CH623502A5 - - Google Patents

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Publication number
CH623502A5
CH623502A5 CH743878A CH743878A CH623502A5 CH 623502 A5 CH623502 A5 CH 623502A5 CH 743878 A CH743878 A CH 743878A CH 743878 A CH743878 A CH 743878A CH 623502 A5 CH623502 A5 CH 623502A5
Authority
CH
Switzerland
Prior art keywords
slide
carriage
installation according
axis
control installation
Prior art date
Application number
CH743878A
Other languages
English (en)
French (fr)
Inventor
Helenio Llop
Claude Alain Letort
Original Assignee
Sopelem
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sopelem filed Critical Sopelem
Publication of CH623502A5 publication Critical patent/CH623502A5/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0011—Arrangements for eliminating or compensation of measuring errors due to temperature or weight
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S33/00—Geometrical instruments
    • Y10S33/21—Geometrical instruments with laser

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CH743878A 1977-07-08 1978-07-07 CH623502A5 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7721099A FR2396954A1 (fr) 1977-07-08 1977-07-08 Dispositif de mesure et de controle de rectitude

Publications (1)

Publication Number Publication Date
CH623502A5 true CH623502A5 (de) 1981-06-15

Family

ID=9193159

Family Applications (1)

Application Number Title Priority Date Filing Date
CH743878A CH623502A5 (de) 1977-07-08 1978-07-07

Country Status (9)

Country Link
US (1) US4195412A (de)
JP (1) JPS5440660A (de)
BE (1) BE868838A (de)
CH (1) CH623502A5 (de)
DE (1) DE2829222C3 (de)
FR (1) FR2396954A1 (de)
GB (1) GB2000867B (de)
IT (1) IT1108669B (de)
NL (1) NL7807230A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3508143A1 (de) * 1985-03-07 1986-09-11 Franz Haimer Zweikoordinaten-laengenmessgeraet

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0030047B1 (de) * 1979-12-04 1983-06-01 Werkzeugmaschinenfabrik Oerlikon-Bührle AG Vorrichtung zum Positionieren eines Werkstückes
US4483618A (en) * 1982-05-24 1984-11-20 Hamar M R Laser measurement system, virtual detector probe and carriage yaw compensator
FR2531205A1 (fr) * 1982-07-29 1984-02-03 Commissariat Energie Atomique Dispositif de palpage a laser pour controle dimensionnel
FR2542080B1 (fr) * 1983-03-02 1986-12-26 Manurhin Dispositif de mesure de cotes horizontales sur une piece
DE3309737A1 (de) * 1983-03-18 1984-09-20 Erno Raumfahrttechnik Gmbh, 2800 Bremen Vorrichtung zum exakten positionieren eines gegenstandes im raum
JPS6080704A (ja) * 1983-10-11 1985-05-08 Mitsutoyo Mfg Co Ltd 立体物測定機
US4714344A (en) * 1986-04-24 1987-12-22 Hamar M R Laser apparatus for monitoring geometric errors
FI76382C (fi) * 1986-10-03 1988-10-10 Outokumpu Oy Foerfarande och anordning foer loesgoering av en elektrolytisk avlagrad utfaellning.
DE3719422A1 (de) * 1986-12-19 1988-06-30 Hommelwerke Gmbh Vorrichtung zur beruehrungsfreien messung eines abstandes von einer oberflaeche, insbesondere zur abtastung einer kontur einer oberflaeche eines werkstueckes laengs eines messweges
GB8705301D0 (en) * 1987-03-06 1987-04-08 Renishaw Plc Calibration of machines
US4932131A (en) * 1987-03-06 1990-06-12 Renishaw Plc Position determination apparatus
GB8705302D0 (en) * 1987-03-06 1987-04-08 Renishaw Plc Combined scale & interferometer
JPH0821153B2 (ja) * 1987-10-12 1996-03-04 オリンパス光学工業株式会社 形状寸法測定装置におけるデータ転送システム
DE3833779A1 (de) * 1988-10-05 1990-04-12 Mauser Werke Oberndorf Mehrkoordinaten-messmaschine
DE3843286C1 (en) * 1988-12-22 1990-06-13 Hoesch Stahl Ag, 4600 Dortmund, De Profile measuring device
DE3936465C2 (de) * 1989-11-02 1998-09-10 Zeiss Carl Fa Koordinatenmeßgerät
EP0518572A3 (en) * 1991-06-14 1993-05-19 Spectra-Physics Laserplane, Inc. System for leveling workpieces
AU2087295A (en) * 1995-03-15 1996-10-02 Tovarishestvo S Ogranichennoi "Otvetstvennostju "Lapik" Industrial module and a device for measuring movements relative to the said module
DE19719336A1 (de) * 1997-05-07 1998-11-12 Beiersdorf Ag Verfahren und Meßgerät zur in vivo-Messung der elastischen Eigenschaften der Haut
FR2801965A1 (fr) * 1999-12-02 2001-06-08 Mecalix Controle Et Mesure Dispositif de mesure en deux dimensions d'un profil d'une piece
WO2008065683A1 (en) * 2006-11-27 2008-06-05 Sintesi S.C.P.A. Optoelectronic measuring system for acquiring position and orientation measures in an industrial machine
CN101915560B (zh) * 2010-06-25 2012-09-05 北京市普锐科创科技有限责任公司 激光直线度/同轴度测量装置
DE102012012197B4 (de) * 2012-05-02 2016-10-13 Wenzel Präzision GmbH Koordinatenmessgerät sowie Verfahren zum Betreiben eines Koordinatenmessgeräts
CN102679831B (zh) * 2012-05-14 2015-03-11 江苏南铸科技股份有限公司 工程机械水泥平衡重检验台检具
CN104104023B (zh) * 2013-04-15 2016-03-23 四川蓝讯宝迩电子科技有限公司 测量精度高的定位调节机构
CN106017366B (zh) * 2016-07-22 2018-07-27 中国工程物理研究院机械制造工艺研究所 一种直线度综合检测装置
CN106767387A (zh) * 2016-12-27 2017-05-31 广东工业大学 一种静压导轨直线度测量装置及测量方法
USD845135S1 (en) 2017-02-24 2019-04-09 S. C. Johnson & Son, Inc. Bottle neck with cap
CN108534679B (zh) * 2018-05-14 2019-08-13 西安电子科技大学 一种筒形件轴线位姿的无靶标自动测量装置及方法
CN109238105B (zh) * 2018-08-28 2020-06-09 洛阳双瑞特种装备有限公司 一种用于回转体表面曲线检测的大尺寸检验样板辅助工装
CN111023981B (zh) * 2019-12-30 2022-02-01 芜湖哈特机器人产业技术研究院有限公司 一种大型圆柱形工件参数测量装置和方法
CN114993184B (zh) * 2022-07-18 2022-10-25 深圳原驰三维技术有限公司 一种激光增材加工用材料尺寸检测装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3600987A (en) * 1969-03-13 1971-08-24 Blaw Knox Co Apparatus for compensating for deviations in the straightness of the bed of a machine tool
DE2008948C3 (de) * 1970-02-26 1979-04-12 C. Stiefelmayer Kg, 7300 Esslingen Gerät zum Messen oder Anreißen von Werkstücken
FR2088675A5 (de) * 1970-04-21 1972-01-07 Thomson Csf
US3741659A (en) * 1970-06-19 1973-06-26 Fellows Gear Shaper Co Bias corrected measuring instrument
SE372724B (de) * 1970-07-10 1975-01-13 Asquith Ltd William
JPS5622839B2 (de) * 1973-07-02 1981-05-27
FR2330997A1 (fr) * 1975-11-07 1977-06-03 Sagem Perfectionnements aux procedes et machines de mesure des dimensions de pieces

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3508143A1 (de) * 1985-03-07 1986-09-11 Franz Haimer Zweikoordinaten-laengenmessgeraet

Also Published As

Publication number Publication date
NL7807230A (nl) 1979-01-10
DE2829222A1 (de) 1979-01-11
BE868838A (fr) 1979-01-08
IT1108669B (it) 1985-12-09
FR2396954B1 (de) 1982-02-19
FR2396954A1 (fr) 1979-02-02
DE2829222B2 (de) 1980-12-18
GB2000867B (en) 1982-01-20
JPS5440660A (en) 1979-03-30
DE2829222C3 (de) 1981-11-12
GB2000867A (en) 1979-01-17
US4195412A (en) 1980-04-01
IT7868620A0 (it) 1978-07-07

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