CN101038215A - Device used for measuring sample temperature in procedure of metal material surface nanometre - Google Patents
Device used for measuring sample temperature in procedure of metal material surface nanometre Download PDFInfo
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- CN101038215A CN101038215A CN200710037302.6A CN200710037302A CN101038215A CN 101038215 A CN101038215 A CN 101038215A CN 200710037302 A CN200710037302 A CN 200710037302A CN 101038215 A CN101038215 A CN 101038215A
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Abstract
The present invention is a sampling temperature measuring device in the nanometer process of the surface made of metal, and said device includes a sampling card and a temperature measuring part. Wherein the sampling card containing a top board, a lateral board, a bottom board, a pressure board, a puller bolt, a countersunk head bolt; the lateral board is fixed with the top board; the bottom board is fixed with the lateral board through the countersunk head bolt; the top board is connected with the pressure board through the puller bolt; the sampling where the pressure board is positioned is positioned on the bottom board and is fixed and pressed by the pressure board through puller bolt. The temperature measuring part includes a thermocouple and a temperature recording meter; the probe head of the thermocouple is fixed on the part of the sampling where the card is inserted; the temperature recording meter is positioned on the outside of side part; the thermocouple and the temperature recording meter are connected through a lead; the number of the thermocouple can be one or two. The device in the present invention can be inserted with cards made of block shaped metal with different thickness and real temperature change in the strong plastic deformation process of the integral of the metal material or the nanometer surface can be measured and recorded. Thus, the device in the present invention is favorable for the controlling of the temperature.
Description
Technical field
The present invention relates to a kind of temperature measuring equipment, be specifically related to a kind of device that is used for measuring sample temperature in procedure of metal material surface nanometre.Belong to the metal material technical field.
Background technology
When the crystallite dimension of metal material is reduced to nanoscale (less than 100nm), just have performances such as unique mechanical, physics, chemistry.The most frequently used method that makes making Nano surface of metal material is that surface mechanical attrition is handled at present.But in metal material stood process that intense plastic strain produces nanometer, the temperature of material can raise, particularly on the surface of material.In the intense plastic strain process of metal material, the motion of dislocation and answer and temperature are closely connected, and are thermally equilibrated processes.Therefore, the important role of temperature in the nanometer process.In addition, the nanocrystal that forms is also very sensitive to temperature, angle from energy, nanocrystal has high excess energy, be in an unsure state, trend with grain growth, from the angle of thermal stability, the thermal stability of nanocrystal is a problem demanding prompt solution of nanocrystal.In addition, for the relatively poor material of some temperature-room type plasticity, it has plasticity preferably in certain temperature range, and therefore being out of shape at a certain temperature is the requirement that this class material carries out plastic yield.
Through looking into new discovery, the new lattice science and technology limited Company in Chengdu has been produced a kind of SNC-I type making Nano surface of metal material testing machine, in this testing machine, its mode of being installed that adopts is that sample is placed on the fixing sample stage, to cover plate then is placed on the sample, thereby will cover plate by bolt and be connected fixed sample with sample stage, its temperature survey mode is that the probe with thermopair is fixed on the gap on the sample stage, show the temperature that measures by thermometer, what adopt that this mode measures is environment temperature in the vibration cavity, the temperature variation of metal material self exists than big-difference in this temperature and the intense plastic strain process, can not reflect real temperature variation in the sample intense plastic strain process fully, because it is thermometric inaccurate, in fact temperature becomes a uncontrollable technological factor, causes the test of making Nano surface of metal material can only at room temperature carry out basically.
Summary of the invention
The objective of the invention is to overcome deficiency of the prior art, a kind of device that is used for measuring sample temperature in procedure of metal material surface nanometre is provided, make its actual temperature that can accurately measure sample in the intense plastic strain process, thereby organize Changing Pattern and provide the temperature Control and Feedback that accurate information is provided in order to separate.
The present invention is achieved through the following technical solutions, the present invention includes sample and be installed and two parts of temperature survey; Sample is installed and partly comprises top board, sidewall paneling, base plate, pressing plate, puller bolt, dormant bolt, top board is fixedlyed connected with sidewall paneling, base plate and sidewall paneling are fastening by dormant bolt, adopt dormant bolt can avoid in the strong deformation process bolt to the pollution on metal material sample surface, top board is connected by puller bolt with pressing plate, sample is placed on the base plate, pressing plate is placed on the sample, sample is fixed by puller bolt by pressing plate, prevent from the making Nano surface process, to come off, this mode of being installed goes for the reguline metal material sample of various different-thickness, and is easy to loading and unloading flexible; Temperature survey partly comprises thermopair and moisture recorder, the probe of thermopair be fixed in sample be installed the part among, described thermopair can adopt single or two, when adopting single thermopair, the probe of thermopair is fixed on pressing plate, on sidewall paneling or the base plate, upper surface with sample, side surface or lower surface closely contact, when adopting two thermopairs, the probe of two thermopairs is fixed on respectively on pressing plate and the base plate, closely contact with lower surface with the upper surface of sample, moisture recorder be positioned at sample be installed the part outside, thermopair is connected with moisture recorder, and the temperature signal that measures passed to moisture recorder, this metering system can be measured in the intense plastic strain process, sample true temperature whole and the nanometer treatment surface changes, and notes temperature curve over time by moisture recorder.
The present invention is directed to the temperature survey mode that adopts in the metal current material surface nanometer process improves, can the be installed reguline metal material of various different-thickness of the present invention, and the true temperature variation of the surface of or generation nanometer whole to metal material in the intense plastic strain process measured and record, and after can the true temperature of sample changes in obtaining the intense plastic strain process, by analog computation sample temperature inside Gradient distribution, has positive meaning for the microstructure evolution of understanding sample, and handle real temperature information is provided under different temperatures, carrying out nanometer, help carrying out temperature controlling.
Description of drawings
Fig. 1 is a structural representation of the present invention
Embodiment
Below one embodiment of the invention are elaborated: present embodiment is being to implement under the prerequisite with the technical solution of the present invention, provided detailed embodiment and concrete operating process, but protection scope of the present invention is not limited to following embodiment.
As shown in the figure, present embodiment comprises that sample is installed partly and the temperature survey part; Sample is installed and partly comprises top board 1, sidewall paneling 2, base plate 3, pressing plate 4 and puller bolt 5, dormant bolt 6, top board 1 is fixedlyed connected with sidewall paneling 2, base plate 3 is fastening by dormant bolt 6 with sidewall paneling 2, adopt dormant bolt 6 can avoid in the strong deformation process bolt to the pollution of specimen surface, puller bolt 5 is connected with pressing plate 4 by the threaded hole on the top board 1, sample is placed on the base plate 3, pressing plate 4 is placed on the sample, sample is fixed by puller bolt 5 by pressing plate 4, prevent from the intense plastic strain process, to come off, this mode of being installed goes for the reguline metal material sample of various different-thickness, and is easy to loading and unloading flexible; Temperature survey partly comprises thermopair 7 and moisture recorder 8, the probe of thermopair 7 be fixed in sample be installed the part among, moisture recorder 8 be positioned at sample be installed the part outside, thermopair 7 and moisture recorder 8 are connected by lead, and the temperature signal that measures passed to moisture recorder 8, by the numerical value of moisture recorder 8 direct displays temperatures or print the time dependent curve of temperature.
The fixed form of the probe of thermopair 7 has following four kinds: first kind, be fixed on the pressing plate 4, and contact with the upper surface of sample, with the true temperature that material monolithic can be measured in this position that is fixed on of the probe of thermopair; Second kind, be fixed on the sidewall paneling 2, contact with the side surface of sample, same what measure is that true temperature whole in the material deformation process changes with this position that is fixed on of the probe of thermopair; The third is fixed on the base plate 3, contacts with the lower surface (being the nanometer surface) of sample, the probe of thermopair is fixed on this position can measures the true temperature on material generation nanometer surface in the intense plastic strain process and change; The 4th kind, the probe with a thermopair is fixed on the pressing plate 4, contacts with the upper surface of sample simultaneously, and the probe of another thermopair is fixed on the base plate 3, contacts with the lower surface of sample.First three kind mode adopts single thermopair, and the 4th kind of mode adopts two thermopairs simultaneously, can obtain the information of temperature gradient distribution more accurately.Adopt the 4th kind of mode not only can obtain the true temperature of surface of sample generation nanometer in the intense plastic strain process and material monolithic respectively, and can analog computation obtain sample temperature inside Gradient distribution.This time understands the feature that microstructure changes in depth and has great importance for carrying out the making Nano surface test at a certain temperature.
Claims (4)
1, a kind of device that is used for measuring sample temperature in procedure of metal material surface nanometre, comprise: sample is installed and two parts of temperature survey, it is characterized in that, described sample is installed and partly comprises top board, sidewall paneling, base plate, pressing plate, puller bolt, dormant bolt, sidewall paneling is fixedlyed connected with top board, base plate and sidewall paneling are fastening by dormant bolt, top board is connected by puller bolt with pressing plate, sample is placed on the base plate, pressing plate is placed on the sample, and sample is fixed by puller bolt by pressing plate; Temperature survey partly comprises thermopair and moisture recorder, the probe of thermopair be fixed in sample be installed the part among, moisture recorder be positioned at sample be installed the part outside, thermopair is connected with moisture recorder.
2, the device that is used for measuring sample temperature in procedure of metal material surface nanometre according to claim 1 is characterized in that, described thermopair is single or two.
3, the device that is used for measuring sample temperature in procedure of metal material surface nanometre according to claim 2, it is characterized in that, when thermopair when being single, the probe of thermopair is fixed on pressing plate, sidewall paneling or the base plate, closely contacts with upper surface, side surface or the lower surface of sample.
4, the device that is used for measuring sample temperature in procedure of metal material surface nanometre according to claim 2, it is characterized in that, when thermopair is two, the probe of two thermopairs be fixed on respectively sample be installed the part pressing plate and base plate on, closely contact with lower surface with the upper surface of sample.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2007100373026A CN100449285C (en) | 2007-02-08 | 2007-02-08 | Device used for measuring sample temperature in procedure of metal material surface nanometre |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2007100373026A CN100449285C (en) | 2007-02-08 | 2007-02-08 | Device used for measuring sample temperature in procedure of metal material surface nanometre |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101038215A true CN101038215A (en) | 2007-09-19 |
| CN100449285C CN100449285C (en) | 2009-01-07 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNB2007100373026A Expired - Fee Related CN100449285C (en) | 2007-02-08 | 2007-02-08 | Device used for measuring sample temperature in procedure of metal material surface nanometre |
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| CN (1) | CN100449285C (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101544352B (en) * | 2009-04-24 | 2012-07-04 | 重庆大学 | Method and equipment for preparing nano material with large thickness and area through acute plastic deformation |
| CN102980790A (en) * | 2012-11-30 | 2013-03-20 | 上海交通大学 | Test device and method for high-temperature shot blasting |
| CN103411697A (en) * | 2013-07-11 | 2013-11-27 | 青岛新力通工业有限责任公司 | Armored thermocouple temperature measuring device of material high temperature mechanical testing machine |
| CN103537331A (en) * | 2013-10-14 | 2014-01-29 | 北京工业大学 | High-polymer nano-grade indentation constant-temperature water-bath sample bench and related experiment method |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2720703B2 (en) * | 1992-05-07 | 1998-03-04 | 日立電線株式会社 | Contact temperature detector |
| JP3662236B2 (en) * | 2002-09-17 | 2005-06-22 | 株式会社岡崎製作所 | Surface thermometer probe |
| CN1265192C (en) * | 2003-09-26 | 2006-07-19 | 南京大学 | Processing method for measuring multi-point temperature change in metal conductor |
| CN100373144C (en) * | 2003-11-06 | 2008-03-05 | 中国科学院力学研究所 | Material thermal treating surface temperature realtime monitoring system |
-
2007
- 2007-02-08 CN CNB2007100373026A patent/CN100449285C/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101544352B (en) * | 2009-04-24 | 2012-07-04 | 重庆大学 | Method and equipment for preparing nano material with large thickness and area through acute plastic deformation |
| CN102980790A (en) * | 2012-11-30 | 2013-03-20 | 上海交通大学 | Test device and method for high-temperature shot blasting |
| CN103411697A (en) * | 2013-07-11 | 2013-11-27 | 青岛新力通工业有限责任公司 | Armored thermocouple temperature measuring device of material high temperature mechanical testing machine |
| CN103411697B (en) * | 2013-07-11 | 2016-04-27 | 青岛新力通工业有限责任公司 | The armoured thermocouple temperature measuring equipment of material at high temperature mechanics machine |
| CN103537331A (en) * | 2013-10-14 | 2014-01-29 | 北京工业大学 | High-polymer nano-grade indentation constant-temperature water-bath sample bench and related experiment method |
| CN103537331B (en) * | 2013-10-14 | 2015-05-20 | 北京工业大学 | High-polymer nano-grade indentation constant-temperature water-bath sample bench and related experiment method |
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| Publication number | Publication date |
|---|---|
| CN100449285C (en) | 2009-01-07 |
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Granted publication date: 20090107 Termination date: 20120208 |