CN100341120C - 等离子体处理装置以及等离子体处理方法 - Google Patents

等离子体处理装置以及等离子体处理方法 Download PDF

Info

Publication number
CN100341120C
CN100341120C CNB031495362A CN03149536A CN100341120C CN 100341120 C CN100341120 C CN 100341120C CN B031495362 A CNB031495362 A CN B031495362A CN 03149536 A CN03149536 A CN 03149536A CN 100341120 C CN100341120 C CN 100341120C
Authority
CN
China
Prior art keywords
substrate
electrode
processed substrate
plasma
plasma processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CNB031495362A
Other languages
English (en)
Chinese (zh)
Other versions
CN1477682A (zh
Inventor
里吉务
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of CN1477682A publication Critical patent/CN1477682A/zh
Application granted granted Critical
Publication of CN100341120C publication Critical patent/CN100341120C/zh
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Plasma Technology (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Chemical Vapour Deposition (AREA)
  • Drying Of Semiconductors (AREA)
CNB031495362A 2002-07-16 2003-07-15 等离子体处理装置以及等离子体处理方法 Expired - Lifetime CN100341120C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002206823 2002-07-16
JP2002206823A JP3880896B2 (ja) 2002-07-16 2002-07-16 プラズマ処理装置およびプラズマ処理方法

Publications (2)

Publication Number Publication Date
CN1477682A CN1477682A (zh) 2004-02-25
CN100341120C true CN100341120C (zh) 2007-10-03

Family

ID=31884270

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB031495362A Expired - Lifetime CN100341120C (zh) 2002-07-16 2003-07-15 等离子体处理装置以及等离子体处理方法

Country Status (4)

Country Link
JP (1) JP3880896B2 (ja)
KR (1) KR100996018B1 (ja)
CN (1) CN100341120C (ja)
TW (1) TWI276173B (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060054514A (ko) * 2004-11-16 2006-05-22 삼성전자주식회사 건식 식각 장치
JP4839294B2 (ja) * 2007-10-04 2011-12-21 株式会社アルバック 半導体ウエハ保持装置
CN102934218B (zh) * 2010-06-08 2016-05-04 艾克塞利斯科技公司 高温下具有机械夹持能力的受热静电夹头
CN105206495B (zh) * 2015-08-17 2018-08-07 深圳市华星光电技术有限公司 干式蚀刻装置及阵列基板干式蚀刻去除静电方法
CN106920730A (zh) * 2015-12-28 2017-07-04 中微半导体设备(上海)有限公司 一种清洁刻蚀硅基片等离子体处理装置的方法
CN106935463B (zh) * 2017-02-27 2018-09-14 成都京东方光电科技有限公司 用于干法刻蚀的承载装置及干法刻蚀设备
US20210005493A1 (en) 2017-11-28 2021-01-07 Tokyo Electron Limited Processing apparatus
JP7329997B2 (ja) * 2019-07-09 2023-08-21 日本特殊陶業株式会社 静電チャック装置
KR20210109998A (ko) * 2020-02-28 2021-09-07 캐논 톡키 가부시키가이샤 흡착장치, 성막장치, 흡착방법, 성막방법 및 전자 디바이스의 제조방법
KR102637744B1 (ko) * 2021-09-30 2024-02-19 주식회사 나이스플라즈마 클램프 링이 구비된 클램프 척

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0845911A (ja) * 1994-07-29 1996-02-16 Nippon Steel Corp プラズマ処理装置用電極
JPH11111830A (ja) * 1997-10-07 1999-04-23 Tokyo Electron Ltd 静電吸着装置および静電吸着方法、ならびにそれを用いた処理装置および処理方法
JP2001148368A (ja) * 1999-11-19 2001-05-29 Matsushita Electric Ind Co Ltd 高周波印加電極とこの電極を用いたプラズマプロセス装置
JP2001284328A (ja) * 2000-03-31 2001-10-12 Taiheiyo Cement Corp セラミック部品
US6331754B1 (en) * 1999-05-13 2001-12-18 Tokyo Electron Limited Inductively-coupled-plasma-processing apparatus
US6387208B2 (en) * 2000-07-07 2002-05-14 Tokyo Electron Limited Inductive coupling plasma processing apparatus

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0845911A (ja) * 1994-07-29 1996-02-16 Nippon Steel Corp プラズマ処理装置用電極
JPH11111830A (ja) * 1997-10-07 1999-04-23 Tokyo Electron Ltd 静電吸着装置および静電吸着方法、ならびにそれを用いた処理装置および処理方法
US6331754B1 (en) * 1999-05-13 2001-12-18 Tokyo Electron Limited Inductively-coupled-plasma-processing apparatus
JP2001148368A (ja) * 1999-11-19 2001-05-29 Matsushita Electric Ind Co Ltd 高周波印加電極とこの電極を用いたプラズマプロセス装置
JP2001284328A (ja) * 2000-03-31 2001-10-12 Taiheiyo Cement Corp セラミック部品
US6387208B2 (en) * 2000-07-07 2002-05-14 Tokyo Electron Limited Inductive coupling plasma processing apparatus

Also Published As

Publication number Publication date
TWI276173B (en) 2007-03-11
JP2004055585A (ja) 2004-02-19
TW200403749A (en) 2004-03-01
KR20040010179A (ko) 2004-01-31
CN1477682A (zh) 2004-02-25
KR100996018B1 (ko) 2010-11-22
JP3880896B2 (ja) 2007-02-14

Similar Documents

Publication Publication Date Title
CN100587938C (zh) 基板载置台和基板处理装置
JP4421874B2 (ja) プラズマ処理装置及びプラズマ処理方法
US7375946B2 (en) Method and apparatus for dechucking a substrate
KR102653085B1 (ko) 클리닝 방법 및 기판 처리 장치
CN101901778B (zh) 静电吸附电极及其制造方法和基板处理装置
JP2002151581A (ja) 基板のデチャック方法及び装置
TW201513262A (zh) 原位可移除式靜電吸盤
CN103824800A (zh) 基板载置台和基板处理装置
CN100341120C (zh) 等离子体处理装置以及等离子体处理方法
JP2007277702A (ja) 基板載置台および基板処理装置
JP2011009692A (ja) 静電吸着電極およびその製造方法、ならびに基板処理装置
CN105632863A (zh) 等离子刻蚀装置
JPH09120988A (ja) プラズマ処理方法
JP5528391B2 (ja) 基板のプラズマ処理方法
JP4783094B2 (ja) プラズマ処理用環状部品、プラズマ処理装置、及び外側環状部材
TW201940257A (zh) 清潔方法及處理裝置
CN1203443A (zh) 从样品台取走被静电吸附的样品的方法和装置
KR20180018411A (ko) 플라즈마 에칭 방법 및 플라즈마 에칭 시스템
JPH1027780A (ja) プラズマ処理方法
JP2004165645A (ja) プラズマ処理装置
US20070221332A1 (en) Plasma processing apparatus
JP3118497B2 (ja) プラズマ処理装置及びプラズマ処理方法
JP2002129320A (ja) スパッタ方法及びスパッタ装置
CN1525534A (zh) 等离子体处理装置及静电吸盘的制造方法
JPH06168914A (ja) エッチング処理方法

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CX01 Expiry of patent term
CX01 Expiry of patent term

Granted publication date: 20071003