CH614778A5 - - Google Patents

Info

Publication number
CH614778A5
CH614778A5 CH835277A CH835277A CH614778A5 CH 614778 A5 CH614778 A5 CH 614778A5 CH 835277 A CH835277 A CH 835277A CH 835277 A CH835277 A CH 835277A CH 614778 A5 CH614778 A5 CH 614778A5
Authority
CH
Switzerland
Application number
CH835277A
Inventor
Rainer Marten
Herbert Rosomm
Heinrich Schwenke
Original Assignee
Kernenergieverwert Ges Fuer
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kernenergieverwert Ges Fuer filed Critical Kernenergieverwert Ges Fuer
Publication of CH614778A5 publication Critical patent/CH614778A5/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH835277A 1976-07-16 1977-07-06 CH614778A5 (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2632001A DE2632001C3 (de) 1976-07-16 1976-07-16 Meßanordnung zur Röntgenfluoreszenzanalyse

Publications (1)

Publication Number Publication Date
CH614778A5 true CH614778A5 (xx) 1979-12-14

Family

ID=5983162

Family Applications (1)

Application Number Title Priority Date Filing Date
CH835277A CH614778A5 (xx) 1976-07-16 1977-07-06

Country Status (12)

Country Link
US (1) US4358854A (xx)
JP (1) JPS5328489A (xx)
AT (1) ATA513777A (xx)
BE (1) BE856851A (xx)
CH (1) CH614778A5 (xx)
DE (1) DE2632001C3 (xx)
DK (1) DK308877A (xx)
FR (1) FR2358653A1 (xx)
GB (1) GB1568863A (xx)
IT (1) IT1117341B (xx)
LU (1) LU77779A1 (xx)
NL (1) NL7707888A (xx)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2717925C3 (de) 1977-04-22 1981-09-03 Gkss - Forschungszentrum Geesthacht Gmbh, 2000 Hamburg Verwendung eines für die Spurenanalyse durch Röntgenfluoreszenz diedenden Anreicherungsverfahren
DE2727505A1 (de) * 1977-06-18 1979-01-04 Ibm Deutschland Roentgenfluoreszenzanalyse zur untersuchung oberflaechennaher schichten
DE3542003A1 (de) * 1985-11-28 1987-06-04 Geesthacht Gkss Forschung Verfahren zur zerstoerungsfreien analyse der oberflaechenschicht von proben
DE3606748C1 (de) * 1986-03-01 1987-10-01 Geesthacht Gkss Forschung Anordnung zur zerstoerungsfreien Messung von Metallspuren
US5014287A (en) * 1990-04-18 1991-05-07 Thornton Michael G Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants
JP2535675B2 (ja) * 1990-06-28 1996-09-18 株式会社東芝 全反射蛍光ｘ線分析装置
DE4130556C2 (de) * 1991-09-13 1996-07-04 Picolab Oberflaechen Und Spure Vorrichtung zur Totalreflexions-Röntgenfluoreszenzanalyse
EP1650558B1 (en) * 2003-07-11 2010-09-08 Waseda University Energy dispersion type x-ray diffraction/spectral device
JP6305327B2 (ja) * 2014-12-04 2018-04-04 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置
CN107536618B (zh) * 2016-06-29 2020-05-15 合肥美亚光电技术股份有限公司 X射线成像装置及其探测器偏转机构
IT202000015082A1 (it) * 2020-06-23 2021-12-23 Istituto Naz Di Astrofisica Metodo di analisi di campioni tramite raggi x a bassa energia e relativa attrezzatura di laboratorio

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1398091A (fr) * 1964-03-26 1965-05-07 Radiologie Cie Gle Perfectionnements aux appareils de dosage par fluorescence chi
GB1272333A (en) * 1968-06-22 1972-04-26 Philips Electronic Associated Apparatus for determining the crystallographic directions of a single crystal by means of a beam of x-rays
US3920984A (en) * 1974-04-08 1975-11-18 Machlett Lab Inc X-ray energy analyzer
DE2727505A1 (de) * 1977-06-18 1979-01-04 Ibm Deutschland Roentgenfluoreszenzanalyse zur untersuchung oberflaechennaher schichten

Also Published As

Publication number Publication date
DE2632001B2 (de) 1979-09-06
LU77779A1 (xx) 1977-10-17
IT1117341B (it) 1986-02-17
NL7707888A (nl) 1978-01-18
BE856851A (fr) 1977-10-31
FR2358653B1 (xx) 1981-11-27
GB1568863A (en) 1980-06-11
DK308877A (da) 1978-01-17
FR2358653A1 (fr) 1978-02-10
US4358854A (en) 1982-11-09
DE2632001C3 (de) 1980-10-23
ATA513777A (de) 1982-05-15
JPS5328489A (en) 1978-03-16
DE2632001A1 (de) 1978-01-19

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Legal Events

Date Code Title Description
PL Patent ceased