CN101060340B - 选择幸存路径累计度量位宽并防止该度量溢出的方法 - Google Patents
选择幸存路径累计度量位宽并防止该度量溢出的方法 Download PDFInfo
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CN101494464B (zh) * | 2009-03-12 | 2011-10-05 | 华为技术有限公司 | 一种译码方法、装置及电子设备 |
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CN1329411A (zh) * | 2001-01-18 | 2002-01-02 | 深圳市中兴集成电路设计有限责任公司 | 多信道维特比译码装置及方法 |
JP2004265478A (ja) * | 2003-02-28 | 2004-09-24 | Toshiba Corp | ビタビ復号器および情報再生装置 |
CN1731687A (zh) * | 2005-08-08 | 2006-02-08 | 北京大学深圳研究生院 | 一种维特比译码器以及决定其中加比选单元数据位宽的方法 |
CN1731686A (zh) * | 2005-08-08 | 2006-02-08 | 北京大学深圳研究生院 | 一种维特比译码器及用于维特比译码器的加比选单元电路 |
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Publication number | Priority date | Publication date | Assignee | Title |
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CN1329411A (zh) * | 2001-01-18 | 2002-01-02 | 深圳市中兴集成电路设计有限责任公司 | 多信道维特比译码装置及方法 |
JP2004265478A (ja) * | 2003-02-28 | 2004-09-24 | Toshiba Corp | ビタビ復号器および情報再生装置 |
CN1731687A (zh) * | 2005-08-08 | 2006-02-08 | 北京大学深圳研究生院 | 一种维特比译码器以及决定其中加比选单元数据位宽的方法 |
CN1731686A (zh) * | 2005-08-08 | 2006-02-08 | 北京大学深圳研究生院 | 一种维特比译码器及用于维特比译码器的加比选单元电路 |
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Effective date of registration: 20151104 Address after: Dameisha Yantian District of Shenzhen City, Guangdong province 518085 Building No. 1 Patentee after: SHENZHEN ZTE MICROELECTRONICS TECHNOLOGY CO., LTD. Address before: 518057 Nanshan District science and Technology Industrial Park, Guangdong high tech Industrial Park, ZTE building Patentee before: ZTE Corporation |
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Application publication date: 20071024 Assignee: Xi'an Chris Semiconductor Technology Co. Ltd. Assignor: SHENZHEN ZTE MICROELECTRONICS TECHNOLOGY CO., LTD. Contract record no.: 2019440020036 Denomination of invention: A method for selecting the survivor path accumulated measurement bit width and preventing the overflow of this measurement Granted publication date: 20110511 License type: Common License Record date: 20190619 |