CN100440158C - A testing method and system for timer in embedded system - Google Patents
A testing method and system for timer in embedded system Download PDFInfo
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Abstract
This invention discloses a test imbed system timer method and system, wherein, the method comprises the following steps: the timer generates interval according to preset time and to inform system operator for interval process; the operator sends label information to PC during process interval; the said PC determines real interval between adjacent two label information to test timer accuracy.
Description
Technical field
The present invention relates to computing machine and embedded development field, particularly test the method and system of the accuracy of timer in the embedded system.
Background technology
In embedded systemic software development or test process, need measure the accuracy of timer clock.The method of the timer in the embedded system of prior art test at present is to use oscillograph to test, but oscillographic clock is inaccurate usually, and the waveform holding time is shorter, is unfavorable for record and observation.In addition, if use oscillograph, embedded system must outwards be drawn a pin (pin), has increased extra equipment.
Particularly prior art neither one when not having oscillograph or not having pin is unfavorable for the carrying out of test job to the method that timer carries out the accuracy test, also just can't guarantee the accuracy (such as the accuracy of timing) with the timer correlation function.
Summary of the invention
The invention provides a kind of method and system of testing timer in the embedded system, have the problem that does not have peripherals to test the accuracy of timer in the prior art in order to solve.
The invention provides following technical scheme:
A kind of method of testing timer in the embedded system, embedded system have the time interval and the quantitative value N of proving installation setting and transmission; Described method is further comprising the steps of:
Timer in the embedded system interrupted according to the default time interval, and the performer in the notice embedded system carries out Interrupt Process;
Described performer sends significant information to the proving installation that has clock when every processing is interrupted for N time;
Described proving installation is according to described significant information and local clock writing time, further determine actual interval according to the time of adjacent twice record, and according to the accuracy of this actual interval with the pre-period interval judgement timer of presetting, wherein, expection is spaced apart N times of the default time interval.
Described performer sends significant information to proving installation when knowing that interruption takes place every N time or when every N handling interrupt finishes.
Obtain actual error or relative error according to actual interval and pre-period interval, judge the accuracy of timer again according to actual error or relative error.
Described actual error is the difference of actual interval and pre-period interval, judges whether actual error is 0, if think that then timer is accurately in this test, otherwise think that timer is inaccurate in this test; Perhaps
Described actual error is the ratio of actual interval and pre-period interval, judges whether actual error is 1, if think that then timer is accurately in this test, otherwise think that timer is inaccurate in this test.
Described actual error is the difference of actual interval and pre-period interval, and perhaps described actual error is the ratio of actual interval and pre-period interval;
Actual error and actual error threshold value are compared,, otherwise think that timer is inaccurate in this test if actual error in the scope of actual error threshold value, thinks then that timer is accurately in this test.
Described relative error is the number percent that the actual interval and the difference of pre-period interval account for pre-period interval, judges whether relative error is 0, if think that then timer is accurately in this test, otherwise think that timer is inaccurate in this test.
Described relative error is the number percent that the actual interval and the difference of pre-period interval account for pre-period interval, relative error and relative error threshold value are compared, if relative error is in the scope of relative error threshold value, think that then timer is accurately in this test, otherwise think that timer is inaccurate in this test.
To the realistic border of a plurality of actual errors mean value in repeatedly testing, perhaps a plurality of relative errors in repeatedly testing are asked relative mean value according to testing time according to testing time; Determine the accuracy of timer again according to described actual mean value or described relative mean value.
When described actual error is the difference of actual interval and pre-period interval, judge whether actual mean value is 0, if think that then timer is accurately, otherwise think that timer is inaccurate; Perhaps
When described actual error is the ratio of actual interval and pre-period interval, judge whether actual mean value is 1, if think that then timer is accurately, otherwise think that timer is inaccurate.
Actual mean value and actual error threshold value are compared, if actual mean value in the scope of actual error threshold value, is thought that then timer is accurately, otherwise thought that timer is inaccurate.
Described relative error is the number percent that the actual interval and the difference of pre-period interval account for pre-period interval;
Judge whether relative mean value is 0, if think that then timer is accurately, otherwise think that timer is inaccurate; Perhaps
Relative mean value and relative error threshold value are compared, if mean value is thought that then timer is accurately, otherwise thought that timer is inaccurate in the scope of relative error threshold value relatively.
In test repeatedly according to think timer accurately the number of times number percent that accounts for total testing time determine percent of pass, percent of pass and judgment threshold are compared, if percent of pass is not less than judgment threshold, determines that then timer is accurately, otherwise determine that timer is inaccurate.
Repeatedly presetting the different time intervals in the test process.
A kind of proving installation that is used for testing the embedded system timer comprises:
Clock is used to provide the current time;
Test cell is used to set interval and quantitative value N;
Transmitting element, be used for sending the described time interval and quantitative value N to embedded system, indicate the timer in the described embedded system to interrupt, and indicate the performer Returning mark information when every processing is interrupted for N time in the described embedded system according to this time interval;
Receiving element is used for receiving the significant information that the performer of embedded system sends;
Described test cell, also be used for according to described significant information and described clock log time, further determine actual interval according to the time of adjacent twice record, and according to the accuracy of this actual interval with the pre-period interval judgement timer of presetting, wherein, expect N times that is spaced apart the default time interval.
Performer in a kind of embedded system comprises:
Receiving element is used for the quantitative value N and the time interval that the device of acceptance test timer sends;
Trigger element is used for sending the described time interval to the embedded system timer, interrupts according to this time interval with the indication timer; And know that timer interrupts;
Processing unit is used for carrying out Interrupt Process after interrupt taking place knowing, and the local counting unit of indication adds 1 or clear 0 with interruption times, and according to quantitative value N, generates significant information when whenever knowing N interruption;
Transmitting element, be used for sending described significant information to described device, make clock and this significant information writing time of described device according to self, and determine actual interval according to the time of adjacent twice record, and the accuracy of judging timer according to this actual interval and default pre-period interval, wherein, expect N times that is spaced apart the default time interval.
A kind of system that tests timer in the embedded system comprises:
Proving installation is used for being provided with and to embedded system transmission time interval and quantitative value N;
Timer in the embedded system be used for interrupting according to the default time interval, and the performer in the notice embedded system carries out Interrupt Process;
Performer in the embedded system is used to receive the interrupt message that described timer sends, and according to default quantitative value N, sends significant information to proving installation when every processing is interrupted for N time;
Described proving installation, also be used for according to described significant information and local clock writing time, further determine actual interval according to the time of adjacent twice record, and according to the accuracy of this actual interval with the pre-period interval judgement timer of presetting, wherein, expect N times that is spaced apart the default time interval.
Obtain actual error or relative error according to actual interval and pre-period interval, judge the accuracy of timer again according to actual error or relative error.
To the realistic border of a plurality of actual errors mean value in repeatedly testing, perhaps a plurality of relative errors in repeatedly testing are asked relative mean value according to testing time according to testing time; Determine the accuracy of timer again according to described actual mean value or described relative mean value.
Repeatedly presetting the different time intervals in the test process.
Beneficial effect of the present invention is as follows:
Writing time when 1, the present invention utilizes PC produce to interrupt according to the timer of local clock in knowing embedded system, and according to the accuracy of the clock of the time test timer of record.The present invention has realized when not having oscillograph or embedded system not to have pin the testing of timer accuracy, and PC is a necessaries in software test procedure.
2, the present invention has also solved the problem of oscillographic inaccurate clock.And PC can clearly be shown to the tester with each data, has solved the problem that the waveform holding time is short, be difficult for observation and record.
Description of drawings
Fig. 1 is the system construction drawing of test timer in the embodiment of the invention;
Fig. 2 is the structural drawing of PC in the embodiment of the invention;
Fig. 3 is the structural drawing of performer in the embodiment of the invention;
Fig. 4 is the method basic flow sheet of test timer in the embodiment of the invention;
Fig. 5 is the method detail flowchart of test timer in the embodiment of the invention.
Embodiment
Have the problem that does not have peripherals to test the accuracy of timer in order to solve in the prior art, the present invention utilizes the clock of PC that the timer in the embedded system is tested, and judges the accuracy of its timing.
Referring to Fig. 1, the system of test timer comprises performer 102 and the timer 103 in PC101, the embedded system in the present embodiment.
Whether PC101 is accurate according to the clock of the clock test timer 103 of this locality.At first utilize PC101 to be 103 fixed times of timer interval, express time parameter is at interval sent to embedded system; And, utilize PC101 that quantitative value N is set, indication performer 102 sends significant information to PC101 when knowing that the N time interruption takes place, and when receiving the significant information that performer 102 sends according to local clock writing time, time according to adjacent twice record is determined actual interval, further determine actual error, relative error, percent of pass, actual mean value and relative mean value with pre-period interval again, determine the accuracy of timer 103 according to The above results according to actual interval.
In order to obtain result comparatively accurately, can repeatedly test timer 103, judge according to the result who repeatedly tests.
Referring to Fig. 2, PC101 comprises receiving element 201, test cell 202, clock 203 and transmitting element 204 in the present embodiment.
Receiving element 201 receives the significant information that performer 102 sends.
Transmitting element 204 sends each parameter to performer 102, comprises the time interval and N value.
Referring to Fig. 3, performer 102 comprises trigger element 301, processing unit 302, counting unit 303, receiving element 304 and transmitting element 305 in the present embodiment.
Counting unit 303 adds 1 or clear 0 according to the indication of processing unit 302 with interruption times.
Receiving element 304 receives each parameter that PC101 sends, and comprises time interval parameter and N value.
Transmitting element 305 sends significant information to PC101.
Referring to Fig. 4, the method basic procedure of test timer is as follows in the present embodiment:
Step 401: timer 103 produces according to the default time interval and interrupts, and notice performer 102 carries out Interrupt Process.
Step 402: performer 102 sends significant information to PC101 when whenever receiving the N time interrupt message.
Step 403:PC101 determines to receive the actual interval of adjacent twice significant information according to described significant information, and according to the accuracy of this actual interval and pre-period interval test timer, wherein, expection is spaced apart the integral multiple in the default time interval.
Referring to Fig. 5, the method idiographic flow of test timer is as follows in the present embodiment:
Step 501: utilize PC101 regularly to interrupt according to the default time interval (as 1us) with the form indication timer 103 of parameter.Can utilize PC101 that time interval parameter is put into timer 103; Also can put into the module of the stored parameter of embedded system, timer 103 reads from this memory module when this parameter of needs.
Step 502: timer 103 regularly interrupts according to the time interval parameter that obtains, and notice performer 102 carries out Interrupt Process.
Step 503: performer 102 knows that interruption takes place, and in this locality interruption times is added 1, when the interruption number of times reaches the quantitative value N (as 1000000) of PC101 appointment, generates significant information, and sends significant information to PC101.
Step 504:PC101 when receiving significant information, the time that receives according to the clock log of this locality.The local real time can be write down, also relative time can be write down; Relative time is meant when receiving significant information for the first time will be designated as 0 the time.
Step below continuing when after PC101 reaches for the second time, receiving significant information to carry out:
Step 505:PC determines actual interval according to the time of 101 these records and the time of last registration, promptly actual interval=this time-time last time.
Step 506: actual interval and pre-period interval are compared, determine whether timer is accurate, judge promptly whether the actual interval and the difference (actual error) of pre-period interval are 0, judge perhaps whether the actual interval and the ratio (actual error) of pre-period interval are 1, if, illustrating that then timer 103 is accurate, this test is passed through, otherwise illustrate that timer 103 is inaccurate, this test is not passed through.
Judge that perhaps actual error is whether in the scope of actual error threshold value, if illustrate that then this test result is accurate, otherwise illustrate that this test result is inaccurate, and can determine the speed degree of timer 103 according to actual error.Expection is spaced apart the product of the time interval and quantitative value N, i.e. 1s; Actual error is meant that in the scope of actual error threshold value the absolute value of actual error is not more than the actual error threshold value.
And can be according to the positive and negative and big or small speed degree of judging timer 103 of actual error.
Can also adopt the second way to judge the accuracy of timer 103 clocks according to above-mentioned steps, continue step 507.
Step 507: determine relative error according to actual error and pre-period interval, it is the difference/pre-period interval of relative error=actual interval and pre-period interval, judge the accuracy of timer 103 then according to relative error, if relative error is 0, illustrate that then this test result is accurate, otherwise illustrate that this test result is inaccurate.
Judge that perhaps relative error is whether in the scope of relative error threshold value (as 5%), if illustrate that then this test result is accurate, otherwise illustrate that this test result is inaccurate, and can judge the speed degree of timer 103 according to relative error.
Can adjust the time interval that interruption takes place timer 103 according to this test result, timer 103 interruption delay have taken place 100us in this test for example, be that actual error is 100us, think that so timer 103 also can postpone 100us in the test next time, so pre-period interval is adjusted into 1000100us, quantitative value N is adjusted into 1000100/1=1000100.
Accurate for the result who guarantees to test, need repeatedly test timer 103, avoid because delay once in a while or certain interruption conductively-closed influence to the judgement of timer, then continue following step.
Step 508: to timer 103 carry out M test and ask percent of pass, percent of pass be meant in M time definite timer 103 accurately number of times account for M time number percent.Then percent of pass and judgment threshold (as 95%) are compared,, illustrate that then timer 103 is accurate, otherwise explanation timer 103 is inaccurate if percent of pass is not less than judgment threshold.
Step 509: further M time relative error or actual error are asked average, according to the actual mean value that obtains or relatively mean value adopt above-mentioned steps 506 and the described method of step 507 to judge the accuracy of timer 103, and according to the actual mean value or the positive and negative and big or small speed degree of judging timer 103 of mean value relatively.
Writing time when the present invention utilizes PC produce to interrupt according to the timer of local clock in knowing embedded system, and according to the accuracy of the clock of the time test timer of record.The present invention has realized when not having oscillograph or embedded system not to have pin the testing of timer accuracy, and PC is a necessaries in software test procedure.The present invention has also remedied the problem of oscillographic inaccurate clock.And PC can clearly be shown to the tester with each data, has remedied the problem that the waveform holding time is short, be difficult for observation and record.
Obviously, those skilled in the art can carry out various changes and modification to the present invention and not break away from the spirit and scope of the present invention.Like this, if of the present invention these are revised and modification belongs within the scope of claim of the present invention and equivalent technologies thereof, then the present invention also is intended to comprise these changes and modification interior.
Claims (19)
1, a kind of method of testing timer in the embedded system is characterized in that, embedded system has the time interval and the quantitative value N of proving installation setting and transmission; Described method is further comprising the steps of:
Timer in the embedded system interrupted according to the default time interval, and the performer in the notice embedded system carries out Interrupt Process;
Described performer sends significant information to the proving installation that has clock when every processing is interrupted for N time;
Described proving installation is according to described significant information and local clock writing time, further determine actual interval according to the time of adjacent twice record, and according to the accuracy of this actual interval with the pre-period interval judgement timer of presetting, wherein, expection is spaced apart N times of the default time interval.
2, the method for claim 1 is characterized in that, described performer sends significant information to proving installation when knowing that interruption takes place every N time or when every N handling interrupt finishes.
3, the method for claim 1 is characterized in that, obtains actual error or relative error according to actual interval and pre-period interval, judges the accuracy of timer again according to actual error or relative error.
4, method as claimed in claim 3 is characterized in that, described actual error is the difference of actual interval and pre-period interval, judge whether actual error is 0, if think that then timer is accurately in this test, otherwise think that timer is inaccurate in this test; Perhaps
Described actual error is the ratio of actual interval and pre-period interval, judges whether actual error is 1, if think that then timer is accurately in this test, otherwise think that timer is inaccurate in this test.
5, method as claimed in claim 3 is characterized in that, described actual error is the difference of actual interval and pre-period interval, and perhaps described actual error is the ratio of actual interval and pre-period interval;
Actual error and actual error threshold value are compared,, otherwise think that timer is inaccurate in this test if actual error in the scope of actual error threshold value, thinks then that timer is accurately in this test.
6, method as claimed in claim 3, it is characterized in that, described relative error is the number percent that the actual interval and the difference of pre-period interval account for pre-period interval, judge whether relative error is 0, if, think that then timer is accurately in this test, otherwise think that timer is inaccurate in this test.
7, method as claimed in claim 3, it is characterized in that, described relative error is the number percent that the actual interval and the difference of pre-period interval account for pre-period interval, relative error and relative error threshold value are compared, if relative error is in the scope of relative error threshold value, think that then timer is accurately in this test, otherwise think that timer is inaccurate in this test.
8, method as claimed in claim 3 is characterized in that, to the realistic border of a plurality of actual errors mean value in repeatedly testing, perhaps according to testing time a plurality of relative errors in repeatedly testing is asked relative mean value according to testing time; Determine the accuracy of timer again according to described actual mean value or described relative mean value.
9, method as claimed in claim 8 is characterized in that, when described actual error is the difference of actual interval and pre-period interval, judges whether actual mean value is 0, if think that then timer is accurately, otherwise think that timer is inaccurate; Perhaps
When described actual error is the ratio of actual interval and pre-period interval, judge whether actual mean value is 1, if think that then timer is accurately, otherwise think that timer is inaccurate.
10, method as claimed in claim 8 is characterized in that, actual mean value and actual error threshold value is compared, if actual mean value in the scope of actual error threshold value, is thought that then timer is accurately, otherwise thought that timer is inaccurate.
11, method as claimed in claim 8 is characterized in that, described relative error is the number percent that the actual interval and the difference of pre-period interval account for pre-period interval;
Judge whether relative mean value is 0, if think that then timer is accurately, otherwise think that timer is inaccurate; Perhaps
Relative mean value and relative error threshold value are compared, if mean value is thought that then timer is accurately, otherwise thought that timer is inaccurate in the scope of relative error threshold value relatively.
12, as each described method in the claim 3 to 7, it is characterized in that, in test repeatedly according to think timer accurately the number of times number percent that accounts for total testing time determine percent of pass, percent of pass and judgment threshold are compared, if percent of pass is not less than judgment threshold, determine that then timer is accurately, otherwise determine that timer is inaccurate.
13, the method for claim 1 is characterized in that, is repeatedly presetting the different time intervals in the test process.
14, a kind of proving installation that is used for testing the embedded system timer is characterized in that, comprising:
Clock is used to provide the current time;
Test cell is used to set interval and quantitative value N;
Transmitting element, be used for sending the described time interval and quantitative value N to embedded system, indicate the timer in the described embedded system to interrupt, and indicate the performer Returning mark information when every processing is interrupted for N time in the described embedded system according to this time interval;
Receiving element is used for receiving the significant information that the performer of embedded system sends;
Described test cell, also be used for according to described significant information and described clock log time, further determine actual interval according to the time of adjacent twice record, and according to the accuracy of this actual interval with the pre-period interval judgement timer of presetting, wherein, expect N times that is spaced apart the default time interval.
15, the performer in a kind of embedded system is characterized in that, comprising:
Receiving element is used for the quantitative value N and the time interval that the device of acceptance test timer sends;
Trigger element is used for sending the described time interval to the embedded system timer, interrupts according to this time interval with the indication timer; And know that timer interrupts;
Processing unit is used for carrying out Interrupt Process after interrupt taking place knowing, and the local counting unit of indication adds 1 or clear 0 with interruption times, and according to quantitative value N, generates significant information when whenever knowing N interruption;
Transmitting element, be used for sending described significant information to the device of test timer, make clock and this significant information writing time of described device according to self, and determine actual interval according to the time of adjacent twice record, and the accuracy of judging timer according to this actual interval and default pre-period interval, wherein, expect N times that is spaced apart the default time interval.
16, a kind of system that tests timer in the embedded system is characterized in that, comprising:
Proving installation is used for being provided with and to embedded system transmission time interval and quantitative value N;
Timer in the embedded system be used for interrupting according to the default time interval, and the performer in the notice embedded system carries out Interrupt Process;
Performer in the embedded system is used to receive the interrupt message that described timer sends, and according to default quantitative value N, sends significant information to proving installation when every processing is interrupted for N time;
Described proving installation, also be used for according to described significant information and local clock writing time, further determine actual interval according to the time of adjacent twice record, and according to the accuracy of this actual interval with the pre-period interval judgement timer of presetting, wherein, expect N times that is spaced apart the default time interval.
17, system as claimed in claim 16 is characterized in that, obtains actual error or relative error according to actual interval and pre-period interval, judges the accuracy of timer again according to actual error or relative error.
18, system as claimed in claim 17 is characterized in that, to the realistic border of a plurality of actual errors mean value in repeatedly testing, perhaps according to testing time a plurality of relative errors in repeatedly testing is asked relative mean value according to testing time; Determine the accuracy of timer again according to described actual mean value or described relative mean value.
19, as each described system in the claim 16 to 18, it is characterized in that, repeatedly presetting the different time intervals in the test process.
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| CNB2006101147884A CN100440158C (en) | 2006-11-23 | 2006-11-23 | A testing method and system for timer in embedded system |
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| CNB2006101147884A CN100440158C (en) | 2006-11-23 | 2006-11-23 | A testing method and system for timer in embedded system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101907682B (en) * | 2009-06-02 | 2012-08-29 | 上海摩波彼克半导体有限公司 | Automatic test circuit structure of digital baseband chip Gptimer module, test platform and method |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101464822B (en) * | 2007-12-21 | 2011-09-21 | 中兴通讯股份有限公司 | Test method for CPU timer accuracy |
| CN103645980A (en) * | 2013-12-19 | 2014-03-19 | 安徽师范大学 | Monitoring method for embedded system timer |
| CN111447333B (en) * | 2020-03-09 | 2021-07-02 | 深圳震有科技股份有限公司 | TDM bus fault detection method, device, equipment and readable storage medium |
| CN113297090B (en) * | 2021-06-11 | 2024-01-23 | 南方电网数字平台科技(广东)有限公司 | System test method, device, computer equipment and storage medium |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4956842A (en) * | 1988-11-16 | 1990-09-11 | Sundstrand Corporation | Diagnostic system for a watchdog timer |
| CN1441570A (en) * | 2002-02-28 | 2003-09-10 | 深圳市中兴通讯股份有限公司上海第二研究所 | Timing method of timer in embedded real-time operation system |
| CN1622045A (en) * | 2003-11-24 | 2005-06-01 | 顺德市顺达电脑厂有限公司 | Method for calibrating real time timer |
-
2006
- 2006-11-23 CN CNB2006101147884A patent/CN100440158C/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4956842A (en) * | 1988-11-16 | 1990-09-11 | Sundstrand Corporation | Diagnostic system for a watchdog timer |
| CN1441570A (en) * | 2002-02-28 | 2003-09-10 | 深圳市中兴通讯股份有限公司上海第二研究所 | Timing method of timer in embedded real-time operation system |
| CN1622045A (en) * | 2003-11-24 | 2005-06-01 | 顺德市顺达电脑厂有限公司 | Method for calibrating real time timer |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101907682B (en) * | 2009-06-02 | 2012-08-29 | 上海摩波彼克半导体有限公司 | Automatic test circuit structure of digital baseband chip Gptimer module, test platform and method |
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