CN101109619A - Three-dimensional on-line measuring method and system using synthesis wave to interfere whole-field nano surface - Google Patents
Three-dimensional on-line measuring method and system using synthesis wave to interfere whole-field nano surface Download PDFInfo
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- CN101109619A CN101109619A CNA2007101206622A CN200710120662A CN101109619A CN 101109619 A CN101109619 A CN 101109619A CN A2007101206622 A CNA2007101206622 A CN A2007101206622A CN 200710120662 A CN200710120662 A CN 200710120662A CN 101109619 A CN101109619 A CN 101109619A
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Abstract
The invention provides a nanometer surface 3D on-line measuring method by using composed wave to interfere the whole field and a system for the method. The measuring range is depending upon the composed wavelength and co-path interference structure. The grating scatters the light beam of spectrum width 40 nm into two segment light pieces with wavelengths continuously and evenly distributed in the space, which are collimated into two parallel light pieces that are staggered in cross direction and are partially overlapped; the overlapped part forms the composed wave. The beam of the parallel light pieces of the composed wave is expanded by two co-focus plane cylinder lens, then through a parallel glass plate, one surface of which is coated with a semi-permeable and half-reflecting membrane, half light intensity is reflected as reference light, another half light intensity is reflected by different measured points, and is detected by a planar array CCD after being interfered by the reference light. Once the phase change of the interference signal for each pixel of CCD is measured, the longitudinal change of the measured point is got. 3D measurements for the surface is completed in one positioning. The measurement is of high speed and low cost. The measuring range is 600 swung dash 1000 Mu m, the resolution is better than 5 nm, is applicable for 3D measuring for nanometer surfaces with bosses and deep slots.
Description
Technical field
The present invention relates to a kind of synthesis wave to interfere whole-field nano surface three-dimensional on-line measuring method and system of utilizing, particularly relate to a kind of Nanosurface three-dimensional on-line measuring method and system that be applicable to, belong to field of optical measuring technologies with boss and deep groove structure.
Background technology
[1] D.P.Hand, T.A.Carolan, J.S.Barton, and J.D.C.Jones, optics letter (OpticsLetters),, the 18th volume, the 16th phase, 1361-1363 page or leaf in 1993.The principle of work of prior art document [1] as shown in Figure 1, light that semiconductor laser sends through 50: 50 coupling mechanisms of faraday isolator and optical fiber after, arrive measuring head, measuring head is a Feisuo interferometer, part light is reflected conduct with reference to light by fiber end face, after another part light focuses on through GRIN Lens, project on the measured surface, come back in the system and by measured surface reflection and to interfere with reference light, interference signal is surveyed by detector D1, and the phase decision of interference signal is in vertical height of measured surface measured point; The drive current that changes this laser instrument is to change the glow frequency of laser instrument, light with four kinds of different frequencies is measured same point, obtain four interference signals, because incident light wave frequency difference, the phase place of four interference signals are just different, regulate drive current, make the phase differential pi/2 of adjacent two interference signals, by following formula, can demodulate the optical path difference D of this point, promptly finish the measurement of single-point:
I
n(n=1,2,3,4) are the intensity of the n time interference signal, and c is the light velocity, and v is the incident light frequency.
Stepper motor drives measuring head transversal scanning measured surface again, promptly finishes the measurement to measured surface.
[2] Dejiao Lin, Xiangqian Jiang, Fang Xie, Wei Zhang, Lin Zhang and IanBennion, optics express train (Optics Express),, the 12nd volume, the 23rd phase, 5729-5734 page or leaf in 2004.The principle of work of prior art document [2] as shown in Figure 2, sending wavelength by semiconductor laser is λ
0Light be divided into two-way after through two 3dB-coupling mechanisms, the one tunnel is reflected by fiber grating, another road is reflected by reference mirror.The two-way reflected light is through meeting once more behind the 3dB-coupling mechanism and interfering, interference signal is through behind the gyroscope, reflected by another fiber grating, pass through gyroscope once more, surveyed by the PIN detector then, the signal that this detector detects is handled the length that the rear drive piezoelectric ceramic tube is regulated the reference arm of fibre optic interferometer through servo circuit, makes two interference arms stablizing interferometer be in quadrature (phase differential is a pi/2) all the time, thereby realizes stablizing the purpose of this interferometer.
The wavelength X that tunable laser is sent
mVariable light is divided into two-way after through two optical fiber 3dB-coupling mechanisms, one the tunnel through getting back in the interferometer once more by measuring mirror reflection again behind the optical fiber self-focus lens, get back in the interferometer once more by the reference mirror reflection again behind another road process optical fiber self-focus lens, meet behind the two-way light process 3dB-coupling mechanism, form interference signal, behind this interference signal process gyroscope and the fiber grating, surveyed, promptly measure the displacement of measuring mirror through phase analysis again by the PIN detector.
The problem and shortage that above-mentioned two prior aries exist is:
1, all be the spot scan metering system, measuring speed is slow, and measurement needs two-dimensional scan for surface three dimension, scanning mechanism complexity, instrument cost height;
2, sensitivity is disturbed in measurement environment vibration and temperature drift etc., be not suitable for on-line measurement;
3, measure the restriction that range is subjected to incident light wave length λ, measure range, can't measure Nanosurface with boss and deep groove structure less than λ/2.
Purpose of the present invention is exactly to propose a kind of synthesis wave to interfere whole-field nano surface three-dimensional on-line measuring method and system of utilizing at the problem and shortage of prior art existence.
Summary of the invention
The objective of the invention is to be achieved through the following technical solutions.
The parallel beam that utilization is made up of a series of parallel composite waves carries out whole audience three-dimensional measurement to the measured device surface, measure light path and reference path and constitute concurrent path interference system in the road altogether, this system is by super-radiance light emitting diode SLD, optical fiber self-focus lens Z, grating G, collimation lens L1, the dull and stereotyped P1 of parallel glass of reflectance coating has been plated on the two sides, flat post lens L2 and L3, spectroscope BS, one side has been plated the dull and stereotyped P2 of parallel glass of semi-transparent semi-reflecting film, vertical micro displacement workbench M1, horizontal micro displacement workbench M2, area array CCD, phase measurement, signal generator, the A/D transition card, computing machine, result's output, drive controlling is formed; The dull and stereotyped P2 of parallel glass that utilizes a centre wavelength to plate semi-transparent semi-reflecting film for super-radiance light emitting diode SLD, optical fiber self-focus lens Z, grating G, collimation lens L1, parallel glass dull and stereotyped P1, flat post lens L2 and L3, spectroscope BS, the one side of 850nm spectrum width 40nm constitutes a common path interference instrument, make ambient vibration and temperature drift obtain common mode inhibition, thereby make this measuring system be applicable to on-line measurement the influence of measuring system; Super-radiance light emitting diode SLD is collimated into parallel beam after sending the light process optical fiber self-focus lens Z that spectrum width is 40nm, grating G with this parallel beam chromatic dispersion become wavelength in the space continuous equally distributed fan-shaped mating plate, collimation lens L1 with fan-shaped mating plate be collimated into wavelength in the space continuous equally distributed parallel mating plate, this parallel mating plate is through two surfaces (upper surface plating partial reflection film of the dull and stereotyped P1 of parallel glass, the lower surface plating total reflection film) reflection, form two parallel to each other, transversion malposition and partly overlapping parallel mating plate, these two parallel mating plates form the parallel mating plate of being made up of a series of parallel composite waves in the part of space overlap.The parallel mating plate of composite wave expands Shu Chengwei composite wave parallel beam through two confocal flat post lens L2 and L3.This composite wave parallel beam impinges perpendicularly on the dull and stereotyped P2 of parallel glass after seeing through spectroscope BS, and the one side of the dull and stereotyped P2 of parallel glass is coated with semi-transparent semi-reflecting film, and half light intensity of composite wave parallel beam is reflected, and Yan Yuanlu returns, and this part light is as reference light; Second half light intensity transmission, this light beam projects on the measured device surface, by meeting with reference light in the measured surface reflected back system and interfering, the synthesis wave to interfere signal is surveyed by area array CCD through spectroscope BS reflection back, the pixel that CCD is different detects the light of the different measured points of measured surface reflected back and the interference signal that reference light meets and produces, and vertical (perpendicular to measured surface) information of measured surface is stated from the phase change of interference signal.Demodulate the phase changing capacity of each pixel interference signal of area array CCD, promptly measure vertical variable quantity of each corresponding measured point on the measured surface, realize the surface three dimension measurement.
Phase changing capacity for the demodulated interferential signal, signal generator sends the certain sawtooth voltage of periodic amplitude and drives the light path that vertical micro displacement workbench M1 regulates the measurement light path through drive controlling, if measured surface is the ideal plane, so, interference signal and sawtooth signal same frequency and same-phase; If measured surface is the surface with boss and deep groove structure, there is vertical variation of Δ h, exist phase differential to be so between interference signal and the sawtooth signal
λ wherein
sBe synthetic wavelength, compare the phase place of interference signal and the phase place of sawtooth signal, its phase difference is measured in phase measurement, make analog to digital conversion through the A/D transition card, be for data processing by computing machine again, promptly measure vertical changing value Δ h of corresponding measured point, the interference signal that each pixel of area array CCD is exported carries out such processing successively, promptly finishes the three-dimensional measurement of measured surface; The measurement range is λ
s/ 2, synthetic wavelength
Be far longer than optical wavelength λ
1And λ
2Can obtain different optical wavelength λ by the thickness of the dull and stereotyped P1 of adjusting parallel glass and the incident angle of parallel mating plate reflex time on the dull and stereotyped P1 of parallel glass
1And λ
2Thereby the synthetic wavelengths that obtain different sizes are regulated the size of measuring range, native system are applicable to have the Nanosurface three-dimensional on-line measuring of boss and deep groove structure.
The invention has the beneficial effects as follows:
1, carries out the whole-field nano surface three-dimensional measurement.The parallel beam that a series of parallel composite waves are formed carries out whole audience three-dimensional measurement to measured surface, and the measuring process one-time positioning is finished surface three dimension and measured.Measuring speed of the present invention is fast, no-raster mechanism, and system architecture is simple, and cost is low, the measuring accuracy height.
2, the present invention utilizes parallel glass dull and stereotyped P1, the flat post lens L2 of light source, optical fiber self-focus lens Z, grating G, collimation lens L1, two sides plated film and the dull and stereotyped P2 formation of the parallel glass concurrent path interference system that L3, spectroscope BS, one side are plated semi-transparent semi-reflecting film, make interference such as ambient vibration and temperature drift obtain common mode inhibition, thereby make system be applicable to on-line measurement the influence of measuring system.
3, the method with synthesis wave to interfere enlarges the interferometry range.The measurement range is λ
s/ 2, synthetic wavelength
Be far longer than optical wavelength λ
1And λ
2, and can be by regulating optical wavelength λ
1And λ
2The synthetic wavelength that obtains different sizes obtains the measurement range of different sizes, measures range and can reach 600～1000 μ m, and the present invention is applicable to the Nanosurface three-dimensional on-line measuring with boss and deep groove structure.
Description of drawings
Fig. 1 is the fundamental diagram of prior art document [1];
Fig. 2 is the fundamental diagram of prior art document [2];
Fig. 3 is a fundamental diagram of the present invention.
Mark among the figure: Z-optical fiber self-focus lens, G-grating, L1-collimation lens, P1-parallel glass flat board, the flat post lens of L2-, the flat post lens of L3-, BS-spectroscope, P2-parallel glass flat board, the vertical micro displacement workbench of M1-, the horizontal micro displacement workbench of M2-.
Embodiment
Below in conjunction with the drawings and specific embodiments the present invention is further described.
As shown in Figure 3, be collimated into behind the light process optical fiber self-focus lens Z of the spectrum width 40nm that the super luminescence diode SLD of centre wavelength 850nm sends and be parallel beam, this bundle parallel beam through grating G chromatic dispersion becoming wavelength in the space continuous equally distributed fan-shaped mating plate, this fan-shaped mating plate through collimation lens L1 after collimation become wavelength in the space equally distributed parallel mating plate continuously, parallel mating plate oblique incidence is on the dull and stereotyped P1 of parallel glass of d to the thickness of two sides plated film, the upper surface plating partial reflection film of the dull and stereotyped P1 of parallel glass, the reflectance coating of lower surface plating reflectivity 100%, two parallel mating plates that two surface reflections obtain about the warp are parallel to each other, transversion malposition, and in the space lap is arranged, two mating plate light intensity are near equating.The wavelength X of two parallel mating plates of the correspondence of difference in a lateral direction of two parallel mating plate laps
1And λ
2Difference forms composite wave after two different wavelength meet.So the parallel mating plate that forms after dull and stereotyped P1 two surface reflections of parallel glass reencounter is made of the synthetic wavelength of composite wave a series of parallel composite waves respectively
Be far longer than optical wavelength λ
1And λ
2The parallel mating plate of this composite wave expands Shu Chengwei composite wave parallel beam through two confocal flat post lens L2 and L3, this composite wave parallel beam sees through spectroscope BS, impinge perpendicularly on the dull and stereotyped P2 of parallel glass, the one side of the dull and stereotyped P2 of parallel glass is coated with semi-transparent semi-reflecting film, half light intensity of composite wave parallel beam is reflected, return along former road, this part light is as reference light, second half light intensity transmission, and project on the measured device surface, by measured surface reflected back system, become wave interference with the reference light concurrent intercrescence of meeting, the synthesis wave to interfere signal is surveyed by area array CCD through spectroscope BS reflection.The area array CCD different pixels detects the reflected light of the different measured point of measured surface and the interference signal that reference light forms, and the phase changing capacity Δ of interference signal has embodied vertical changing value Δ h of measured point.The pass of Δ and Δ h is
Synthetic wavelength λ
sBe decided by parallel mating plate in the incident angle of the dull and stereotyped P1 of parallel glass and the thickness d of parallel plate, it is far longer than optical wavelength λ
1And λ
2The range of native system is λ
s/ 2, be far longer than range λ/2 (λ is an optical wavelength) of traditional interferometry, realized the purpose of wide range interferometry, native system is applicable to have the Nanosurface three-dimensional on-line measuring of boss and deep groove structure.
For the phase changing capacity of demodulated interferential signal, signal generator send sawtooth signal by drive controlling drive vertical micro displacement workbench M1 at the uniform velocity longitudinal scanning realize measuring the adjusting of light path light path.Regulate the initial position and the sawtooth signal amplitude of worktable, make the interference signal same frequency same-phase ground variation of sawtooth signal and the some pixels of CCD in the light path scanning process.If measured surface is the ideal plane, the interference signal of other pixel of CCD also with sawtooth signal same frequency same-phase; If measured surface is the surface with boss and deep groove structure, the interference signal of other pixel of CCD and the phase place of sawtooth signal are just inequality, the phase difference between the two is measured in phase measurement, promptly obtains vertical changing value Δ h of corresponding measured point after handling through computer data; Interference signal to each pixel of CCD is all done such processing, promptly measures vertical variable quantity of each corresponding measured point on the measured surface, finishes the three-dimensional measurement on surface.Compare with spot scan Nanosurface three-dimension measuring system, this measuring method and system greatly improve measuring speed, and need not scanning mechanism, and system architecture is simple, and cost is low, the measuring accuracy height.
Above-mentioned instantiation has been described in realization in order to demonstrate the invention.But other variations of the present invention and modification it will be apparent to those skilled in the art that, in the essence of the disclosed content of the present invention and any modification/variation in the cardinal rule scope or imitate conversion all to belong to claim protection domain of the present invention.
Claims (4)
1. one kind is utilized synthesis wave to interfere whole-field nano surface three-dimensional on-line measuring system, it is characterized in that: the parallel beam that utilizes a series of parallel composite waves to form carries out measurement of full field to the measured device surface, measures light path and reference path and constitutes concurrent path interference system in the road altogether; This system by super-radiance light emitting diode SLD, optical fiber self-focus lens Z, grating G, collimation lens L1, parallel glass dull and stereotyped P1, flat post lens L2 and L3, spectroscope BS, the dull and stereotyped P2 of parallel glass,, vertically micro displacement workbench M1, laterally micro displacement workbench M2, area array CCD, phase measurement, signal generator, A/D transition card, computing machine, result's output, drive controlling are formed; The dull and stereotyped P2 of parallel glass that utilizes a centre wavelength to plate semi-transparent semi-reflecting film for super-radiance light emitting diode SLD, optical fiber self-focus lens Z, grating G, collimation lens L1, parallel glass dull and stereotyped P1, flat post lens L2 and L3, spectroscope BS, the one side of 850nm spectrum width 40nm constitutes a common path interference instrument, make ambient vibration and temperature drift obtain common mode inhibition, thereby make this measuring system be applicable to on-line measurement the influence of measuring system.
2. one kind is utilized the synthesis wave to interfere whole-field nano surface three-dimensional on-line measuring method, it is characterized in that: be collimated into parallel beam after utilizing super-radiance light emitting diode SLD to send the light process fiber collimating lenses Z of spectrum width for 40nm, grating G with this parallel beam chromatic dispersion become wavelength in the space continuous equally distributed fan-shaped mating plate, collimation lens L1 with this fan-shaped mating plate be collimated into into wavelength in the space continuous equally distributed parallel mating plate, two surface one sides of the dull and stereotyped P1 of parallel glass are coated with the partial reflection film, it is 100% total reflection film that another side is coated with reflectivity, this parallel mating plate through two surface reflections of the dull and stereotyped P1 of parallel glass obtain two parallel to each other, transversion malposition and partly overlapping parallel mating plate, these two parallel mating plates form the parallel mating plate of being made up of a series of parallel composite waves in the part of space overlap; The parallel mating plate of composite wave expands Shu Chengwei composite wave parallel beam through two confocal flat post lens L2 and L3; This composite wave parallel beam impinges perpendicularly on the dull and stereotyped P2 of parallel glass after seeing through spectroscope BS, and the one side of the dull and stereotyped P2 of parallel glass is coated with semi-transparent semi-reflecting film, and half light intensity of composite wave parallel beam is reflected, and Yan Yuanlu returns, and this part light is as reference light; Second half light intensity transmission, and project on the measured device surface, interfere by meeting in the measured surface reflected back system and with reference light, by the area array CCD detection, the pixel that CCD is different detects the light of the different measured points of measured surface reflected back and the interference signal that reference light meets and produces to the synthesis wave to interfere signal through spectroscope BS reflection; Vertical (perpendicular to measured surface) information of measured surface is stated from the phase change of interference signal, demodulates the phase changing capacity of each pixel interference signal of CCD, promptly measures vertical variable quantity of each corresponding measured point on the measured surface; Phase changing capacity for the demodulated interferential signal, the sawtooth signal that signal generator sends through the drive controlling link drive vertical micro displacement workbench M1 at the uniform velocity longitudinal scanning realize measuring the adjusting of light path light path, regulate the initial position and the sawtooth signal amplitude of worktable, make the interference signal same frequency same-phase ground variation of sawtooth signal and some pixels of CCD in vertical micro displacement workbench M1 scanning process; If measured surface is the ideal plane, the interference signal of other pixel of CCD also with sawtooth signal same frequency same-phase; If measured surface is the surface with boss and deep groove structure, there is vertical variation of Δ h, the phase differential of interference signal and sawtooth signal is so
Synthetic wavelength wherein
λ
1And λ
2It is optical wavelength; The phase measurement link is measured its phase difference , make analog to digital conversion through the A/D transition card, be for data processing by computing machine again, promptly measure vertical changing value Δ h of corresponding measured point, the interference signal that each pixel of area array CCD is exported carries out such processing successively, promptly measure vertical changing value of each corresponding measured point, finish the three-dimensional measurement of measured surface.
3. a kind of synthesis wave to interfere whole-field nano surface three-dimensional on-line measuring method that utilizes according to claim 2, it is characterized in that: the method range extension that utilizes synthesis wave to interfere, make the measurement range of system break through the restriction of optical wavelength, measure range and be decided by synthetic wavelength λ
s, the measurement range of native system is λ
s/ 2, the thickness of the dull and stereotyped P1 of adjusting parallel glass and parallel mating plate are at the incident angle of the dull and stereotyped P1 reflex time of parallel glass, scalable synthetic wavelength λ
sSize, to obtain the measurement ranges of different sizes; Measure range and can reach 600～1000 μ m, resolution is better than 5nm, is applicable to the Nanosurface three-dimensional on-line measuring with boss and deep groove structure.
4. a kind of synthesis wave to interfere whole-field nano surface three-dimensional on-line measuring method that utilizes according to claim 2, it is characterized in that: utilize two confocal flat post lens L2 the parallel mating plate of composite wave to be expanded Shu Chengwei composite wave parallel beam Nanosurface is carried out whole audience three-dimensional on-line measuring with L3, one-time positioning is finished surface three dimension and is measured.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104136882A (en) * | 2011-12-19 | 2014-11-05 | 感知器股份有限公司 | Non-contact sensor having improved laser spot |
| CN106931877A (en) * | 2015-12-30 | 2017-07-07 | 上海微电子装备有限公司 | A kind of optical grating measuring system |
| CN109373905A (en) * | 2018-08-28 | 2019-02-22 | 江苏大学 | Minute yardstick transparent body defocus distance-measuring device and method based on redundancy optical path |
-
2007
- 2007-08-23 CN CNB2007101206622A patent/CN100480621C/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104136882A (en) * | 2011-12-19 | 2014-11-05 | 感知器股份有限公司 | Non-contact sensor having improved laser spot |
| CN106931877A (en) * | 2015-12-30 | 2017-07-07 | 上海微电子装备有限公司 | A kind of optical grating measuring system |
| CN109373905A (en) * | 2018-08-28 | 2019-02-22 | 江苏大学 | Minute yardstick transparent body defocus distance-measuring device and method based on redundancy optical path |
| CN109373905B (en) * | 2018-08-28 | 2020-11-03 | 江苏大学 | Redundant light path-based device and method for measuring out-of-focus distance of micro-scale transparent body |
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