CN101055224A - High reflectivity measuring method based on semiconductor laser self-mixing effect - Google Patents

High reflectivity measuring method based on semiconductor laser self-mixing effect Download PDF

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CN101055224A
CN101055224A CN 200710098755 CN200710098755A CN101055224A CN 101055224 A CN101055224 A CN 101055224A CN 200710098755 CN200710098755 CN 200710098755 CN 200710098755 A CN200710098755 A CN 200710098755A CN 101055224 A CN101055224 A CN 101055224A
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output signal
cavity
semiconductor laser
optical cavity
laser instrument
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CN100559147C (en
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龚元
李斌成
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Institute of Optics and Electronics of CAS
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Institute of Optics and Electronics of CAS
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Abstract

The invention discloses a high reflectivity measuring method based on a semiconductor laser self-mixing effect, and belongs to the technical field of measurement of optical element parameters. In the existing cavity ring-down technology for determining high reflectivity by measuring ring-down time, the coupling efficiency from laser power to a ring-down cavity is improved by controlling the backward feedback light intensity of a continuous wave semiconductor laser by utilizing the self-mixing effect of the semiconductor laser, so that the signal-to-noise ratio of an output signal of the cavity is greatly improved, and the measurement precision and the measurement range of the high reflectivity are improved. The method for controlling the backward feedback light intensity to enable the amplitude of the output signal of the optical cavity to reach the maximum comprises the following steps: and a linear polaroid, an attenuation sheet, an optical isolator or an iris diaphragm is inserted between the semiconductor laser and the first cavity mirror, or the pitching of the first cavity mirror is adjusted, or the distance between the laser and the first cavity mirror is changed.

Description

The high reflectivity measurement method of based semiconductor laser instrument self-mixing effect
Technical field
The present invention relates to a kind of method of measuring optical component parameter, relate to a kind of improved high reflectivity measurement method especially.
Background technology
High reflectance is accurately measured in the widely-used an urgent demand of high reflectance optical element in laser system, and classic method can't satisfy the measuring accuracy requirement of high reflectance.Chinese patent application numbers 98114152.8, publication number CN1242516A, the patent of invention in open January 26 2000 date discloses " a kind of measuring method of high specular reflectivity of reflector ", adopt pulse laser system to make light source, incide the optical resonator that two high reflective mirrors are formed, receive optical cavity exponential damping signal, determine respectively straight chamber ring-down time T-and folded cavity ring-down time T＜, calculate the reflectivity R of mirror to be measured.The shortcoming of this method is: since pulsed laser beam of poor quality, decline and swing factors such as there being mode competition in the chamber, measuring accuracy is restricted; And, because employed pulse laser system cost height is unfavorable for promoting the use of.Chinese patent application numbers 200610011254.9, publication number CN1804572A, the patent of invention in open July 19 2006 date provides " a kind of measuring method of reflectance ratio of high reflected mirror "; " Chinese laser " that publish in September, 2006, Gong Yuan, Li Bincheng, the 33rd volume the 9th phase 1247-1250 page or leaf, disclose the method for a kind of " continuous laser optical cavity ring-down method is accurately measured high reflectance ", they have all proposed a kind ofly to make the high reflectivity measurement method of light source with the continuous semiconductor laser instrument, use the square-wave frequency modulation continuous laser, adopt phase-lock mode to survey the amplitude fading and the phase delay of output signal, thereby obtain optical cavity ring-down time and reflectance ratio of high reflected mirror.The patent of invention of Chinese patent application numbers 200610114363.3 " a kind of method of determining high reflective cavity mirror and test mirrors reflectivity simultaneously " has been improved data processing method on this basis, makes it can determine high reflective cavity mirror and test mirrors reflectivity simultaneously.This square law device is simple, cost is low, but because phase-lock mode is surveyed the optical cavity output signal that will aspire for stability, interference effect can cause signal amplitude than great fluctuation process, so must adopt from axle incident to avoid the interference effect in the chamber.Be meant laser beam incident direction and the optical axis conllinear not that declines and swing the chamber from axle incident.After cavity mirrors reflectivity was brought up to a certain degree, the optical cavity output amplitude was less, and signal to noise ratio (S/N ratio) descends, and made device regulate relatively difficulty, and had limited measuring accuracy.The patent of invention " measuring method of reflectance ratio of high reflected mirror " of Chinese patent application numbers 200610165082.0 makes continuous laser swing chamber optical axis incident along declining, utilize interference effect to strengthen the optical cavity ring-down signal, and close laser beam when the optical cavity ring-down signal amplitude triggers during greater than preset threshold, survey the reflectivity that exponential damping signal and match obtain chamber mirror and test mirrors.This square law device is simple, the precision height, but very high to the collimation requirement of total system, and must carry out minute adjustment to the chamber mirror.The present invention is on the basis of patent " measuring method of reflectance ratio of high reflected mirror " (application number 200610165082.0), control from first chamber mirror reflection by simple mechanical device or optical component and to return the back of laser instrument to the feedback light light intensity, semiconductor laser output spectrum characteristic is changed, increasing substantially laser beam is coupled into to decline and swings the efficient of optical cavity, make and occur the very big spiking of amplitude in the optical cavity output signal, thereby guaranteeing high precision, cheaply under the prerequisite, the collimation that greatly reduces whole optical system requires and regulates difficulty, and has improved the measurement range of high reflectance.
Summary of the invention
The technical problem to be solved in the present invention is at the deficiencies in the prior art, and a kind of measuring accuracy height, measurement range is big and optical system is easy to adjust method for measuring reflectance ratio of high reflected mirror are provided.
The technical solution adopted for the present invention to solve the technical problems is: the high reflectivity measurement method of based semiconductor laser instrument self-mixing effect may further comprise the steps:
(1) continuous laser incides the straight chamber that two identical plano-concave high reflective cavity mirrors, concave surface plating high-reflecting film and concave surface constitute relatively, control first chamber mirror reflection and return the back of laser resonant cavity, make to occur the resonance spike in the optical cavity output signal and make its peak value reach maximum to the feedback light light intensity;
(2) when the spiking amplitude is higher than preset threshold in the optical cavity output signal, trigger and close laser beam, swing signal fitting by declining of straight chamber output and obtain straight chamber ring-down time and calculate cavity mirrors reflectivity;
(3) holding chamber is long constant, between two identical plano-concave high reflective cavity mirrors, add high reflection measurement mirror and constitute folded cavity, when the spiking amplitude is higher than preset threshold in the folded cavity output signal, trigger and close laser beam, obtain the folded cavity ring-down time by the match of folded cavity output signal, and calculate the test mirrors reflectivity by folded cavity ring-down time and straight chamber ring-down time.
Described back is controlled in the following manner to the feedback light intensity:
(1) insert linear polarizer perpendicular to light path between laser instrument and first chamber mirror, the angle of rotation linear polarizer in perpendicular to the plane of light path makes that the spiking amplitude reaches maximum in the optical cavity output signal;
(2) between laser instrument and first chamber mirror, insert optoisolator, make in the optical cavity output signal spiking amplitude reach maximum;
(3) between laser instrument and first chamber mirror, insert the neutral density filter or the attenuator of decay intensity gradual change, and regulate decay intensity, make that the spiking amplitude reaches maximum in the optical cavity output signal;
(4) between laser instrument and first chamber mirror, insert diaphragm or iris, make that the spiking amplitude reaches maximum in the optical cavity output signal;
(5) regulate the pitching of first chamber mirror, make that the spiking amplitude reaches maximum in the optical cavity output signal;
(6) regulate between semiconductor laser and the first chamber mirror along the distance of optical path direction, make that the spiking amplitude reaches maximum in the optical cavity output signal.
Described continuous laser is produced by the continuous semiconductor laser instrument, and its light intensity adopts square-wave frequency modulation or direct current input.
Described continuous laser goes into to inject to adopt before the optical cavity spatial filtering and telescopic system to make laser transverse mode swing optical cavity intrinsic transverse mode coupling with declining, perhaps directly into injecting optical cavity.
Described threshold value is set by control triggering electric circuit, according in the optical cavity output signal resonance spike the distribution characteristics setting threshold in the 50%-99% of spike peak swing scope.
The reflectivity of described high-reflecting film is greater than 99%.
The present invention compared with prior art has following advantage:
(1) controls the back to the feedback light intensity by above simple method, having increased substantially laser beam is coupled into to decline and swings the efficient of optical cavity, make to occur the very big spiking of amplitude in the optical cavity output signal, the collimation that greatly reduces whole optical system requires and regulates difficulty.
(2) the high reflection rate measurement scope is big.Be coupled into to decline and swing the efficient of optical cavity owing to improved laser beam, make and measure more that high reflectance becomes possibility.
(3) precision height.The present invention has improved the optical cavity coupling efficiency by controlling the back to the feedback light intensity, and the optical cavity output amplitude is increased, and signal to noise ratio (S/N ratio) improves, and the energy high precision is determined the reflectivity of chamber mirror and mirror to be measured.
Description of drawings
Fig. 1 is the synoptic diagram of a kind of straight chamber measurement mechanism embodiment of the present invention;
Fig. 2 is the optical cavity output signal that has the large amplitude spike of the present invention;
Fig. 3 closes the exponential damping signal that writes down behind the laser instrument for trigger circuit of the present invention;
Fig. 4 is the structural representation of the embodiment of a kind of folded cavity of the present invention.
Embodiment
As shown in Figure 1, measurement mechanism of the present invention is made up of light source 1, iris 2, spatial filtering and telescopic system 3, plano-concave high reflective mirror 4,5, convergent lens 6, detector 7, trigger switch circuit 8, oscillograph or data collecting card 9 and computing machine 10.Thick line among the figure is represented light path, and fine rule represents that signal wire links to each other.Wherein detector 6 generally adopts photodiode or photomultiplier tube detectors.
Light source 1 adopts the continuous semiconductor laser instrument.Iris 2 is used for the control back to the feedback light intensity, also can adopt linear polarizer, attenuator or optoisolator, perhaps regulate the pitching of first chamber mirror, perhaps regulate between semiconductor laser and the first chamber mirror along the distance of optical path direction, make that the spiking amplitude reaches maximum in the optical cavity output signal.Spatial filtering and telescopic system 3 are made up of two lens and a pin hole, be used for laser beam reshaping with light source 1 output become basic mode and with the optical cavity pattern match.Also can remove spatial filtering and telescopic system 3 in the measuring system, directly laser be gone into to inject optical cavity without pattern match.At first, constituting straight chamber by plano-concave high reflective mirror 4,5 measures.By controlling the back, make the optical cavity output signal the very large spike of a lot of amplitudes occur, as shown in Figure 2 to the feedback light intensity.Two identical plano-concave high reflective mirrors 4,5, its concave surface plating high-reflecting film, reflectivity is greater than 99%, and concave surface constitutes straight chamber resonator cavity relatively.Continuous laser beam is repeatedly reflection back output in resonator cavity, is received by detector 7 after lens 6 are assembled.Detector 7 converts light signal to electric signal, and outputs to trigger switch circuit 8 and oscillograph or data collecting card 9 simultaneously.Then, set one less than the peaked threshold value of resonance spike with trigger switch circuit 8, according to the distribution characteristics setting threshold of resonance spike in the optical cavity output signal in the 50%-99% of spike peak swing scope, and the size of preset threshold and detector 7 output amplitudes relatively.When the spiking amplitude is higher than threshold value, exciting current or the voltage quick closedown laser output of trigger switch circuit 8 by changing semiconductor laser, thus obtain the exponential damping signal.Trigger switch circuit 8 triggers the exponential damping signal after laser instrument closed in oscillograph or data collecting card 9 records simultaneously, as shown in Figure 3, and sends into computing machine 10, by single index attenuation function y=A *Exp (t/ τ 1)+B match obtains straight chamber ring-down time τ 1, again by R=exp (L/c τ 1) or R=1-L/c τ 1Calculate cavity mirrors reflectivity R, c is the light velocity, and L is that the chamber is long.Then, holding chamber is long constant, adds high reflection measurement mirror 11 backs and constitutes folded cavitys, as shown in Figure 4, can measure the reflectivity of any reflectivity greater than 99% plane high reflective mirror.Be similar to straight chamber measuring process, setting threshold is the 50%-99% scope of spiking peak swing when the folded cavity situation, when the spiking amplitude is greater than threshold value in the signal of detector 7 outputs, triggering is closed light source 1 and is triggered oscillograph or data collecting card 9 record folded cavity exponential damping signals, presses single index attenuation function y=A*exp (t/ τ by computing machine 10 2)+B match obtains straight chamber ring-down time τ 2, again by R x=exp (L/c τ 1-L/c τ 2) calculate test mirrors reflectivity Rx.

Claims (6)

1, the high reflectivity measurement method of based semiconductor laser instrument self-mixing effect is characterized in that realizing by following steps:
(1) continuous laser incides the straight chamber that two identical plano-concave high reflective cavity mirrors, concave surface plating high-reflecting film and concave surface constitute relatively, control first chamber mirror reflection and return the back of laser resonant cavity, make to occur the resonance spike in the optical cavity output signal and make its peak value reach maximum to the feedback light light intensity;
(2) when the spiking amplitude is higher than preset threshold in the optical cavity output signal, trigger and close laser beam, swing signal fitting by declining of straight chamber output and obtain straight chamber ring-down time and calculate cavity mirrors reflectivity;
(3) holding chamber is long constant, between two identical plano-concave high reflective cavity mirrors, add the folded cavity that high reflection measurement mirror constitutes, when the spiking amplitude is higher than preset threshold in the folded cavity output signal, trigger and close laser beam, obtain the folded cavity ring-down time by the match of folded cavity output signal, and calculate the test mirrors reflectivity by folded cavity ring-down time and straight chamber ring-down time.
2, the high reflectivity measurement method of based semiconductor laser instrument self-mixing effect according to claim 1 is characterized in that: described back is controlled in the following manner to the feedback light intensity:
(1) insert linear polarizer perpendicular to light path between laser instrument and first chamber mirror, the angle of rotation linear polarizer in perpendicular to the plane of light path makes that the spiking amplitude reaches maximum in the optical cavity output signal;
(2) between laser instrument and first chamber mirror, insert optoisolator, make in the optical cavity output signal spiking amplitude reach maximum;
(3) between laser instrument and first chamber mirror, insert the neutral density filter or the attenuator of decay intensity gradual change, and regulate decay intensity, make that the spiking amplitude reaches maximum in the optical cavity output signal;
(4) between laser instrument and first chamber mirror, insert diaphragm or iris, make that the spiking amplitude reaches maximum in the optical cavity output signal;
(5) regulate the pitching of first chamber mirror, make that the spiking amplitude reaches maximum in the optical cavity output signal;
(6) regulate between semiconductor laser and the first chamber mirror along the distance of optical path direction, make that the spiking amplitude reaches maximum in the optical cavity output signal.
3, the high reflectivity measurement method of based semiconductor laser instrument self-mixing effect according to claim 1 is characterized in that: described continuous laser is produced by the continuous semiconductor laser instrument, and its light intensity adopts square-wave frequency modulation or direct current input.
4, the high reflectivity measurement method of based semiconductor laser instrument self-mixing effect according to claim 1, it is characterized in that: described continuous laser goes into to inject to adopt before the optical cavity spatial filtering and telescopic system to make laser transverse mode swing optical cavity intrinsic transverse mode coupling with declining, perhaps directly into injecting optical cavity.
5, the high reflectivity measurement method of based semiconductor laser instrument self-mixing effect according to claim 1, it is characterized in that: described threshold value is set by control triggering electric circuit, according in the optical cavity output signal resonance spike the distribution characteristics setting threshold in the 50%-99% of spike peak swing scope.
6, the high reflectivity measurement method of based semiconductor laser instrument self-mixing effect according to claim 1, it is characterized in that: the reflectivity of described high-reflecting film is greater than 99%.
CN 200710098755 2007-04-26 2007-04-26 High reflectivity measuring method based on semiconductor laser self-mixing effect Expired - Fee Related CN100559147C (en)

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CN101261182B (en) * 2008-03-26 2010-06-23 中国科学院光电技术研究所 High reflectivity measuring method based on frequency selective optical feedback cavity ring-down technology
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