CN101212859A - Method for detecting inter-layer displacement of multi-layer flexible printed circuit board - Google Patents
Method for detecting inter-layer displacement of multi-layer flexible printed circuit board Download PDFInfo
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- CN101212859A CN101212859A CNA2006100637814A CN200610063781A CN101212859A CN 101212859 A CN101212859 A CN 101212859A CN A2006100637814 A CNA2006100637814 A CN A2006100637814A CN 200610063781 A CN200610063781 A CN 200610063781A CN 101212859 A CN101212859 A CN 101212859A
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- 238000000034 method Methods 0.000 title claims abstract description 17
- 239000010410 layer Substances 0.000 title claims description 33
- 239000011229 interlayer Substances 0.000 title claims description 25
- 238000006073 displacement reaction Methods 0.000 title claims description 7
- 238000001514 detection method Methods 0.000 claims description 5
- 239000000047 product Substances 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- 239000011889 copper foil Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000005755 formation reaction Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000013139 quantization Methods 0.000 description 2
- 238000003556 assay Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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CN200610063781A CN100596253C (en) | 2006-12-31 | 2006-12-31 | Method for detecting inter-layer displacement of multi-layer flexible printed circuit board |
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CN200610063781A CN100596253C (en) | 2006-12-31 | 2006-12-31 | Method for detecting inter-layer displacement of multi-layer flexible printed circuit board |
Publications (2)
Publication Number | Publication Date |
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CN101212859A true CN101212859A (en) | 2008-07-02 |
CN100596253C CN100596253C (en) | 2010-03-24 |
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CN200610063781A Expired - Fee Related CN100596253C (en) | 2006-12-31 | 2006-12-31 | Method for detecting inter-layer displacement of multi-layer flexible printed circuit board |
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Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101907454A (en) * | 2010-07-06 | 2010-12-08 | 竞华电子(深圳)有限公司 | Method for measuring expansion and shrinkage of printed circuit board, and printed circuit board |
CN101646304B (en) * | 2008-08-05 | 2011-04-20 | 比亚迪股份有限公司 | Alignment method for printed circuit board |
CN102032885A (en) * | 2010-08-31 | 2011-04-27 | 北大方正集团有限公司 | Printed circuit board, method and device for detecting layer-to-layer registration of circuit graphs at two surfaces thereof |
CN102072716A (en) * | 2010-12-21 | 2011-05-25 | 胜宏科技(惠州)有限公司 | Method for detecting interlayer offset and drilling offset of multi-layer circuit board |
CN102607368A (en) * | 2012-03-20 | 2012-07-25 | 昆山鼎鑫电子有限公司 | Laser drilling deviation inspection method for HDI (High Density Interconnection) plate |
CN103256905A (en) * | 2012-02-16 | 2013-08-21 | 华孚精密金属科技(常熟)有限公司 | Method and structure of detection of die casting code spraying position deviation |
CN103900475A (en) * | 2013-11-22 | 2014-07-02 | 大连太平洋电子有限公司 | Laser blind hole and through hole alignment precision detection method |
CN103913471A (en) * | 2012-12-31 | 2014-07-09 | 深南电路有限公司 | Method for examining position alignment of capacitor-embedding layer on capacitor-embedding plate |
CN104244590A (en) * | 2014-08-28 | 2014-12-24 | 广州兴森快捷电路科技有限公司 | Control method of outer layer deviation of circuit boards |
CN104677279A (en) * | 2015-03-06 | 2015-06-03 | 业成光电(深圳)有限公司 | Method for confirming outline dimension of base plate |
CN105407637A (en) * | 2015-12-23 | 2016-03-16 | 珠海市联决电子有限公司 | Flexible printed circuit (FPC) jointed board and jointed board design method thereof |
CN103175456B (en) * | 2011-12-21 | 2016-03-30 | 北大方正集团有限公司 | The method of detection contraposition skew and PCB are in making sheet |
CN103256905B (en) * | 2012-02-16 | 2016-11-30 | 华孚精密金属科技(常熟)有限公司 | On die casting coding position skew detection method and structure |
CN109737878A (en) * | 2018-12-29 | 2019-05-10 | 广州兴森快捷电路科技有限公司 | The measurement method and measuring system of interlayer offset |
JP2020136351A (en) * | 2019-02-14 | 2020-08-31 | 大日本印刷株式会社 | Wiring board and manufacturing method thereof |
JP2020136352A (en) * | 2019-02-14 | 2020-08-31 | 大日本印刷株式会社 | Wiring board and manufacturing method thereof |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103796435B (en) * | 2014-01-16 | 2017-08-11 | 广州兴森快捷电路科技有限公司 | The method that measurement circuitry flaggy presses off normal |
-
2006
- 2006-12-31 CN CN200610063781A patent/CN100596253C/en not_active Expired - Fee Related
Cited By (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101646304B (en) * | 2008-08-05 | 2011-04-20 | 比亚迪股份有限公司 | Alignment method for printed circuit board |
CN101907454A (en) * | 2010-07-06 | 2010-12-08 | 竞华电子(深圳)有限公司 | Method for measuring expansion and shrinkage of printed circuit board, and printed circuit board |
CN102032885A (en) * | 2010-08-31 | 2011-04-27 | 北大方正集团有限公司 | Printed circuit board, method and device for detecting layer-to-layer registration of circuit graphs at two surfaces thereof |
CN102032885B (en) * | 2010-08-31 | 2013-05-15 | 北大方正集团有限公司 | Printed circuit board, method and device for detecting layer-to-layer registration of circuit graphs at two surfaces thereof |
CN102072716A (en) * | 2010-12-21 | 2011-05-25 | 胜宏科技(惠州)有限公司 | Method for detecting interlayer offset and drilling offset of multi-layer circuit board |
CN102072716B (en) * | 2010-12-21 | 2012-05-23 | 胜宏科技(惠州)有限公司 | Method for detecting interlayer offset and drilling offset of multi-layer circuit board |
CN103175456B (en) * | 2011-12-21 | 2016-03-30 | 北大方正集团有限公司 | The method of detection contraposition skew and PCB are in making sheet |
CN103256905A (en) * | 2012-02-16 | 2013-08-21 | 华孚精密金属科技(常熟)有限公司 | Method and structure of detection of die casting code spraying position deviation |
CN103256905B (en) * | 2012-02-16 | 2016-11-30 | 华孚精密金属科技(常熟)有限公司 | On die casting coding position skew detection method and structure |
CN102607368A (en) * | 2012-03-20 | 2012-07-25 | 昆山鼎鑫电子有限公司 | Laser drilling deviation inspection method for HDI (High Density Interconnection) plate |
CN103913471A (en) * | 2012-12-31 | 2014-07-09 | 深南电路有限公司 | Method for examining position alignment of capacitor-embedding layer on capacitor-embedding plate |
CN103913471B (en) * | 2012-12-31 | 2016-04-13 | 深南电路有限公司 | The method held and plate buries and holds layer contraposition is buried in a kind of inspection |
CN103900475A (en) * | 2013-11-22 | 2014-07-02 | 大连太平洋电子有限公司 | Laser blind hole and through hole alignment precision detection method |
CN104244590B (en) * | 2014-08-28 | 2018-07-20 | 广州兴森快捷电路科技有限公司 | The control method of circuit board outer layer deviation |
CN104244590A (en) * | 2014-08-28 | 2014-12-24 | 广州兴森快捷电路科技有限公司 | Control method of outer layer deviation of circuit boards |
CN104677279B (en) * | 2015-03-06 | 2017-08-15 | 业成光电(深圳)有限公司 | Confirm the method for contour substrate size |
CN104677279A (en) * | 2015-03-06 | 2015-06-03 | 业成光电(深圳)有限公司 | Method for confirming outline dimension of base plate |
CN105407637A (en) * | 2015-12-23 | 2016-03-16 | 珠海市联决电子有限公司 | Flexible printed circuit (FPC) jointed board and jointed board design method thereof |
CN109737878A (en) * | 2018-12-29 | 2019-05-10 | 广州兴森快捷电路科技有限公司 | The measurement method and measuring system of interlayer offset |
JP2020136351A (en) * | 2019-02-14 | 2020-08-31 | 大日本印刷株式会社 | Wiring board and manufacturing method thereof |
JP2020136352A (en) * | 2019-02-14 | 2020-08-31 | 大日本印刷株式会社 | Wiring board and manufacturing method thereof |
JP7216911B2 (en) | 2019-02-14 | 2023-02-02 | 大日本印刷株式会社 | Wiring board and method for manufacturing wiring board |
JP7216912B2 (en) | 2019-02-14 | 2023-02-02 | 大日本印刷株式会社 | Wiring board and method for manufacturing wiring board |
Also Published As
Publication number | Publication date |
---|---|
CN100596253C (en) | 2010-03-24 |
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Assignee: SHENZHEN BYD ELECTRONIC COMPONENT Co.,Ltd. Assignor: BYD Co.,Ltd. Contract fulfillment period: 2008.4.25 to 2015.11.14 Contract record no.: 2008440000067 Denomination of invention: Method for detecting inter-layer displacement of multi-layer flexible printed circuit board License type: Exclusive license Record date: 20080504 |
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Free format text: EXCLUSIVE LICENCE; TIME LIMIT OF IMPLEMENTING CONTACT: 2008.4.25 TO 2015.11.14 Name of requester: BIYADI ELECTRON MEMBER CO., LTD., SHENZHEN CITY Effective date: 20080504 |
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Effective date of registration: 20150901 Address after: 518119 Guangdong province Shenzhen City Dapeng new Kwai town Yanan Road No. 1 building experimental Byd Co Patentee after: SHENZHEN BYD ELECTRONIC COMPONENT Co.,Ltd. Address before: Kwai Chung town Yanan Road, BYD Industrial Park in Longgang District of Shenzhen City, Guangdong province 518119 Patentee before: BYD Co.,Ltd. |
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Address after: 518119 Guangdong province Shenzhen City Dapeng new Kwai town Yanan Road No. 1 building experimental Byd Co Patentee after: Shenzhen helitai photoelectric Co.,Ltd. Address before: 518119 Guangdong province Shenzhen City Dapeng new Kwai town Yanan Road No. 1 building experimental Byd Co Patentee before: SHENZHEN BYD ELECTRONIC COMPONENT Co.,Ltd. |
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