CN101083383B - 激光器装置 - Google Patents
激光器装置 Download PDFInfo
- Publication number
- CN101083383B CN101083383B CN2007101081805A CN200710108180A CN101083383B CN 101083383 B CN101083383 B CN 101083383B CN 2007101081805 A CN2007101081805 A CN 2007101081805A CN 200710108180 A CN200710108180 A CN 200710108180A CN 101083383 B CN101083383 B CN 101083383B
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- dielectric constant
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- laser device
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- electromagnetic
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- 239000011248 coating agent Substances 0.000 claims description 37
- 238000000576 coating method Methods 0.000 claims description 37
- 239000004065 semiconductor Substances 0.000 claims description 18
- 239000002800 charge carrier Substances 0.000 claims description 12
- 239000002184 metal Substances 0.000 claims description 7
- 229910052751 metal Inorganic materials 0.000 claims description 7
- 230000005540 biological transmission Effects 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 239000003989 dielectric material Substances 0.000 claims description 3
- 230000005641 tunneling Effects 0.000 claims description 3
- 238000005253 cladding Methods 0.000 abstract description 5
- 230000001902 propagating effect Effects 0.000 abstract 1
- 239000000758 substrate Substances 0.000 description 22
- 230000010355 oscillation Effects 0.000 description 21
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 20
- 239000004020 conductor Substances 0.000 description 16
- 239000007772 electrode material Substances 0.000 description 15
- 238000000034 method Methods 0.000 description 15
- 239000000463 material Substances 0.000 description 12
- 238000004088 simulation Methods 0.000 description 11
- 230000005684 electric field Effects 0.000 description 8
- 230000003287 optical effect Effects 0.000 description 7
- 230000008878 coupling Effects 0.000 description 5
- 238000010168 coupling process Methods 0.000 description 5
- 238000005859 coupling reaction Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 5
- 238000005530 etching Methods 0.000 description 5
- 239000003574 free electron Substances 0.000 description 5
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000005672 electromagnetic field Effects 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 230000003071 parasitic effect Effects 0.000 description 3
- 230000035515 penetration Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 230000007704 transition Effects 0.000 description 3
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 238000009616 inductively coupled plasma Methods 0.000 description 2
- 238000001451 molecular beam epitaxy Methods 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 238000001259 photo etching Methods 0.000 description 2
- 229910000673 Indium arsenide Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000013016 damping Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000005036 potential barrier Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000007634 remodeling Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/227—Buried mesa structure ; Striped active layer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S1/00—Masers, i.e. devices using stimulated emission of electromagnetic radiation in the microwave range
- H01S1/02—Masers, i.e. devices using stimulated emission of electromagnetic radiation in the microwave range solid
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/12—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region the resonator having a periodic structure, e.g. in distributed feedback [DFB] lasers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3401—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having no PN junction, e.g. unipolar lasers, intersubband lasers, quantum cascade lasers
- H01S5/3402—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having no PN junction, e.g. unipolar lasers, intersubband lasers, quantum cascade lasers intersubband lasers, e.g. transitions within the conduction or valence bands
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2302/00—Amplification / lasing wavelength
- H01S2302/02—THz - lasers, i.e. lasers with emission in the wavelength range of typically 0.1 mm to 1 mm
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/1046—Comprising interactions between photons and plasmons, e.g. by a corrugated surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Biophysics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Geometry (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006150923 | 2006-05-31 | ||
| JP2006150923A JP4857027B2 (ja) | 2006-05-31 | 2006-05-31 | レーザ素子 |
| JP2006-150923 | 2006-05-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101083383A CN101083383A (zh) | 2007-12-05 |
| CN101083383B true CN101083383B (zh) | 2010-09-29 |
Family
ID=38290143
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007101081805A Expired - Fee Related CN101083383B (zh) | 2006-05-31 | 2007-05-30 | 激光器装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7693198B2 (https=) |
| EP (1) | EP1863140A1 (https=) |
| JP (1) | JP4857027B2 (https=) |
| CN (1) | CN101083383B (https=) |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5196779B2 (ja) * | 2006-03-17 | 2013-05-15 | キヤノン株式会社 | 光伝導素子及びセンサ装置 |
| JP4881056B2 (ja) | 2006-05-01 | 2012-02-22 | キヤノン株式会社 | 電磁波吸収体部を含むフォトニック結晶電磁波デバイス、及びその製造方法 |
| JP4873746B2 (ja) * | 2006-12-21 | 2012-02-08 | キヤノン株式会社 | 発振素子 |
| JP4871816B2 (ja) * | 2007-08-31 | 2012-02-08 | キヤノン株式会社 | レーザ素子 |
| JP5127430B2 (ja) * | 2007-12-25 | 2013-01-23 | キヤノン株式会社 | レーザ素子 |
| JP5106260B2 (ja) * | 2008-06-16 | 2012-12-26 | キヤノン株式会社 | カスケードレーザ素子 |
| JP5328265B2 (ja) * | 2008-08-25 | 2013-10-30 | キヤノン株式会社 | テラヘルツ波発生素子、及びテラヘルツ波発生装置 |
| JP5441469B2 (ja) * | 2009-03-27 | 2014-03-12 | キヤノン株式会社 | 共振器 |
| JP5441470B2 (ja) * | 2009-03-27 | 2014-03-12 | キヤノン株式会社 | 共振器 |
| WO2012015990A2 (en) * | 2010-07-27 | 2012-02-02 | The Regents Of The University Of California | Plasmon lasers at deep subwavelength scale |
| KR20120087631A (ko) * | 2011-01-28 | 2012-08-07 | 삼성전자주식회사 | 나노 구조화된 음향광학 소자, 및 상기 음향광학 소자를 이용한 광 스캐너, 광 변조기 및 홀로그래픽 디스플레이 장치 |
| JP6062640B2 (ja) | 2011-03-18 | 2017-01-18 | キヤノン株式会社 | 光伝導素子 |
| US8805147B2 (en) * | 2011-05-17 | 2014-08-12 | Canon Kabushiki Kaisha | Waveguide, apparatus including the waveguide, and method of manufacturing the waveguide |
| US9008983B2 (en) | 2011-05-17 | 2015-04-14 | Canon Kabushiki Kaisha | Waveguide, apparatus including the waveguide, and method of manufacturing the waveguide |
| JP6034616B2 (ja) * | 2011-09-09 | 2016-11-30 | キヤノン株式会社 | 導波路及びその製造方法、ならびに電磁波分析装置 |
| JP2013149665A (ja) * | 2012-01-17 | 2013-08-01 | Sumitomo Electric Ind Ltd | 量子カスケード半導体レーザ |
| WO2014000046A1 (en) * | 2012-06-29 | 2014-01-03 | Hill Martin Terence | Metal-insulator-metal waveguide for nano-lasers and optical amplifiers |
| CN102928912B (zh) * | 2012-11-14 | 2014-04-02 | 北京邮电大学 | 一种产生法诺共振现象的金属-介质耦合谐振腔 |
| US9231368B2 (en) | 2012-11-30 | 2016-01-05 | Thorlabs Quantum Electronics, Inc. | Passive waveguide structure with alternating GaInAs/AlInAs layers for mid-infrared optoelectronic devices |
| WO2014085562A1 (en) * | 2012-11-30 | 2014-06-05 | Corning Incorporated | Multiwavelength quantum cascade laser via growth of different active and passive cores |
| JP2014175533A (ja) * | 2013-03-11 | 2014-09-22 | Canon Inc | レーザ素子 |
| JP2014207654A (ja) * | 2013-03-16 | 2014-10-30 | キヤノン株式会社 | 導波路素子 |
| CN104134860B (zh) * | 2014-07-02 | 2016-10-19 | 上海大学 | 毫米波段共面波导馈电的单层介质板Fabry-Perot天线 |
| CA2968925C (en) * | 2014-12-03 | 2020-11-17 | Alpes Lasers Sa | Quantum cascade laser with current blocking layers |
| JP6190407B2 (ja) * | 2015-03-09 | 2017-08-30 | 株式会社東芝 | 半導体発光装置およびその製造方法 |
| US9899959B2 (en) | 2015-05-22 | 2018-02-20 | Canon Kabushiki Kaisha | Element, and oscillator and information acquiring device including the element |
| JP7076937B2 (ja) * | 2015-06-15 | 2022-05-30 | キヤノン株式会社 | 半導体素子 |
| JP6597037B2 (ja) * | 2015-08-06 | 2019-10-30 | 住友電気工業株式会社 | 量子カスケードレーザデバイス |
| JP6719882B2 (ja) * | 2015-10-20 | 2020-07-08 | キヤノン株式会社 | 発振素子及びそれを用いた測定装置 |
| US10461216B2 (en) * | 2016-09-23 | 2019-10-29 | Wright State University | Gallium nitride cross-gap light emitters based on unipolar-doped tunneling structures |
| DE102016125430A1 (de) * | 2016-12-22 | 2018-06-28 | Osram Opto Semiconductors Gmbh | Oberflächenmontierbarer Halbleiterlaser, Anordnung mit einem solchen Halbleiterlaser und Betriebsverfahren hierfür |
| CN107181037B (zh) * | 2017-06-01 | 2020-09-15 | 深圳凌波近场科技有限公司 | 基于表面波光子晶体的开放式法布里佩罗谐振腔 |
| JP2017157865A (ja) * | 2017-06-07 | 2017-09-07 | 株式会社東芝 | 半導体発光装置およびその製造方法 |
| US11074382B2 (en) | 2018-01-30 | 2021-07-27 | International Business Machines Corporation | Quantum computing device design |
| US11784464B2 (en) * | 2020-09-30 | 2023-10-10 | Ii-Vi Delaware, Inc. | Directly modulated laser |
| US20220344902A1 (en) * | 2021-04-22 | 2022-10-27 | Intraband LLC | Semiconductor Laser Structure for Higher-Order Mode Suppression |
| CN113193351B (zh) * | 2021-04-30 | 2022-04-05 | 南京邮电大学 | 人工表面等离激元宽带毫米波端射天线 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3194503B2 (ja) * | 1992-06-04 | 2001-07-30 | キヤノン株式会社 | 化合物半導体装置及びその製造方法 |
| CA2132043C (en) * | 1993-09-17 | 1999-03-23 | Toshihiko Ouchi | Method and apparatus for frequency modulating a semiconductor laser, and an optical communication system using the same |
| JP3244976B2 (ja) * | 1994-12-05 | 2002-01-07 | キヤノン株式会社 | 半導体レーザの駆動方法及び半導体レーザ装置及び光通信方法及びノード及び光通信システム |
| US6089442A (en) * | 1996-04-10 | 2000-07-18 | Canon Kabushiki Kaisha | Electrode connection method |
| JP3854693B2 (ja) * | 1996-09-30 | 2006-12-06 | キヤノン株式会社 | 半導体レーザの製造方法 |
| JPH11168263A (ja) * | 1997-09-30 | 1999-06-22 | Canon Inc | 光デバイス装置及びその製造方法 |
| JPH11168262A (ja) * | 1997-09-30 | 1999-06-22 | Canon Inc | 面型光デバイス、その製造方法、および表示装置 |
| US6055257A (en) * | 1998-04-27 | 2000-04-25 | Lucent Technologies Inc. | Quantum cascade laser |
| US6301282B1 (en) | 1998-07-29 | 2001-10-09 | Lucent Technologies Inc. | Long wavelength semiconductor lasers incorporating waveguides based on surface plasmons |
| JP3728147B2 (ja) * | 1999-07-16 | 2005-12-21 | キヤノン株式会社 | 光電気混載配線基板 |
| JP3990846B2 (ja) * | 1999-08-27 | 2007-10-17 | キヤノン株式会社 | 面型光素子、その製造方法、およびこれを用いた装置 |
| JP3927913B2 (ja) * | 2003-03-05 | 2007-06-13 | キヤノン株式会社 | 光電気混載装置、及びその駆動方法 |
| JP4164423B2 (ja) * | 2003-08-29 | 2008-10-15 | キヤノン株式会社 | センシング部とポインティングデバイスとを含み構成される装置 |
| US7615787B2 (en) * | 2004-03-26 | 2009-11-10 | Canon Kabushiki Kaisha | Photo-semiconductor device and method of manufacturing the same |
| JP4785392B2 (ja) * | 2004-03-26 | 2011-10-05 | キヤノン株式会社 | テラヘルツ電磁波の発生素子の製造方法 |
| JP5196779B2 (ja) * | 2006-03-17 | 2013-05-15 | キヤノン株式会社 | 光伝導素子及びセンサ装置 |
| JP4881056B2 (ja) * | 2006-05-01 | 2012-02-22 | キヤノン株式会社 | 電磁波吸収体部を含むフォトニック結晶電磁波デバイス、及びその製造方法 |
-
2006
- 2006-05-31 JP JP2006150923A patent/JP4857027B2/ja not_active Expired - Fee Related
-
2007
- 2007-05-01 US US11/742,627 patent/US7693198B2/en not_active Expired - Fee Related
- 2007-05-02 EP EP07107334A patent/EP1863140A1/en not_active Withdrawn
- 2007-05-30 CN CN2007101081805A patent/CN101083383B/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US7693198B2 (en) | 2010-04-06 |
| JP4857027B2 (ja) | 2012-01-18 |
| EP1863140A1 (en) | 2007-12-05 |
| US20070280319A1 (en) | 2007-12-06 |
| CN101083383A (zh) | 2007-12-05 |
| JP2007324257A (ja) | 2007-12-13 |
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