CN100449362C - 液晶显示面板检测装置 - Google Patents

液晶显示面板检测装置 Download PDF

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Publication number
CN100449362C
CN100449362C CNB2006100834600A CN200610083460A CN100449362C CN 100449362 C CN100449362 C CN 100449362C CN B2006100834600 A CNB2006100834600 A CN B2006100834600A CN 200610083460 A CN200610083460 A CN 200610083460A CN 100449362 C CN100449362 C CN 100449362C
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CN
China
Prior art keywords
lcd panel
worktable
plate
location
movable frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB2006100834600A
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English (en)
Chinese (zh)
Other versions
CN1873479A (zh
Inventor
都贤玽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Soulbrain ENG Co Ltd
Original Assignee
Phicom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Phicom Corp filed Critical Phicom Corp
Publication of CN1873479A publication Critical patent/CN1873479A/zh
Application granted granted Critical
Publication of CN100449362C publication Critical patent/CN100449362C/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/6773—Conveying cassettes, containers or carriers

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
CNB2006100834600A 2005-06-03 2006-05-31 液晶显示面板检测装置 Expired - Fee Related CN100449362C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020050047759 2005-06-03
KR1020050047759A KR100650273B1 (ko) 2005-06-03 2005-06-03 액정표시패널 검사 장비

Publications (2)

Publication Number Publication Date
CN1873479A CN1873479A (zh) 2006-12-06
CN100449362C true CN100449362C (zh) 2009-01-07

Family

ID=37483997

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2006100834600A Expired - Fee Related CN100449362C (zh) 2005-06-03 2006-05-31 液晶显示面板检测装置

Country Status (4)

Country Link
JP (1) JP2006338007A (ko)
KR (1) KR100650273B1 (ko)
CN (1) CN100449362C (ko)
TW (1) TWI283292B (ko)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI396839B (zh) * 2008-07-10 2013-05-21 Au Optronics Corp 面板抽驗裝置及方法
JP5156970B2 (ja) * 2008-11-10 2013-03-06 株式会社日本マイクロニクス 電気的検査のためのプローブユニット、電気的検査装置および点灯検査装置
KR101119124B1 (ko) * 2010-02-24 2012-03-20 (주)신세계엔지니어링 백라이트유닛을 위한 반전기
CN102004338B (zh) * 2010-10-08 2012-03-14 友达光电(厦门)有限公司 显示装置的组装结构与组装方法
CN103558728B (zh) * 2013-10-30 2016-05-25 无锡市安捷脚手架有限公司 一种可实现平面内移动的铝合金支架
CN107783321A (zh) * 2016-08-24 2018-03-09 神讯电脑(昆山)有限公司 液晶显示屏检测装置及其方法
CN106200048B (zh) * 2016-08-30 2023-08-22 京东方科技集团股份有限公司 一种用于显示模组检测的治具
CN106646946A (zh) * 2016-12-06 2017-05-10 无锡市创恒机械有限公司 一种移动式背光装置
KR101906793B1 (ko) * 2017-09-14 2018-10-15 주식회사 디이엔티 디스플레이 패널 검사를 위한 fpcb 교체시스템
CN110726533A (zh) * 2019-09-27 2020-01-24 苏州精濑光电有限公司 一种显示面板装载装置
KR102240751B1 (ko) * 2020-10-20 2021-04-15 김국겸 이송 장치 및 이를 포함한 외관 검사 시스템
KR102308988B1 (ko) * 2020-11-02 2021-10-07 김종겸 텐션 장치가 구비된 이송 스테이지 및 이를 포함한 이송 장치

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10123193A (ja) * 1996-10-18 1998-05-15 Micronics Japan Co Ltd 表示パネル基板の検査装置および検査方法
JPH1114956A (ja) * 1997-06-23 1999-01-22 Micronics Japan Co Ltd 液晶パネル用検査ステージ
US6064462A (en) * 1998-07-21 2000-05-16 Sony Corporation Inspecting method and inspecting apparatus for liquid crystal display panel whereby the cell gap is inspected
JP2002251149A (ja) * 2001-02-26 2002-09-06 Horiba Ltd 平面表示パネルの欠陥検査装置
US6529837B1 (en) * 1999-11-12 2003-03-04 Lg. Philips Lcd Co., Ltd. Apparatus and method for inspecting cell defect of liquid crystal display device
US6774958B2 (en) * 2002-02-26 2004-08-10 Lg.Philips Lcd Co., Ltd. Liquid crystal panel, apparatus for inspecting the same, and method of fabricating liquid crystal display thereof
US6826963B2 (en) * 2002-10-04 2004-12-07 Quanta Computer, Inc. Panel testing apparatus
US20050094055A1 (en) * 2002-03-25 2005-05-05 Choo Hun J. Cassette for liquid crystal panel inspection and method of inspecting liquid crystal panel

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10123193A (ja) * 1996-10-18 1998-05-15 Micronics Japan Co Ltd 表示パネル基板の検査装置および検査方法
JPH1114956A (ja) * 1997-06-23 1999-01-22 Micronics Japan Co Ltd 液晶パネル用検査ステージ
US6064462A (en) * 1998-07-21 2000-05-16 Sony Corporation Inspecting method and inspecting apparatus for liquid crystal display panel whereby the cell gap is inspected
US6529837B1 (en) * 1999-11-12 2003-03-04 Lg. Philips Lcd Co., Ltd. Apparatus and method for inspecting cell defect of liquid crystal display device
JP2002251149A (ja) * 2001-02-26 2002-09-06 Horiba Ltd 平面表示パネルの欠陥検査装置
US6774958B2 (en) * 2002-02-26 2004-08-10 Lg.Philips Lcd Co., Ltd. Liquid crystal panel, apparatus for inspecting the same, and method of fabricating liquid crystal display thereof
US20050094055A1 (en) * 2002-03-25 2005-05-05 Choo Hun J. Cassette for liquid crystal panel inspection and method of inspecting liquid crystal panel
US6826963B2 (en) * 2002-10-04 2004-12-07 Quanta Computer, Inc. Panel testing apparatus

Also Published As

Publication number Publication date
KR100650273B1 (ko) 2006-11-27
JP2006338007A (ja) 2006-12-14
CN1873479A (zh) 2006-12-06
TW200643377A (en) 2006-12-16
TWI283292B (en) 2007-07-01

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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20090107

Termination date: 20130531