07-23 | 理学電機株式会社 | X線装置のコリメータ |
JP3197104B2 (ja) * | 1993-04-19 | 2001-08-13 | セイコーインスツルメンツ株式会社 | X線解析装置 |
JPH07260714A (ja) * | 1994-03-25 | 1995-10-13 | Hitachi Ltd | X線分析装置 |
JP3330563B2 (ja) * | 1999-04-12 | 2002-09-30 | セイコーインスツルメンツ株式会社 | 微量試料分析装置 |
JP2001074892A (ja) * | 1999-09-03 | 2001-03-23 | Rigaku Corp | コリメータ及びx線装置 |
ATE369556T1 (de) * | 2000-09-27 | 2007-08-15 | Euratom | Mikrostrahl-kollimator für hochauflösungs- röntgenstrahl-beugungsanalyse mittels konventionellen diffraktometern |
JP2002131488A (ja) * | 2000-10-18 | 2002-05-09 | Vision Arts Kk | X線レンズおよびそのx線レンズの製造方法 |
AU2002363962A1 (en) | 2001-12-04 | 2003-06-17 | X-Ray Optical Systems, Inc. | X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof |
EP1758131B1 (en) * | 2005-08-22 | 2009-10-07 | Unisantis FZE | X-ray lens assembly and X-ray device incorporating said assembly |
ATE445221T1 (de) * | 2005-08-22 | 2009-10-15 | Unisantis Fze | Vorrichtung zur abschirmung von röntgenstrahlen und röntgengerät mit dieser |
-
2005
- 2005-08-22 AT AT05018216T patent/ATE423382T1/de not_active IP Right Cessation
- 2005-08-22 DE DE602005012824T patent/DE602005012824D1/de active Active
- 2005-08-22 EP EP05018216A patent/EP1758132B1/en not_active Not-in-force
-
2006
- 2006-08-17 US US12/064,387 patent/US7769136B2/en not_active Expired - Fee Related
- 2006-08-17 CN CN2006800303099A patent/CN101243522B/zh not_active Expired - Fee Related
- 2006-08-17 WO PCT/EP2006/008142 patent/WO2007022917A1/en active Application Filing
- 2006-08-17 JP JP2008527359A patent/JP2009505111A/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5192869A (en) * | 1990-10-31 | 1993-03-09 | X-Ray Optical Systems, Inc. | Device for controlling beams of particles, X-ray and gamma quanta |
CN1202810A (zh) * | 1995-10-05 | 1998-12-23 | 株式会社东芝 | X射线摄像装置 |
US6504901B1 (en) * | 1998-07-23 | 2003-01-07 | Bede Scientific Instruments Limited | X-ray focusing apparatus |
US6888920B2 (en) * | 2002-09-03 | 2005-05-03 | Basil Eric Blank | Low-cost, high precision goniometric stage for x-ray diffractography |
Also Published As
Publication number | Publication date |
---|---|
ATE423382T1 (de) | 2009-03-15 |
EP1758132A1 (en) | 2007-02-28 |
EP1758132B1 (en) | 2009-02-18 |
WO2007022917A1 (en) | 2007-03-01 |
CN101243522A (zh) | 2008-08-13 |
JP2009505111A (ja) | 2009-02-05 |
DE602005012824D1 (de) | 2009-04-02 |
US20090220054A1 (en) | 2009-09-03 |
US7769136B2 (en) | 2010-08-03 |
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