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Publication date
Application filed by Siemens AgfiledCriticalSiemens Ag
Publication of CH670700A5publicationCriticalpatent/CH670700A5/de
G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
G01B17/025—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness for measuring thickness of coating
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Physics & Mathematics
(AREA)
General Physics & Mathematics
(AREA)
Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves
(AREA)
Length Measuring Devices Characterised By Use Of Acoustic Means
(AREA)
Vorrichtung und verfahren zum zerstoerungsfreien und beruehrungslosen messen der schichtdicke von extrudierten langgestreckten gegenstaenden aus kunststoff
Innenrohr-messsonde nach dem ultraschall-impulsechoverfahren zur wanddickenmessung an narbigen oberflaechen, vorzugsweise zum nachweis von korrosion in rohren
Verfahren und Vorrichtung zum kapazi tivenPrufen der Außenmaße und Feststellen von Fehlern in der Außenseite von rohr , stangen oder stabförmigen Prüflingen aus Metall oder Kunststoff