CN100485394C - IC detection device - Google Patents
IC detection device Download PDFInfo
- Publication number
- CN100485394C CN100485394C CNB2004100376529A CN200410037652A CN100485394C CN 100485394 C CN100485394 C CN 100485394C CN B2004100376529 A CNB2004100376529 A CN B2004100376529A CN 200410037652 A CN200410037652 A CN 200410037652A CN 100485394 C CN100485394 C CN 100485394C
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- CN
- China
- Prior art keywords
- pick
- test board
- material fetching
- dispenser
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001514 detection method Methods 0.000 title abstract description 6
- 230000007246 mechanism Effects 0.000 claims abstract description 106
- 239000000463 material Substances 0.000 claims abstract description 60
- 238000006073 displacement reaction Methods 0.000 claims description 13
- 238000007599 discharging Methods 0.000 claims description 11
- 239000000284 extract Substances 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 12
- 230000003028 elevating effect Effects 0.000 description 11
- 230000001360 synchronised effect Effects 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
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Abstract
The invention discloses IC detection device. Set first and second material pick-up mechanisms with dispenser on the two sides of test bench, which set sideslip and lifting structure on frames, drove by two drive source to bring dispenser move at X-Y direction separated; set in and out material mechanism on frond and end of test bench; then the first material pick-up mechanism extracts IC by in material mechanism and carries to test beach; the second material pick-up mechanism sideslips to in material mechanism to extract IC; the first material pick-up mechanism carries IC tested to out material mechanism, the second material pick-up mechanism then sends IC to test beach to test, and the first material pick-up mechanism take pick-up material operation repeated; thereby, every mechanism acts separated, increases assemble precision and carry speed, then advances test efficiency.
Description
Technical field
The present invention relates to a kind of IC pick-up unit, its each material fetching mechanism independence start can be easy to promote assembly precision and carry speed, and then improve detection efficiency more.
Background technology
See also Fig. 1～Fig. 5, be " the IC pick-up unit " of No. the 88217626th, the Taiwan patented claim of the previous application of applicant, be provided with a transverse-moving mechanism 2 and two elevating mechanisms 3 in the top of test board 1,4, this transverse-moving mechanism 2 is provided with upright plate body 6 cunnings of transverse slider 5 sacrificial vessel cross slides 7 and puts assembling in the frame both sides, and each 6 of upright plate body is provided with a support 8, this support 8 screws togather a transverse screw 9 with swivel nut, this transverse screw 9 is driven by a motor 10, and then can drive support 8 and the 6 traversing starts of upright plate body, be provided with upright slide block 11 in upright plate body 6 sides in addition, for two elevating mechanisms 3,4 horizontal support 12,13 with upright slide 14,15 cunnings are put assembling, in addition in each support 12,13 bottom surface is provided with suction nozzle 16,17, and be provided with a longitudinal screw 18 that runs through transverse-moving mechanism 2 supports 8 in end face, 19, this longitudinal screw 18,19 by two motor 20,21 drive, and then two elevating mechanism 3,4 can drive suction nozzle 16 respectively, 17 lifting starts, the both sides of this test board 1 are provided with the microscope carrier mechanism 22 that tool is counted microscope carrier again, 23, this two microscope carriers mechanism 22, before 23, the rear is provided with a feeding mechanism 24 and material fetching mechanism 25; By this, when the microscope carrier of a microscope carrier mechanism 22 is carried to test board 1 side with IC, two groups of elevating mechanisms 3,4 promptly descend synchronously, make the suction nozzle 16 of one group of elevating mechanism 3 draw IC, then this transverse-moving mechanism 2 promptly drives two groups of elevating mechanisms 3,4 synchronous backward displacements, the elevating mechanism 3 of drawing IC is descended, IC is placed in the test board 1 tests, another elevating mechanism 4 is then drawn IC in the microscope carrier mechanism 23 of homonymy, after treating that the IC detection finishes, this transverse-moving mechanism 2 drives two groups of elevating mechanisms 3 once more, 4 reverse displacements make each suction nozzle 16,17 descend makes to place IC respectively and detects the IC action; But, though this pick-up unit can promote the throughput rate of IC test jobs, but because two elevating mechanisms are laterally to be linked between transversing gear and the start of phase mutually synchronization with support, its each inter-agency collocation assembly precision requires quite high, so that it is quite difficult and time-consuming in the assembling, when if assembly precision is low, promptly must slow down the speed that carries of each mechanism, to make each inter-agency synchronous shift start smoothly, cause and effectively the test jobs time to be foreshortened to optimization, in addition when there is clip in one mechanism slightly, promptly affects mutually and influence the smoothness of whole start.
Summary of the invention
The purpose of this invention is to provide a kind of IC pick-up unit, be provided with first of tool dispenser in the both sides of test board, two material fetching mechanisms, this is first years old, two material fetching mechanisms are equipped with traversing structure and lifting structure on frame, and drive by two drive sources, distinctly do X-Z direction displacement to drive dispenser, and then this first material fetching mechanism is drawn IC on a feeding mechanism, and be carried to test board and test, and second material fetching mechanism is traversing to feeding mechanism absorption IC, first material fetching mechanism is after the IC test finishes, then be carried to a discharging mechanism top discharge, and second material fetching mechanism is about to IC and is carried to test board test, and this moment, first material fetching mechanism repeated material extracting operation again; By this, each material fetching mechanism independence start of the present invention, the assembly collocation is easily assembled, needn't time-consumingly assemble, and is easy to promote assembly precision, to speed the velocity of displacement of each material fetching mechanism, carries the time and shorten, and reaches the benefit that more effectively improves detection efficiency.
The present invention is described in detail with instantiation below in conjunction with accompanying drawing.
Description of drawings
Fig. 1 is the synoptic diagram of No. 88217626 patent in Taiwan;
Fig. 2 is the partial top view of Fig. 1;
Fig. 3 be Fig. 1 get the material synoptic diagram;
Fig. 4 is that the IC of Fig. 1 detects and another gets material IC synoptic diagram;
Fig. 5 is the blowing of Fig. 1 and detects synoptic diagram;
Fig. 6 is the arrangement plan of each mechanism of the present invention;
Fig. 7 is first and second material fetching mechanism synoptic diagram of the present invention;
Fig. 8-1 is the synoptic diagram of first material fetching mechanism;
Fig. 8-2 is side views of first material fetching mechanism;
Fig. 9-1 is the synoptic diagram of second material fetching mechanism;
Fig. 9-2 is side views of second material fetching mechanism;
Figure 10 is the front elevation of first and second material fetching mechanism;
Figure 11 is the vertical view of first and second material fetching mechanism;
Figure 12 is the synoptic diagram that carries IC;
Figure 13 is the synoptic diagram that first material fetching mechanism is drawn IC;
Figure 14 is that first and second material fetching mechanism is made the synoptic diagram that IC tested and drew another IC respectively;
Figure 15 is the synoptic diagram that first and second material fetching mechanism is done another IC test and IC discharging respectively;
Figure 16 is the synoptic diagram that first and second material fetching mechanism is drawn IC and IC discharging respectively once more.
Description of reference numerals: test board 1; Transverse-moving mechanism 2; Elevating mechanism 3,4; Transverse slider 5; Cross slide 7; Upright plate body 6; Support 8; Transverse screw 9; Motor 10; Upright slide block 11; Horizontal support 12,13; Upright slide 14,15; Suction nozzle 16,17; Longitudinal screw 18,19; Motor 20,21; Microscope carrier mechanism 22,23; Feeding mechanism 24; Material fetching mechanism 25; Test board 30; First material fetching mechanism 40; Second material fetching mechanism 50; Horizontal slide rail 41,51; Transverse screw 42,52; Motor 43,53; Sliding part 44,54; Swivel nut 441,541; Cross slide 442,542; Vertical slide 443,543; Dispenser 45,55; Vertical slide rail 451,551; Cross slide 452,552; Support 46,56; Horizontal slide rail 461,561; Vertical slide 462,562; Swivel nut 463,563; Vertical slide rail 47,57; Longitudinal screw 48,58; Motor 49,59; Feeding mechanism 60; Discharging mechanism 70; Microscope carrier 61,71; Suction nozzle 62,72.
Embodiment
See also Fig. 6～Figure 11, pick-up unit of the present invention includes test board 30, first, two material fetching mechanisms 40,50 and go into, discharging mechanism 60,70, wherein, the both sides of this test board 30 are provided with first, two material fetching mechanisms 40,50, each material fetching mechanism is equipped with the traversing structure and the lifting structure of mutual assembling, each traversing structure is provided with horizontal slide rail 41 in frame, 51 and transverse screw 42,52, and transverse screw 42,52 by a motor 43,53 drive, one has swivel nut 441,541 and cross slide 442,542 sliding part 44,54, slide and put and be screwed together in horizontal slide rail 41,51 and transverse screw 42, on 52, and be provided with vertical slide 443 in other face, 543, and lifting structure is at the dispenser 45 of a bottom surface tool suction nozzle, 55 sides are provided with vertical slide rail 451,551, with the sliding sliding part 44 that places, vertical slide 443 of 54, in 543, this traversing structure is in addition in dispenser 45,55 end face is provided with a cross slide 452,552, with the sliding support 46 that places, 56 horizontal slide rail 461, on 561, and lifting structure is in this support 46,56 face in addition is provided with two vertical slides 462,562 and one swivel nut 463,563, to be assembled in vertical slide rail 47 of frame respectively, 57 and longitudinal screw 48, on 58, and longitudinal screw 48,58 by a motor 49,59 drive, and then the motor 43 of working as each traversing structure, 53 drive transverse screw 42,52 o'clock, promptly drive sliding part 44,54 cross slide 442,542 and dispenser 45,55 cross slide 452,552, horizontal slide rail 41 in frame, 51 and support 46,56 horizontal slide rail 461, make the directions X shift reciprocately on 561, and when the motor 49 of each lifting structure, 59 drive longitudinal screw 48,58 o'clock, promptly drive support 46, vertical slide 462 of 56,562 and dispenser 45, vertical slide rail 451 of 55,551, vertical slide rail 47 in frame, 57 and sliding part 44, vertical slide 443 of 54, make Z direction shift reciprocately on 543, before this feeding mechanism 60 and discharging mechanism 70 are located at test board 30 respectively in addition, the rear, respectively be provided with a tool microscope carrier 61,71 microscope carrier structure, in order to carry IC, reach one and have suction nozzle 62,72 pick and place structure, in order to pick and place IC;
By this, see also Figure 12, shown in Figure 13, the suction nozzle 62 of this feeding mechanism 60 is positioned over IC on the microscope carrier 61, be carried to dispenser 45 belows of first material fetching mechanism 40 with microscope carrier 61, the motor 49 of this first material fetching mechanism 40 promptly drives longitudinal screw 48, to drive support 46 and dispenser 45 declines, makes the suction nozzle of dispenser 45 draw IC on microscope carrier 61, and rise and to reset, and microscope carrier 61 more oppositely displacement reset with carrying IC;
See also Figure 11, Figure 13, shown in Figure 14, the two motor 49 of this first material fetching mechanism 40,43 promptly drive respectively vertical, transverse screw 48,42, to drive support 46, sliding part 44 and dispenser 45 are done X-Z direction displacement synchronously, IC on the dispenser 45 is placed in carries out test jobs in the test board 30, at the same time, the microscope carrier 61 of feeding mechanism 60 carries the side of another IC to test board 30 again, and the motor 53 of second material fetching mechanism 50 promptly drives transverse screw 52, do the directions X displacement to drive sliding part 54 and dispenser 55, make dispenser 55 be positioned at microscope carrier 61 tops of feeding mechanism 60, drive longitudinal screw 58 with another motor 59 again, and drive support 56 and dispenser 55 descend, make the suction nozzle of dispenser 55 draw IC, and oppositely displacement reset;
See also Figure 11, Figure 15, shown in Figure 16, after the IC of first material fetching mechanism 40 detection finishes, promptly by two motor 49,43 drivings are vertical, transverse screw 48,42, to drive dispenser 45 in each horizontal slide rail 41, transversal displacement is to microscope carrier 71 tops of discharging mechanism 70 on 461, and make 45 times general who has surrendered IC of dispenser be positioned on the microscope carrier 71 sending, at the same time, the two motor 59 of second material fetching mechanism 50,53 promptly drive respectively vertical, transverse screw 58,52, to drive support 56, sliding part 54 and dispenser 55 are done X-Z direction displacement synchronously, IC on the dispenser 55 is placed in carries out test jobs in the test board 30, when the IC of second material fetching mechanism 50 does test, the dispenser 45 of this first material fetching mechanism 40 is reverse displacement start, and on the microscope carrier 61 of feeding mechanism 60, adsorb IC once more, when on the dispenser 55 of second material fetching mechanism 50 is positioned over the IC that tests the microscope carrier 71 of discharging mechanism 70, sending, first material fetching mechanism 40 can be placed in IC in the test board 30 and test, therefore, this first, two material fetching mechanisms 40,50 can carry IC rapidly in regular turn carries out test jobs.
Claims (7)
1, a kind of IC pick-up unit, it is characterized in that: it comprises: test board: be provided in a side of on the board;
Feeding mechanism: the place ahead that is provided in a side of test board, described feeding mechanism is provided with the microscope carrier structure that picks and places structure and can move of tool suction nozzle, the structure that picks and places of the described microscope carrier structure sacrificial vessel suction nozzle that can move is inserted IC to be measured, and IC to be measured is carried to the side of test board;
First material fetching mechanism: the side that is provided in a side of test board, and be provided with traversing structure and lifting structure, and each is driven by a drive source, do X-Z direction displacement to drive a dispenser, in order to being presented to, the structural IC to be measured of the microscope carrier of feeding mechanism carries out test jobs in the test board, and after finishing test, will finish survey IC and shift out test board;
Second material fetching mechanism: the side that is provided in a side of test board, and be provided with traversing structure and lifting structure, and each is driven by a drive source, do X-Z direction displacement to drive a dispenser, in order to being inserted, the structural IC to be measured of the microscope carrier of feeding mechanism in test board, carries out test jobs, and after finishing test, will finish survey IC and shift out test board;
Discharging mechanism: the rear that is provided in a side of test board, what described discharging mechanism was provided with the tool suction nozzle picks and places structure and microscope carrier structure movably, described movably microscope carrier structure can have been inserted for first and second material fetching mechanism and survey IC, and will finish and survey the rear that IC is carried to test board, take out by the structure that picks and places of tool suction nozzle.
2, according to the described IC pick-up unit of claim 1, it is characterized in that: the traversing structure of each of described first and second material fetching mechanism motor driven one transverse screw, spiral shell is established the sliding part of a tool swivel nut on the described transverse screw, each lifting structure is provided with the vertical slide and vertical slide rail that cooperatively interacts between sliding part and dispenser, described traversing structure in addition is provided with the cross slide and horizontal slide rail that cooperatively interacts between the end face of dispenser and a support, lifting structure is being provided with swivel nut to be screwed on the longitudinal screw on the support, longitudinal screw is by a motor driven.
3, according to the described IC pick-up unit of claim 2, it is characterized in that: the traversing structure of each of described first and second material fetching mechanism is provided with several horizontal slide rails on frame, puts assembling for the cross slide cunning of dispenser.
4, according to the described IC pick-up unit of claim 2, it is characterized in that: each lifting structure of described first and second material fetching mechanism is provided with several vertical slide rails on frame, puts assembling for vertical slide cunning of support.
5, according to the described IC pick-up unit of claim 1, it is characterized in that: the dispenser of described first and second material fetching mechanism has suction nozzle.
6, according to the described IC pick-up unit of claim 1, it is characterized in that: described feeding mechanism is provided with and picks and places structure, in order to pick and place IC.
7, according to the described IC pick-up unit of claim 1, wherein, described discharging mechanism is provided with and picks and places structure, in order to pick and place IC.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100376529A CN100485394C (en) | 2004-04-28 | 2004-04-28 | IC detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100376529A CN100485394C (en) | 2004-04-28 | 2004-04-28 | IC detection device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1690717A CN1690717A (en) | 2005-11-02 |
| CN100485394C true CN100485394C (en) | 2009-05-06 |
Family
ID=35346299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2004100376529A Expired - Lifetime CN100485394C (en) | 2004-04-28 | 2004-04-28 | IC detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100485394C (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101241869B (en) * | 2007-02-08 | 2010-06-23 | 鸿劲科技股份有限公司 | Chip testing classifier |
| CN102189082B (en) * | 2010-03-10 | 2013-06-26 | 鸿劲科技股份有限公司 | Electronic component test classifier |
| CN105984722B (en) * | 2015-02-16 | 2018-05-15 | 鸿劲科技股份有限公司 | Electronic component Filtting device and its implement of application |
-
2004
- 2004-04-28 CN CNB2004100376529A patent/CN100485394C/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| CN1690717A (en) | 2005-11-02 |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
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| TR01 | Transfer of patent right |
Effective date of registration: 20210917 Address after: Taichung City, Taiwan, China Patentee after: HONGJIN PRECISION Co.,Ltd. Address before: TaiWan, China Patentee before: HON TECHNOLOGIES, Inc. |
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| TR01 | Transfer of patent right |